KR102628828B1 - Handler for testing electronic devices - Google Patents

Abstract

The present invention relates to a handler for testing electronic components.
The handler for testing electronic components according to the present invention is equipped with a reverse insertion detector that detects whether the test tray accommodated in the test chamber is reversely inserted.
According to the present invention, the reliability of the electrical connection between the electronic components loaded on the test tray and the tester is improved.

Description

Handler for testing electronic components {HANDLER FOR TESTING ELECTRONIC DEVICES}

The present invention relates to a handler for testing electronic components.

Produced electronic components are tested by testers and then divided into good and defective products, and only good products are shipped.

The electrical connection between the tester and electronic components is made by a handler for testing electronic components (hereinafter abbreviated as 'handler'), and there are various types of handlers depending on the type of electronic component. Among them, the present invention relates to a handler equipped with a test tray on which a large number of electronic components can be loaded.

The handler to which the test tray is applied has various forms, including Korean Patent Publication No. 10-2013-0105104, and generally includes a loading device 110, a soak chamber 120, and a loading device 110, as shown in the conceptual plan view of FIG. 1. It includes a test chamber 130, a connection device 140, a desoak chamber 150, and an unloading device 160.

The loading device 110 loads the electronic components to be tested loaded on the customer tray (CT ₁ ) onto the test tray (TT) at the loading position (LP: LOADING POSITION).

The soak chamber 120 is provided to pre-adjust the temperature (preheat or precool) by applying thermal stimulation according to test temperature conditions prior to testing the electronic components loaded on the received test tray (TT).

The test chamber 130 is provided to test electronic components of the test tray (TT) that have been preheated/precooled in the soak chamber 120 and then transferred to the test position (TP: TEST POSITION). That is, the test chamber 130 provides a temperature environment for maintaining the temperature of electronic components loaded on the received test tray TT at test temperature conditions.

The connection device 140 electrically connects the electronic components loaded on the test tray (TT) at the test position (TP) to the tester.

The desoak chamber 150 is provided to return the electronic components loaded on the test tray (TT) transferred from the test chamber 130 to room temperature or a certain temperature that does not cause problems during unloading.

The unloading device 160 unloads electronic components from the test tray (TT) at the unloading position (UP: UNLOADING POSITION), sorts them by test grade, and moves them to an empty customer tray (CT ₂ ).

As seen, the test tray (TT) circulates along a circular path (CC) that leads back to the loading position (LP) through the loading position (LP), testing position (TP), and unloading position (UP). For this purpose, a number of transporters (not shown) transport the test tray (TT) in each section forming the circulation path (CC).

On the other hand, the handler 100 as shown in FIG. 1 has a structure that places the test chamber 130 between the soak chamber 110 and the desoak chamber 150 and transports the test tray (TT) in a closed circulation path (CC). Because of its structure, it is difficult to provide more than four test windows (TW) when considering the width and height of the equipment. Here, the test window (TW) refers to a window where electronic components are electrically connected to the tester, and one test tray (TT) corresponds to one test window (TW). Of course, the tester (TESTER) is coupled to the handler 100 through the test window (TW). Therefore, the number of electronic components that can be tested at one time is limited to the number loaded on at least 1 to as many as 3 test trays (TT), which forces the handler 100, which cannot expand its size indefinitely, to limit processing capacity. It has limits.

Therefore, the present applicant, in the currently unpublished patent application No. 10-2017-000080, has disclosed a technology regarding a new concept handler that can significantly expand processing capacity by providing a moving chamber capable of carrying a test tray (hereinafter referred to as 'prior art 1') ) has been proposed. In addition, in patent application No. 10-2017-0160905, a technology for an electrical connection method between electronic components and a tester made in a new concept handler (hereinafter referred to as 'prior art 2') was presented, and in patent application no. 10-2017-0174996. A test tray movement method (hereinafter referred to as 'prior art 3') has been proposed.

