KR102400170B1 - Calibration system and method for coil - Google Patents

Abstract

The present invention provides a calibration system and calibration method for a coil to perform telescoping correction without damaging a coil during telescoping correction work on the coil configured in the form of a roll. To this end, the present invention includes first and second calibration units arranged on both sides of the coil and a control unit that acquires data on the film thickness of the coil and controls the operation of the first and second calibration units so that the first and second calibration units perform a first telescoping correction process based on vibration or a second telescoping correction process based on pressing force.

Description

COIL CALIBRATION SYSTEM AND METHOD FOR COIL

The present invention relates to a coil calibration system and a calibration method, and more particularly, to a coil calibration system and a calibration method for calibrating a wound coil.

In general, long plate articles such as steel coils, paper and synthetic resin materials are produced in the form of rolls for the convenience of transport and distribution. In addition, the roll-shaped article is subjected to a telescope process in order to correct the protruding area of the side before packaging.

For example, in a conventional coil telescope correction operation, an external force is provided using hydraulic and pneumatic cylinders disposed on both sides in a state in which the coil is seated on the support. Accordingly, the telescope of the coil can be corrected, but centering misalignment and product damage occur. In particular, a thin steel sheet coil, for example, a thin sheet product having a thickness of 1.2 mm or less, has a problem in that a product defect occurs in the telescope calibration, waste of resources and deterioration of work efficiency.

Accordingly, there is a continuing demand for a technology capable of reducing the working time while preventing a decrease in the working efficiency of an operator and damage to the coil in the telescope correction operation of the coil.

Republic of Korea Patent Publication No. 10-2011-0094863 (coil packaging robot, 2011.08.24.)

SUMMARY OF THE INVENTION It is an object of the present invention to provide a coil calibration system and calibration method capable of performing telescopic calibration without damaging the coil in a telescopic operation of a coil configured in a roll shape.

The coil calibration system according to the present invention is a coil calibration system for uniformly aligning the protruding regions of the side of the coil, and acquires data on the thin film thickness of the first and second correction units and the coil disposed on both sides of the coil and a control unit for controlling the operations of the first and second correction units so that the first and second correction units perform a first telescopic process based on vibration or a second telescope process based on a pressing force includes

The first telescope process may be performed when the thickness of the thin film is 1.2 mm or less, and the second telescope process may be performed when the thickness of the thin film exceeds 1.2 mm.

The first and second correction units include a pressure plate facing the side surface of the coil, a driving module connected to the pressure plate to allow the pressure plate to reciprocate with respect to the side surface of the coil, and the coil facing the side surface. It may include a contact unit protruding from one surface of the pressure plate and recessed into the pressure plate when in contact with the coil, and a vibration generating module connected to the contact unit to generate vibration, respectively.

The control unit moves the pressure plate toward the coil in the first telescope process to operate the vibration generating module when the contact unit comes into contact with the side surface of the coil so that the side surface of the coil is uniformly generated by vibration. When the contact unit is depressed, the transfer of the pressure plate and the operation of the vibration generating module are stopped, and the pressure plate is transferred toward the coil in the second telescope process based on the pressing force of the pressing plate. The side surfaces of the coil may be uniformly aligned.

Each of the first and second correction units includes a sensing module that measures the distance from the side of the coil in the first and second telescope processes to adjust the transfer distance of the pressurizing plate, and is connected to the driving module It may further include a linear displacement sensor for measuring the tensile distance of the drive module.

The coil calibration system further includes a coil support unit inserted into the hollow of the coil to maintain the coil in an elevated state in the telescopic process of the coil, and the pressure plate is located in the upper region of the pressure plate. An anti-interference part is formed so that the coil support unit passes through without interference when it is transported toward the coil, and the sensing module is disposed behind the pressure plate to measure the distance from the side of the coil through the interference prevention part. can

The coil calibration system may further include a pressure sensor for measuring whether the sides of the coil are uniformly aligned after the transfer of the pressure plate and the operation of the vibration generating module are stopped in the first telescope process .

On the other hand, the coil calibration method according to the present invention is a coil calibration method for uniformly aligning the protruding regions of the side of the coil, the coil being disposed between the first and second correction units and the control unit is the thin film thickness of the coil and controlling the operation of the first and second correction units according to the data so that the first and second correction units are based on a first telescopic process based on vibration or a pressing force. and causing a second telescope process to be performed.

The coil calibration system and calibration method according to the present invention has the effect of reducing the manual load of the operator, the work required time, and the product defect rate by performing the telescopic calibration work so as not to damage the coil.

The technical effects of the present invention as described above are not limited to the effects mentioned above, and other technical effects not mentioned will be clearly understood by those skilled in the art from the following description.

