KR102494490B1 - Method and apparatus for analysing expired patents - Google Patents

Abstract

The present invention is a method for analyzing extinguished patents using a target technology keyword, which is a keyword representing a target technology, in a patent DB based on the target technology keyword, a plurality of extinguished patents belonging to a technology field including the target technology. analyzing and generating a patent list in the same field; Analyzing a plurality of extinguished patents searched for in the patent DB with an extended keyword, which is an expanded keyword based on the target technology keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology, and generating a list of patents in other fields. ; selecting a predetermined number of selected patent lists by performing patent quality evaluation on the patents included in the patent list in the same field and the patent list in other fields; performing a patent risk assessment on the patents included in the selected patent list; and classifying the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and the patent risk evaluation.

Description

Expired patent analysis method and apparatus {METHOD AND APPARATUS FOR ANALYSING EXPIRED PATENTS}

The present invention relates to methods and apparatus for analyzing expired patents.

A patent is a system in which an exclusive right called a patent is granted for a certain period of time in return for disclosing an invention, which is a technological creation. In other words, the patent system has the effect of preventing competitors from using their technology without permission, and inducing the disclosure of inventions in the industrial aspect to promote overall industrial development.

However, the patent right expires when the designated duration has elapsed, the annual fee for the patent is not paid, the applicant does not exist, the patent right is abandoned, or the patent is invalidated by a patent invalidation trial. For example, rights can be extinguished due to the expiration of the term of the basic technology of conglomerates, non-payment of patent maintenance costs by startups, negligence of patent management by universities and public institutions, etc.

At this time, although an expired patent can be judged to have a high possibility of utilization as it is a technology whose value has been recognized in the examination stage, it can be said that a preliminary investigation is essential because an improved technology may exist and the possibility of patent infringement must be considered. .

Therefore, there is a need for a method and apparatus for analyzing lapsed patents that increase the possibility of discovering technological opportunities by utilizing lapsed patents while reducing the risks associated with their utilization.

An object of the present invention is to provide an analysis method and apparatus for suggesting specific ways to utilize expired patents by developing indicators for measuring the availability and risk of expired patents.

In order to achieve the above object, a method for analyzing a lapsed patent according to an embodiment of the present invention is a method for analyzing a lapsed patent using a target technology keyword, which is a keyword representing a target technology, based on the target technology keyword in a patent DB. generating a list of patents in the same field by analyzing a plurality of lapsed patents belonging to a technology field including the target technology; Analyzing a plurality of extinguished patents searched for in the patent DB with an extended keyword, which is an expanded keyword based on the target technology keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology, and generating a list of patents in other fields. ; selecting a predetermined number of selected patent lists by performing patent quality evaluation on the patents included in the patent list in the same field and the patent list in other fields; performing a patent risk assessment on the patents included in the selected patent list; and classifying the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and the patent risk evaluation.

Preferably, the step of classifying into a predetermined number of groups is based on the rankings of the patent quality evaluation and the patent risk evaluation of each patent included in the selected patent list, respectively. A monitoring group whose ranking is below the predetermined standard ranking, a group in need of quality improvement whose ranking in patent quality evaluation is below the reference ranking and whose ranking in patent risk evaluation exceeds the reference ranking, and whose ranking in patent quality evaluation exceeds the reference ranking It can be divided into a group in need of infringement risk reduction in which the priority of the patent risk assessment is equal to or lower than the reference priority, and a highest priority group in which the priority of the patent quality evaluation and the patent risk assessment exceeds the reference priority, respectively.

Preferably, after the step of classifying into the predetermined number of groups, for each patent included in the highest priority group, recombinant novelty measuring a new combination of technical elements and possibility of continuous use of technical elements A step of determining priority by evaluating component familiarity may be further included.

Preferably, after the step of classifying into a predetermined number of groups, calculating an average value of each of the market scope, technical impact, protection scope, and utilization scope for a plurality of patents of a specific applicant related to the target technology; And the market scope, technical impact, protection scope, and utilization scope are calculated for each patent included in the quality improvement group, and the average value of the calculated market scope, technical impact, protection scope, and utilization scope is increased according to the degree of increase. A step of determining a priority may be further included.

