KR102654550B1 - Hybrid floating block - Google Patents

Abstract

The present invention includes a plate coupled to a rotating body; and a contact block that protrudes from the bottom of the plate and can contact the pad of the object through rotation, wherein the contact block includes: a slot into which a probe pin is inserted; and a scale protrusion formed to protrude further than the slot, wherein the slots form at least two first and second slot rows arranged side by side in the X-axis direction, and the first slot row and the second slot row. The slots forming the slot row display floating blocks in which odd-numbered slots and even-numbered slots in each row have different Y-axis coordinates. According to the present invention, the probe pin can contact the pad of the test subject without short circuit.

Description

Hybrid floating block {HYBRID FLOATING BLOCK}

The present invention relates to a hybrid floating block, and more specifically, to a hybrid type floating block that aligns the probe pins when the carrier jig rotates and makes contact with the pad of the object to be inspected.

The content presented in this section only provides background information for the present invention and does not constitute prior art.

A floating block corresponds to a part in a probe system into which a probe pin that contacts a test subject is inserted. The floating block is not fixed to prepare for errors that may occur in the process of the probe pin contacting the pad of the test object, but is flexible within a certain range, so the probe pin is aligned by changing the position according to the error to make contact on the target pad. It has the function of

The floating block according to the prior art, in addition to being flexible in position, did not have suitable shape characteristics for guiding the probe pin to the exact target position on the pad of the object to be inspected.

As a technology related to the present invention, a board inspection device published in the Korean Patent Publication publishes a floating head in which a connector seating portion is formed. However, the published floating head does not depict any structural features other than the ability to move up and down relative to the pin block. The configuration and effect of the two inventions are different in that the floating block according to the present invention has a shape suitable for contacting a thinner probe pin to the pad of an object to be inspected in addition to its fluidity.

Republic of Korea Patent No. 10-2388161 (announced on May 17, 2022)

One problem that the present invention aims to solve is to provide a floating block that can prevent short circuit of a probe pin inserted into a thinner slot.

In addition, a floating block having a shape suitable for guiding the position of the probe pin in contact with the pad of the object to be inspected is provided.

One problem that the present invention seeks to solve is to provide a floating block that can prevent thinner probe pins from being damaged due to positional errors.

The problem to be solved by the present invention is not limited to the problems mentioned above, and other problems not mentioned will be clearly understood by those skilled in the art from the description below.

In order to achieve the above object, according to an embodiment according to the technical idea of the present invention, a plate coupled to the rotating body; and a contact block formed to protrude from the bottom of the plate and capable of contacting the pad of the object through rotation, wherein the contact block includes: a slot into which a probe pin is inserted; and a scale protrusion formed to protrude further than the slot, wherein the slots form at least two first and second slot rows arranged side by side in the X-axis direction, and the first slot row and the second slot row. The slots forming the slot row are posted with floating blocks in which odd-numbered slots and even-numbered slots in each row have different Y-axis coordinates.

Additionally, the floating block may be configured so that the ribs corresponding to the side components of the partitions constituting each slot are removed.

In addition, the floating block may be configured to zigzagly arrange the contact portion of the probe pin inserted into the odd-numbered slot and the contact portion of the probe pin inserted into the even-numbered slot in a position opposite to the cusp so as not to overlap each other. .

In addition, the floating block may be configured to guide the position of the probe pin to a predetermined position by first contacting the bottom and curve of the object before the tip of the probe pin contacts the object. there is.

In addition, the floating block may be configured so that the scale protrusions are rounded without corners to prevent collision with the floor on which the object to be inspected in the opposing position is placed.

In addition, the floating block includes at least one of a coupling hole and a coupling protrusion that floats and couples the floating block to the rotating body, and the scale protrusion is positioned in the slot at a position matching the curve of the floor on which the object to be inspected is placed in a floating state. It may be configured to determine the X and Y coordinates of the inserted probe pin.

In addition, the floating block includes an external projection formed around the projection, surrounding the slot; and an internal protrusion formed between the first slot row and the second slot row, wherein the protrusion may be configured to protrude further than the cusp of the probe pin inserted into the slot.

Additionally, the floating block may include an external projection, four corner portions, and four edge portions between the corner portions, and the corner portions may be configured to extend further than the edge portions.

