KR102276448B1 - An invention pattern analysis system using patent classification codes and method of analyzing invention patterns using the patent classification code - Google Patents

Abstract

The present invention relates to an invention pattern analysis system using a patent classification code and an invention pattern analysis method using the same, and more specifically, a representative technology of each applicant's invention using the International Patent Classification Code (IPC) and Advanced Patent Classification (CPC). By extracting , it is possible to provide an invention pattern analysis system and an invention pattern analysis method using the patent classification code that can easily grasp the trend of invention technology and establish an efficient patent strategy.
In addition, in the invention pattern analysis system using the patent classification code, a search terminal receiving applicant information and the applicant information received from the search terminal are used to analyze the trend based on the applicant's technical invention using the patent classification code And it is an invention pattern analysis system using a patent classification code including a main server for extracting a representative technology.

Description

Invention pattern analysis system using patent classification code and invention pattern analysis method using the same

The present invention relates to an invention pattern analysis system using a patent classification code and an invention pattern analysis method using the same, and more specifically, a representative technology of each applicant's invention using the International Patent Classification Code (IPC) and Advanced Patent Classification (CPC). By extracting , it relates to an invention pattern analysis system using a patent classification code that can easily grasp the trend of invention technology and establish an efficient patent strategy, and an invention pattern analysis method using the same.

As the market for the knowledge economy related to technology and intellectual property is rapidly changing due to the development of science and technology, competition for technological development between companies and countries is getting fiercer.

In particular, in line with the era of globalization, in the field of information and communication technology and in industries based on advanced equipment technology, patent rights are secured to ensure the monopoly of technology and the right to use technology in order to gain a competitive edge.

In order to secure such patent rights, companies place importance on access to patent databases and the practicality of patent analysis. We are continuously conducting research on advanced patents by comparing and analyzing technologies.

However, the existing patent analysis mainly used keyword analysis, and it was difficult to accurately analyze the patent due to inaccurate terminology, mistranslation by machine language, and difference in technical description between patent commercializations.

In addition, since the analysis is based on the content of the patent, the technical information within the patent can be easily grasped, but there is a problem in that the interrelationship with the technology used in other patents cannot be identified.

Therefore, in order to solve this problem, the present invention extracts the representative technology of each applicant's invention using the International Patent Classification Code (IPC) and the Advanced Patent Classification (CPC), thereby easily grasping the trend of the invention technology and efficiently It is intended to provide an invention pattern analysis system using a patent classification code capable of establishing a patent strategy and an invention pattern analysis method using the same.

In order to solve the above problems, the object of the present invention is to easily grasp the trend of invention technology by extracting the representative technology of each applicant's invention using the International Patent Classification Code (IPC) and Advanced Patent Classification (CPC), An object of the present invention is to provide an invention pattern analysis system using a patent classification code that enables efficient patent strategy establishment and an invention pattern analysis method using the same.

In order to solve the above problems, in the invention pattern analysis system using a patent classification code according to an embodiment of the present invention, a search terminal receiving applicant information and a patent classification code by receiving the applicant information from the search terminal It may include a main server that extracts the applicant's technical invention using

Here, the main server, an intellectual property database; a collection unit for collecting the applicant's invention data from the intellectual property database; a pre-processing unit for refining the invention data collected by the collection unit using CPC and IPC including sections, classes, sub-classes, main groups and sub-groups and structures therebelow; a comparison unit for deriving a result value using CPC and IPC for the invention data refined by the preprocessor; It may include an analysis unit for analyzing the invention data refined by the preprocessor and an extraction unit for extracting the patent classification code of the representative technology that occupies the highest ratio in the invention data analyzed by the analysis unit.

In this case, the intellectual property database may collect and store invention data from one or two or more sets of web servers that provide information on the Korean Patent Information Service (KIPRIS), USPTO, EPO, and patent literature.

In addition, the preprocessor may purify the collected applicant's invention data by leaving CPC and IPC in sections, classes, subclasses, main groups and subgroups and removing the rest.

And, the analysis unit analyzes by applying four invention patterns, and the four invention patterns include the same (S; Same), T; Transition, E; Expansion, and I; independent. can do.