Preferably, after the step of classifying into a predetermined number of groups, for each patent included in the group requiring infringement risk reduction, the step of determining the priority by evaluating the need for avoidance design based on the number of related lawsuits can include more.

Preferably, the step of selecting a predetermined number of selected patent lists is a step of calculating market scope, technical impact, protection scope, and application scope for each of the patents included in the patent list in the same field and the patent list in other fields. ; and selecting the predetermined number of selected patent lists by integrating the calculated market scope, technical impact, protection scope, and utilization scope, and determining a ranking.

Preferably, in the step of performing the patent risk assessment, for each patent included in the selected patent list, the subsequent technical index based on the number of citations and the average number of citations, the number of effective citation patents and the total number of citation patents Calculating a patent application index based on a patent right index and the number of subsequent patents in a similar range of patent applicants and the total number of subsequent patents; and applying a predetermined weight to each of the subsequent technology index, the patent rights index, and the patent application index, and determining the patent risk evaluation ranking of each patent included in the selected patent list by applying a predetermined algorithm. can do.

Preferably, prior to the step of generating the patent list in the same field, the marketability, technicality, and rights of a plurality of extinguished patents and a plurality of valid patents in the technical field including the target technology are analyzed and their values are compared. It may further include steps to do.

In addition, in the device for analyzing an extinct patent according to an embodiment of the present invention for achieving the above object is an apparatus for analyzing an extinct patent using a target technology keyword, which is a keyword representing a target technology, in a patent DB, the target technology keyword Based on this, a plurality of lapsed patents belonging to the technical field including the target technology are analyzed, a list of patents in the same field is generated, and an extension keyword, which is a keyword expanded based on the target technology keyword in the patent DB, and the target technology a generation unit that analyzes a plurality of lapsed patents searched for with a classification keyword, which is a keyword indicating a technology classification different from the above, and generates a list of patents in other fields; Performing patent quality evaluation on the patents included in the same field patent list and the other field patent list, selecting a predetermined number of selected patent lists, and performing patent risk assessment on the patents included in the selected patent list evaluation department; and a classifier for classifying the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and the patent risk evaluation.

Preferably, the classifying unit monitors that each of the rankings of the patent quality evaluation and the patent risk evaluation is equal to or less than a predetermined reference rank according to the ranking of the patent quality evaluation and the patent risk evaluation of each patent included in the selected patent list. group, a group in need of quality improvement in which the ranking of the patent quality evaluation is less than or equal to the standard ranking and the ranking of the patent risk evaluation exceeds the standard ranking, the ranking of the patent quality evaluation exceeds the standard ranking and the ranking of the patent risk evaluation It can be divided into a group in need of infringement risk reduction whose rank is lower than the reference rank and a highest priority group in which each of the patent quality evaluation and patent risk evaluation ranks exceeds the reference rank.

According to an embodiment disclosed in the present invention, by providing the result of evaluating the applicability and the risk of utilization of the lapsed patent, there is an effect that a company or institution can more easily utilize the lapsed patent for research and development.

1 is a flowchart illustrating a method for analyzing a lapsed patent according to an embodiment of the present invention.
2 is a block diagram illustrating an apparatus for analyzing a lapsed patent according to an embodiment of the present invention.
3 is a diagram for explaining classification according to PRI Rank and PQI Pank according to an embodiment of the present invention.
4 is a diagram for explaining a classification result of patent technologies in the same field according to an embodiment of the present invention.
5 is a diagram for explaining a classification result of patent technologies in other fields according to an embodiment of the present invention.

Since the present invention can make various changes and have various embodiments, specific embodiments will be illustrated in the drawings and described in detail in the detailed description. However, this is not intended to limit the present invention to specific embodiments, and should be understood to include all modifications, equivalents, and substitutes included in the spirit and scope of the present invention. Like reference numerals have been used for like elements throughout the description of each figure.

Terms such as first, second, A, and B may be used to describe various components, but the components should not be limited by the terms. These terms are only used for the purpose of distinguishing one component from another. For example, a first element may be termed a second element, and similarly, a second element may be termed a first element, without departing from the scope of the present invention. The terms and/or include any combination of a plurality of related recited items or any of a plurality of related recited items.