In addition, the floating block is such that, among the edge portions, the edge portion parallel to the first slot row or the second slot row protrudes on the inner side to the same height as the height of the inner projection, and the outer side protrudes further than the inner projection, The outer side and the inner side may be configured to have two different heights.

Additionally, the floating block may be configured such that the external projection includes an inclined surface formed on the inside in at least one of the X-axis direction and the Y-axis direction.

Specific details of other embodiments are included in “Specific Details for Carrying Out the Invention” and the attached “Drawings.”

Advantages and/or features of the present invention and methods for achieving them will become clear by referring to various embodiments described in detail below along with the accompanying drawings.

However, the present invention is not limited to the configuration of each embodiment disclosed below, but may also be implemented in various different forms. However, each embodiment disclosed in this specification is intended to ensure that the disclosure of the present invention is complete, and the present invention It is provided to fully inform those skilled in the art of the present invention, and it should be noted that the present invention is only defined by the scope of each claim.

According to the present invention, short circuit of the probe pin can be prevented by the slot structure.

Additionally, the floating block allows the probe pin to safely contact the pad of the test object.

Additionally, by guiding the floating block to the correct position, the thinner probe pin can be prevented from being damaged due to positional error.

The effects that can be achieved by the hybrid floating block according to the technical idea of the present invention are not limited to the effects mentioned above, and other effects not mentioned may be explained by those with ordinary knowledge in the technical field to which the present invention pertains from the description below. You will be able to understand it clearly.

1 is an exemplary diagram of a carrier jig.
Figure 2 is an exemplary diagram depicting the bottom of a floating block according to an embodiment of the present invention included in the carrier jig of Figure 1.
Figure 3 is an exemplary diagram depicting the top surface of a floating block included in the carrier jig of Figure 1, according to an embodiment of the present invention.
Figure 4 is an example diagram depicting the bottom of a contact block included in the floating block of Figure 2.
Figure 5 is an enlarged illustration of the contact block of Figure 4.
Figure 6 is a cross-sectional view depicting a cross-section cut at position h3 of the contact block of Figure 4.

Before explaining the present invention in detail, the terms or words used in this specification should not be construed as unconditionally limited to their ordinary or dictionary meanings, and the inventor of the present invention should not use the terms or words in order to explain his invention in the best way. It should be noted that the concepts of various terms can be appropriately defined and used, and furthermore, that these terms and words should be interpreted with meanings and concepts consistent with the technical idea of the present invention.

That is, the terms used in this specification are only used to describe preferred embodiments of the present invention, and are not used with the intention of specifically limiting the content of the present invention, and these terms refer to various possibilities of the present invention. It is important to note that this is a term defined with consideration in mind.

In addition, it should be noted that in this specification, singular expressions may include plural expressions, unless the context clearly indicates a different meaning, and may include singular meanings even if similarly expressed in plural. .

Throughout this specification, when a component is described as “including” another component, it does not exclude any other component, but includes any other component, unless specifically stated to the contrary. It could mean that you can do it.

Furthermore, if a component is described as being "installed within or connected to" another component, it means that this component may be installed in direct connection or contact with the other component and may be installed in contact with the other component and It may be installed at a certain distance, and in the case where it is installed at a certain distance, there may be a third component or means for fixing or connecting the component to another component. It should be noted that the description of the components or means of 3 may be omitted.

On the other hand, when a component is described as being “directly connected” or “directly connected” to another component, it should be understood that no third component or means is present.

Likewise, other expressions that describe the relationship between components, such as "between" and "immediately between", or "neighboring" and "directly neighboring", have the same meaning. It should be interpreted as

In addition, in this specification, terms such as "one side", "other side", "one side", "the other side", "first", "second", etc., if used, refer to one component. It is used to clearly distinguish it from other components, and it should be noted that the meaning of the component is not limited by this term.

In addition, in this specification, terms related to position such as "top", "bottom", "left", "right", etc., if used, should be understood as indicating the relative position of the corresponding component in the corresponding drawing. Unless the absolute location is specified, these location-related terms should not be understood as referring to the absolute location.

In addition, in this specification, when specifying the reference numeral for each component in each drawing, the same component has the same reference number even if the component is shown in different drawings, that is, the same reference is made throughout the specification. The symbols indicate the same component.

In the drawings attached to this specification, the size, position, connection relationship, etc. of each component constituting the present invention is exaggerated, reduced, or omitted in order to convey the idea of the present invention sufficiently clearly or for convenience of explanation. It may be described, and therefore its proportions or scale may not be exact.

