KR102319455B1 - Apparatus for sensing particle - Google Patents

Abstract

The particle sensing device according to the embodiment includes a light emitting unit emitting light, an ionization unit converting polarity of the introduced air particles into ionized particles, and disposed in a path after the ionization unit under the light emitting unit, the ionized particles air flows to intersect the optical axis of the light emitting unit, includes a scattering unit providing scattered light by ionized particles, is disposed on the optical axis under the flow path, and flows into the light receiving unit and the scattering unit into which the scattered light passing through the flow path is incident A particle sensing device comprising a repulsive force generating unit that applies a repulsive force of the same polarity as that of the ionized particles to the ionized particles entering the scattering unit.

Description

Particle sensing device {Apparatus for sensing particle}

The embodiment relates to a particle sensing device.

In general, in the case of a dust sensing device that senses particles such as dust, light is irradiated toward the dust, and light scattered from the dust is sensed to obtain information about the dust. As dust continues to flow into the inside of the conventional dust sensing device, dust accumulates inside the dust sensing device, particularly in the optical system, and thus it may be difficult to obtain accurate information on the dust. In order to solve this problem, the user of the dust sensing device has an inconvenient problem in that the user of the dust sensing device has to directly clean the optical system in the dust sensing device at a certain period, for example, every 3 or 6 months.

An embodiment is to provide a particle sensing device capable of preventing contamination of particles.

A particle sensing device according to an embodiment includes a light emitting unit emitting light; an ionizer for converting the polarity of the introduced air particles into ionized particles; a flow path part disposed in a path after the ionization part under the light emitting part, the air containing the ionized particles flowing to cross the optical axis of the light emitting part, and including a scattering part providing scattered light by the ionized particles; a light receiving unit disposed on the optical axis under the flow path and receiving the scattered light passing through the flow path; and a repulsive force generating unit that applies a repulsive force having the same polarity as that of the ionized particles introduced into the scattering unit on the ionized particles entering the scattering unit.

For example, the flow passage includes a passage inlet through which the air is introduced; a passage outlet through which the air is discharged; and an inlet-side passage intermediate portion positioned between the passage inlet and the scattering portion, wherein the passage inlet includes an inlet through which the air is introduced from the outside; and an inflow path formed between the inlet and the inlet-side flow path from the inlet, wherein the scattering unit may be positioned on the optical axis between the flow path inlet and the flow path outlet.

For example, the ionization unit may be disposed in at least one of the inlet, the inflow path, and an intermediate portion of the inlet side flow path.

For example, the repulsive force generating unit may include: at least one first electrode disposed on the side of the light emitting unit and having the same polarity as that of the ionized particles; and at least one second electrode disposed to face the at least one first electrode on the side of the light receiving unit and having the same polarity as that of the ionized particle.

For example, the light emitting unit may include a light source unit; a light emitting case disposed on the optical axis, defining a first opening through which light emitted from the light source unit is emitted toward the scattering unit, and accommodating the light source unit; and a lens unit accommodated in the light emitting case, disposed on the optical axis between the light source unit and the first opening, and condensing the light emitted from the light source unit into the first opening.

For example, the at least one first electrode may include a 1-1 electrode disposed near the first opening and the scattering unit on the light emitting case.

For example, the at least one first electrode may include a 1-2 electrode disposed on the optical axis between the lens unit and the first opening in the light emitting case.

For example, the light receiving unit may include a light transmitting member; and a light sensing unit configured to sense the scattered light by the ionized particles in the scattering unit.

For example, the particle sensing device further includes a light receiving unit disposed between the scattering unit and the light receiving unit, the light receiving unit adjusting the amount of light incident to the light receiving unit, and having a third opening disposed on the optical axis, the at least one a second electrode of the 2-1 electrode disposed near the third opening and the scattering part on the light-receiving incident part; a 2-2 electrode disposed above the light-transmitting member; Alternatively, it may include at least one of the second and third electrodes disposed below the light-transmitting member.

For example, the particle sensing device may further include a light absorbing unit disposed on the optical axis under the light receiving unit and absorbing the light passing through the light receiving unit.

For example, at least one of the first and second electrodes described above may include a light-transmitting conductive layer.

The particle sensing device according to the embodiment can prevent the optical system from being contaminated by the particles, reduce the number of times of cleaning to remove the particles contaminated with the optical system or reduce the hassle of cleaning, and sense accurate information about the particles can do.

1 is a schematic block diagram for explaining the concept of a particle sensing device according to an embodiment.
2 shows an exemplary profile of scattered light scattered by ionized particles.
FIG. 3 is a cross-sectional view illustrating an embodiment of the particle sensing device illustrated in FIG. 1 .
4A is an enlarged cross-sectional view of part 'A1' to explain the flow path part, the ionization part, and the repulsive force generating part shown in FIG. 3, and FIGS. 4B and 4C are another embodiment of the repulsive force generating part shown in FIG. For explanation, it is an enlarged cross-sectional view of part 'B1' according to an embodiment.
5 is a cross-sectional view of another embodiment of the particle sensing device shown in FIG. 1 .
6A is an enlarged cross-sectional view of part 'A2' to explain the flow path part, the ionization part, and the repulsive force generating part shown in FIG. 5, and FIGS. 6B and 6C are another embodiment of the repulsive force generating part shown in FIG. In order to do so, it is an enlarged cross-sectional view according to an embodiment of part 'B2'.
7 is a cross-sectional view of another embodiment of the particle sensing device shown in FIG.
8A is an enlarged cross-sectional view of part 'A3' to explain the embodiment of the repulsive force generating unit shown in FIG. 7, the flow path part, and the ionization unit, and FIGS. 8B and 8C are another embodiment of the repulsive force generating unit shown in FIG. 7 In order to explain, it is an enlarged cross-sectional view according to an embodiment of part 'B3'.
9 is an enlarged cross-sectional view of part 'C' shown in FIG. 3 .
FIG. 10 shows a planar shape of an embodiment of the light sensing unit shown in FIG. 9 .
FIG. 11 shows a planar shape of another embodiment of the light sensing unit shown in FIG. 9 .
FIG. 12 is a cross-sectional view showing another embodiment of the particle sensing device shown in FIG. 1 .
13 is a side view of the particle sensing device shown in FIG. 12 .
14 is a top perspective view of the particle sensing device shown in FIG. 12 .
15 is a left perspective view of the particle sensing device shown in FIG. 14, respectively.
FIG. 16 is a plan view taken along line I-I' shown in FIG. 14 .
FIG. 17 is an enlarged cross-sectional view of part 'D' shown in FIG. 12 .
18 is an enlarged cross-sectional view of part 'E' shown in FIG. 12 .
19 is a block diagram of an embodiment of the information analysis unit shown in FIG. 1 .
20 is a schematic perspective view of a particle sensor according to an embodiment.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings to help the understanding of the present invention by giving examples, and to explain the present invention in detail. However, the embodiments according to the present invention may be modified in various other forms, and the scope of the present invention should not be construed as being limited to the embodiments described in detail below. The embodiments of the present invention are provided to more completely explain the present invention to those of ordinary skill in the art.

In the description of this embodiment, in the case where it is described as being formed on "on or under" of each element, above (above) or below (below) ( on or under includes both elements in which two elements are in direct contact with each other or in which one or more other elements are disposed between the two elements indirectly.

In addition, when expressed as "up (up)" or "down (on or under)", a meaning of not only an upward direction but also a downward direction may be included based on one element.

Also, as used hereinafter, relational terms such as "first" and "second," "upper/upper/above" and "lower/lower/below" refer to any physical or logical relationship or It may be used to distinguish one entity or element from another, without requiring or implying an order.

Hereinafter, the particle sensing apparatus 100 according to the embodiment will be described with reference to the accompanying drawings as follows. For convenience of description, although the particle sensing apparatus 100: 100A to 100D is described using a Cartesian coordinate system (x-axis, y-axis, and z-axis), it goes without saying that this can also be described by other coordinate systems. In addition, according to the Cartesian coordinate system, the x-axis, the y-axis, and the z-axis are orthogonal to each other, but the embodiment is not limited thereto. That is, the x-axis, y-axis, and z-axis may cross each other.

1 is a schematic block diagram for explaining the concept of a particle sensing device 100 according to an embodiment, and is a light emitting unit 110 , a flow path unit 120 , a light receiving unit 130 , and a light absorption unit 144 . ), a signal converter 140 , an information analyzer 142 , an ionizer 150 , a repulsive force generator 160 , a housing 170 , and a fan 180 .

Referring to FIG. 1 , the light emitting unit 110 serves to emit light, and may include a light source unit 112 , a lens unit 114 , and a light emitting case 116 .

The light source unit 112 serves to emit the first light L1 and may include at least one light source. The light source included in the light source unit 112 may be at least one of a light emitting diode (LED) or a laser diode (LD). is not limited to the number of For example, as a light source for implementing the light source unit 112, it may be a blue LED, a high-brightness LED, a chip LED, a high-luxe LED, or a power LED having straightness, but the light source according to the embodiment is not limited to a specific type of LED. .

If the light source unit 112 is implemented as an LED, light of a visible light wavelength band (eg, 405 nm to 660 nm) or an infrared (IR: Infrared) wavelength band (eg, 850 nm to 940 nm) can emit. In addition, when the light source unit 112 is implemented as an LD, light of a red/blue wavelength band (eg, 450 nm to 660 nm) may be emitted. However, the embodiment is not limited to a specific wavelength band of the first light L1 emitted from the light source unit 112 .

Also, the intensity of the third light L3 emitted from the light emitting unit 110 may be 3000 mcd or more, but the embodiment is not limited to a specific intensity of the third light L3 emitted.