1 is a perspective view schematically showing a coil calibration system according to this embodiment,
2 is a block diagram showing a coil calibration system according to the present embodiment,
3 is a flowchart showing the operation of the coil calibration system according to the present embodiment,
4 is a conceptual diagram showing the first telescope process using the coil calibration system according to the present embodiment,
5 is a conceptual diagram illustrating a second telescope process using the coil calibration system according to the present embodiment.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, this embodiment is not limited to the embodiment disclosed below, but may be implemented in various forms, and only this embodiment allows the disclosure of the present invention to be complete, and the scope of the invention to those of ordinary skill in the art It is provided for complete information. The shapes of elements in the drawings may be exaggerated for more clear explanation, and elements indicated by the same reference numerals in the drawings mean the same elements.

Figure 1 is a perspective view schematically showing a coil calibration system according to this embodiment, Figure 2 is a block diagram showing the coil calibration system according to the present embodiment.

1 and 2, the coil calibration system 1000 according to the present embodiment may perform a telescope process in the packaging process of the coil 10 in which the plate material is formed in a roll shape. However, this is for explaining the present embodiment, and the coil calibration system 1000 may perform the telescope process as a process independent of the packaging process of the coil 10 . Here, the telescope process refers to a process in which the side of the coil 10 is uniformly aligned by pressing the protruding area of the side of the coil 10 in the form of a roll.

The coil calibration system 1000 may include a coil support unit 100 , a correction unit 200 , and a control unit 300 .

First, the coil 10 is transferred by the coil support unit 100 , and may be disposed between a pair of correction units 200 . In this case, the coil support unit 100 may be provided as a crane, and may serve to transport the coil 10 in the packaging process of the coil 10 . However, when the coil calibration system 1000 is independently configured, the coil support unit 100 may simply serve to elevate the coil 10 . In the coil support unit 100 , a pair of support modules 110 provided in the form of a robot arm are inserted into the hollow of the coil 10 to participate in the transfer and elevating of the coil 10 .

Meanwhile, the compensation unit 200 may include first and second compensation units 200a and 200b disposed on both sides of the coil 10 disposed at the working position. The first and second correction units 200a and 200b are provided with the same configuration and are arranged symmetrically. Hereinafter, the first and second correction units 200a and 200b will be collectively referred to as the correction unit 200 . The correction unit 200 may include a pressure plate 210 , a driving module 220 , a contact module 230 , a vibration generating module 240 , and a sensing module 250 .

First, the pressure plate 210 may be made of a solid material and is disposed so that one surface faces the side surface of the coil 10 . The pressing plate 210 may slide from the side of the coil 10 and press the coil 10 to perform a telescope process. In addition, a buffer member is provided on the pressure plate 210 to prevent damage to the coil 10 due to stress in the telescope process. This buffer member is for buffering the impact, and the material or shape is not limited.

And the pressure plate 210 is formed with an anti-interference part 211 through which the support module 110 does not interfere when approaching the coil 10 supported by the coil support unit 100 . The interference prevention part 211 may be formed in the upper region of the pressing plate 210 , and for this purpose, the pressing plate 210 may be provided in an approximately 'U' shape. Accordingly, the pressure plate 210 may be in close contact with the side of the coil 10 without being interfered with by the support module 110 when it is transferred toward the coil 10 .

Meanwhile, the driving module 220 is connected to the pressure plate 210 so that the pressure plate 210 reciprocates with respect to the side surface of the coil 10 . The driving module 220 may be provided to include a plurality of cylinders, but the type of the driving module 220 is not limited. In addition, the driving module 220 may be provided with a detection sensor 221 for measuring the tensile distance of the cylinder. The detection sensor 221 may be provided as a Linear Variable Differential Transformer Sensor (LVDT Sensor), but the type of the detection sensor 221 is not limited.

And the contact module 230 is provided on the pressure plate (210). The contact module 230 is configured to primarily contact the side surface of the coil 10 when the pressure plate 210 slides toward the coil 10 .

The contact module 230 may be provided in the form of a touch pad to sense the contact of the coil 10 , and may be elongated in the vertical direction in the central lower region of the pressure plate 210 . In this case, the contact module 230 may be formed to be longer than the length from the inner diameter to the outer diameter of the coil 10 . The contact module 230 may maintain a state protruding from the pressure plate 210 toward the side of the coil 10 and be depressed into the pressure plate 210 by a pressing force when in contact with the coil 10 . In addition, the contact module 230 may provide a related signal to the control unit 300 when it comes into contact with the coil 10 or is depressed into the pressure plate 210 .

