KR19990001076A - Component level measuring method and device - Google Patents

Abstract

To measure the level of the part placed on the reference plane, the part surface is irradiated with light, the light path is blocked by the jig member to form a shadow image on the part surface, and then the level of the part relative to the reference plane is processed through the information processing of the shadow image. Disclosed is a component level measuring method for measuring a light source, and as an optimal apparatus for performing the method, a light source for emitting light to a component surface placed on a reference surface, and a light image emitted from the light source to block a shadow image on the component surface. Displays a shadow image forming jig member provided on an optical path between a light source and a component, a camera for inputting a shadow image, image processing means for processing the shadow image input to the camera, and shadow image information Disclosed is a component level measuring apparatus including a display means for performing the same.

Description

Component level measuring method and device

The present invention relates to a component level measuring method and apparatus for measuring the level of a small flat component placed on a reference plane such as a flat table, and in particular, a non-contact component level measuring method capable of measuring the level of the component in a non-contact manner through image processing. And to the apparatus.

In recent years, with the miniaturization and high functionalization of industrial products, the use parts are also gradually miniaturized and precision. Therefore, such small precision parts are not easy to handle in the manufacturing process, so many precision optical devices such as microscopes are used for assembly or inspection. For example, when the semiconductor package is mounted on a substrate, the arrangement of the lead pin height of the lead frame or the surface state of the high-precision workpiece or the flatness of a small flat component such as a liquid crystal display (LCD) or a charge coupled device (CCD) A part level measuring apparatus using a laser beam as shown in FIG. 1 is used for surface inspection. This measuring apparatus receives a light beam reflected by the light receiving portion 12 by projecting the laser beam emitted from the light emitting source 11 onto the surface of the inspection component 1 placed on the reference plane 10 such as a stage, as shown. The level of the component 1 with respect to the reference plane 10 can be measured by triangulation.

However, the conventional component level measuring apparatus has a problem that it is difficult to efficiently measure a plurality of components. For example, when the reference plane is used as a conveyor or a transportable flat table to increase the measurement efficiency, an additional device for determining the position of the part must be provided, and the accuracy of the measurement depends on the position of the part. There is a problem.

Although not shown, as shown in the product name Sensorium-10 of Samhyeop Machinery Co., Ltd., published on pages 93 to 101 of the January 1992 issue of Image Information Industrial, it is optimized for the components on the stage. There is an apparatus for checking a focus state using an autofocusing optical system and measuring the level of a component through an image processing means, but there is a disadvantage in that the configuration is complicated and expensive.

SUMMARY OF THE INVENTION The present invention has been made in an effort to improve the above-described conventional problems, and an object of the present invention is to provide a method and apparatus for measuring a component level with improved measurement accuracy in measuring a component level with respect to a reference plane.

1 is a schematic block diagram showing a conventional component level measuring apparatus,

2 is a schematic block diagram showing an apparatus for measuring a component level according to the present invention;

3 and 4 are views for explaining the operation of the component level measuring method and apparatus according to the present invention.

Explanation of symbols for main parts of the drawings

100 ... light source 200 ... stage for supporting parts

300 ... Jig member for shadow image formation (optical filter)

400 camera 500 image processing means

600 ... monitor

In order to achieve the above object, the component level measuring method according to the present invention includes irradiating light onto the component surface for measuring the level of the component placed on a reference surface, and blocking a path of the light with a jig member to produce a shadow image on the component surface. After the formation, the level of the reference plane of the part is measured through the information processing of the shadow image.

In order to achieve the above object, the component level measuring apparatus according to the present invention comprises: a light source for emitting light onto the component surface for measuring the level of the component placed on a reference surface; A shadow image forming jig member provided on an optical path between the light source and the component to block light emitted from the light source to form a shadow image on the component surface; A camera for inputting the shadow image; And image processing means for processing the shadow image input to the camera and display means connected to the image processing means for displaying the shadow image information.