The above-described packaging form of the light source of the light emitting unit 110 may be implemented as a surface mount device (SMD) type or a lead type. Here, the SMD type means a packaging type in which the light source of the light emitting unit 112A is mounted on a printed circuit board (PCB) through soldering, as shown in FIG. 3 to be described later. In addition, the lead type means a packaging type in which a lead that can be connected to a PCB electrode from a light source protrudes. However, the embodiment is not limited to a specific packaging type of the light source.

In addition, when the light emitting unit 110 is implemented as an LD, the LD may be a TO Can type packaged in a metal, and may consume 5 mW or more of power, but the embodiment is not limited thereto.

The lens unit 114 may be disposed on the optical axis LX between the light source unit 112 and the first opening OP1 . That is, the lens unit 114 may be disposed on a path through which the first light L1 passes from the light source unit 112 toward the first opening OP1 . The lens unit 114 serves to condense the first light L1 emitted from the light source unit 112 to the first opening OP1 ( L2 ). Also, the lens unit 114 may serve to convert the first light L1 emitted from the light source unit 112 into the parallel light L2 . To this end, the lens unit 114 may include only one lens or a plurality of lenses arranged on the optical axis LX. The material of the lens unit 114 may be the same as a lens applied to a general camera module or an LED module.

The light emitting case 116 accommodates the light source unit 112 and the lens unit 114 , and serves to define the first opening OP1 . In the case of FIG. 1 , the light emitting case 116 is illustrated as being separate from the top portion 172 of the housing 170 , but the embodiment is not limited thereto. That is, as illustrated in FIGS. 12 to 15 to be described later, the light emitting case 116 may be integrally formed with the top portion 172 of the housing 170 . In this case, the light emitting case 116 may be omitted.

In addition, in the first opening OP1 that may be defined by the light emitting case 116 , the second light L2 emitted from the light source unit 112 and passing through the lens unit 114 is transmitted to the scattering unit of the flow path unit 120 . A portion that is emitted as the third light L3 toward the (or scattering space) SS and may be disposed on the optical axis LX of the light emitting unit 110 . The scattering unit SS will be described later in detail when the flow path unit 120 is described.

Also, the first opening OP1 may have an area corresponding to a view angle of the first light L1 emitted from the light source unit 112 . In general, the light emission angle of the LED that can be the light source 112 is about 15° when the luminous intensity drops to 50%. As such, since the power of the LED is large at the center, light of a desired intensity may be emitted through the first opening OP1 even if the area of the first opening OP1 is not large. However, when the light emission angle is large, if the area of the first opening OP1 is determined so that the third light L3 having a desired intensity is emitted from the light emitting unit 110, light loss may occur and the light intensity may be weakened. have. Accordingly, the light emission angle may be determined in consideration of this. For example, when the first opening OP1 has a circular planar shape, when the diameter of the first opening OP1 is greater than 15 mm, the size of the particle sensing device 100 also increases and optical noise may be caused. have. The diameter of the first opening OP1 may be 2 mm to 15 mm, for example, 3 mm to 10 mm, preferably 4 mm to 6 mm, for example, 5.5 mm, but the embodiment is not limited thereto. .

Meanwhile, the flow path unit 120 may be disposed to cross the optical axis LX of the light emitting unit 110 under the light emitting unit 110 , and air including particles may flow through the flow path unit 120 . . Air including particles may be introduced in the IN1 direction toward the inlet IH of the flow path 120 and may be discharged in the OUT1 direction through the outlet OH of the flow path 120 . For example, a particle is a particle floating in the air, and may be dust or smoke, and the embodiment is not limited to a specific shape of the particle.

Particles included in the air introduced in the IN1 direction through the inlet IH of the flow path 120 are scattered by the third light L3 emitted from the light emitting unit 110 to the scattering unit SS of the flow path unit 120 . The scattered fourth light L4 (hereinafter, referred to as 'scattered light') may be provided to the light receiving unit 130 . Here, the particles to be scattered by the scattering unit SS correspond to the particles whose polarity is changed to the ionized particles in the ionization unit 150 . This will be described later in detail.

In the case of FIG. 1 , the flow path 120 is illustrated as being spaced apart from the light emitting unit 110 and the light receiving unit 130 , but this is to explain the concept of the particle sensing device 100 according to the embodiment. That is, according to a method in which the flow path 120 is implemented, the flow path 120 may be disposed in contact with the light emitting unit 110 and the light receiving unit 130 , respectively, as in the particle sensing devices 100A to 100D to be described later.

The fan 180 serves to induce the flow of air in the flow passage 120 . That is, the fan 180 serves to constantly maintain the flow rate of air in the flow passage 120 . To this end, the fan 180 may be disposed adjacent to the flow path unit 120 in a direction in which air flows (eg, a y-axis direction). For example, as shown in FIG. 1 , the fan 180 may be disposed on the outlet OH side of the flow passage 120 , but the embodiment is not limited thereto. That is, the embodiment is not limited to a specific arrangement position of the fan 180 as long as it is possible to induce the flow of air within the flow path unit 120 .

For example, the flow path unit 120 may be implemented or the rotation speed of the fan 180 may be determined so that the air containing particles in the flow path unit 120 maintains a flow rate of 5 ml/sec, but the embodiment does not provide for this. not limited Also, in some cases, the fan 180 may be omitted.

Meanwhile, the light receiving unit 130 serves to incident the fourth light L4 that has passed through the flow path unit 120 , and for this purpose, it may be disposed on the optical axis LX under the flow path unit 120 . Here, the fourth light L4 passing through the flow path 120 may include at least one of scattered light and non-scattered light.

2 shows an exemplary profile of scattered light scattered by ionized particles (P).

Referring to FIG. 2 , the scattered light may refer to light scattered by the particles P included in the air passing through the flow passage 120 by the third light L3 emitted from the light emitting unit 110 . . The non-scattered light may refer to light in which the third light L3 emitted from the light emitting unit 110 travels to the light receiving unit 130 without being scattered by the particles P passing through the flow path unit 120 .

The light receiving unit 130 may receive the scattered light and may provide an electrical signal of the received light to the signal converting unit 140 .

On the other hand, the ionizer 150 serves to convert the polarity of the introduced air particles into ionized particles. That is, the ionizer 150 serves to ionize the particles to be scattered by the scattering unit SS. To this end, the ionizer 150 may be disposed in a path through which air flows before the air enters the scattering unit SS. The position of the ionization unit 150 will be described in detail later with reference to FIGS. 3, 4A, 5, 6A, 7 and 8A, which will be described later.

Particles included in the air may be ionized to have a positive or negative polarity in the ionizer 150 . To this end, for example, the ionizer 150 may ionize particles by corona discharge, but the embodiment is not limited to a specific method of ionizing the particles in the ionizer 150 . When corona discharge is used, ionization of molecules in the air occurs, and the ionized molecules are attached to the surface of the particles P, so that the particles P can be ionized.

The repulsive force generating unit 160 generates a repulsive force having the same polarity as the polarity of the ionized particles, and serves to apply a repulsive force to the ionized particles entering the scattering unit SS. When the particles P entering the scattering unit SS are ionized with positive or negative polarity, and the repulsive force generating unit 160 applies a repulsive force of the same polarity as the ionized polarity to the ionized particles, Coulomb ( A repulsive force (or electrostatic repulsion) acts by the Coulomb force. For this reason, it is possible to prevent the particles P from flowing from the scattering unit SS toward the light emitting unit 110 or the light receiving unit 130 . That is, the particles may not flow toward the light emitting unit 110 through the first opening OP1 and may not flow toward the light receiving unit 130 through a third opening OP3 to be described later. Accordingly, it is possible to prevent the particles P from contaminating the light emitting unit 110 or the light receiving unit 130 .

In the case of FIG. 1 , the flow path unit 120 is illustrated as being spaced apart from the ionization unit 150 and the repulsive force generating unit 160 , respectively, but this is to explain the concept of the particle sensing device 100 according to the embodiment. That is, as shown in FIGS. 3 to 8C and FIGS. 12 to 15 , which will be described later according to the manner in which the flow path unit 120 is implemented, the flow path unit 120 includes an ionization unit 150 and a repulsive force generating unit 160 and They may be disposed adjacent to each other.

The light absorbing unit 144 serves to absorb the fifth light L5 that has passed through the light receiving unit 130 , and for this purpose, it may be disposed on the optical axis LX under the light receiving unit 130 . The light absorbing unit 144 may correspond to a kind of dark room that absorbs and confines unnecessary light (hereinafter, 'main light') that is not received by the light receiving unit 130 and travels in a straight line.

Meanwhile, referring back to FIG. 1 , the housing 170 serves to accommodate the light emitting unit 110 , the flow path unit 120 , the light receiving unit 130 , and the light absorption unit 144 . For example, the housing 170 may include a top portion 172 , a middle portion 174 , and a bottom portion 176 . The top part 172 is a part that can accommodate the light emitting part 110 , the middle part 174 is a part that can accommodate the flow path part 120 and the fan 180 , and the bottom part 176 is a part that can accommodate the light receiving part 130 and light. It is a part that can accommodate the absorption part (144).

In the case of FIG. 1 , the middle part 174 and the flow path part 120 of the housing 170 are illustrated as being separate, but the embodiment is not limited thereto. According to another embodiment, the flow passages 120A, 120B, and 120C may be formed by the middle portion 174 of the housing 170 as in the particle sensing devices 100A to 100D to be described later.

The signal converter 140 may convert the signal in the form of a current incident from the light receiver 130 into a signal in the form of a voltage, and output the converted result to the information analyzer 142 as an electrical signal. In some cases, the signal converting unit 140 may be omitted, and the light receiving unit 130 may serve as the signal converting unit 140 . In this case, the electrical signal output from the light receiving unit 130 may be directly provided to the information analyzing unit 142 .