Here, the same (S) is when the CPC and IPC of the invention data purified by the preprocessor are the same up to the subgroup, and the transition (T) is the CPC and IPC of the invention data purified by the preprocessor The case is different from the subgroup, the extension (E) is the case where the CPC and IPC of the invention data purified by the preprocessor are different from the main group, and the independent (I) is the case of the invention data purified by the preprocessor. It may be a case where CPC and IPC differ from subclass or higher.

In addition, the extraction unit may include: a derivation unit for deriving a representative technique using CPC and IPC from the invention data analyzed by the analysis unit; The representative technology derived by the derivation unit is a measurement unit that measures the frequency of CPC and IPC for each of the four invention patterns, and the patent classification code of the representative technology that has a high ratio with the frequency measured by the measurement unit is derived. It may include a trend analysis unit for analyzing the trend of the invention.

Furthermore, in the invention pattern analysis method using the patent classification code, an input step of receiving applicant information; collecting applicant's invention data using the applicant's information; refining the collected invention data using CPC and IPC including sections, classes, subclasses, main groups and subgroups and structures therebelow; It may include analyzing the refined invention data and extracting a patent classification code of a representative technology having a high ratio in the analyzed invention data.

In this case, the invention pattern analysis method using the patent classification code may further include the step of deriving a result value by using the refined invention data CPC and IPC.

In addition, the step of extracting the patent classification code of the representative technology, deriving the representative technology by using CPC and IPC from the analyzed invention data; Measuring the frequency of CPC and IPC for each of the four invention patterns for the derived representative technology, and analyzing the trend of invention by deriving a patent classification code of the representative technology occupying a high ratio with the measured frequency can do.

The invention pattern analysis system using the patent classification code according to the embodiment of the present invention as described above and the invention pattern analysis method using the same are representative of each applicant's invention using the International Patent Classification Code (IPC) and the Advanced Patent Classification Code (CPC). By extracting the technology, there is an advantage in that similar technologies can be clustered and analyzed by clearly limiting the analysis target between technology areas.

In addition, since it is not limited by language, it is possible to accurately analyze domestic and foreign inventions, and thus there is an advantage in that the cost and time for multilingual processing can be saved.

In addition, by analyzing the patented invention using the four invention patterns, there is an advantage in that it is possible to easily analyze the change in the invention trend for each applicant.

In addition, by extracting the applicant's common patterns and representative technologies and analyzing the trends of inventions, there is an advantage in that it is possible to identify future technology trends and identify the proportion of representative technologies in the field.

In addition, there is an advantage in that the patent-based technology trend can be grasped by establishing a patent knowledge base.

In addition, by analyzing the applicant's technological invention trend, there is an advantage that can be utilized in the representative technology trend analysis by performing trend analysis on the main invention fields of the owned technology, continuous invention technology, and newly invented technology.

1 is a block diagram showing an invention pattern analysis system using a patent classification code according to an embodiment of the present invention.
2 is a block diagram showing the configuration of a main server according to an embodiment of the present invention.
3 is a block diagram showing the configuration of an extraction unit according to an embodiment of the present invention.
4 is a flowchart illustrating an invention pattern analysis method using an invention pattern analysis system using a patent classification code according to an embodiment of the present invention.
5 is a flowchart illustrating an invention pattern analysis method using an invention pattern analysis system using a patent classification code according to another embodiment of the present invention.
6 is a flowchart illustrating a step S50 of FIGS. 4 and 5 .

Hereinafter, the description of the present invention with reference to the drawings is not limited to specific embodiments, and various modifications may be made and various embodiments may be provided. In addition, it should be understood that the contents described below include all conversions, equivalents, and substitutes included in the spirit and scope of the present invention.

In the following description, terms such as first and second are terms used to describe various components, meanings are not limited thereto, and are used only for the purpose of distinguishing one component from other components.

Like reference numbers used throughout this specification refer to like elements.