According to the above prior arts 1 to 3, since a plurality of test chambers are provided in two rows in the front and rear directions with a mobile chamber in between, the outer frame of the test tray is left and right for unified production of test chambers and reduction of production cost. It needs to be provided symmetrically in the direction and front-to-back direction.

The purpose of the present invention is to further develop the handlers according to the prior arts 1 to 3 to provide a technology that can prevent incorrect electrical connections between the tester and electronic components loaded on a test tray whose outer frame is symmetrical in the left-right and front-back directions. will be.

A handler for testing electronic components according to the present invention includes a loading device that loads electronic components loaded on a customer tray onto a test tray at a loading position; a test chamber that accommodates a test tray whose electronic components have been loaded by the loading device, provides a temperature environment in which the electronic components of the test tray can be tested, and has an entrance through which the test tray can enter and exit; a connection device that electrically connects the electronic components of the test tray accommodated in the test chamber to the tester; an unloading device that unloads tested electronic components from a test tray that has been taken out of the test chamber and brought to an unloading position; a reverse insertion detector that detects whether the test tray accommodated in the test chamber is reversely inserted; and a controller that controls the next operation to be performed when the test tray is inserted correctly based on information detected by the reverse insertion detector. It includes, and the test tray is provided with a detection means that allows the reverse insertion detector to detect whether the test tray has been reversely inserted.

a presence sensor that detects whether a test tray is accommodated in a test position within the test chamber; and a position confirmation sensor that detects whether the position of the test tray accommodated in the test chamber is appropriate. It includes, and when the test tray is confirmed by the presence confirmation sensor, the controller checks whether the position of the test tray is appropriate using the position confirmation sensor and then checks whether the test tray is reversely inserted through the reverse insertion detector. Control it to do so.

a first soak chamber that receives a test tray loaded with electronic components by the loading device and then applies thermal stimulation to the electronic components; and a delivery device provided to deliver the test tray during the process of moving from the first soak chamber to the test chamber or from the test chamber to the unloading position. It includes: a second soak chamber that receives the test tray received from the first soak chamber and then maintains thermal stimulation applied to the electronic component in the first soak chamber; a loading block capable of loading the test tray taken out from the test chamber and being integrally coupled with the second soak chamber; a mover that moves the second soak chamber so that the second soak chamber is located on one side of the first soak chamber or the test chamber; Includes.

The test chamber is provided in plural numbers, the delivery device delivers the test tray to the plurality of test chambers, and the reverse insertion detector is provided in each of the plurality of test chambers.

an opening and closing device for opening and closing one side of the test chamber so that a test tray can be exchanged between the delivery device and the test chamber; and a door device provided on a side opposite to the opening and closing device to allow an operator to manually attach and detach a test tray to the other side of the test chamber. is provided.

According to the present invention, the operator can check whether the test tray is inserted backwards, which has the effect of securing the reliability of the electrical connection between the electronic component and the tester.

1 is a conceptual plan view of a conventional handler for testing electronic components.
Figure 2 is a conceptual plan view of a handler for testing electronic components according to an embodiment of the present invention.
Figure 3 is a schematic perspective view of a test chamber applied to the handler of Figure 2.
FIG. 4 is a schematic perspective view of a portion of the second moving chamber applied to the handler of FIG. 2.
FIG. 5 is a reference diagram for explaining the exchange of test trays between the delivery device and the test chamber in the handler of FIG. 2.
FIG. 6 is a reference diagram for explaining features of the present invention in the handler of FIG. 2.
FIG. 7 is a schematic perspective view of a test tray applied to the handler of FIG. 2.
FIG. 8 is a reference diagram for explaining the operation of main parts of the handler of FIG. 2.

Preferred embodiments according to the present invention will be described with reference to the attached drawings, but for brevity of explanation, the contents and notes presented in previous patent applications Nos. 10-2017-000080, 10-2017-0160905, and 10-2017-0174996 will be used. Descriptions of overlapping or identical components in the provided technology or explanation are omitted or compressed as much as possible.

