KR102441896B9 - Apparatus and method for measuring optical propercies - Google Patents

Apparatus and method for measuring optical propercies

Info

Publication number
KR102441896B9
KR102441896B9 KR1020200109951A KR20200109951A KR102441896B9 KR 102441896 B9 KR102441896 B9 KR 102441896B9 KR 1020200109951 A KR1020200109951 A KR 1020200109951A KR 20200109951 A KR20200109951 A KR 20200109951A KR 102441896 B9 KR102441896 B9 KR 102441896B9
Authority
KR
South Korea
Prior art keywords
propercies
measuring optical
measuring
optical
optical propercies
Prior art date
Application number
KR1020200109951A
Other languages
Korean (ko)
Other versions
KR102441896B1 (en
KR20220030402A (en
Inventor
김한필
손두진
김정헌
김왕기
Original Assignee
한국광기술원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국광기술원 filed Critical 한국광기술원
Priority to KR1020200109951A priority Critical patent/KR102441896B1/en
Publication of KR20220030402A publication Critical patent/KR20220030402A/en
Application granted granted Critical
Publication of KR102441896B1 publication Critical patent/KR102441896B1/en
Publication of KR102441896B9 publication Critical patent/KR102441896B9/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0242—Control or determination of height or angle information of sensors or receivers; Goniophotometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0266—Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0271—Housings; Attachments or accessories for photometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0437—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using masks, aperture plates, spatial light modulators, spatial filters, e.g. reflective filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/06—Restricting the angle of incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020200109951A 2020-08-31 2020-08-31 Apparatus and method for measuring optical propercies KR102441896B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020200109951A KR102441896B1 (en) 2020-08-31 2020-08-31 Apparatus and method for measuring optical propercies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020200109951A KR102441896B1 (en) 2020-08-31 2020-08-31 Apparatus and method for measuring optical propercies

Publications (3)

Publication Number Publication Date
KR20220030402A KR20220030402A (en) 2022-03-11
KR102441896B1 KR102441896B1 (en) 2022-09-13
KR102441896B9 true KR102441896B9 (en) 2023-04-12

Family

ID=80814508

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200109951A KR102441896B1 (en) 2020-08-31 2020-08-31 Apparatus and method for measuring optical propercies

Country Status (1)

Country Link
KR (1) KR102441896B1 (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996035930A1 (en) * 1995-05-08 1996-11-14 Japan Energy Corporation Environment monitor apparatus
JP2002076490A (en) * 2000-09-04 2002-03-15 Ricoh Co Ltd Characteristic measuring device for laser beam
KR101675475B1 (en) * 2010-02-05 2016-11-14 삼성전자주식회사 Apparatus and Method for evaluating optical property of LED and method of manufacturing LED device using the same
KR101680851B1 (en) * 2010-02-05 2016-11-30 삼성전자주식회사 Method for evaluating optical properties of LED chip and method of manufacturing LED device using the same
JP2012007951A (en) * 2010-06-23 2012-01-12 Nikon Corp Measurement device for light distribution characteristics of light source
KR101418816B1 (en) 2013-03-28 2014-08-14 한국에너지기술연구원 Light distribution measurement apparatus for illumination and method of measurement thereof

Also Published As

Publication number Publication date
KR102441896B1 (en) 2022-09-13
KR20220030402A (en) 2022-03-11

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Legal Events

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E701 Decision to grant or registration of patent right
GRNT Written decision to grant
G170 Re-publication after modification of scope of protection [patent]