Meanwhile, the vibration generating module 240 is connected to the contact module 230 . The vibration generating module 240 may generate vibration when the contact module 230 comes into contact with the coil 10 as necessary. That is, the vibration generating module 240 generates vibration based on a signal provided from the control unit 300 as the contact module 230 comes into contact with the coil 10 , and the coil 10 through the contact module 230 . ) to perform the telescopic process. The vibration generating module 240 may be provided with an air hammer, but the type of the vibration generating module 240 is not limited.

And the sensing module 250 is disposed at the rear of the pressing plate (210). The detection module 250 may be provided as a laser sensor, and measures the distance from the side of the coil 10 through the interference prevention unit 211 . And the sensing module 250 may provide the measured distance information to the control unit 300 to adjust the sliding distance of the pressing plate 210 in the telescope process.

On the other hand, the control unit 300 controls the overall operation of the coil calibration system (1000). When the coil 10 is disposed at the working position, the control unit 300 may perform a different telescopic process based on the thickness of the coil 10 thin film. For example, if the thin film thickness of the coil 10 is 1.2 mm or less and a general telescope process is applied, the coil 10 may be easily damaged. Accordingly, the control unit 300 may perform a telescope process using the pressure plate 210 or a telescope process using the vibration generating module 240 according to the thickness of the thin film of the coil 10 .

Hereinafter, a telescope process according to the thin film thickness of the coil 10 will be described with reference to the accompanying drawings. However, detailed descriptions of the above-described components will be omitted and the same reference numerals will be assigned to them.

Figure 3 is a flow chart showing the operation of the coil calibration system according to this embodiment, Figure 4 is a conceptual diagram showing the first telescope process using the coil calibration system according to this embodiment. And Figure 5 is a conceptual diagram showing a second telescope process using the coil calibration system according to the present embodiment.

3 to 5, in the coil calibration system 1000 according to the present embodiment, the coil 10 is provided as a working position (S110). At this time, the coil 10 may be in a state supported by the coil support unit 100 and raised to a predetermined height from the bottom of the working position.

Then, the coil data is provided to the control unit 300 (S120). The coil data includes numerical data on the thin film thickness of the coil 10 . In this case, the coil data may be input by an operator, but may be automatically acquired using a separate measuring device.

Thereafter, according to the acquisition of the coil data, the control unit 300 may select a telescope process suitable for the coil 10 to perform the telescope process (S130).

First, when the thin film thickness of the coil 10 is 1.2 mm or less, the first telescope process ( S200 ) may be performed, and when the thin film thickness of the coil 10 exceeds 1.2 mm, the second telescope process (S300) may be allowed to proceed.

However, in this embodiment, it is described that the control unit 300 selects the first and second telescope processes (S200, S300) according to the coil data, but the operator selects the first and second telescope processes (S200, S300) S300) can be directly selected.

First, as shown in FIG. 4 , the first telescope process performed when the thin film thickness of the coil 10 is 1.2 mm or less will be described as follows.

The coil calibration system 1000 operates the sensing module 250 to obtain a distance from the coil 10 . And the control unit 300 drives the driving module 220 based on the acquired distance information so that the pressure plate 210 slides toward the side of the coil 10 . And as the pressure plate 210 approaches the coil, the contact module 230 protruding from the pressure plate 210 comes into primary contact with the side surface of the coil 10 .

Accordingly, when a contact signal is provided through the contact module 230 , the control unit 300 operates the vibration generating module 240 . Accordingly, the vibration generated from the vibration generating module 240 is applied to the coil through the contact module 230 so that the protruding areas on the side of the coil 10 are uniformly aligned. Thereafter, when the contact module 230 is depressed into the pressure plate 210 , the control unit 300 stops the operation of the vibration generating module 240 and determines whether the telescope is calibrated. At this time, the coil calibration system 1000 may determine whether to calibrate based on a pressure sensor that may be provided on the pressure plate 210 .

Finally, when the telescope calibration is completed, the control unit 300 returns the pressure plate 210 to the initial position to complete the telescope process.

Meanwhile, as shown in FIG. 5 , the second telescope process performed when the thin film thickness of the coil 10 exceeds 1.2 mm will be described as follows.

The coil calibration system 1000 operates the sensing module 250 to measure the distance to the coil 10 . And the control unit 300 drives the driving module 220 based on the acquired distance information so that the pressure plate 210 slides toward the side of the coil 10 . At this time, the detection sensor 221 measures the distance of the driving module 220 and adjusts the transport distance of the pressure plate 210 , and the pressure plate 210 ensures that the protruding areas on the side of the coil 10 are uniformly aligned. . At this time, the contact module 230 may maintain a depressed state in the pressure plate 210 in a state in which the vibration generating module 240 does not operate, or may perform protrusion and depression operations.