<Description of composition>

Figure 2 is a conceptual plan view of a handler 200 (hereinafter abbreviated as 'handler') for testing electronic components according to the present invention.

The handler 200 according to this embodiment includes a supply part (SP), a loading device 210, an identifier (DA), a drive tester (DT), a first buffer (B1), a first opening device 220, and a first Soak chamber (230), 8 test chambers (TC), 8 connection devices (CA), 8 opening and closing devices (OC), desoak chamber 240, unloading device 250, second buffer (B2) , a second opening device 260, a recovery part (RP), a delivery device 270, a feeder 280, a recovery device 290, and a controller (CD).

The supply section (SP) supplies the electronic components to be tested. This supply part (SP) can be implemented in various forms, but in this embodiment, a vehicle (TM) is mounted to transport customer trays (CT ₁ ) loaded with electronic components to be tested, and the truck (TM) The customer trays (CT ₁ ) mounted on ) are supplied sequentially one by one.

The loading device 210 holds the electronic components loaded on the customer tray (CT ₁ ) provided in the supply part (SP) and ultimately loads them into the test tray (TT) at the loading position (LP).

An identifier (DA) is provided when there is a need to individually manage electronic components, and it is sufficient to be provided with a reader that can read the corresponding identifier according to the identifier. For example, if the identifier is a barcode, the reader is equipped with a barcode reader (or a camera to photograph the barcode) that can read the barcode. The identifier DA in this embodiment reads the identifier while the electronic component is held in the loading device 210. Therefore, the loading device 210 is operated to pass through the identifier (DA) in the process of loading electronic components into the test tray (TT).

A drive tester (DT) is provided to simply test whether electronic components operate by applying power. For driving testing of electronic components by such a driving tester (DT), it is desirable to provide a separate test frame (TF) and opener (OD). In this embodiment, in order to increase processing capacity, a test frame (TF) and an opener (OD) are provided in pairs on both sides of the drive tester (DT). In addition, the test frame (TF) is moved in the left and right directions so that it can be selectively positioned in the supply and demand area (RA) and the test area (TA), and the opener (OD) is fixedly provided in the supply and demand area (RA).

For the driving test, the loading device 210 first loads the electronic components into the test frame TF opened by the opener OD before loading the electronic components into the test tray TT.

When all electronic components are loaded in the test frame (TF), the test frame (TF) moves to the test area (TA) and a driving test is performed by the driving tester (DT). At this time, the loading device 210 loads the electronic components into the test frame TF on the other side.

When the driving test is completed, the test frame (TF) returns to the supply and demand area (RA), and the opener (OD) opens the test frame (TF). Then, the loading device 210 grasps the electronic components from the test frame (TF) and loads them into the test tray (TT). At this time, electronic components determined to be defective in the drive test are moved to the first buffer B1.

The first buffer B1 is provided to store electronic components that are determined to be defective in a drive test.

The first opening device 220 opens the test tray (TT) at the loading position (LP) so that the loading device 210 can load the electronic component into the test tray (TT) at the loading position (LP).

The first soak chamber 230 is provided to receive a test tray (TT) loaded with electronic components by the loading device 210 and then apply thermal stimulation to the electronic components. Here, thermal stimulation includes not only heating electronic components but also cooling electronic components.