As used herein, the singular expression includes the plural expression unless the context clearly dictates otherwise. In addition, terms such as "comprises", "comprising" or "have" described below are intended to designate the existence of features, numbers, steps, operations, components, parts, or combinations thereof described in the specification. It should be construed as not precluding the possibility of addition or existence of one or more other features, numbers, steps, operations, components, parts, or combinations thereof.

Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning in the context of the related art, and should not be interpreted in an ideal or excessively formal meaning unless explicitly defined in the present application. does not

In addition, in the description with reference to the accompanying drawings, the same components are given the same reference numerals regardless of the reference numerals, and the overlapping description thereof will be omitted. In describing the present invention, if it is determined that a detailed description of a related known technology may unnecessarily obscure the gist of the present invention, the detailed description thereof will be omitted.

The invention pattern analysis system using the patent classification code of the present invention and the invention pattern analysis method using the same are provided in environments such as a mobile communication terminal including a smart phone communicating through a wireless communication network, and a computer communicating through a wired communication network. Hereinafter, for convenience of description, a mobile communication terminal will be mainly described.

1 is a block diagram showing an invention pattern analysis system using a patent classification code according to an embodiment of the present invention, FIG. 2 is a block diagram showing the configuration of a main server according to an embodiment of the present invention, and FIG. 3 is this It is a block diagram showing the configuration of an extraction unit according to an embodiment of the present invention.

Referring to FIG. 1 , it can be confirmed that the invention pattern analysis system 10 using the patent classification code includes the search terminal 100 and the main server 200 .

The search terminal 100 may receive the applicant's information, and may transmit it to the main server 200 .

In this case, the search terminal 100 may be a PC, tablet, PDA (Personal Digital Assistant), etc. other than a mobile terminal communicating through a wireless communication network, and may be an electronic device that can be input through a network communication network, such as a computer communicating through a wired communication network. .

The information of the applicant input through the search terminal 100 may be one or more of an applicant's name, an inventor's name, a company name, a business name, an employee name, an industrial company name, and a group name.

The main server 200 collects the applicant information received from the search terminal 100 as a patent classification code, specifically, a Cooperative Patent Classification (CPC) (hereinafter referred to as CPC) and an International Patent Classification Code (IPC; International). Patent Classification, hereinafter described as IPC) can be used to extract technical inventions.

IPC is currently adopted and used by 62 countries, and CPC uses a classification system developed for their own country in some countries of IPC to compensate for the difficulty of integrated comparison of patented technologies to enable interworking of patent classification codes. It is a patent classification code.

However, since CPC and IPC have the advantage of being able to search for patent technology regardless of language differences between countries, they have the advantage of being able to derive more accurate patent technology using this.

Referring to FIG. 2 , the main server 200 includes an intellectual property database 210 , a collection unit 220 , a preprocessor 230 , a comparison unit 240 , an analysis unit 250 , and an extraction unit 260 . You can confirm that you are doing it.

The intellectual property rights database 210 can store invention data for all intellectual property rights collected through the web server, and is derived from the applicant's invention data and the applicant's invention data collected based on the applicant's information input through the search terminal 100 . It is possible to store the obtained result value, the analysis data analyzed from the applicant's invention data, and the applicant's representative technology and patent classification code extracted from the analyzed applicant's invention data.

Here, the intellectual property database 210 may collect and store invention data from one or two or more sets of web servers that provide information on the Korean Patent Information Service (KIPRIS), USPTO, EPO, and patent literature.

The collection unit 220 may collect the applicant's invention data from the intellectual property right database 210 based on the applicant's information input through the search terminal 100 .

In this case, the collected applicant's invention data may be the applicant's invention patent information.

That is, it may be invention patent information including not only CPC and IPC, but also applicant, inventor, year, etc., where only patent invention data having CPC, IPC and publication date is preferably collected.

The preprocessor 230 may purify the invention data collected by the collection unit 220 using CPC and IPC.

In this case, CPC and IPC include a section, a class, a subclass, a main group, a subgroup, and the following structures, and will be described in detail with reference to Table 1.

As shown in Table 1 above, it can be seen that the CPC and IPC patent classification codes have a hierarchical structure of sections, classes, subclasses, main groups, subgroups, and the following.

