KR102318514B9 - Transparent electrode or transistor semiconductor active layer comprising organicnonorganic hybid superlattice structure - Google Patents
Transparent electrode or transistor semiconductor active layer comprising organicnonorganic hybid superlattice structureInfo
- Publication number
- KR102318514B9 KR102318514B9 KR1020190165214A KR20190165214A KR102318514B9 KR 102318514 B9 KR102318514 B9 KR 102318514B9 KR 1020190165214 A KR1020190165214 A KR 1020190165214A KR 20190165214 A KR20190165214 A KR 20190165214A KR 102318514 B9 KR102318514 B9 KR 102318514B9
- Authority
- KR
- South Korea
- Prior art keywords
- organicnonorganic
- hybid
- active layer
- transparent electrode
- semiconductor active
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/02554—Oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02565—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020190165214A KR102318514B1 (en) | 2019-12-12 | 2019-12-12 | Transparent electrode or transistor semiconductor active layer comprising organic―nonorganic hybid superlattice structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020190165214A KR102318514B1 (en) | 2019-12-12 | 2019-12-12 | Transparent electrode or transistor semiconductor active layer comprising organic―nonorganic hybid superlattice structure |
Publications (3)
Publication Number | Publication Date |
---|---|
KR20210074487A KR20210074487A (en) | 2021-06-22 |
KR102318514B1 KR102318514B1 (en) | 2021-10-28 |
KR102318514B9 true KR102318514B9 (en) | 2022-03-15 |
Family
ID=76600458
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020190165214A KR102318514B1 (en) | 2019-12-12 | 2019-12-12 | Transparent electrode or transistor semiconductor active layer comprising organic―nonorganic hybid superlattice structure |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR102318514B1 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006032689A (en) * | 2004-07-16 | 2006-02-02 | Sharp Corp | Organic device |
KR101298017B1 (en) * | 2008-12-24 | 2013-08-19 | 한양대학교 산학협력단 | N-type organic-inorganic nanohybrid superlattice transparent semiconductor thin film, method for preparing the same, and uses of the same for electronic devices |
KR101389451B1 (en) * | 2012-03-19 | 2014-04-29 | 연세대학교 산학협력단 | Composition for oxide thin film, Method for forming oxide thin film, an electrical device using the low-temperature pressure annealing, and a thin film transistor |
-
2019
- 2019-12-12 KR KR1020190165214A patent/KR102318514B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR102318514B1 (en) | 2021-10-28 |
KR20210074487A (en) | 2021-06-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
E701 | Decision to grant or registration of patent right | ||
G170 | Re-publication after modification of scope of protection [patent] |