The eight test chambers (TC) are divided into four each and are arranged side by side in the front-back direction at the rear of the first soak chamber 230 and the de-soak chamber 240 with the delivery device 270 in between. Each test chamber (TC) receives a test tray (TT) that has passed through the first soak chamber 230 and the delivery device 270, and provides a temperature environment in which electronic components of the received test tray (TT) can be tested. provides. Each of these test chambers (TC) has a first entrance (I/O1) facing toward the delivery device 270, as shown in the excerpt of FIG. 3. Of course, the test tray (TT) is brought into or taken out of the test chamber (TC) through the first entrance (I/O1). Here, it can be seen that the test chambers (TC) are spaced apart from the first soak chamber 230. Depending on the implementation, the test chamber (TC) immediately behind the first soak chamber 230 is the first soak chamber. Although it may be provided to be coupled to 230 in the front-back direction, at least the remaining test chambers TC cannot be provided to be coupled to the first soak chamber 230. That is, the handler 200 according to this embodiment is provided with the first soak chamber 230 and the test chamber (TC) spaced apart from each other, and the test tray (TT) is provided between the first soak chamber 230 and the test chamber (TC). In cases where they cannot be moved directly, a method is taken to transfer the electronic components from the first soak chamber 230 to the test chamber TC while preserving the thermal stimulation applied to the electronic components as much as possible. The present invention is related to checking whether the test tray (TT) is reversely inserted into the test chamber (TC), and this will be described later in a different table of contents.

One connecting device (CA) is provided per test chamber (TC), and electrically connects the electronic components of the test tray (TT) accommodated in the test chamber (TC) to the tester. When the test is completed, the test tray (TT) is connected to the tester (TT). Raise the test tray (TT) for removal. Since the technology related to this connection device (CA) was introduced in detail in Patent Application No. 10-2017-0160905 by the present applicant under the name pressurizing device, its detailed description will be omitted.

There are a total of 8 switchgear (OC) since they are provided in each test chamber (TC), and each is equipped with a cylinder (C) and a door (D) as shown in FIG. 3. Therefore, the door (D) opens or closes the first entrance (I/O1) depending on the operating state of the cylinder (C).

The desoak chamber 240 accommodates a test tray (TT) loaded with electronic components for which testing has been completed, and returns the electronic components of the test tray (TT) to room temperature or close to room temperature, thereby preventing unloading by the unloading device 250 later. Ensures that loading operations are performed properly and damage to electronic components is prevented. Of course, if thermal stimulation can be sufficiently removed from the electronic component only by exposure to room temperature, there may be no need to construct the desoak chamber 240.

The unloading device 250 unloads the tested electronic components from the test tray (TT), which has been taken out from the test chamber (TC) and then brought to the unloading position (UP) through the transfer device 270 and the desoak chamber 240. Unload it. At this time, the unloading device 250 can unload electronic components by grade according to test results, and in the case of electronic components that require retest, they are moved to the second buffer B2.

The second buffer B2 is provided to load electronic components that need to be retested.

The second opening device 260 opens the test tray (TT) in the unloading position UP, so that the electronic components for which testing has been completed can be unloaded from the test tray (TT) by the unloading device 250. let it be

The recovery part (RP) recovers the electronic components for which the test has been completed by providing an empty customer tray (CT ₂ ) on which the tested electronic components can be placed. That is, the unloading device 250 unloads the electronic components from the test tray (TT) at the unloading position (UP) and then moves them to the empty customer tray (CT ₂ ) provided by the recovery part (RP). For this purpose, the recovery part (RP) may be provided with several stackers (SK) that can accommodate the customer trays (CT ₂ ) as in this embodiment.

The delivery device 270 is used in the process of moving from the first soak chamber 230 to the test chamber (TC) or in the desoak chamber 250 to move from the test chamber (TC) to the unloading position (UP), which is the ultimate destination. It is prepared to deliver a test tray (TT) in the process of moving to. This delivery device 270 includes a second soak chamber 271, a pair of open/close devices 272, a loading block 273, and a mover 274.

The second soak chamber 271 accommodates the test tray TT received from the first soak chamber 230 and maintains the thermal stimulation applied to the electronic components in the first soak chamber 230. For this purpose, a temperature environment is created inside the second soak chamber 271 to maintain thermal stimulation of electronic components or to assimilate electronic components lacking thermal stimulation to a temperature according to test conditions. This second soak chamber 271 has a second entrance (I/O2) facing toward the test chamber (TC) on both left and right sides as shown in the excerpt of FIG. 4, and this second entrance (I/O2) Through this, the test tray (TT) is brought into the second soak chamber 271 or taken out from the second soak chamber 271.