In addition, hereinafter, in describing the present invention, detailed descriptions of configurations that are judged to unnecessarily obscure the gist of the present invention, for example, known technologies including prior art, may be omitted.

Hereinafter, embodiments of the present invention will be described in detail with reference to the related drawings.

1 is an exemplary diagram of a carrier jig.

Referring to Figure 1, a carrier jig included in the probe system is depicted. The carrier jig moves by a conveyor device and has the function of inputting an inspection signal to the inspected object by contacting the probe pin with the inspected object. The carrier jig may be configured to include a base plate 20 on which a seating area 22 on which a test subject is placed is formed, and a socket assembly 10 coupled to the base plate 20.

The base plate 20 corresponds to a type of workbench that fixes the object to be inspected. The base plate 20 is configured to include clamps 21a, 21b that pressurize and secure one end and the other end of the object to be inspected, a seating area 22, a hollow 23 formed at the bottom of the seating area, and a position mark 24. It can be.

The probe system can determine the position of the carrier jig using the vision system and position mark 24. The probe system transports a plurality of carrier jigs on which the test object is seated through a conveyor device in the probe system, and operates the socket assembly 10 to transport the test object corresponding to the part of the finished product before the final assembly of the finished product, for example. You can perform a performance test (probe) on the display panel.

The socket assembly 10 corresponds to a device that inputs a test signal to an object to be inspected. A probe pin is located at the end of the socket assembly, and the probe pin contacts the pad of the object to be inspected, so that a test signal can be input to the object to be inspected through the probe pin.

The socket assembly 10 may be configured to include a fixed body that is coupled and fixed to the base plate 20 and a rotating body that is coupled to and rotates through a hinge. When the pad formed at the end of the FPCB of the object to be inspected is seated on the fixture, the rotating body can rotate toward the pad to bring the probe pin into contact with the pad. Here, the rotating body includes a floating block 100, and a probe pin is inserted and disposed within the floating block 100. And the fixture includes a nest block. The pad of the object to be inspected is seated on the nest block. That is, the pad of the object to be inspected, while seated on the nest block, comes into contact with the probe pin inserted into the floating block.

The floating block 100 includes a probe pin and has a function of guiding the movement of the probe pin so that the probe pin contacts the correct position on the pad of the object to be inspected.

Figure 2 is an exemplary diagram depicting the bottom of a floating block included in the carrier jig of Figure 1, according to an embodiment of the present invention.

Figure 3 is an exemplary diagram depicting the top surface of a floating block included in the carrier jig of Figure 1, according to an embodiment of the present invention.

Referring to Figure 2, the bottom of the floating block 100 is depicted. The floating block 100 may be configured to include a plate 110 coupled to the rotating body of the carrier jig and a contact block 200 protruding from the bottom of the plate.

The contact block 200 has a function of electrically contacting the pad of the object to be inspected through rotation. The contact block 200 may be placed at the center of the plate 110. The contact block 200 may be formed to protrude beyond the plate 110 because it must guide the position on the pad where the probe pin included in the contact block 200 is in contact when rotating.

A plurality of first coupling holes 101 and a plurality of second coupling holes 102 of different diameters may be formed on the surface of the plate 110 around the contact block 200. The first coupling hole 101 and the second coupling hole 102 can be used to couple the floating block 100 to the rotating body. A pin hole 103 into which a probe pin for a different purpose than the probe pin included in the contact block 200 is inserted may be additionally formed in the plate 110.

Referring to Figure 3, the top surface of the floating block 100 is depicted. Since the plurality of first coupling holes 101 and the plurality of second coupling holes 102 formed on the bottom of the floating block 100 penetrate the plate 110, they are also depicted on the top surface of the plate 110. A pinhole 103 is also depicted on the top surface of the plate 110.

A pair of coupling protrusions 105 may be additionally formed on the top surface of the plate 110. The pair of coupling protrusions 105 have the opposite concept of the coupling hole and can be coupled with the coupling hole formed in the rotating body.

Figure 4 is an exemplary diagram depicting the bottom of a contact block included in the floating block of Figure 2.

Figure 5 is an enlarged illustration of the contact block of Figure 4.

Figure 6 is a cross-sectional view depicting a cross-section cut at position h3 of the contact block of Figure 4.

