KR102430283B1 - 소프트웨어 애플리케이션 프로그래밍 인터페이스(api)로 자동화된 시험 특징의 사용자 제어 기법 - Google Patents

소프트웨어 애플리케이션 프로그래밍 인터페이스(api)로 자동화된 시험 특징의 사용자 제어 기법 Download PDF

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KR102430283B1
KR102430283B1 KR1020180049214A KR20180049214A KR102430283B1 KR 102430283 B1 KR102430283 B1 KR 102430283B1 KR 1020180049214 A KR1020180049214 A KR 1020180049214A KR 20180049214 A KR20180049214 A KR 20180049214A KR 102430283 B1 KR102430283 B1 KR 102430283B1
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user
test
api
dut
server
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KR20180121410A (ko
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로템 나훔
파드마자 날루리
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주식회사 아도반테스토
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stored Programmes (AREA)
KR1020180049214A 2017-04-28 2018-04-27 소프트웨어 애플리케이션 프로그래밍 인터페이스(api)로 자동화된 시험 특징의 사용자 제어 기법 Active KR102430283B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,285 2017-04-28
US15/582,285 US10592370B2 (en) 2017-04-28 2017-04-28 User control of automated test features with software application programming interface (API)

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KR20180121410A KR20180121410A (ko) 2018-11-07
KR102430283B1 true KR102430283B1 (ko) 2022-08-05

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Country Status (5)

Country Link
US (1) US10592370B2 (cg-RX-API-DMAC7.html)
JP (1) JP6761441B2 (cg-RX-API-DMAC7.html)
KR (1) KR102430283B1 (cg-RX-API-DMAC7.html)
CN (1) CN108845557B (cg-RX-API-DMAC7.html)
TW (1) TWI761495B (cg-RX-API-DMAC7.html)

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TWI773140B (zh) * 2020-03-05 2022-08-01 日商愛德萬測試股份有限公司 用於流量捕獲及除錯工具之圖形使用者介面
US12475024B2 (en) 2020-04-21 2025-11-18 UiPath, Inc. Test automation for robotic process automation
US11797432B2 (en) 2020-04-21 2023-10-24 UiPath, Inc. Test automation for robotic process automation
CN111694733A (zh) * 2020-05-22 2020-09-22 五八有限公司 一种软件开发工具包sdk的api测试方法以及测试装置
CN112819605A (zh) * 2021-01-29 2021-05-18 山东浪潮通软信息科技有限公司 资金结算业务测试方法、装置及计算机可读介质
CN114911653B (zh) * 2021-02-09 2025-11-04 浙江宇视科技有限公司 一种接口检测方法、装置、电子设备、系统及介质
CN112925509A (zh) * 2021-02-25 2021-06-08 苏州艾方芯动自动化设备有限公司 集成电路测试分选机的通用型硬件相关程序库的架构系统
US20230027880A1 (en) * 2021-07-22 2023-01-26 Infor (Us), Llc Techniques for automated testing of application programming interfaces
CN115187025A (zh) * 2022-06-29 2022-10-14 南京鼎华智能系统有限公司 制造软件塑模系统及其方法
CN115113981B (zh) * 2022-07-11 2025-12-16 苏州忆联信息系统有限公司 启动多个仿真环境验证dut的方法及相关设备
CN116913361B (zh) * 2023-06-08 2024-05-07 深圳市晶存科技有限公司 硬盘自动测试方法、系统及介质
TWI885795B (zh) * 2024-03-12 2025-06-01 廣達電腦股份有限公司 自動化測試系統
WO2025196789A1 (en) * 2024-03-21 2025-09-25 Jio Platforms Limited System and method for performing a plurality of tests on a set top box (stb) device

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Also Published As

Publication number Publication date
TW201843589A (zh) 2018-12-16
JP2018189641A (ja) 2018-11-29
CN108845557B (zh) 2023-08-08
KR20180121410A (ko) 2018-11-07
CN108845557A (zh) 2018-11-20
TWI761495B (zh) 2022-04-21
JP6761441B2 (ja) 2020-09-23
US20180314613A1 (en) 2018-11-01
US10592370B2 (en) 2020-03-17

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