It is understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, but other elements may exist in the middle. It should be. On the other hand, when an element is referred to as “directly connected” or “directly connected” to another element, it should be understood that no other element exists in the middle.

Terms used in this application are only used to describe specific embodiments, and are not intended to limit the present invention. Singular expressions include plural expressions unless the context clearly dictates otherwise. In this application, the terms "include" or "have" are intended to designate that there is a feature, number, step, operation, component, part, or combination thereof described in the specification, but one or more other features It should be understood that the presence or addition of numbers, steps, operations, components, parts, or combinations thereof is not precluded.

Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs. Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning in the context of the related art, and unless explicitly defined in the present application, they should not be interpreted in an ideal or excessively formal meaning. don't

1 is a flowchart illustrating a method for analyzing a lapsed patent according to an embodiment of the present invention.

In step S110, the lapsed patent analysis device analyzes a plurality of lapsed patents belonging to the technology field including the target technology based on the target technology keyword, which is a keyword representing the target technology in the patent DB, and generates a list of patents in the same field. .

Here, the target technology may be composed of patents, theses, technical data, etc. of a specific applicant, and the target technology keyword may be a core keyword extracted from the specific applicant's patents, theses, or technical data.

If the target technology of the specific applicant includes technologies in multiple fields, the device for analyzing expired patents applies a modeling technique such as the LDA topic modeling technique to derive a plurality of key technical fields of the specific applicant, and then One of them may be selected by the user and determined as the target technology.

For example, referring to Table 1 below, the device for analyzing expired patents derives a total of 7 technical fields by applying the LDA topic modeling technique, and among them, "Medicinal herb consmetics" can be selected and determined as a target technology.

<Table 1>

On the other hand, the lapsed patent analysis device may search for a plurality of lapsed patents belonging to a technology field including the target technology by searching for a technology in a technology field including the target technology in a patent DB. In addition, the device for analyzing lapsed patents may calculate an index indicating similarity between a keyword included in the plurality of extinguished patents and a target technology keyword, and generate a list of patents in the same field according to a predetermined criterion.

In another embodiment, the device for analyzing lapsed patents applies the LDA topic modeling technique to the plurality of lapsed patents to derive a plurality of major technology fields, and then selects one of them from the user and selects lapsed patents belonging to the major technology fields. From this, a list of patents in the same field can be created.

For example, the device for analyzing lapsed patents derives 5 major technology fields by applying the LDA topic modeling technique to the plurality of lapsed patents, selects one of them, "Cell culture and albumenization-related technology", and compiles a list of patents in the same field. can create

<Table 2>

In step S120, the lapsed patent analysis device analyzes a plurality of lapsed patents retrieved from the patent DB with an extended keyword, which is an expanded keyword based on the target technology keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology, Create a list of patents in other fields.

At this time, the device for analyzing extinguished patents may search for a plurality of extinguished patents by using an extended keyword that expands the range of a target technology keyword in order to search for technologies in other technical fields. At this time, the extinct patent analysis device may use a classification keyword (eg, IPC) of a technology field that is not a target technology and is technically related to the target technology.

For example, when the target technology keyword is "Medicinal herb consmetics", the device for analyzing expired patents may use an extended keyword of "herb consmetics". At this time, keywords that limit the technical field, such as medicinal, may be deleted. Also, when the target technology is a technology related to "cosmetics," the device for analyzing extinct patents may use classification keywords corresponding to "pharmaceuticals," "food," and "medicine."

Also, the device for analyzing lapsed patents may generate an index of similarities between keywords included in the plurality of lapsed patents and extended keywords, and generate a list of patents in other fields according to a predetermined criterion.

In another embodiment, the device for analyzing lapsed patents applies the LDA topic modeling technique to the plurality of lapsed patents to derive a plurality of major technology fields, and then selects one of them from the user and selects lapsed patents belonging to the major technology fields. A list of patents in other fields can be created from

<Table 3>

In step S130, the device for analyzing lapsed patents performs patent quality evaluation on the patents included in the patent list in the same field and the patent list in other fields, and selects a predetermined number of selected patent lists.

For example, the device for analyzing expired patents can perform patent quality evaluation of patents included in the same field patent list and other field patent lists using the OECD's Patent Quality Index (PQI) and Automatic Patent Value Evaluation System (SMART). there is. Further, the device for analyzing extinct patents may select a predetermined number of selected patent lists among patents included in the same field patent list and other field patent lists, and determine the ranking of each patent according to the patent quality evaluation.