The second soak chamber 271 as described above can be selectively positioned on one side of each of the test chambers TC by moving back and forth. Therefore, when the second soak chamber 271 is located on one side of the test chamber (TC), the first entrance (I/O1) and the second entrance (I/O2) face each other at a distance from each other, so that the first entrance (I) /O1) and the second entrance (I/O2) allow the test tray (TT) to be moved from the second soak chamber 271 to the test chamber (TC).

The pair of switches 272 have substantially the same configuration as the switch OC and open and close the second entrances I/O2 on the left and right, respectively.

The loading block 273 is provided on the upper side of the second soak chamber 230 and can load the test tray (TT) taken out from the test chamber (TC). This loading block 273 is provided to be integrally coupled to the second soak chamber 271 and thus moves in the front-back direction together with the second soak chamber 271. In this embodiment, the loading block 273 is composed of a square frame (SF) open on all sides, front, left, right, and back, and a support rail (SR) that supports and guides the test tray (TT). However, depending on the implementation, the square frame (SF) ) Instead, it can be replaced with a housing with an opening and closing door and provided in the form of a chamber. If provided in the form of a chamber, it may be equipped with a function to remove thermal stimulation applied to electronic components.

The mover 274 moves the second soak chamber 271 in the front-back direction so that the second soak chamber 271 is positioned on one side of the first soak chamber 230 or the test chambers TC.

The feeder 280 supplies the test tray (TT) from the second soak chamber 271 to the test chamber (TC).

The retriever 290 retrieves the test tray (TT) from the test chamber (TC) to the loading block 273.

In this embodiment, the supply 280 is provided in the second soak chamber 271, and the recovery device 290 is installed in the loading block 273. As a result, the supply device 280 and the recovery device 290 are provided. It moves forward and backward together with the first soak chamber 271 and the loading block 273. However, depending on implementation, an example may be taken in which a supply device 280 and a recovery device 290 are provided in each test chamber TC.

The controller (CD) controls each of the above components.

<Description of operation>

The following is a description of the operation of the handler 200 described above.

When a dummy of the customer tray (CT ₁ ) is mounted in the supply part (SP) with the trolley (TM), one customer tray (CT ₁ ) is supplied sequentially for loading of electronic components.

The loading device 210 holds the electronic components to be tested from the customer tray (CT ₁ ) and loads them into the test frame (TF) in the supply and demand area (RA) through the identifier (DA). During this process, electronic components are individually identified by an identifier (DA).

When all electronic components are loaded on the test frame (TF), the electronic components and the driving tester (DT) are electrically connected while the test frame (TF) moves to the test area (TA). Then, a driving test is conducted.

When the driving test is completed, the test frame (TF) returns to the supply and demand area (RA), and the loading device 210 grasps the electronic components from the test frame (TF) and places them in the test tray (TT) at the loading position (LP). Load it with At this time, electronic components determined to be defective in the drive test are separated into the first buffer B1.

When all electronic components are loaded on the test tray (TT) at the loading position (LP), the test tray (TT) is accommodated in the first soak chamber 230 at the rear. Accordingly, thermal stimulation is applied to the electronic components loaded on the test tray (TT). And when the test tray (TT) is moved to the second soak chamber (271) waiting on the right side of the first soak chamber (230), the second soak chamber (271) moves rearward and contains the electronic components to be tested. A test tray (TT) is located on one side of the required test chamber (TC). In that state, the opening/closing device (OC) and the opening/closing device 272 operate to open the first entrance (I/O1) and the second entrance (I/O2). Next, the feeder 280 operates to move the test tray (TT) from the second soak chamber 271 to the test chamber (TC). At this time, if it is not the initial stage of operation of the handler 200, a test tray (TT) containing electronic components for which testing has already been completed will be accommodated in the test chamber (TC). This will be described in more detail with reference to FIG. 5 .