In the component level measuring apparatus according to the present invention, the light source is preferably a point light source such as a laser emitting device (LED), and the jig member for shadow image forming is preferably an optical filter that transmits only light in a specific wavelength band. .

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Referring to FIG. 2, the component level measuring apparatus according to the present invention includes, for example, a light source 100 provided to emit light onto a surface of a component 1 placed on a reference surface 10 such as a conveyor or a stage, and the light source 100. And a shadow image forming jig member 200 provided on an optical path between the light source 100 and the component 1 to block light emitted from the surface to form a shadow image S on the surface of the component 1. And a camera 300 for inputting the shadow image S, an image processing means 400 for signal processing the shadow image S information input by the camera 300, and the shadow image information. It comprises a monitor 500 which is connected to the image processing means 400 in order to.

In the above configuration, in particular, the light source 100 is preferably a point light source such as, for example, a laser emitting device (LED), the jig member 200 for forming a shadow image is provided with an optical filter for transmitting only light of a specific wavelength band It is preferable.

3 and 4 are views for explaining the operation of the component level measuring method and apparatus according to the present invention, the operation principle of the component level measuring method and apparatus according to the present invention with reference to the following.

Light emitted from the light source 100 is blocked by the shadow image forming jig member 200. As a result, a shadow image of the jig member 200 is formed on the surface of the component 1. The length of the shadow image S formed at this time depends on the height of the component. That is, referring to FIG. 3, a and b are light incidence points with respect to the surfaces of the parts 1 and 1 'having heights h and h', respectively, and have a distance difference d by mutually. Therefore, the length of the shadow image differs by the distance d. θ is an angle formed between the component surface (reference surface or the end of the jig member) and the optical axis, and by calculating the component height (h or h ') by the following equation by the angle (θ) with respect to the reference surface 100 Component level can be measured.

[Equation]

h = d tanθ

(A), (b) and (c) of FIG. 4 are exemplary views showing that the type of shadow image formed according to the height of the component to be measured is displayed on the monitor 600, respectively. Based on the shadow image length Sh at h, the component height h 'in (a) is larger than h, and the length Sh' of the shadow image is shorter than Sh. The height h of the component in (c) is smaller than h, and the length Sh of the shadow image is longer than Sh.

Therefore, according to the component level measuring method and apparatus according to the present invention, the shadow image information of the jig member 200 formed on the surface of the component 1 placed on the reference plane 10 is input to the camera 300 to perform the image processing means. By 400, the part level with respect to the reference plane can be easily measured by comparing the length with the reference length.

According to the component level measuring method and the apparatus according to the present invention as described above, since the apparatus configuration is simple and economical, and the component level is measured by shadow image processing of the measuring component, for example, a conveyor or a transferable flat table may be used as a reference plane. Even in the case of use, it is possible to precisely measure in the dynamic state without determining the position of the component in the static state, thereby increasing the measurement efficiency and the reliability of the measurement result.

Claims (6)

In order to measure the level of the component placed on the reference plane, the component plane is irradiated with light, and a path of the light is blocked by a jig member to form a shadow image on the component plane, and then through the information processing of the shadow image, A component level measuring method, characterized in that for measuring the level of the component. The method of claim 1, The jig member is a component level measuring method, characterized in that the optical filter for transmitting only light of a specific wavelength band. A light source for emitting light to the component surface for measuring the level of the component placed on the reference surface; A shadow image forming jig member provided on an optical path between the light source and the component to block light emitted from the light source to form a shadow image on the component surface; A camera for inputting the shadow image; Image processing means for information processing of the shadow image input to the camera; and And display means connected to said image processing means for displaying said shadow image information. The method of claim 3, And the light source is a point light source. The method of claim 3, And the light source is a laser emitting device (LED). The method of claim 3, The shadow image forming jig member is a component level measuring device, characterized in that the optical filter for transmitting only light of a specific wavelength band.