Referring to Figures 4 and 5, the contact block 200 may be configured to include a slot 213 and a projection 220. The slots 213 may form a plurality of rows, for example, two rows as shown in FIG. 4 . The scale protrusion 220 may be composed of an external scale protrusion 230 and an internal scale protrusion 270.

The slot 213 is composed of a plurality of partition walls arranged at regular intervals, and a probe pin can be inserted into the space between the partition walls.

The slots 213 may be arranged with a plurality of partition walls forming a row, and two slot rows are depicted in FIGS. 4 and 5. A plurality of slots 213 may be arranged side by side in the X-axis direction. The arranged slots 213 may form a first slot row 211 and a second slot row 212.

The slots 213 forming the first slot row 211 and the second slot row 212 may have different Y-axis coordinates of the odd-numbered slots 213 and the even-numbered slots 213. That is, when viewed in the X-axis direction, parts of odd-numbered slots and even-numbered slots can be arranged so that they do not overlap. Conventionally, the pitch between slots was 0.35 mm, but the pitch between slots in the present invention is 0.175 mm. Therefore, in order to prevent short circuits between probe pins inserted into the narrowed slot, it is necessary to arrange some parts of the slot so that they do not overlap each other.

By arranging the slots, the contact portion of the probe pin inserted into the odd-numbered slot and the contact portion of the probe pin inserted into the even-numbered slot may be arranged in a zigzag manner so as not to overlap each other, while being positioned opposite to the cusp of the probe pin.

The lip corresponding to the side component of the partition constituting each slot may be formed to be removed. According to the prior art, since there were side components of the partition wall of the slot, there were cases where the side components were damaged due to positional errors. In the present invention, since the lip corresponding to the side component is removed, the slot is not damaged due to positional error.

The external projection 230 may be formed on the outside of the slot 213, that is, surrounding the slot 213. The internal projection 270 may be formed inside the slot 213, that is, between the first slot row 211 and the second slot row 212. When the floating block 100 rotates, the external projection 230 and the internal projection 270 come into contact with the pad of the inspection object or the nest plate corresponding to the floor on which the inspection object is placed with a time difference.

The external protrusion 230 and the internal protrusion 270 read the curvature of the surface of the pad before the probe pin placed in the slot 213 contacts the pad of the object to be inspected, and the external protrusion 230 and the internal protrusion 270 It has the function of guiding the position of the probe pin placed in the slot 213 by ensuring that the curvature of the projection and the curvature of the surface of the pad coincide with each other. Here, “scanning” of the scales means “reading” the curvature of the surface.

Before the probe pin contacts the pad, the external protrusion 230 first contacts a curved part of the pad or bottom, and the internal protrusion 270 follows, making contact with another curved part of the pad or bottom. For this reason, the external scale protrusion 230 may be formed to be more protruding than the internal scale protrusion 270.

Referring to FIG. 4, the external projection 230 is divided into two virtual horizontal lines (h1, h2) and two virtual vertical lines (v1, v2), four corner portions 240, and a corner portion (240). ) may be configured to include two horizontal edge portions 250 and two vertical edge portions 260 between them.

Referring to Figure 5, even within the external projection 230, the corner portion 240 may be formed to protrude more than the edge portions 250 and 260 depending on the position.

Referring to Figures 5 and 6, among the edge parts 250 and 260, the vertical edge part 260 parallel to the first slot row 211 or the second slot row 212 has an inner projection 270 on the inside. It protrudes at the same height as the height of, and the outer side protrudes further than the inner protrusion, that is, the outer and inner sides can be formed at two different heights. That is, by dividing the height of the vertical edge portion 260 of the external projection 230 into two levels, the floating block 100 can more effectively replace the curve of the pad and hold a preset position.

The internal projection 270 may be formed to include a horizontal element 270h and a vertical element 270v based on the horizontal line h4. The horizontal element 270h guides the X-axis coordinate of the floating block 100, and the vertical element 270v guides the Y-axis coordinate of the floating block 100.

The external scale protrusion 230 and the internal scale protrusion 270 may be rounded without corners, that is, configured as a curved surface, to prevent collision with the floor on which the object to be inspected is placed in an opposing position. For example, the curved surfaces 252 and 264 of the vertical edge portion, the curved surface 252 of the horizontal edge portion, and the curved surface 242 of the corner portion are depicted in FIG. 5 .