Referring to the schematic diagram of FIG. 5, the test tray (TT) loaded with electronic components for which testing has been completed is raised in advance by the connection device (CA), so that the test tray (TT) coming from the second soak chamber 271 is It is in a state where it can be brought into the test chamber (TC). In the state of FIG. 5, when the switch device (OC) and the switch 272 operate to open the first entrance (I/O1) and the second entrance (I/O2), the supply device 280 operates and the electronics to be tested A test tray (TT) loaded with components is supplied to the test chamber (TC) through the second entrance (I/O2) and the first entrance (I/O1) sequentially. In addition, the recovery device 290 operates in parallel, and the test tray TT containing the electronic components for which testing has been completed is recovered to the loading block 273 via the first entrance I/O1. And when the exchange of the test tray (TT) is completed, the opening/closing device (OC) and the opening/closing device 272 close the first entrance (I/O1) and the second entrance (I/O2), respectively. In other words, the test tray (TT) is exchanged between the test chamber (TC) and the delivery device 270 when the switch (OC) is operated once. Accordingly, at least a portion of the time section in which the feeder 280 operates and the time section in which the recovery device 290 operates overlap. Therefore, the time for which the test tray (TT) is supplied to the test chamber (TC) and the total time for the test tray (TT) to be recovered from the test chamber (TC) are minimized, resulting in loss of the temperature environment within the test chamber (TC). is minimized. Of course, minimizing this time brings about an improvement in processing capacity as a bonus. Simultaneous exchange of the test tray (TT) between the test chamber (TC) and the delivery device 270 is possible because the connection device (CA) raises the test tray (TT) to be taken out from the test chamber (TC), thereby enabling the supply (280) This is because the movement line ML1 of the test tray (TT) by ) and the movement line ML2 of the test tray (TT) by the recovery machine 290 can be spaced apart from each other in the vertical direction.

When the exchange of the test tray (TT) between the test chamber (TC) and the delivery device 270 is completed, the second soak chamber 271 moves forward and is located on the left side of the desoak chamber 240, and the test tray (TT) ) is moved to the desoak chamber 240.

Continuing, the test tray (TT) moves from the desoak chamber 240 to the unloading position (UP), and the unloading device 250 unloads the electronic components from the test tray (TT) in the unloading position (UP). Load it and move it to the customer tray (CT ₂ ) in the recovery part (RP). In this process, electronic components that need to be retested are moved to the second buffer (B2).

<Description of the configuration for checking whether the test tray is inserted backwards>

In addition to the above configuration and operations, the handler 200 according to the present invention includes an presence sensor (ECS), a position confirmation sensor (PCS), and a station sensor inside each test chamber (TC), as shown in FIG. 6. It further includes an insertion detector (RIS), a manual stopper (HS) and an automatic stopper (AS).

The presence sensor (ECS) detects whether the test tray (TT) is accommodated in the test location. In other words, the presence sensor (ECS) detects whether the test tray (TT) exists at the test location.

The positioning sensor (PCS) is provided as a pair on the left and right, and detects whether the position of the test tray (TT) at the test location is precisely positioned to enable electrical connection between the electronic components and the tester.

The reverse infiltration detector (RIS) detects whether the test tray (TT) accommodated in the test chamber (TC) is reverse inserted. For this purpose, the test tray (TT) is equipped with a sensing means called reverse insertion detection groove (RIH) on one side as shown in FIG. 7. That is, the reverse insertion detector (RIS) can detect whether the test tray (TT) has been reversely inserted into the test chamber (TC) by detecting the presence of the reverse insertion detection groove (RIH).