The information analysis unit 142 uses an electrical signal provided from the signal conversion unit 140 (or, if the signal conversion unit 140 is omitted, the light receiving unit 130), the number, concentration, size or shape of the particles (P). At least one of them can be analyzed.

Hereinafter, embodiments 100A to 100D of the particle sensing device 100 shown in FIG. 1 will be described with reference to the accompanying drawings.

3 is a cross-sectional view of an embodiment 100A of the particle sensing device 100 shown in FIG. 1 . For ease of understanding, the light traveling in FIG. 3 is indicated by a shade (L).

The particle sensing device 100A shown in FIG. 3 includes a light emitting unit 110A, a flow path unit 120A, a light receiving unit 130A, a light absorption unit 144, an ionization unit 150A, a repulsive force generating unit 160A, and a housing. It includes 172 and 176 and the fan 180, and the signal converter 140 and the information analyzer 142 shown in FIG. 1 are omitted.

3 , the light emitting unit 110A, the flow path unit 120A, the light receiving unit 130A, the light absorption unit 144, the ionization unit 150A, the repulsive force generating unit 160A, the housings 172 and 176, and the fan shown in FIG. Reference numeral 180 denotes the light emitting unit 110, the flow path unit 120, the light receiving unit 130, the light absorption unit 144, the ionization unit 150, the repulsive force generating unit 160, the housing 172, shown in FIG. 176) and the fan 180, respectively, perform the same function, and thus redundant description of each function of the component shown in FIG. 3 will be omitted.

Referring to FIG. 3 , the light source unit 112A includes only one light source, and the lens unit 114A includes only one lens. The lens 114A is disposed on the optical axis LX between the light source 112A and the first opening OP1 , and serves to condense the light emitted from the light source 112A into the first opening OP1 .

4A is an enlarged cross-sectional view of part 'A1' in order to explain the flow path part 120A, the ionization part 150A, and the repulsive force generator 160A shown in FIG. 3, and FIGS. 4B and 4C are FIG. 3 In order to explain other embodiments (160B, 160C) of the repulsive force generating unit 160A shown in Fig. 3, as an enlarged cross-sectional view according to the embodiments (B11, B12) of the part 'B1', the fan shown in Fig. 3 for convenience of explanation The illustration of 180 is omitted from FIGS. 4A-4C .

Referring to FIGS. 3 and 4 , the flow path part 120A includes a flow path inlet part FI, an entry side flow path middle part FII1, a scattering part SS, an outlet side flow path middle part FII2, and a flow path outlet part ( FO) may be included.

The flow path inlet FI is a portion into which air, which may include particles P, is introduced, and may include an inlet IH and an inflow path. Here, the inlet IH corresponds to an inlet of the flow path 120A through which air flows in the IN1 direction from the outside, and the inflow path corresponds to a path formed between the inlet IH and the inlet side flow path middle portion FII1. do.

The flow path outlet FO is a portion through which air, which may include particles P, is discharged, and may include an outlet OH and an outflow path. Here, the outlet OH corresponds to an outlet of the flow path 120A through which air flows out in the OUT1 direction, and the outflow path corresponds to a path formed between the outlet-side flow path intermediate portion FII2 and the outlet OH. do.

The scattering unit SS is disposed on a path after the ionization unit 150A, and the optical axis is between the light emitting unit 110A and the light receiving unit 130A and between the entrance-side flow path intermediate portion FII1 and the exit-side flow path intermediate portion FII2. (LX) may be located.

The scattering unit SS provides a space in which the light emitted from the light emitting unit 110A is scattered by the particles P. To this end, the scattering unit SS refers to the first opening OP1 and the first opening OP1 in the flow path units 120 and 120A in a direction in which the light emitting unit 110A and the light receiving unit 130A are opposed to each other (eg, the z-axis direction). It can be defined as an overlapping region. As such, since the scattering unit SS is disposed on the optical axis LX, air including ionized particles may flow while crossing the optical axis LX of the light emitting unit 110A.

The inlet flow path middle portion FII1 is located between the flow path inlet portion FI and the scattering unit SS, and the outlet side flow passage middle portion FII2 is located between the flow path entrance portion SS and the flow path outlet portion FO. can

According to an embodiment, the ionizer 150A may be disposed in at least one of the inlet IH, the inflow path, or the inlet-side flow path intermediate portion FII1.

Hereinafter, as illustrated in FIG. 4A , it will be described that the ionization unit 150A is disposed across the passage inlet FI and the inlet-side passage intermediate portion FII1 , but the embodiment is not limited thereto. According to another embodiment, although not shown, the ionizer 150A may be disposed inside or outside the flow path 120A while in contact with the inlet IH, and the scattering unit SS from the inlet IH. It may move further toward the side and be disposed on the inflow path of the flow path inlet FI, or may be disposed in the inlet-side flow path intermediate portion FII1 spaced apart from the flow path inlet F1. Even in this case, the following description will be Since it may be applied, a redundant description will be omitted. That is, as long as the ionized particles can be provided to the scattering unit SS, the embodiment is not limited to a specific position of the ionization unit 150A.

After the air containing the particles P is introduced through the inlet IH, it is ionized in the ionization unit 150A. Thereafter, the ionized particles proceed to the scattering unit SS through the inlet-side passage middle portion FII1 , and then pass through the outlet-side passage intermediate portion FII2 and are discharged through the passage outlet FO. As described above, the fan 180 may be disposed to help the air containing the particles P smoothly proceed to the flow passage 120A as described above. For example, as shown in FIG. 3 , the fan 180 may be disposed within the flow path outlet FO, or may be disposed adjacent to the outlet OH of the flow path exit FO, as shown in FIG. 3 . . Alternatively, according to another embodiment, the fan 180 may be disposed in the flow path inlet FI or adjacent to the inlet IH.

The third light L3 emitted from the first opening OP1 while the air containing the particles P passes through the flow passage 120A collides with the particles P in the scattering unit SS, and is shown in FIG. 2 . It spawns in a bar-like shape. At this time, in order to make all the particles P passing through the scattering unit SS collide with the third light L3 emitted from the light emitting unit 110A, the third light emitted from the first opening OP1 ( L3) a first area suitable for forming a light curtain in the scattering unit SS in a direction (eg, x-axis and z-axis) intersecting the direction in which air flows (eg, y-axis direction) The opening OP1 may have it.

Also, a cross-sectional area (eg, an area in the x-axis and z-axis directions) of the flow path part 120A may be smaller than an area (eg, an area in the x-axis and y-axis directions) of the first opening OP1. . For example, referring to FIG. 4A , when the length of the first opening OP1 in the x-axis direction is equal to the length of the flow path part 120A in the x-axis direction, the width D1 of the first opening OP1 is ) may be greater than the height D2 of the flow path part 120A. Alternatively, referring to FIG. 4A , when the first opening OP1 has a circular planar shape and the flow path part 120A has a circular lateral cross-sectional shape, in this case, the first opening OP1 moves in the y-axis direction. The diameter D1 may be larger than the diameter D2 of the flow path part 120A. The width (or diameter) D1 of the first opening OP1 may be 2 mm to 15 mm, for example 3 mm to 10 mm, preferably 4 mm to 6 mm, for example 5.5 mm, Examples are not limited thereto.

As such, when the cross-sectional area of the flow path part 120A is smaller than the area of the first opening part OP1, the amount of air including the particles P passing through the flow path part 120A increases, that is, the flow path part 120A. As the number of particles passing through is increased, a larger amount of particles can be sensed.

In addition, the cross-sectional area of the flow path part 120A may be smaller than the beam size of the light emitted from the first opening OP1 . Due to this, the amount of air including the particles P passing through the flow passage 120A increases, that is, the amount of particles passing through the flow passage 120A increases, so that a larger amount of the particles P is sensed. can be

As described above, as the amount of the particles P passing through the flow passage 120A increases, more information on the particles P can be secured, so that the information on the particles P can be analyzed more accurately. can

In order to allow many particles P to pass through, the flow path unit 120 shown in FIG. 1 may have various configurations other than the illustrated configuration.

5 is a cross-sectional view of another embodiment 100B of the particle sensing device 100 shown in FIG. 1 , and FIG. 6A is a flow path part 120B, an ionization part 150B and a repulsive force generating part shown in FIG. 160A) is an enlarged cross-sectional view of part 'A2', and FIGS. 6B and 6C are other embodiments (160B, 160D) of the repulsive force generating unit 160A shown in FIG. 5, 'B2' ' As an enlarged cross-sectional view according to the embodiments B21 and B22, the fan 180 illustrated in FIG. 5 is omitted from FIGS. 6A to 6C for convenience of description.

The cross-sectional shapes of the flow path part 120A shown in FIG. 3 and the flow path part 120B shown in FIG. 5 are different from each other, and the position where the ionization part 150A shown in FIG. 3 is disposed and the ionization part shown in FIG. The positions where 150B is arranged are different from each other. Except for this, since the particle sensing device 100B shown in FIG. 5 is the same as the particle sensing device 100A shown in FIG. 3 , a redundant description will be omitted. For example, the definition of the scattering unit SS described above with reference to FIG. 4A may also be applied to the flow path unit 120B shown in FIG. 6A .

Referring to FIGS. 3 and 4A , in the direction (eg, the x-axis direction and the z-axis direction) crossing the direction in which the air flows (eg, the y-axis direction), the flow path inlet FI, the inlet The cross-sectional areas of the side passage intermediate portion FII1 , the scattering portion SS, the outlet-side passage intermediate portion FII2 , and the passage outlet portion FO are constant.

On the other hand, the cross-sectional area of the inlet flow path middle portion FII1 in a direction (eg, x-axis and z-axis direction) intersecting the direction in which the air flows (eg, the y-axis direction) is the scattering part SS. It may include a portion that decreases as it approaches, and the cross-sectional area of the outlet-side flow path middle portion FII2 may include a portion that increases as it moves away from the scattering portion SS.