In another embodiment, the lapsed patent analysis device selects a predetermined number of selected patent lists based on market scope, technical impact, protection scope, and utilization scope for each of the patents included in the patent list in the same field and the patent list in other fields, and , the ranking can be determined.

For example, the device for analyzing expired patents may perform patent quality evaluation using the OECD Patent Quality Index (PQI). More specifically, referring to Table 4, the expired patent analysis device calculates the market scope, technological impact, protection scope, and application scope to determine the quality of individual patents. can be evaluated

<Table 4>

In step S140, the device for analyzing lapsed patents performs patent risk assessment on the patents included in the selected patent list.

For example, the device for analyzing expired patents may perform a patent risk assessment to calculate an index for the risk of patent infringement for each patent included in the selected patent list. And, the lapsed patent analysis device may determine the ranking of each patent according to the patent risk assessment.

More specifically, the device for analyzing extinct patents can perform patent risk assessment using information on the frequency of citations, the effective ratio of cited patents, and the ratio of holding similar patents by patent applicants for patents included in the selected patent list. there is.

In another embodiment, the device for analyzing lapsed patents may perform patent risk evaluation for each patent included in the selected patent list based on a subsequent technology index, a patent rights index, and a patent application index.

For example, the lapsed patent analysis device may perform patent risk evaluation using the patent risk index (PRI) proposed in the present invention. More specifically, referring to Table 4, the extinct patent analysis device can evaluate the quality of individual patents by calculating the subsequent technology index, patent rights index, and patent holder index.

At this time, the follow-up technology index is calculated according to the ratio of the number of citations and the average number of citations, the patent right index is calculated according to the ratio of the number of effective cited patents and the total number of cited patents, and the patent application index is calculated according to the similar range of patent applicants. It can be calculated according to the ratio of the number of subsequent patents and the total number of subsequent patents.

At this time, the device for analyzing the extinct patent may assign a predetermined weight to each element of the patent risk assessment and calculate the ranking by applying a TOPSIS (Technique for Order of Preference by Similarity to Ideal Solution) analysis technique.

For example, referring to FIG. 4, the lapsed patent analysis device calculates the PQI Rank and the PQI Rank for patent technologies in the same field, and shows the result in a quadrant. Referring to FIG. 5, the lapsed patent analysis device calculates PQI Rank and PQI Rank for patent technologies in other fields. This is the result shown in the quadrant by calculating PQI Rank and PQI Rank.

Finally, in step S150, the device for analyzing lapsed patents classifies the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and patent risk evaluation.

That is, the device for analyzing expired patents may classify the patents included in the selected patent list into a plurality of groups according to the results of the patent quality evaluation and patent risk evaluation. For example, the device for analyzing expired patents may classify into a group with excellent patent quality evaluation and patent risk evaluation, a group with excellent patent quality evaluation, a group with excellent patent risk evaluation, and a group with low both of patent quality evaluation and patent risk evaluation.

In another embodiment, the device for analyzing lapsed patents may classify patents included in the selected patent list into a predetermined number of groups according to the rankings of patent quality evaluation and patent risk evaluation of each patent included in the selected patent list.

In other words, the device for analyzing extinct patents selects patents included in the selected patent list into a monitoring group in which the rankings of patent quality evaluation and patent risk evaluation are each lower than the predetermined standard ranking, and the ranking of patent quality evaluation is lower than the standard ranking and the ranking of patent risk evaluation. The group in need of quality improvement that exceeds the standard ranking, the group in need of infringement risk reduction in which the ranking of patent quality evaluation exceeds the standard ranking and the ranking of patent risk evaluation is below the standard ranking, and each of the rankings of patent quality evaluation and patent risk evaluation is the standard ranking can be divided into groups of highest priority.

For example, referring to FIG. 3, the extinct patent analysis device can be divided into a monitoring group, a quality improvement group, an infringement risk reduction group, and a top priority group according to the PRI Rank and the PQI Rank, and the horizontal axis (PQI Rank) and vertical axis (PRI Rank), it is possible to maximize the visual effect.