When the patent classification code is A23K 20/184, section A, class 23, subclass K, main group 20, subgroup 18, and 4 or less.

Using CPC and IPC having such a hierarchical structure, the pre-processing unit 230 can control and refine the subgroup of the patent classification code by controlling the remaining structures below it.

For example, as shown in Table 2, it can be seen that when the patent classification code A23K 20/184 is refined by the preprocessor 230, it becomes A23K 20/18.

By refining the patent classification code up to the subgroup in this way, it is possible to make a state suitable for use in extracting the representative technology so that the extraction unit 240 can quickly process the representative technology, and detailed technical classification analysis is possible. and technology trend analysis can be done accurately.

The comparison unit 240 may derive a result value using CPC and IPC of the invention data refined by the preprocessor 230 .

Table 3 shows the patent classification codes of patent technology 1 (code1) and patent technology (code2) of the same applicant as an example for generating a tree structure of CPC and IPC.

It can be seen that the patent classification codes of Code 1 and Code 2 have the same code numbers up to the section, class, sub-class, and main group, and the sub-group and sub-group sub-groups have different code numbers.

At this time, with each code number as a node, an edge may be generated so that one flow can be followed until another code number is displayed.

The analysis unit 250 may analyze the onset data purified by the preprocessor 230 , and it is preferable to apply and analyze the four invention patterns.

Here, the four invention patterns may include the same (S; Same), T; Transition, E; Expansion, and I; independent.

The same (S) may be a case in which the CPC and IPC of the invention data refined by the preprocessor 230 have the same code number up to the subgroup, and the technology is the same.

The transition (T) may be a case in which the CPC and IPC of the invention data refined by the preprocessor 230 have different code numbers from the subgroup, and the description content is transferred differently.

The extension (E) may be a case in which the CPC and IPC of the invention data refined by the pre-processing unit 230 have different code numbers from the main group, and the scope of the description is broadly expanded.

Independent (I) may be a case in which the CPC and IPC of the invention data refined by the pre-processing unit 230 have different code numbers from the classification code or more, and the description contents are different from each other and thus have different independent technical relationships.

As an example, we will explain with Figure 1.

[Figure 1]

Referring to Figure 1, P patent) is a patent that has been requested for examination in the corresponding year.

However, since this is only an example for carrying out the present invention, it is natural that the present invention can be applied to the publication date, registration date, and filing date, etc., not just the patent for which examination has been requested.

First, since it can be seen that G06F 17/30 in 2007 and 2009 have the same code number up to subgroups, they may be the same (S).

G06F 17/30 in 2007 and G06F 17/18 in 2009 may be transition (T) because the subgroups are different.

In addition, G06F 17/30 in 2007 and G06F 50/18 in 2008 may be extended (E) because the main group is different.

Finally, G06F 17/30 in 2007 and H04L63/30 in 2008 can be independent (I) because the sub-crals anomalies are different.

With these four invention patterns, there is an advantage in that it is possible to easily analyze the change in the invention of each applicant through the applicant's invention data.

The extraction unit 260 may extract the patent classification code of the representative technology that occupies the highest ratio in the invention data analyzed by the analysis unit 250 , and may analyze the trend of the invention with this.

Specifically, referring to FIG. 3 , it can be seen that the extraction unit 260 includes a derivation unit 261 , a measurement unit 262 , and a trend analysis unit 263 .

The derivation unit 261 may derive a representative technology from the invention data analyzed by the analysis unit 250 using CPC and IPC.

In this case, the representative technology can be obtained by first analyzing the correlation in the analyzed invention data to generate a support matrix.

The support matrix can be generated by sequentially obtaining support, reliability, and improvement using the CPC- and IPC-based association rule analysis (ARM) technique.

Specifically, the degree of support can be calculated by extracting 1-frequent itemsets according to the CPC and IPC of the analyzed invention data, and generating 2-frequent itemsets as 1-frequent itemsets.

A itemset is a possible subset of the entire CPC and IPC, the 1-frequent itemset may be one CPC and IPC, respectively, and the 2-frequent itemset is a set of 1-frequent itemsets, consisting of two CPCs and IPC can be configured.