For example, as shown in FIGS. 5 and 6A , in the middle of the inlet flow path in a direction (eg, x-axis and z-axis direction) crossing the direction in which air flows (eg, y-axis direction) The cross-sectional area of the portion FII1 may decrease and then become constant as it approaches the scattering portion SS, and the cross-sectional area of the outlet-side flow path middle portion FII2 may become constant and then increase as it moves away from the scattering portion SS. Alternatively, unlike shown in FIGS. 5 and 6A , although not shown, the inlet is in a direction (eg, x-axis and z-axis direction) intersecting the direction in which air flows (eg, y-axis direction) The cross-sectional area of the side passage middle portion FII1 may continue to decrease as it approaches the scattering portion SS, and the cross-sectional area of the exit-side passage intermediate portion FII2 may continue to increase as it moves away from the scattering portion SS.

In addition, unlike shown in FIGS. 3 and 4A , in a direction (eg, x-axis and z-axis direction) crossing the direction in which air flows (eg, y-axis direction), the flow path inlet FI ) and a cross-sectional area of the flow passage outlet FO may be larger than a cross-sectional area of the scattering unit SS.

In addition, in the flow path portions 120A and 120B shown in FIGS. 4A and 6A , the opening region in which the inlet-side flow path intermediate portion FII1 (or the outlet-side flow passage intermediate portion FII2) and the scattering portion SS communicate with each other. When the second opening OP2 is defined, the area of the first opening OP1 (eg, the areas in the x-axis and y-axis directions) is the same as the direction in which the air flows (eg, the y-axis direction) and The cross-sectional area of the second opening OP2 may be larger than the cross-sectional area of the second opening OP2 in the intersecting direction (eg, in the x-axis and z-axis directions).

For example, referring to FIGS. 4A and 6A , when the length of the first opening OP1 in the x-axis direction is the same as the length of the second opening OP2 in the x-axis direction, the first opening OP1 The width D1 may be greater than the height D4 of the second opening OP2. Alternatively, referring to FIGS. 4A and 6A , when the first opening OP1 has a circular planar shape and the second opening OP2 has a circular lateral cross-sectional shape, the diameter D1 of the first opening OP1 is may be larger than the diameter D4 of the second opening OP2 .

In addition, unlike shown in FIGS. 3 and 4A , the ionization unit 150B is disposed only in the inlet-side flow path middle portion FII1 .

When the flow path portion 120B has a cross-sectional shape as shown in FIGS. 5 and 6A , due to a change in the cross-sectional area of the inlet and outlet flow path intermediate portions FII1 and FII2, more particles P are introduced into the flow path. It can pass through the part 120B, so the accuracy of sensing the particle P can be increased.

7 is a cross-sectional view of another embodiment 100C of the particle sensing device 100 shown in FIG. 1 , and FIG. 8A is an embodiment 160F of the repulsive force generating unit 160E shown in FIG. 7 , a flow path part (120C), an enlarged cross-sectional view of part 'A3' to explain the ionization unit 150C, FIGS. 8B and 8C are other embodiments (160C, 160G) of the repulsive force generating unit 160E shown in FIG. 7 . In order to describe , it is an enlarged cross-sectional view of part 'B3' according to the embodiments (B31 and B32), and the fan 180 shown in FIG. 7 is omitted from FIGS. 8A to 8C for convenience of description.

The cross-sectional shapes of the flow path part 120A shown in FIG. 3 and the flow path part 120C shown in FIG. 7 are different from each other, and the position where the ionization part 150A shown in FIG. 3 is disposed and the ionization part shown in FIG. The positions of 150C are different from each other, and the cross-sectional shape of the repulsive force generating unit 160A shown in FIG. 3 and the cross-sectional shape of the repulsive force generating unit 160E shown in FIG. 7 are different from each other. Except for this, since the particle sensing device 100C shown in FIG. 7 is the same as the particle sensing device 100A shown in FIG. 3 , a redundant description will be omitted.

In the case of FIGS. 3 and 4A , in the direction (eg, the x-axis direction and the z-axis direction) crossing the direction in which the air flows (eg, the y-axis direction), the flow path inlet FI, the inlet side The cross-sectional areas of the flow path intermediate portion FII1 , the scattering portion SS, the outlet-side flow path intermediate portion FII2 , and the flow path exit portion FO are constant.

On the other hand, in the case of FIGS. 7 and 8A , in the direction (eg, the x-axis and the z-axis direction) crossing the direction in which the air flows (eg, the y-axis direction), the inlet flow path middle part FII1 ) decreases and then increases as it approaches the scattering part SS. In addition, in the direction (eg, the x-axis and z-axis direction) intersecting the direction in which the air flows (eg, the y-axis direction), the cross-sectional area of the outlet-side flow path middle part FII2 is the scattering part SS) It decreases and then increases as the distance from it increases.

In addition, the opening having the smallest cross-sectional area in the direction intersecting the direction in which air flows in the inlet-side intermediate passage portion FII1 (or the outlet-side intermediate passage portion FII2) of the passage portion 120C illustrated in FIG. 8A . When the region is defined as the second opening OP2 , the area of the first opening OP1 (eg, the areas in the x-axis and y-axis directions) is the direction in which air flows (eg, the y-axis direction). The cross-sectional area of the second opening OP2 may be larger than the cross-sectional area of the second opening OP2 in a direction (eg, the x-axis and z-axis directions) intersecting the .

For example, referring to FIG. 8A , when the length of the first opening OP1 in the x-axis direction is equal to the length of the second opening OP2 in the x-axis direction, the width ( D1 may be greater than a height D4 of the second opening OP2 . Alternatively, referring to FIG. 8A , when the first opening OP1 has a circular planar shape and the second opening OP2 has a circular lateral cross-sectional shape, the diameter D1 of the first opening OP1 is the second It may be larger than the diameter D4 of the opening OP2.

For example, the height D4 of the second opening OP2 shown in FIGS. 4A , 6A and 8A may be between 1 mm and 10.0 mm, for example between 1 mm and 5.0 mm, preferably between 1 mm and 2.0 mm For example, it may be 2 mm, but the embodiment is not limited thereto. As described above, according to the embodiment, since the height D4 of the second opening OP2 is reduced, the size of the entire particle sensing apparatuses 100A to 100C may be reduced.

In addition, in order to allow more particles to pass through the flow passages 120 : 120A, 120B, and 120C, there should be no change in the volume of the flow rate of the air passing through the flow passage 120 . To this end, when a double nozzle (DN: Double Nozzle) structure is formed by the second opening OP2 as shown in FIGS. 7 and 8A , the volume change of the flow rate of the air passing through the flow passage 120C is Even when there is, it is possible to adjust the flow rate of air to the extent that it is easy to measure, so that the accuracy of sensing the particles (P) can be increased. For example, since a bottleneck is created by the double nozzle structure, more particles P can pass through the flow path part 120C, so that the accuracy of sensing the particles P can be increased.

The structures of the flow passages 120A, 120B, and 120C shown in FIGS. 3, 4A, 5, 6A, 7 and 8A are only examples. That is, if more air can be introduced through the flow passages 120A, 120B, and 120C, the embodiment is not limited to a specific example of the flow passage 120 .

In addition, as illustrated in FIGS. 6A and 8A , in a direction (eg, x-axis and z-axis direction) intersecting the direction in which air flows (eg, y-axis direction), the inlet (IH) and A cross-sectional area of each outlet OH may be greater than an area of the first opening OP1 and greater than a cross-sectional area of the second opening OP2 .

Alternatively, in a direction (eg, x-axis and z-axis direction) crossing the direction in which air flows (eg, y-axis direction), the inflow path of the flow path inlet part FI and the flow path exit part FO The widest cross-sectional area of each of the outflow paths may be greater than the area of the first opening OP1 and greater than the cross-sectional area of the second opening OP2 .

For example, when the x-axis length of each of the inlet IH and the outlet OH and the x-axis length of each of the first and second openings OP1 and OP2 are the same, the inlet IH and the outlet OH ) each of the height D2 in the z-axis direction is greater than the width D1 in the y-axis direction of the first opening OP1, and is greater than the height D4 in the z-axis direction of the second opening OP2. can

Also, for example, when the flow path inlet FI, the flow path outlet FO, and the second opening OP2 each have a circular lateral cross-sectional shape, and the first opening OP1 has a circular planar shape, the inlet A diameter D2 of each of the IH and the outlet OH may be greater than the diameter D1 of the first opening OP1 and greater than the diameter D4 of the second opening OP2 .

The height (or diameter) D2 of the inlet IH may be between 1 mm and 15 mm, for example between 2 mm and 8 mm, preferably between 3 mm and 4 mm, for example, 3.5 mm, but in an embodiment is not limited thereto. In addition, the height (or diameter) of the outlet OH may be 5 mm to 25 mm, for example 8 mm to 15 mm, preferably 10 mm to 12 mm, for example 11 mm, but in an embodiment It is not limited to this.

Or, for example, when the x-axis length of each of the inlet IH and the outlet OH and the x-axis length of each of the first opening OP1 and the second opening OP2 are the same, the inflow path and the outflow path, respectively The highest height in the z-axis direction may be greater than the width D1 of the first opening OP1 in the y-axis direction and greater than the height D4 of the second opening OP2 in the z-axis direction.

Also, for example, when each of the flow path inlet FI, the flow path outlet FO, and the second opening OP2 has a circular lateral cross-sectional shape, and the first opening OP1 has a circular planar shape, the inflow In each of the path and the outflow path, the largest diameter may be greater than the diameter D1 of the first opening OP1 and greater than the diameter D4 of the second opening OP2 .