In another embodiment, the device for analyzing expired patents may determine priority by evaluating recombinant novelty and component familiarity for each patent included in the highest priority group.

In other words, the device for analyzing expired patents allows users to review patents with high novelty first, and prioritizes patents included in the highest priority group by evaluating novelty of recombination and familiarity with technology elements in order to review patents that have been utilized until recently. ranking can be determined.

At this time, recombination novelty is an index that measures a new combination of detailed technical elements that have not appeared in the past, and is an index that can evaluate technologies with high novelty within the technical field. On the other hand, the extinct patent analysis device can calculate recombination novelty using Equation 1.

[Equation 1]

는 재조합 신규성이고,

는 과거 특허에서 등장한 적 없는 특허 k의 특허분류 서브클래스 조합의 수이고,

는 특허 k의 모든 특허분류 서브클래스 조합의 수이다.here,

is recombination novelty,

Is The number of patent classification subclass combinations of patent k that have not appeared in previous patents,

is the number of all patent classification subclass combinations of patent k.

In addition, familiarity with technology elements is an index to measure the patent classification used until recently within the technology field. On the other hand, the device for analyzing expired patents may calculate familiarity with technology elements using Equation 2.

[Equation 2]

은 특허 k의 모든 특허분류 서브클래스 수이고,

는 특허분류 j를 가진 모든 과거 특허 i의 수이다.Here, CF _k is the skill factor familiarity,

is the number of all patent classification subclasses of patent k,

is the number of all past patent i with patent classification j.

In another embodiment, the apparatus for analyzing expired patents may determine a priority based on a plurality of patents of a specific applicant related to a target technology for each patent included in the quality improvement group.

To this end, the device for analyzing expired patents may calculate average values of market scope, technical impact, protection scope, and utilization scope for a plurality of patents of a specific applicant related to the target technology.

For example, the device for analyzing expired patents may calculate average values of market scope, technical impact, protection scope, and utilization scope for a plurality of patents related to target technologies owned by company A.

And, the extinct patent analysis device calculates the market scope, technical impact, protection scope, and utilization scope for each patent included in the quality improvement group, and calculates the average value of the previously calculated market scope, technical impact, protection scope, and utilization scope. Priority can be determined according to the degree of increase.

For example, the device for analyzing extinct patents determines one element with a relatively low value among the average values of market scope, technical impact, protection scope, and utilization scope previously calculated, and determines to give high priority to patents that increase the element. can

More specifically, when the average value of the protection scope is the lowest among the average values of the previously calculated market scope, technical impact, protection scope, and utilization scope, the extinction patent analysis device determines that the index of protection scope among patents included in the quality improvement group is The highest priority can be given to the highest patent.

In another embodiment, the device for analyzing expired patents may evaluate the need for avoidance design based on the number of related lawsuits for each patent included in the infringement risk reduction group, and determine the priority.

That is, the device for analyzing expired patents can evaluate the need for avoidance design by examining the patent litigation index (PLI) in a predetermined related DB for each patent included in the infringement risk reduction group. Specifically, it can be seen that the need for avoidance design is high for patents with a large number of patent lawsuits, and the need for avoidance design is low for patents with a small number of patent lawsuits.

In addition, when the need for avoidance design is the same, the device for analyzing extinct patents determines that a more recently registered patent has a high possibility of utilization and may assign a higher priority.

In another embodiment, before step S110, the lapsed patent analysis device analyzes the marketability, technicality, and rights of a plurality of lapsed patents and a plurality of valid patents in the technical field including the target technology, and compares their values. can

That is, the device for analyzing lapsed patents may analyze market definition, technicality, and rights for each of lapsed patents and valid patents on an annual basis for a predetermined period of time, and compare their values. At this time, if the number of either lapsed patents or valid patents is too large, there is a high possibility of error in statistical analysis, so it may be desirable to compare values for years in which the number of lapsed patents and valid patents is similar. For example, the lapsed patent analysis device may perform the T-test shown in Table 5 below.

At this time, it will be apparent that if the device for analyzing the lapsed patent determines that the value of the lapsed patent and the valid patent are similar, it can be interpreted that the availability of the lapsed patent is as excellent as the valid patent.