Support can be calculated through Equation 1 with the generated 2-frequent itemset.

[Equation 1]

Here, X and Y are the CPC and IPC of the 2-frequent itemset, n(X∪Y) is the number of analyzed invention data including both X and Y, and N is the total number of analyzed invention data.

Reliability can be obtained only with 2-frequent itemsets whose support is greater than or equal to the minimum support value.

In this case, the minimum support value may be the minimum value among the support levels of the 1-frequent itemset extracted from the analyzed invention data.

In this way, the reliability can be calculated using Equation 2 for the 2-frequent itemsets whose support is equal to or greater than the minimum support value.

[Equation 2]

Here, X and Y are the CPC and IPC of 2-frequent itemsets, n(X∪Y) is the number of analyzed invention data including both X and Y, and N(X) is the number of analyzed invention data including X to be.

The degree of improvement may be calculated through Equation 3 using the calculated reliability in order to determine the actual utility value of the association rule.

[Equation 3]

Here, X and Y are the CPC and IPC of the 2-frequent itemset, c(X→Y) is the reliability, and s(Y) is the support for Y.

With the reliability, improvement, and support obtained in this way, the support matrix in Table 4 can be generated in order to identify the correlation between technologies.

T ₁ T ₂ … T _j T ₁ One Sup(T ₁ ,T ₂ ) … Sup(T ₁ ,T _j ) T ₂ Sup(T ₂ ,T ₁ ) One … … … … One … T _i Sup(T _i ,T ₂ ) … One

Here, T _i and T _j are CPC and IPC of the analyzed invention data, respectively, and Sup(T _i ,T _j ) is the degree of support, and since the correlation of the same technology is always the same, it is calculated as 1.

The technology importance value may be calculated using the support matrix generated in this way, and the technology importance value may be calculated using the technology importance analysis (ANP).

Here, technology importance analysis (ANP) is one of the multi-criteria decision analysis methods (MCDM, Multi-Criteria Decision Marking). It is a method of solving problems by making each decision element into a network structure and analyzing the complex interrelationship between the decision elements. to be.

The present invention analyzes the core technology by responding to the decision-making factors defined in the ANP technique with CPC and IPC. The importance value for each classification code is derived by performing correlation analysis between variables, network model construction, and pairwise comparison of the support matrix derived through association rule analysis.

More specifically, the initial matrix can be generated by first obtaining the sum of the element values of each row in the support matrix, dividing by the sum of the element values of the row, and normalizing it so that the sum of the element values of each row becomes 1.

Then, a weighted supermatrix can be generated by multiplying the initial matrix by the weight values of the two reference sets.

Here, when there is no weight between the two reference sets, the initial matrix may be the weighting matrix.

Then, the convergence matrix (Limited Supermatrix) may be generated by infinitely multiplying each element value of the weighting matrix until it converges to a constant value.

Finally, the technology importance value for each technology can be derived through the generated convergence matrix. An element value of the convergence matrix may be a technology importance value.

In this way, it is possible to derive a technology importance value for a technology based on the relationship between technology codes, that is, CPC and IPC, and a representative technology can be derived by a technology efficiency analysis (DEA) using the technology importance value.

More specifically, the relative efficiency of CPC and IPC can be measured by comprehensively evaluating the technology importance values of CPC and IPC representing each technology, and CPC and IPC with high efficiency scores can be extracted as representative technologies.

To this end, the BCC model, which is a variable scale return, and the output-oriented model, which uses the support, reliability, and improvement as output factors and fixes the input factors, and maximizes the output factors, the relationship between the input and output factors. can be used to derive representative technologies.

The measurement unit 262 may apply the four invention patterns to the representative technology derived by the derivation unit 261 and measure the frequency and ratio of CPC and IPC of each invention pattern (S, T, E, I).

The trend analysis unit 263 may derive a classification code of a representative technology occupying a high proportion with the frequency measured by the measurement unit 262 , and may analyze the trend of the invention with this.