Meanwhile, referring back to FIG. 1 , the light receiving unit 130 may have various structures in order to accurately detect the light scattered from the particles P. The light receiving unit 130A shown in FIGS. 3, 5 and 7 corresponds to an embodiment of the light receiving unit 130 shown in FIG. 1 .

9 is an enlarged cross-sectional view of part 'C' shown in FIG. 3 .

3 and 9 , the light receiving unit 130A may include a light transmitting member 132 and a light sensing unit 134 . In addition, the light receiving unit 130A may further include the light guide unit 136A, but in some cases, the light guide unit 136A may be omitted.

The light-transmitting member 132 may be implemented with a material that can transmit light, for example, it may be implemented with glass. The light transmitting member 132 may include a first surface 132-1 and a second surface 132-2. The first surface 132-1 corresponds to the upper surface (ie, the top surface) of the light-transmitting member 132 facing the scattering unit SS, and the second surface 132-2 is the first surface 132-1. As a surface opposite to , it may correspond to a lower surface (ie, a bottom surface) of the light-transmitting member 132 .

The light sensing unit 134 and the light guide unit 136A may be disposed around the optical axis of the light transmitting member 132 . The light sensing unit 134 and the light guide unit 136A may be disposed on opposite surfaces of the light transmitting member 132 . For example, as shown in FIG. 9 , the light sensing unit 134 is disposed on the second surface 132 - 2 of the light transmitting member 132 , and the light guide unit 136A is disposed on the light transmitting member 132 . It may be disposed on the first surface 132-1. Alternatively, unlike shown in FIG. 9 , the light sensing unit 134 is disposed on the first surface 132-1 of the light-transmitting member 132 , and the light guide unit 136A is disposed on the second surface of the light-transmitting member 132 . It may be disposed on the surface 132-2. Hereinafter, the light sensing unit 134 is disposed on the second surface 132 - 2 of the light transmitting member 132 , and the light guide unit 136A is disposed on the first surface 132-1 of the light transmitting member 132 . However, the following description can be applied even in the opposite case.

The light sensing unit 134 is disposed on the periphery of the optical axis LX under the light transmitting member 132 , and after being scattered by the particles P in the scattering unit SS, the light incident through the light receiving unit OP3 . can be sensed. The light-receiving incident portion will be described later.

FIG. 10 shows a planar shape of an embodiment 134A of the light sensing unit 134 shown in FIG. 9 .

Referring to FIG. 10 , the photodetector 134A may include a central portion 134 - 1 and a photodiode 134 - 2 . The central part 134 - 1 is positioned on the optical axis LX to transmit the main light passing through the scattering part SS to the light absorbing part 144 , and may be made of a translucent material. For example, the central portion 134 - 1 may be made of glass.

Also, the central portion 134 - 1 may cover the light entrance OPL of the light absorption portion 144 . As such, when the central portion 134 - 1 covers the light inlet OPL, penetration of particles or foreign substances into the light absorbing portion 144 may be prevented, and the particles P passing through the scattering portion SS may It is possible to prevent the light absorbing part 144 from entering, so that the flow of the particles P in the flow path part 120A may be smoothed and a measurement error may also be reduced.

In addition, when the photodiode 134 - 2 is disposed on the second surface 132 - 2 of the light transmitting member 132 , damage to the photodiode 132 - 2 due to foreign substances can be prevented.

The photodiode 134-2 is disposed around the central portion 134-1, and serves to sense light scattered by the particles P. The photodiode 134-2 corresponds to an active region that absorbs light in a general photodiode structure.

For example, the photodiode 134-2 may detect light in a wavelength band of 380 nm to 1100 nm, but the embodiment is not limited to a specific wavelength band detectable by the photodiode 134-2. In addition, so that scattered light can be well sensed, the photodiode 134-2 may have a sensitivity of 0.4 A/W in a wavelength band of 660 nm or a sensitivity of 0.3 A/W in a wavelength band of 450 nm. is not limited thereto.

Referring to FIG. 10 , the width W1 of the light sensing unit 134A may be 5 mm to 20 mm, for example, 7 mm to 15 mm, preferably 8 mm to 10 mm, but the embodiment is limited thereto. doesn't happen

In addition, the width W2 of the central portion 134-1 may be 3 mm to 18 mm, for example, 5 mm to 13 mm, preferably 7 mm to 9 mm, but the embodiment is not limited thereto.

In addition, the width W3 on the plane of the photodiode 134-2 may be 0.1 mm to 5 mm, for example, 1 mm to 3 mm, preferably 1.5 mm to 2.5 mm, but the embodiment is not limited thereto. does not

In addition, although not illustrated, the light sensing unit 134 illustrated in FIG. 9 may have various planar shapes different from those illustrated in FIG. 10 . For example, the planar shape of the photodiode 134 - 2 shown in FIG. 10 is a circular annular shape, but the embodiment is not limited thereto. If the photodetector 134 may include the central portion 134-1, the photodiode 134-2 may have various planar shapes. For example, the photodiode 134-2 may have a polygonal ring shape such as a rectangular ring shape, a square ring shape, or a triangular ring shape or an elliptical ring shape instead of a circular ring shape.

FIG. 11 shows a planar shape of another embodiment 134B of the light sensing unit 134 shown in FIG. 9 .

The photodiode 134 - 2 may include a plurality of sensing segments spaced apart from each other on the same plane. For example, as illustrated in FIG. 11 , the photodiode 134-2 may include a plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 spaced apart from each other. .

Even when the photodiode 134 - 2 has a polygonal or elliptical ring shape, it may be divided into a plurality of sensing segments spaced apart from each other as shown in FIG. 11 .

Also, the plurality of sensing segments 134-21 , 134-22 , 134-23 , and 134-24 illustrated in FIG. 11 may be arranged at equal intervals or spaced apart from each other at different intervals. For example, as the spaced distance G of the plurality of sensing segments 134-21 , 134-22 , 134-23 , and 134-24 increases, a signal level may increase to increase design freedom. For example, the gap G may be 0.01 mm to 1 mm, for example, 0.1 mm to 0.5 mm, preferably 0.15 mm to 0.25 mm, but the embodiment is not limited thereto.

Also, the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 may have the same planar area or different planar areas.

In addition, the light sensing unit 134A or 134B illustrated in FIG. 10 or 11 may be symmetrically disposed on a plane, but the embodiment is not limited thereto. According to another embodiment, the light sensing unit 134A or 134B may be asymmetrically disposed on a plane.

In addition, the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 may be arranged symmetrically or asymmetrically in a plane.

As for the widths W1, W2, and W3 shown in FIG. 11, the contents described in FIG. 10 may be applied.

For example, like the photodiode 134-2, each of the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 may detect light in a wavelength band of 380 nm to 1100 nm. , the embodiment is not limited to a specific wavelength band that can be detected by the plurality of sensing segments 134-21 , 134-22 , 134-23 , and 134-24 . In addition, each of the plurality of sensing segments 134-21 , 134-22 , 134-23 , 134-24 has a sensitivity of 0.4A/W in a wavelength band of 660 nm, or 450 so that the scattered light can be sensed well. It may have a sensitivity of 0.3 A/W in nm, but the embodiment is not limited thereto.

11 , when the photodiode 134-2 is disposed to be spaced apart from the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24, the information analysis unit 142 may predict the shape of the particle by using the relative size of a result sensed in each of the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24.

If the shape of the particle P is symmetrical, for example, a spherical shape, the intensity of scattered light detected by each of the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 is the same. As such, when the intensity of the light detected by the plurality of sensing segments 134-21, 134-22, 134-23, and 134-24 is the same, the information analysis unit 142 determines that the particle P has a symmetrical shape. You can decide to have

On the other hand, when the shape of the particle P is asymmetrical, for example, non-spherical, the intensity of scattered light sensed in each of the plurality of sensing segments 134-21 , 134-22 , 134-23 and 134-24 is different from each other. . As such, when the intensity of light detected by the plurality of sensing segments 134-21 , 134-22 , 134-23 , and 134-24 is different from each other, the information analysis unit 142 determines that the particle P has an asymmetric shape. it can be decided that In addition, in order to predict various shapes of particles, of course, the divided shape and divided number of the plurality of sensing segments may be changed.

Like the light source 112A of the light emitting unit 110A, the above-described packaging form of the photodiodes 134-2, 134-21 to 134-24 of the light receiving unit 130A may be implemented as an SMD type or a lead type. However, the embodiment is not limited to a specific packaging type of the photodiodes 134-2 and 134-21 to 134-24.

Meanwhile, the light receiving unit may be disposed between the scattering unit SS and the light receiving unit 130A to adjust the amount of light incident to the light receiving unit 130A. To this end, as shown in FIGS. 3, 5, and 7 , the light receiving unit may include a third opening OP3 disposed on the optical axis LX.

The third opening OP3 has a suitable area (eg, the x-axis and the y area in the axial direction).

For example, when the distance from the center of the scattering unit SS to the fifth opening OP5 to be described later is 12° left and right with respect to the optical axis LX among the light scattered by the particles P in the scattering unit SS That is, when the predetermined angle θ shown in FIGS. 3, 5 and 7 is 24°, 20% of the total light scattered from the particles P may be incident to the light receiving unit 130A, and the predetermined angle ( When θ) is 60° (ie, 30° left and right with respect to the optical axis LX), 50% of the total light scattered from the particles P may be incident to the light receiving unit 130A. Considering this, according to the embodiment, the third opening OP3 has a left-right sum of the light scattered by the particles P based on the optical axis LX, that is, the predetermined angle θ is 24° to 60°. For example, it may have an area suitable for light in a range of 30° left and right with respect to the optical axis LX to be incident on the light receiving unit 130A. As described above, it can be seen that the amount of light incident to the light receiving unit 130A can be adjusted by adjusting the area of the third opening OP3 .