<Table 5>

On the other hand, referring to Table 6 below, as a result of performing the T-test for lapsed patents and valid patents in 2002, statistically significant differences were not found in the marketability, technicality and rights of extinguished patents and valid patents. can confirm that it is not.

<Table 6>

2 is a flowchart illustrating an apparatus for analyzing a lapsed patent according to an embodiment of the present invention.

Referring to FIG. 2 , the lapsed patent analysis device 200 according to an embodiment of the present invention includes a generation unit 110 , an evaluation unit 120 and a classification unit 130 .

The generation unit 110 analyzes a plurality of lapsed patents belonging to the technology field including the target technology based on the target technology keyword in the patent DB, generates a patent list in the same field, and based on the target technology keyword in the patent DB A list of patents in other fields is generated by analyzing a plurality of expired patents searched for with an extended keyword, which is an expanded keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology.

The evaluation unit 120 performs patent quality evaluation on the patents included in the patent list in the same field and the patent list in other fields, selects a predetermined number of selected patent lists, and applies patents for the patents included in the selected patent list. Conduct a risk assessment.

Finally, the classification unit 130 classifies the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and patent risk evaluation.

In another embodiment, the classification unit 130 monitors whether each of the rankings of the patent quality evaluation and patent risk evaluation is less than or equal to a predetermined reference rank according to the rankings of the patent quality evaluation and patent risk evaluation of each patent included in the selected patent list. Group, the group in need of quality improvement whose ranking in patent quality evaluation is below the standard ranking and whose ranking in patent risk evaluation exceeds the standard ranking, infringement risk whose ranking in patent quality evaluation exceeds the standard ranking and whose ranking in patent risk evaluation is below the standard ranking It can be divided into a group requiring reduction and a top priority group whose rankings of patent quality evaluation and patent risk evaluation each exceed the standard ranking.

The above description is merely an example of the technical idea of the present invention, and various modifications and variations can be made to those skilled in the art without departing from the essential characteristics of the present invention. Therefore, the embodiments implemented in the present invention are not intended to limit the technical idea of the present invention, but to explain, and the scope of the technical idea of the present invention is not limited by these embodiments. The protection scope of the present invention should be construed according to the following claims, and all technical ideas within the equivalent range should be construed as being included in the scope of the present invention.

Claims (10)

In the method of analyzing a lapsed patent using a target technology keyword, which is a keyword representing a target technology,
generating a list of patents in the same field based on the target technology keyword in a patent DB, based on similarity between a keyword included in a plurality of lapsed patents belonging to a technology field including the target technology and the target technology keyword;
Keywords included in a plurality of lapsed patents searched for in the patent DB with an extension keyword, which is a keyword whose technology range is expanded from that of the target technology keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology keyword, based on the target technology keyword in the patent DB. Generating a patent list in other fields based on the similarity between the extension keyword and the extension keyword;
For the patents included in the patent list in the same field and the patent list in other fields, a patent quality evaluation is performed using the OECD Patent Quality Index (PQI) or Automatic Patent Value Evaluation System (SMART), and a predetermined number of selected patent lists are selected. selecting;
assigning a predetermined weight to each of the subsequent technology index, patent rights index, and patent application index for the patents included in the selected patent list, and calculating the ranking through TOPSIS analysis technique to perform patent risk assessment;
Based on the results of the patent quality evaluation and the patent risk evaluation, according to the ranking of the patent quality evaluation and the patent risk evaluation of each patent included in the selected patent list, the ranking of the patent quality evaluation and the patent risk evaluation A monitoring group each of which is below a predetermined standard rank, a group in need of quality improvement whose rank of patent quality evaluation is below the standard rank and a rank of patent risk assessment exceeds the standard rank, and a rank of the patent quality evaluation is above the standard rank classifying into a group in need of infringement risk reduction and a group in need of infringement risk whose ranking of the patent risk assessment is less than or equal to the reference rank and a highest priority group in which each of the rankings of the patent quality evaluation and the patent risk evaluation exceeds the reference ranking; and
For each patent included in the highest priority group, determining the priority by evaluating the recombinant novelty that measures a new combination of technology elements and the possibility of continuous use of technology elements by evaluating component familiarity. including,
The recombination novelty is calculated using Equation 1 below, and the technology element familiarity is calculated using Equation 2 below.
[Equation 1]

here,

is recombination novelty,

is the number of patent classification subclass combinations of patent k that have not appeared in previous patents,

is the number of all patent classification subclass combinations of patent k.