Thereafter, when the telescope calibration is finally completed, the control unit 300 returns the pressure plate 210 to the initial position to complete the telescope process.

As such, the coil calibration system 1000 performs a different telescope process based on the thin film thickness of the coil 10 so that a stable telescope process is performed without damage to the coil 10 .

Accordingly, the coil calibration system and calibration method according to the present invention has the effect of reducing the manual load of the operator, the time required for the work, and the product defect rate by performing the telescope calibration work so as not to damage the coil.

One embodiment of the present invention described above and shown in the drawings should not be construed as limiting the technical spirit of the present invention. The protection scope of the present invention is limited only by the matters described in the claims, and those skilled in the art can improve and change the technical idea of the present invention in various forms. Accordingly, such improvements and modifications will fall within the protection scope of the present invention as long as they are apparent to those of ordinary skill in the art.

Claims (8)

In the coil correction system for uniformly aligning the protrusion area on the side of the coil,
first and second correction units disposed on both sides of the coil; and
Acquiring data on the thin film thickness of the coil, and controlling the operation of the first and second correction units, the first and second correction units based on a first telescopic process based on vibration or a pressing force and a control unit to perform a second telescope process,
The first telescope process is performed when the thickness of the thin film is 1.2 mm or less,
The second telescope process is performed when the thickness of the thin film exceeds 1.2 mm,
The first and second correction units include a pressure plate facing the side surface of the coil, a driving module connected to the pressure plate to allow the pressure plate to reciprocate with respect to the side surface of the coil, and the coil facing the side surface. A contact unit protruding from one surface of the pressure plate and recessed into the pressure plate when in contact with the coil, and a vibration generating module connected to the contact unit to generate vibration,
The control unit moves the pressure plate toward the coil in the first telescope process to operate the vibration generating module when the contact unit comes into contact with the side surface of the coil so that the side surface of the coil is uniformly generated by vibration. When the contact unit is depressed, the transfer of the pressure plate and the operation of the vibration generating module are stopped, and the pressure plate is transferred toward the coil in the second telescope process based on the pressing force of the pressing plate. Coil calibration system, characterized in that the side of the coil is uniformly aligned.
delete delete delete According to claim 1,
Each of the first and second correction units is
A sensing module for measuring the distance from the side of the coil in the first and second telescope processes to adjust the transfer distance of the pressing plate;
Coil calibration system according to claim 1, further comprising a linear displacement sensor connected to the drive module to measure a tensile distance of the drive module.
6. The method of claim 5,
Further comprising a coil support unit inserted into the hollow of the coil to maintain the coil in a raised state in the telescopic process of the coil,
In the upper region of the pressure plate,
An anti-interference part is formed so that the coil support unit passes through without interference when the pressure plate is transferred toward the coil,
The detection module is
Coil calibration system, which is disposed at the rear of the pressure plate and measures the distance from the side of the coil through the interference prevention unit.
According to claim 1,
Further comprising a pressure sensor for measuring whether the side surfaces of the coil are uniformly aligned after the transfer of the pressure plate and the operation of the vibration generating module are stopped in the first telescope process,
The pressure sensor is a coil calibration system, characterized in that installed on the pressure plate.
In the coil calibration method for uniformly aligning the protruding area on the side of the coil,
placing the coil between the first and second correction units;
acquiring, by a control unit, data on the thin film thickness of the coil; and
Control the operation of the first and second correction units according to the data so that the first and second correction units perform a first telescopic process based on vibration or a second telescopic process based on a pressing force comprising the steps of
The first telescope process is performed when the thickness of the thin film is 1.2 mm or less,
The second telescope process is performed when the thickness of the thin film exceeds 1.2 mm,
The first and second correction units include a pressure plate facing the side surface of the coil, a driving module connected to the pressure plate to allow the pressure plate to reciprocate with respect to the side surface of the coil, and the coil facing the side surface. A contact unit protruding from one surface of the pressure plate and recessed into the pressure plate when in contact with the coil, and a vibration generating module connected to the contact unit to generate vibration,
The control unit moves the pressure plate toward the coil in the first telescope process to operate the vibration generating module when the contact unit comes into contact with the side surface of the coil so that the side surface of the coil is uniformly generated by vibration. When the contact unit is depressed, the transfer of the pressure plate and the operation of the vibration generating module are stopped, and the pressure plate is transferred toward the coil in the second telescope process based on the pressing force of the pressing plate. Coil calibration method, characterized in that so that the side of the coil is uniformly aligned.

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