In addition, referring to FIGS. 4A , 6A and 8A , the area of the third opening OP3 (eg, the area in the x-axis and y-axis directions) is the area of the first opening OP1 (eg, area in the x-axis and y-axis directions). For example, when the third opening OP3 has a circular planar shape and the diameter D3 of the third opening OP3 is greater than 10 mm, the photodiodes 134-2 and 134-21 to 134-24 As more scattered light than the area of , may be introduced, optical noise may occur. In addition, when the diameter D3 of the third opening OP3 is less than 2 mm, the amount of scattered light received from the photodiodes 134-2 and 134-21 to 134-24 is reduced, and thus the photodiodes 134-2 and 134-21. to 134-24), the magnitude of the detected signal may be small. Accordingly, the diameter D3 of the third opening OP3 may be 1 mm to 12 mm, for example, 1 mm to 6 mm, preferably 2 mm to 4 mm, for example, 3 mm. not limited

Meanwhile, referring back to FIG. 9 , the light guide unit 136A serves to guide the light scattered by the scattering unit SS to the light sensing unit 134 . To this end, for example, the light guide part 136A may include inner partition walls 136 - 1 and 136 - 2 and outer partition walls 136 - 3 and 136 - 4 . If the inner partition walls 136-1 and 136-2 have a circular planar shape, the inner partition walls 136-1 and 136-2 are integral and the outer partition walls 136-3 and 136-4 have a circular planar shape. In the case of having the outer partition walls 136-3 and 136-4 may be integral.

The inner partition walls 136 - 1 and 136 - 2 have a fourth opening OP4 overlapping the light inlet OPL of the light absorbing part 144 in a direction parallel to the optical axis LX (eg, the z-axis direction). can be defined. In the inner partition walls 136 - 1 and 136 - 2 , the scattered light passing through the third opening OP3 proceeds to the fifth opening OP5 , and the main light passing through the third opening OP3 is transmitted through the fourth opening. It can have a height H1 that allows it to proceed to (OP4). That is, the inner partition walls 136 - 1 and 136 - 2 serve to separate the main light and the scattered light.

The height H1 of the inner partition walls 136-1 and 136-2 may be 1 mm to 15 mm, for example 2 mm to 10 mm, preferably 3 mm to 6 mm, for example 5 mm, but in practice Examples are not limited thereto.

The outer barrier ribs 136 - 3 and 136 - 4 form a fifth opening OP5 overlapping the photodiode 134 - 2 in a direction parallel to the optical axis LX (eg, the z axis direction) to form the inner barrier rib 136 . -1, 136-2) can be defined together.

The width W4 of the fifth opening OP5 may be 0.1 mm to 6 mm, for example, 0.5 mm to 3 mm, preferably 0.8 mm to 1.5 mm, for example, 1 mm, but the embodiment is not limited thereto. does not

When the inner partition walls 136-1 and 136-2 and the outer partition walls 136-3 and 136-4 are disposed as described above, as indicated by the arrows in FIG. 3 , incident to the third opening OP3 The scattered light may travel to the photodiode 134 - 2 of the light sensing unit 134 , and the main light incident through the third opening OP3 may travel toward the light absorption unit 144 .

Meanwhile, the light receiving unit 130A may further include the sensing support 138 , but in some cases, the sensing support 138 may be omitted.

The sensing support 138 serves to support the light sensing unit 134 , and may be implemented separately from the bottom part 176 of the housing 170 as shown in FIG. 3 , or as shown in FIG. 3 , the housing 170 . ) may be implemented integrally with the bottom portion 176 of the.

Meanwhile, according to an embodiment, as illustrated in FIG. 3 , the light absorption part 144 may include a protrusion part 144A and an absorption case 144B. The absorption case 144B defines an optical entrance OPL through which the light passing through the light receiving unit 130A is incident, and serves to receive the main light passing through the light receiving unit 130A. The width of the light entrance OPL (eg width in the y-axis direction) may be 2 mm to 15 mm eg 3 mm to 10 mm preferably 4 mm to 6 mm eg 5.5 mm However, the embodiment is not limited thereto.

To this end, the inner wall of the absorption case 144B may be coated with a material having light absorption. In the case of FIG. 3 , the absorption case 144B and the bottom portion 176 of the housing 170 are illustrated as being separate, but the embodiment is not limited thereto. That is, as in the particle sensing device 100D to be described later, the bottom portion 176 of the housing 170 and the absorption case 144B may be integrally formed. That is, the bottom portion 176 of the housing 170 may also serve as the absorption case 144B.

Also, the protrusion 144A may have a shape protruding from the bottom surface of the absorption case 144B toward the light inlet OPL. In addition, the width of the protrusion 144A may become narrower toward the optical inlet OPL from the bottom surface of the absorption case 144B. For example, as illustrated in FIG. 3 , the protrusion 144A may have a circular (pendulum) cross-sectional shape, but the embodiment is not limited thereto. In this way, when the protrusion 144A is disposed, the main light incident to the optical entrance OPL is reflected from the inner wall of the absorption case 144B and escapes to the optical entrance OPL, and the optical entrance OPL is prevented. By reflecting the main light incident through the absorbing case 144B to the inner wall of the absorbing case 144B, the absorption rate of the main light incident to the light entrance OPL may be improved.

12 is a cross-sectional view showing another embodiment 100D of the particle sensing device 100 shown in FIG. 1 , FIG. 13 is a side view of the particle sensing device 100D shown in FIG. 12 , and FIG. 14 is 12 is a top perspective view of the particle sensing device 100D shown in FIG. 12 , FIG. 15 is a left perspective view of the particle sensing device 100D shown in FIG. 14 , respectively, and FIG. 16 is II′ shown in FIG. 14 . A plan view cut along a line is shown.

In FIGS. 12 to 16, only parts different from those shown in FIGS. 3 to 11 will be described. Accordingly, it goes without saying that the descriptions of FIGS. 3 to 11 may be applied to parts not described with respect to FIGS. 12 to 16 other than the parts described below.

While the packaging form of the light source 112A in the particle sensing devices 100A, 100B, and 100C shown in FIGS. 3, 5 and 7 is an SMD type, the particle sensing device 100D shown in FIGS. 12 to 15 is The light source unit 112B may be a dome type (or through hole type) LED, but the embodiment is not limited thereto. For example, the diameter φ of the dome-type light emitting unit 110B may be 3 mm to 5 mm, and the view angle may be 20° or less, but the embodiment is not limited thereto.

In addition, the operating temperature of the photodiode 134-2 may be -10°C to 50°C, but the embodiment is not limited to a specific operating temperature of the photodiode 134-2.

The lens unit 114A of the particle sensing devices 100A, 100B, and 100C shown in FIGS. 3, 5 and 7 includes only one lens, while the particle sensing device 100D shown in FIGS. 12 to 15 is used. The lens unit 114B may include first and second lenses 114B-1 and 114B-2. The first lens 114B-1 serves to convert the light emitted from the light source unit 112B into parallel light, and the second lens 114B-2 receives the parallel light emitted from the first lens 114B-1. It may serve to collect light through the first opening OP1 .

In the case of the particle sensing devices 100A, 100B, and 100C shown in FIGS. 3, 5 and 7, the top 172 of the housing 170 and the light emitting case 116 are separate, whereas in FIGS. 12 to 15 In the case of the illustrated particle sensing device 100D, the top portion 172 of the housing 170 and the light emitting case 116 are integrated. That is, it can be seen that the top portion of the housing 170 serves as the light emitting case 116 .

The flow path part 120C of the particle sensing device 100D shown in FIGS. 12 to 15 may have a double nozzle DN structure like the flow path part 120C shown in FIGS. 7 and 8A . Therefore, the overlapping description of the flow path part 120C shown in FIGS. 12 to 15 is replaced with the description of the flow path part 120C with respect to FIGS. 7 and 8A .

In FIG. 12 , the minimum width D5 of the outlet-side flow path intermediate portion FII2 is 1 mm to 15 mm, for example 2 mm to 8 mm, preferably 3 mm to 5 mm, for example 4 mm. However, the embodiment is not limited thereto.

FIG. 17 is an enlarged cross-sectional view of part 'D' shown in FIG. 12 .

Referring to FIG. 17 , the light receiving unit 190 may include a light guide unit 192 , a cover light transmitting unit 194 , and a light blocking unit 196 .

The light guide unit 192 may be disposed between the scattering unit SS and the light receiving unit 130B to define the third opening OP3 . Here, the characteristics of the third opening OP3 may be the same as those of the third opening OP3 described above with reference to FIG. 3 . That is, the third opening OP3 has an area (eg, the x-axis) suitable for 20% to 80% of the total amount of light scattered by the particles P in the scattering unit SS to be incident on the light receiving unit 130B. an area having a length in the direction and a width in the y-axis direction). In addition, among the light scattered by the particles P, the predetermined angle θ of the left and right summed from the center of the scattering unit SS to the fifth opening OP5 with respect to the optical axis LX is 24° to 60°, for example. For example, the third opening OP3 may have an area such that light in a range of 60° is suitable to be incident on the light receiving unit 130B. As described above, it can be seen that the amount of light incident to the light receiving unit 130B can be adjusted by adjusting the area of the third opening OP3 .

Also, the area of the third opening OP3 may be different from the area of the first opening OP1 . For example, the area of the first opening OP1 may be larger than the area of the third opening OP3 . In this case, the focal point of the light emitted from the light emitting unit 110B is formed to be farther than the center of the scattering unit SS, so that a measurement error due to the main beam can be reduced.

The light blocking part 196 may be disposed between the scattering part SS and the light guide part 192 to define the sixth opening OP6 . By adjusting the width W5 of the sixth opening OP6 , the main light is blocked from being incident on the photodiode 134 - 2 or is incident on the light receiving unit 130B and proceeding to the light absorbing unit 132 . can be adjusted.