[Equation 2]

here,

is the number of all patent classification subclasses of patent k,

is the number of all past patent i with patent classification j. delete delete delete According to claim 1,
After the step of classifying into the predetermined number of groups,
For each patent included in the infringement risk reduction group, determining the priority by evaluating the need for avoidance design based on the number of related lawsuits.
Expired patent analysis method characterized in that it further comprises. According to claim 1,
The step of selecting the predetermined number of selected patent lists
Calculating market scope, technical impact, protection scope, and utilization scope by performing a T-test on each of the patents included in the patent list in the same field and the patent list in other fields; and
selecting a predetermined number of selected patent lists by integrating the calculated market scope, technical impact, protection scope, and utilization scope, and determining a ranking;
Expired patent analysis method comprising a. According to claim 1,
The step of performing the patent risk assessment
For each of the patents included in the selected patent list, the subsequent technology index based on the number of citations and the average number of citations, the patent right index based on the number of effective cited patents and the total number of cited patents, and the similar range of subsequent patents of patent applicants Calculating a patent application count index based on the number of cases and the total number of subsequent patents; and
Determining the patent risk evaluation ranking of each patent included in the selected patent list by applying a predetermined weight to each of the subsequent technology index, the patent rights index, and the patent application index, and applying a predetermined algorithm
Expired patent analysis method comprising a. According to claim 1,
Prior to the step of generating the patent list in the same field,
Analyzing the marketability, technicality, and rights of a plurality of extinguished patents and a plurality of valid patents in the technical field including the target technology, and comparing their values
Expired patent analysis method characterized in that it further comprises. In the apparatus for analyzing an extinct patent using a target technology keyword, which is a keyword representing a target technology,
Based on the target technology keyword in the patent DB, a list of patents in the same field is created based on the similarity between the keyword included in a plurality of lapsed patents belonging to the technology field including the target technology and the target technology keyword, Keywords included in a plurality of extinguished patents searched for in the patent DB by an extension keyword, which is a keyword whose technology range is expanded from the target technology keyword, and a classification keyword, which is a keyword indicating a technology classification different from the target technology keyword, based on the target technology keyword, and a generator for generating a list of patents in other fields based on the similarity of the extended keywords;
For the patents included in the patent list in the same field and the patent list in other fields, a patent quality evaluation is performed using the OECD Patent Quality Index (PQI) or Automatic Patent Value Evaluation System (SMART), and a predetermined number of selected patent lists are selected. Evaluation to perform patent risk assessment by selecting the patents included in the selected patent list, assigning a predetermined weight to each of the subsequent technology index, patent rights index, and patent application index, and calculating the ranking through TOPSIS analysis technique wealth; and
A division unit for classifying the patents included in the selected patent list into a predetermined number of groups based on the results of the patent quality evaluation and the patent risk evaluation;
The division
According to the rankings of the patent quality evaluation and the patent risk evaluation of each patent included in the selected patent list, the monitoring group in which each of the rankings of the patent quality evaluation and the patent risk evaluation are below a predetermined standard rank, the patent quality evaluation Groups in need of quality improvement whose ranking is below the standard ranking and whose ranking in patent risk assessment exceeds the standard ranking; infringement whose ranking in patent quality evaluation exceeds the standard ranking and whose ranking in patent risk assessment is below the standard ranking Classify the risk reduction group and the highest priority group in which each of the rankings of the patent quality evaluation and the patent risk evaluation exceeds the standard ranking,
For each of the patents included in the highest priority group, priorities are determined by evaluating recombinant novelty that measures new combinations of technology elements and component familiarity of the possibility of continuous use of technology elements,
The recombination novelty is calculated using Equation 1 below, and the technology element familiarity is calculated using Equation 2 below.

[Equation 1]

here,

is recombination novelty,

is the number of patent classification subclass combinations of patent k that have not appeared in previous patents,

is the number of all patent classification subclass combinations of patent k.

[Equation 2]

here,

is the number of all patent classification subclasses of patent k,

is the number of all past patent i with patent classification j.
delete

Images