JP6761441B2 - ソフトウェアアプリケーションプログラミングインタフェース（ａｐｉ）を用いた自動テスト機能のユーザによる制御 - Google Patents

ソフトウェアアプリケーションプログラミングインタフェース（ａｐｉ）を用いた自動テスト機能のユーザによる制御 Download PDF

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JP6761441B2
JP6761441B2 JP2018081567A JP2018081567A JP6761441B2 JP 6761441 B2 JP6761441 B2 JP 6761441B2 JP 2018081567 A JP2018081567 A JP 2018081567A JP 2018081567 A JP2018081567 A JP 2018081567A JP 6761441 B2 JP6761441 B2 JP 6761441B2
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user
test
api
server
dut
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JP2018189641A (ja
JP2018189641A5 (cg-RX-API-DMAC7.html
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ナホム ロテム
ナホム ロテム
ナルルーリ パドマジャ
ナルルーリ パドマジャ
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Advantest Corp
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Advantest Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stored Programmes (AREA)
JP2018081567A 2017-04-28 2018-04-20 ソフトウェアアプリケーションプログラミングインタフェース（ａｐｉ）を用いた自動テスト機能のユーザによる制御 Active JP6761441B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,285 2017-04-28
US15/582,285 US10592370B2 (en) 2017-04-28 2017-04-28 User control of automated test features with software application programming interface (API)

Publications (3)

Publication Number Publication Date
JP2018189641A JP2018189641A (ja) 2018-11-29
JP2018189641A5 JP2018189641A5 (cg-RX-API-DMAC7.html) 2019-05-30
JP6761441B2 true JP6761441B2 (ja) 2020-09-23

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JP2018081567A Active JP6761441B2 (ja) 2017-04-28 2018-04-20 ソフトウェアアプリケーションプログラミングインタフェース（ａｐｉ）を用いた自動テスト機能のユーザによる制御

Country Status (5)

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US (1) US10592370B2 (cg-RX-API-DMAC7.html)
JP (1) JP6761441B2 (cg-RX-API-DMAC7.html)
KR (1) KR102430283B1 (cg-RX-API-DMAC7.html)
CN (1) CN108845557B (cg-RX-API-DMAC7.html)
TW (1) TWI761495B (cg-RX-API-DMAC7.html)

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CN111694733A (zh) * 2020-05-22 2020-09-22 五八有限公司 一种软件开发工具包sdk的api测试方法以及测试装置
CN112819605A (zh) * 2021-01-29 2021-05-18 山东浪潮通软信息科技有限公司 资金结算业务测试方法、装置及计算机可读介质
CN114911653B (zh) * 2021-02-09 2025-11-04 浙江宇视科技有限公司 一种接口检测方法、装置、电子设备、系统及介质
CN112925509A (zh) * 2021-02-25 2021-06-08 苏州艾方芯动自动化设备有限公司 集成电路测试分选机的通用型硬件相关程序库的架构系统
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CN115113981B (zh) * 2022-07-11 2025-12-16 苏州忆联信息系统有限公司 启动多个仿真环境验证dut的方法及相关设备
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Also Published As

Publication number Publication date
TW201843589A (zh) 2018-12-16
JP2018189641A (ja) 2018-11-29
CN108845557B (zh) 2023-08-08
KR102430283B1 (ko) 2022-08-05
KR20180121410A (ko) 2018-11-07
CN108845557A (zh) 2018-11-20
TWI761495B (zh) 2022-04-21
US20180314613A1 (en) 2018-11-01
US10592370B2 (en) 2020-03-17

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