The width W5 of the sixth opening OP6 may be 1 mm to 15 mm, for example, 2 mm to 8 mm, preferably 3 mm to 4 mm, for example, 3.5 mm, but the embodiment is not limited thereto. does not

By disposing the light blocking unit 196 in this way, the main light may be blocked from proceeding to the photodiode 134 - 2 of the light sensing unit 134 through the fifth opening OP5 . Here, the light sensing unit 134 may be implemented in the form of a module.

Also, the cover light-transmitting part 194 may be disposed between the third opening OP3 and the sixth opening OP6 . The light-transmitting cover 194 serves to block foreign matter from entering the light-receiving unit 130B. By disposing the light-transmitting cover 194, it is possible to prevent the particles P passing through the scattering unit SS from penetrating into the light-receiving unit 130B, so that the flow of the particles P in the flow path unit 120C can be smooth. and can reduce measurement error. In this case, even when the photodiodes 134-2 and 134-21 to 134-24 are formed on any of the first surface 132-1 and the second surface 132-2 of the light transmitting member 132, the Damage to the photodiodes 134-2 and 134-21 to 134-24 can also be prevented.

18 is an enlarged cross-sectional view of part 'E' shown in FIG. 12 .

The light sensing unit 134 and the light guide unit 136B illustrated in FIG. 18 may be disposed around the optical axis LX of the light transmitting member 132 . The light sensing unit 132 and the light guide unit 136B may be disposed on opposite surfaces of the light transmitting member 132 . For example, as shown in FIG. 18 , the light sensing unit 134 is disposed on the second surface 132 - 2 of the light transmitting member 132 , and the light guide unit 136B is disposed on the light transmitting member 132 . It may be disposed on the first surface 132-1. Alternatively, unlike shown in FIG. 18 , the light sensing unit 134 is disposed on the first surface 132-1 of the light-transmitting member 132 , and the light guide unit 136B is disposed on the second surface of the light-transmitting member 132 . It may be disposed on the surface 132-2. Here, the first surface 132-1 and the second surface 132-2 are as defined in the above description of FIG. 9 . Hereinafter, the light sensing unit 134 is disposed on the second surface 132 - 2 of the light transmitting member 132 , and the light guide unit 136B is disposed on the first surface 132-1 of the light transmitting member 132 . However, the following description can be applied even in the opposite case.

The cross-section shown in FIG. 18 is the same as the cross-section shown in FIG. 9, except that the inner partition walls 136-1 and 136-2 have different structures. Accordingly, the same reference numerals are used for the same parts as in the cross section shown in FIG. 9 and a brief description will be given, and only other parts will be mainly described as follows.

In the inner partition walls 136 - 1 and 136 - 2 , the scattered light passing through the third opening OP3 proceeds to the fifth opening OP5 , and the main light passing through the sixth opening OP6 passes through the fourth opening. It can have a height H2 that allows it to proceed to (OP4). For example, the height H2 may be 1 mm to 15 mm, for example, 2 mm to 10 mm, preferably 3 mm to 6 mm, for example, 5 mm, but the embodiment is not limited thereto.

Each of the inner partition walls 136-1 and 136-2 extends from the inner portions 136-11 and 136-21 and the inner portions 136-11 and 136-21 defining the fourth opening OP4 to form the outer partition wall 136. 3 and 136 - 4 may include outer portions 136 - 12 and 136 - 22 defining the fifth opening OP5 . The diameter of the fourth opening OP4 having a circular planar shape should be larger than the focusing size of the main beam. If the diameter of the fourth opening OP4 is smaller than 1 mm, all of the main beam does not pass through the fourth opening OP4 and is incident on the photodiode 134-2 and is scattered by the photodiode 134-2. The light may not be sensed. Also, when the diameter of the fourth opening OP4 is greater than 8 mm, it may be difficult to implement the slit. Accordingly, the diameter of the fourth opening OP4 may be 1 mm to 8 mm, for example, 1 mm to 5 mm, preferably 1 mm to 3 mm, for example, 2 mm, but the embodiment is not limited thereto. .

Also, the width W4 of the fifth opening OP5 may be greater than the width W6 of the outer portions 136 - 12 and 126 - 22 . The width W6 of the outer portions 136-12, 126-22 may be 0.1 mm to 5 mm, for example, 0.4 mm to 2 mm, preferably 0.6 mm to 1 mm, for example, 1 mm. is not limited thereto. For example, when the width W4 of the fifth opening OP5 is 1.1 mm, the width W6 of the outer portions 136-12 and 136-22 may be 0.8 mm, but the embodiment is not limited thereto. .

In addition, the outer portions 136-12 and 136-22 and the inner portions 136-11 and 136-21 of the inner partition walls 136-1 and 136-2 may be integrally formed.

In addition, unlike shown in FIG. 18 , from the first surface 132-1 of the light-transmitting substrate 132 toward the third opening OP3, the outer portions 136-12 and 136-22 or the inner portions 136-11, 136-21), the cross-sectional width of at least one may be reduced. That is, since the division of the inner portions 136-11 and 136-21 and the outer portions 136-12 and 136-22 is to allow the scattered light to be well incident on the photodiode 134-2 at an angle, as shown in the triangular It may have a cross-sectional shape.

Also, the area of the fourth opening OP4 shown in FIG. 18 (eg, areas in the x-axis and y-axis directions) is the area (eg, the x-axis) of the sixth opening OP6 shown in FIG. 17 . and area in the y-axis direction), but the embodiment is not limited thereto. As such, when the area of the sixth opening OP6 is larger than that of the fourth opening OP4 , the main beam may be better blocked from proceeding to the photodiode 134 - 2 .

Meanwhile, the scattering unit SS may be in contact with the plurality of openings. That is, the scattering unit SS communicates with the light emitting units 110A and 110B through the first opening OP1 , and is connected to the inlet-side passage intermediate portion FII1 (or the outlet-side passage intermediate portion FII2 ) and the second portion. It may communicate through the opening OP2 and may communicate with the light receiving units 130A and 130B through the third opening OP3 or the sixth opening OP6 .

Meanwhile, according to an embodiment, the repulsive force generating unit 160 includes at least one first electrode disposed on the light emitting unit 110A, 110B side and at least one second electrode disposed on the light receiving unit 130A, 130B side. can do.

At least one of the first and second electrodes may be disposed to face each other. In addition, in order to apply a Coulomb repulsion to the ionized particles entering the scattering unit SS, each of the first and second electrodes may have the same polarity as the ionized polarity of the particles.

In addition, the at least one first electrode is disposed at various positions in various shapes on the light emitting unit (110A, 110B) side, and the at least one second electrode is arranged at various positions in various shapes on the light receiving unit (130A, 130B) side. can

The at least one first electrode may include at least one of a 1-1 electrode and a 1-2 electrode. The 1-1 electrode may be disposed near the first opening OP1 and the scattering unit SS on the light emitting case 116 . For example, as shown in FIGS. 3, 4A, 5, 6A, 6C, 7, 8A, 8C, or 12 to 15 , the first-first electrodes 162A, 162C, 162D , 162E, and 162F may be disposed near the first opening OP1 and the scattering unit SS on the light emitting case 116 (or the top 172 of the housing 170 ). The 1-2 electrodes may be disposed on the optical axis LX between the lens units 114A and 114B and the first opening OP1 in the light emitting case 116 . For example, as shown in FIGS. 4B, 4C, 6B, 6C, and 8B, the 1-2 electrodes 162B are formed in the light emitting case 116 with the lens unit 114A and the first opening ( It may be disposed on the optical axis LX between the OP1).

For example, as shown in FIGS. 3, 4A, 5, 6A, 7, 8A, 8C, or 12 to 15 , the first electrode is the first-first electrode 162A, 162C, 162D. , 162E, 162F), as shown in Fig. 4b, Fig. 4c, Fig. 6b or Fig. 8b, including only the 1-2 electrode 162B, or as shown in Fig. 6c, the 1-1 electrode ( 162A) and the first and second electrodes 162B may be included.

In addition, the 1-1 electrode may be disposed only in the light emitting case 116 , or may extend from the light emitting case 116 to the top 172 of the housing 170 . For example, as shown in FIGS. 3, 4A, 5, 6A, 6C, and 7 , the first-first electrodes 162A and 162C may be disposed only in the light emitting case 116, or FIG. 8A . Alternatively, as shown in FIG. 8C , the first-first electrodes 162D and 162E may be disposed to extend from the light emitting case 116 to the top portion 172 of the housing 170 .

In addition, the second electrode may include at least one of a 2-1 electrode, a 2-2 electrode, and a 2-3 electrode. The 2-1 electrode may be disposed near the third opening OP3 and the scattering part SS on the light receiving incident part. For example, as shown in FIGS. 3, 4A, 5, 6A, 6C, 7, 8A, 8C, or FIGS. 12 to 15 , the second-first electrodes 164A, 164D, 164E , 164F may be disposed near the third opening OP3 and the scattering unit SS. The second-second electrode may be disposed above the light-transmitting member 132 . For example, as shown in FIGS. 4B , 6B , 8B or 8C , the second-second electrode 164B may be disposed above the light-transmitting member 132 . The 2-3 th electrode may be disposed under the light transmitting member 132 . For example, as shown in FIGS. 4C , 6C , or 8C , the second-third electrode 164C may be disposed below the light-transmitting member 132 . In this case, the 2-3 th electrode may be disposed between the photodiodes 134 - 2 .

For example, FIGS. 3, 4A, 5, 6A. As shown in FIGS. 7, 8A, or 12 to 15, the second electrode includes only the 2-1 electrodes 164A, 164D, and 164F, or as shown in FIGS. 4B, 6B or 8B, the second electrode Only the 2-2 electrode 164B, only the 2-3th electrode 164C as shown in FIG. 4C, or although not shown, the 2-1 and 2-2 electrodes are included, or although Although not shown, it includes the 2-2 and 2-3 electrodes, or includes the 2-1 and 2-3 electrodes 164A and 164C, as shown in FIG. 6C , or as shown in FIG. 8C . As described above, the 2-1 th electrode, the 2-2 th electrode, and the 2-3 th electrode 164E, 164B, and 164C may all be included.