When the above additional configurations are provided, when the test tray (TT) is confirmed by the presence sensor (ECS), the controller (CD) determines the location of the test tray (TT) using the information detected by the position confirmation sensor (PCS). Check whether is set accurately. And if the position of the test tray (TT) is appropriate, the controller (CD) checks whether the test tray (TT) is reversely inserted using the reverse insertion detector (RIS). If it is confirmed that the test tray (TT) has been inserted correctly based on the information detected by the reverse insertion detector (RIS), the controller (CD) performs the next operation (operation according to the installation of an additional test tray or full-scale test support operation, etc.). The above configurations are controlled to be performed, and when it is confirmed that the test tray (TT) has been reversely inserted, the controller (CD) generates a jam.

Meanwhile, the test tray used in the handler for testing conventional memory semiconductor devices has an asymmetrical outer frame, so there is no risk of the operator being confused and inserting the test tray backwards. In addition, since the insert on which the semiconductor device is loaded is symmetrical, there was no problem even if the test tray was inserted reversely because the outer frame was symmetrical. However, in the case where a plurality of test chambers (TC) are arranged in two rows in the left and right directions as in this embodiment, the front-back and left-right directions of the outer frame of the test tray (TT) need to be symmetrically the same. The above-mentioned reverse insertion detector (RIS) was considered.

The manual stopper (HS) is equipped to be mounted or removed by sliding in the up and down direction. This manual stopper (HS) is installed on the opposite side of the switch (OC) to prevent excessive entry or departure of the test tray (TT) from the second soak chamber (271) to the opposite side.

The automatic stopper (AS) is provided on the second soak chamber 271 side. This automatic stopper (AS) prevents the test tray (TT) from bouncing and moving toward the second soak chamber (271) due to the elastic repulsion force of the manual stopper (HS) after it enters the inside of the test chamber (TC). . Therefore, the automatic stopper (AS) allows the test tray (TT) to enter the inside of the test chamber (TC), but prevents the test tray (TT) that has entered the test chamber (TC) from being thrown out in the opposite direction of the entry direction. Since the test tray (TT) must be stopped at the stop position, the stopper head (SH) is provided to advance and retreat in the forward and backward directions by the driver (DD). Of course, depending on the implementation, it is enough for the stopper head (SH) to selectively allow the test tray (TT) to enter at an appropriate distance or to be bounced off by the repulsion force caused by the manual stopper (HS). In this embodiment, It is sufficient if it is not only configured to advance and retreat together, but also can be selectively positioned at a stop position by rotation, etc.

<Additional explanation of the test chamber>

The reverse insertion detector (RIS) in the present invention is required when initially mounting the test tray (TT) on the handler. Therefore, it is sufficient to be provided in only one test chamber (TC) among a plurality of test chambers (TC).

However, as mentioned above, it is desirable if each test chamber (TC) is equipped with a reverse insertion detector (RIS) because the initial installation time can be reduced. For the following reasons, the reverse insertion detector (RIS) is installed in each test chamber (TC). It is more desirable to have everything provided.

Generally, handlers cause jams due to malfunction during the electrical connection between electronic components and testers. Additionally, defects in internal components often occur. In this case, the handler 200 according to the present invention must turn off the corresponding test chamber (TC) and handle the jam or repair the defect. In this case, it is necessary to remove and pull out the test tray (TT) from the test chamber (TC). To this end, as shown in FIG. 8, the handler 200 according to the present invention is equipped with a door device (DA) that can open and close the test chamber (TC) in the direction opposite to the second soak chamber 271 (manual stopper side). do.

Therefore, if a defect such as a jam occurs inside the test chamber (TC), the operator opens the test chamber (TC) by operating the door device (DA) (see arrow a) and lifts the manual stopper (HS) upward to remove it. After doing so, remove the test tray (TT) from the test chamber (TC). When the defect processing work is completed, the operator manually enters the test tray (TT) into the test chamber (TC), installs the manual stopper (HS), and operates the door device (DA) to enter the test chamber (TC). ) is closed. After this series of tasks is completed, the controller (CD) needs to check whether the operator accidentally inserted the test tray (TT) backwards. Therefore, when the test chamber (TC) side is turned on, the controller (CD) confirms the existence and location of the test tray (TT) through the presence sensor (ECS) and position confirmation sensor (PCS), and then reverse inserts the test tray (TT). Check whether the test tray (TT) has been inserted backwards through the detector (RIS). Likewise, at this time, the controller (CD) controls the following tasks to be performed if the test tray (TT) is inserted correctly, and generates a jam if the test tray (TT) is inserted reversely.