Referring again to FIG. 5 , the external protrusion 230 may further include an inclined surface 243 formed on the inside in at least one of the X-axis direction and the Y-axis direction. The floating block 100 can be positioned by measuring the curvature of the pad or floor of the inspected object without collision using the inclined surface 243 formed on the external measuring protrusion 230.

The floating block 100 is a floating combination with a rotating body, that is, a combination that can change its position within a limited range, so that according to the rotation of the rotating body, its position changes to match the curve of the pad of the inspection object or the floor on which the inspection object is placed. Thus, it has the function of contacting the probe pin to the desired position on the pad of the object to be inspected.

In the present invention, the floating block 100 is characterized in that it has a shape suitable for detecting the curvature of the pad or floor of the object to be inspected. That is, the contact block 200 in the floating block 100 additionally includes an internal projection in addition to the external projection, and among the external projections, the corner portion and edge portion show a height difference, and the vertical edge portion has inner and outer projections. Since the height difference is formed, the position of the probe pin can be precisely adjusted.

In this way, according to an embodiment of the present invention, the probe pin can safely contact the pad of the object to be inspected through the floating block.

Additionally, by guiding the floating block to the correct position, the thinner probe pin can be prevented from being damaged due to positional error.

Above, various preferred embodiments of the present invention have been described by giving some examples, but the description of the various embodiments described in the "Detailed Contents for Carrying out the Invention" section is merely illustrative and the present invention Those skilled in the art will understand from the above description that the present invention can be implemented with various modifications or equivalent implementations of the present invention.

In addition, since the present invention can be implemented in various other forms, the present invention is not limited by the above description, and the above description is intended to make the disclosure of the present invention complete and is commonly used in the technical field to which the present invention pertains. It is provided only to fully inform those with knowledge of the scope of the present invention, and it should be noted that the present invention is only defined by each claim in the claims.

100: floating block, 110: plate, 101: first coupling hole, 102: second coupling hole, 103: pin hole, 200: contact block, 211: first slot row, 212: second slot row, 213: slot, 220: scale, 230: external scale, 240: corner, 243: slope, 250: horizontal edge, 260: vertical edge, 270: internal scale.

Claims (10)

A plate coupled to the rotating body; and
It is formed to protrude from the bottom of the plate and includes a contact block that can contact the pad of the object to be inspected through rotation,
The contact block is,
A slot into which the probe pin is inserted; and
It includes a scale protruding further than the slot,
The slots form at least two first and second slot rows arranged side by side in the X-axis direction,
The slots forming the first slot row and the second slot row are,
Odd-numbered slots and even-numbered slots in each column have different Y-axis coordinates,
Floating block. The method of claim 1, wherein the slot is:
Configured to remove the rib corresponding to the side component of the partition wall constituting each slot,
Floating block. The method of claim 1, wherein the slot is:
The contact portion of the probe pin inserted into the odd-numbered slot and the contact portion of the probe pin inserted into the even-numbered slot are arranged in a zigzag manner so as not to overlap each other, while being positioned opposite to the cusp.
Floating block. The method of claim 1, wherein the scales are,
Before the tip of the probe pin contacts the object, it is configured to guide the position of the probe pin to a predetermined position by first contacting the bottom and curve on which the object is placed,
Floating block. The method of claim 1, wherein the scales are,
It is configured to be rounded without corners to prevent collision with the floor on which the object to be inspected is placed in an opposing position.
Floating block. The method of claim 1, wherein the floating block is:
It includes at least one of a coupling hole and a coupling protrusion floatingly coupled to the rotating body,
The scale protrusion is configured to determine the
Floating block. The method of claim 1, wherein the scales are,
External projections formed around the slot; and
It includes an internal projection formed between the first slot row and the second slot row,
The protrusion is configured to protrude further than the tip of the probe pin inserted into the slot.
Floating block. The method of claim 7, wherein the external processus is,
Includes four corner portions and four edge portions between the corner portions,
The corner portion is configured to protrude further than the edge portion,
Floating block. In claim 8,
Among the edge portions, the edge portion parallel to the first slot row or the second slot row is,
The inner side protrudes at the same height as the inner protrusion, and the outer side protrudes further than the inner protrusion, so that the outer side and the inner side are composed of two different heights,
Floating block. The method of claim 7, wherein the external processus is,
Configured to include an inclined surface formed on the inside in at least one of the X-axis direction and the Y-axis direction,
Floating block.

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