In addition, each of the 1-1 electrode, the 1-2 electrode, the 2-1 electrode, the 2-2 electrode, and the 2-3 electrode may have various cross-sectional shapes. 3 to 8c or 12 to 15, the 1-1 electrodes 162A, 162C, 162D, 162E, and 162F, the 1-2 electrodes 162B, the 2-1 electrodes 164A, 164D, 164E, 164F), the second-second electrode 164B, and the second-third electrode 164C are illustrated as having a polygonal cross-sectional shape, but the embodiment is not limited thereto.

Since the 1-1 electrodes 162A, 162C, 162D, 162E, and 162F and the 2-1 electrodes 164A, 164D, 164E, and 164F are not disposed on the optical axis LX, they may be implemented with a transmissive or non-transmissive material. On the other hand, the 1-2 electrode 162B, the 2-2 electrode 164B, and the 2-3 electrode 164C are respectively disposed on the optical axis LX, and thus may be implemented with a light-transmitting material. This is in order not to prevent light from traveling from the lens units 114A and 114B to the light absorption unit 144 . For example, at least one of the first and second electrodes may include a light-transmitting conductive layer (ITO), but embodiments are not limited thereto.

The shape and arrangement position of each of the first electrode and the second electrode are not limited to the above-described examples. That is, if it is possible to prevent the particles from entering the light emitting unit 110 and the light receiving unit 130 through the first and third openings OP1 and OP3, respectively, by applying a repulsive force to the ionized particles passing through the scattering unit SS. , can have various modifications.

19 is a block diagram of an embodiment 142A of the information analysis unit 142 shown in FIG. 1 , and may include an amplifier 142-1 and a control unit 142-2.

The amplifying unit 142-1 amplifies the electrical signal incident through the input terminal IN2 from the light receiving units 130A and 130B (or the signal converting unit 140), and outputs the amplified result to the control unit 142-2. can do. The control unit 142-2 compares the analog signal amplified by the amplification unit 142-1 with a pulse width modulation (PWM) reference signal, and uses the comparison result to determine the number and concentration of particles P , at least one of size or shape may be analyzed, and the analyzed result may be output through the output terminal OUT2.

20 is a schematic perspective view of a particle sensor 1000 according to an embodiment.

The particle sensor 1000 shown in FIG. 20 may include a particle sensing device 300 , a base substrate 210 , and a plurality of wires 222 and 224 .

Since the particle sensing device 300 shown in FIG. 20 corresponds to the particle sensing devices 100 and 100A to 100D shown in FIGS. 1 to 19 , a redundant description will be omitted.

The base substrate 210 is a part on which the particle sensing device 300 is seated, and supplies power required by the particle sensing device 300 through a plurality of wires 222 and 224 or a signal from the particle sensing device 300 . It can perform a role such as receiving. For example, the base board 210 may be a printed circuit board, but the embodiment is not limited thereto.

For example, the first wire 222 is connected to the first electrode of the repulsive force generating unit 160, the second wire 224 is connected to the second electrode of the repulsive force generating unit 160, the repulsive force generating unit ( 160), each of the first and second electrodes included in the particle may have the same polarity as the ionized polarity.

The particle sensing apparatuses 100 and 100A to 100D according to the above-described embodiment have the following effects.

If, in the particle sensing apparatus 100: 100A to 100D according to the above-described embodiment, the ionization unit 150 and the repulsive force generating unit 160 do not exist, the optical system, for example, the lens units 114A, 114B or Since particles are accumulated on the light-transmitting member 132 and become contaminated, accurate information about the particles cannot be sensed. On the other hand, in the case of the particle sensing apparatus 100: 100A to 100D according to the embodiment, after the ionization unit 150 ionizes the particles, the ionized particles are dispersed between the light emitting unit 110 and the light receiving unit 130 ( SS), by applying a repulsive force to the ionized particles using the repulsive force generating unit 160, the particles pass through the first and third openings OP1 and OP3 through the light emitting unit 110 and the light receiving unit 130. can be prevented from entering each. Due to this, it is possible to prevent the particle sensing devices 100: 100A to 100D from being contaminated by the particles. Therefore, it is possible to reduce the number of times the user manually periodically removes the particles contaminated in the optical system or to reduce the hassle of cleaning, and it is possible to sense accurate information about the particles.

In addition, in the above-described embodiment, the light is irradiated in the optical axis (LX) direction to the scattering unit (SS) located in the path through which the air containing the particles (P) flows, and the light scattered from the particles (P) is irradiated to the optical axis (LX). ), it is a forward-type particle sensing device that analyzes information about the particle (P) by sensing in the direction parallel to the optical axis (LX) direction, not the side. However, in addition to the omni-directional particle sensing device, the ionization unit 150 and repulsive force generation according to the embodiment are also applied to the lateral particle sensing device that irradiates light toward the dust in the optical axis direction and senses the light scattered from the dust from the side of the optical axis. It goes without saying that the unit 160 may be applied.

The particle sensing devices 100: 100A to 100D according to the above-described embodiment may be applied to home appliances and industrial air purifiers, air purifiers, air cleaners, air coolers, and air conditioners, and air quality management systems for buildings (Air Quality management) system), an indoor/outdoor air conditioning system for a vehicle, or an indoor air quality measurement device for a vehicle. However, the particle sensing apparatuses 100 and 100A to 100D according to the embodiment are not limited to these examples and may be applied to various fields, of course.

In the above, the embodiment has been mainly described, but this is only an example and does not limit the present invention, and those of ordinary skill in the art to which the present invention pertains are not exemplified above in the range that does not depart from the essential characteristics of the present embodiment. It will be appreciated that various modifications and applications are possible. For example, each component specifically shown in the embodiment can be implemented by modification. And differences related to such modifications and applications should be construed as being included in the scope of the present invention defined in the appended claims.

100, 100A to 100D: particle sensing device 110, 110A, 110B: light emitting unit
120, 120A, 120B, 120C: flow path 130, 130A, 130B: light receiver
140: signal conversion unit 142: information analysis unit
144: light absorption unit 150, 150A, 150B, 150C: ionization unit
160, 160A, 160B, 160C, 160D, 160E, 160F, 160G, 160H: Repulsive force generator
1-1 electrode: 162A, 162C, 162D, 162E
2-1 electrode: 162B 2-1 electrode: 164A, 164D, 164E
2nd-2nd electrode: 164B 2nd-3rd electrode: 164C
170: housing 180: fan (fan)

Claims (11)

a light emitting unit emitting light;
an ionizer for converting the polarity of the introduced air particles into ionized particles;
a flow path part disposed in a path after the ionization part under the light emitting part, the air including the ionized particles flowing to cross the optical axis of the light emitting part, and including a scattering part providing scattered light by the ionized particles;
a light receiving unit disposed on the optical axis under the flow path and receiving the scattered light passing through the flow path; and
and a repulsive force generating unit that applies a repulsive force of the same polarity as that of the ionized particles introduced into the scattering unit on the ionized particles entering the scattering unit,
The ionizer is disposed in a path before the air enters the scattering unit within the flow path forming a path through which the air flows. The method of claim 1, wherein the flow path part
a passage inlet through which the air is introduced;
a passage outlet through which the air is discharged; and
and an inlet-side flow path intermediate portion positioned between the flow passage inlet and the scattering portion,
The passage inlet
an inlet through which the air is introduced from the outside; and
and an inflow path formed between the inlet and the inlet-side flow path from the inlet,
The scattering unit is positioned on the optical axis between the passage inlet and the passage outlet. The particle sensing device of claim 2 , wherein the ionizer is disposed in at least one of the inlet, the inflow path, and an intermediate portion of the inlet side flow path. According to claim 1, wherein the repulsive force generating unit
at least one first electrode disposed on the side of the light emitting unit and having the same polarity as that of the ionized particles; and
and at least one second electrode disposed to face the at least one first electrode on a side of the light receiving unit and having the same polarity as that of the ionized particle. 5. The method of claim 4, wherein the light emitting unit
light source;
a light emitting case disposed on the optical axis to define a first opening through which the light emitted from the light source unit is emitted toward the scattering unit, and accommodating the light source unit; and
and a lens unit accommodated in the light emitting case, disposed on the optical axis between the light source unit and the first opening, and condensing the light emitted from the light source unit into the first opening. 6. The method of claim 5, wherein the at least one first electrode comprises:
and a 1-1 electrode disposed near the first opening and the scattering unit on the light emitting case. 6. The method of claim 5, wherein the at least one first electrode comprises:
and a 1-2 first electrode disposed on the optical axis between the lens unit and the first opening in the light emitting case. The method of claim 5, wherein the light receiving unit
light-transmitting member; and
and a light sensing unit configured to sense the scattered light by the ionized particles in the scattering unit. The method of claim 8, further comprising: a light receiving unit disposed between the scattering unit and the light receiving unit, the light receiving unit adjusting the amount of light incident to the light receiving unit, and having a third opening disposed on the optical axis;
the at least one second electrode
a 2-1 electrode disposed near the third opening and the scattering unit on the light-receiving incident unit;
a 2-2 electrode disposed above the light-transmitting member; or
and at least one of a second and third electrode disposed under the light-transmitting member. 5 . The particle sensing device of claim 4 , further comprising a light absorption unit disposed on the optical axis under the light receiving unit and absorbing the light passing through the light receiving unit. 11. The particle sensing device according to any one of claims 4 to 10, wherein at least one of the first or second electrode comprises a light-transmitting conductive layer.

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