As described above, the specific description of the present invention has been made by way of examples with reference to the accompanying drawings. However, since the above-described embodiments are only explained by referring to preferred examples of the present invention, the present invention is limited to the above-described embodiments. It should not be understood as limited, and the scope of rights of the present invention should be understood as the scope of the claims described later and their equivalents.

200: Handler
210: loading device
230: 1st soak chamber
250: Unloading device
270: delivery device
271: Second soak chamber 273: Loading block
274: Mobile
TC: Test chamber
CA: Connector
ECS: Presence confirmation sensor PCS: Position confirmation sensor
RIS: Reverse insertion detector
DA: Door device
CD: Controller

Claims (5)

A supply section that sequentially supplies customer trays containing electronic components to be tested, one by one;
a loading device that loads electronic components loaded on a customer tray provided in the supply section onto a test tray at the loading position;
a test chamber that accommodates a test tray whose electronic components have been loaded by the loading device, provides a temperature environment in which the electronic components of the test tray can be tested, and has an entrance through which the test tray can enter and exit;
a connection device that electrically connects the electronic components of the test tray accommodated in the test chamber to the tester;
an unloading device that unloads test-completed electronic components from a test tray brought to an unloading position after being taken out of the test chamber and then moves them to an empty customer tray;
a recovery portion that stores a customer tray loaded with electronic components for which testing has been completed by the unloading device in order to retrieve electronic components for which testing has been completed;
a reverse insertion detector that detects whether the test tray accommodated in the test chamber is reversely inserted; and
a controller that controls the next operation to be performed when the test tray is inserted correctly based on information detected by the reverse insertion detector; Includes,
The test tray is equipped with a sensing means that allows the reverse insertion detector to detect whether the test tray has been reversely inserted.
Handler for testing electronic components. According to claim 1,
a presence sensor that detects whether a test tray is accommodated in a test position within the test chamber; and
a position confirmation sensor that detects whether the test tray accommodated in the test chamber is appropriately positioned; Including,
When the test tray is confirmed by the presence confirmation sensor, the controller checks whether the position of the test tray is appropriate using the position confirmation sensor, and then controls the controller to check whether the test tray is reversely inserted through the reverse insertion detector.
Handler for testing electronic components. According to claim 1,
a first soak chamber that receives a test tray loaded with electronic components by the loading device and then applies thermal stimulation to the electronic components; and
a delivery device provided to deliver the test tray during the process of moving from the first soak chamber to the test chamber or from the test chamber to the unloading position; Including,
The delivery device is,
a second soak chamber that receives the test tray received from the first soak chamber and then maintains thermal stimulation applied to the electronic component in the first soak chamber;
a loading block capable of loading the test tray taken out from the test chamber and being integrally coupled with the second soak chamber;
a mover that moves the second soak chamber so that the second soak chamber is located on one side of the first soak chamber or the test chamber; containing
Handler for testing electronic components. According to clause 3,
The test chamber is provided in plural,
The delivery device delivers the test tray to the plurality of test chambers,
The reverse insertion detector is provided in each of the plurality of test chambers.
Handler for testing electronic components. According to clause 3,
An opening and closing device for opening and closing one side of the test chamber so that a test tray can be exchanged between the delivery device and the test chamber; and
A door device provided on the opposite side of the opening and closing device to allow an operator to manually attach and detach a test tray to the other side of the test chamber; equipped with
Handler for testing electronic components.