4 is a flowchart illustrating an invention pattern analysis method using an invention pattern analysis system using a patent classification code according to an embodiment of the present invention, and FIG. 5 is an invention pattern using a patent classification code according to another embodiment of the present invention. It is a flowchart illustrating an invention pattern analysis method using an analysis system, and FIG. 6 is a flowchart illustrating the steps of S50 of FIGS. 4 and 5 .

Referring to Figure 4, the invention pattern analysis method using the patent classification code, the step of receiving the applicant information (S10), the step of collecting the applicant's invention data using the applicant information (S20), the collected invention data section , class, sub-class, main group and sub-group, and the steps of purifying using CPC and IPC including the structures below (S30), analyzing the refined invention data (S40) and having from the analyzed invention data It can be seen that the step (S50) of extracting the patent classification code of the representative technology occupying a high proportion is included.

First, the step of receiving the applicant's information (S10) may be a step of inputting the applicant's information through a search terminal. After that, when the applicant's information is transmitted to the main server, the applicant's invention data is collected using the applicant's information. It is good to go through the step (S20).

When the applicant's invention data is collected in this way, the next step (S30) of refining the collected invention data using CPC and IPC including sections, classes, subclasses, main groups and subgroups and the structures below them may be performed. .

Such steps will be described with reference to Table 5, which is an example for carrying out the present invention.

However, the examples described below are for explaining the present invention, and it will be natural for those skilled in the art that the number of representative applicants can be extended to N or more.

_{Table 5 selects the research institute (I 1} , I ₂ , I ₃ ), the company (C ₁ , C ₂ , C ₃ ) and the school (U ₁ , U ₂ , U ₃ ) in the step (S10) of entering the applicant information in case it is entered.

The research institutes (I ₁ , I ₂ , I ₃ ), companies (C ₁ , C ₂ , C ₃ ) and schools (U ₁ , U ₂ , U ₃ ) input in this way are transmitted to the main server to collect the applicant’s invention data. By proceeding to step (S20), it can be derived as the number of selected patents in Table 5.

Thereafter, the collected invention data is purified using CPC and IPC including sections, classes, subclasses, main groups and subgroups and the structures below (S30) to finally obtain purified CPCs and IPCs. it can be

The step of analyzing the refined invention data (S40) may be a step of analyzing the refined invention data by applying four invention patterns.

Here, it has been described above that the four invention patterns may include the same (S; Same), T; Transition, E; Expansion, and I; independent, and a detailed description thereof will be omitted. do it with

Next, the step (S50) of extracting the patent classification code of the representative technology occupying a high proportion in the analyzed invention data is the same (S), transition (T), It may be a step of extracting a representative technology with an invention pattern of extension (E) and independence (I).

Meanwhile, referring to FIG. 4 , the invention pattern analysis method using the patent classification code of the present invention may further include deriving a result value using CPC and IPC for refined guest data.

In this case, it is possible to derive a result value using the refined invention data using CPC and IPC.

Referring to FIG. 6 , the step of extracting the patent classification code of the representative technology (S50) is the step of deriving the representative technology using CPC and IPC from the analyzed invention data (S51), and the derived representative technology is used for the above four inventions. It can be confirmed that it includes the step (S52) of measuring the frequency of CPC and IPC for each pattern and the step (S53) of analyzing the trend of the invention by deriving the patent classification code of the representative technology occupying a high proportion with the measured frequency (S53). have.

The step (S51) of deriving a representative technology using CPC and IPC from the analyzed invention data overlaps with the contents described in the invention pattern analysis system 10 using the patent classification code, so a detailed description will be omitted.

Therefore, the derivation of the representative technology can be obtained by sequentially obtaining support, reliability, and improvement using the CPC- and IPC-based association rule analysis (ARM) technique, and then generating a support matrix based on this.

Using this support matrix, a technology importance value can be calculated and obtained through technology importance analysis (ANP), and a representative technology can be derived using the technology importance value derived in this way.

In this way, the representative technology derived by the step (S51) of deriving the representative technology is preferably subjected to a step (S52) of measuring the frequencies of CPC and IPC for each of the four invention patterns.

The step of measuring the frequency ( S52 ) may be a step of measuring the frequency and ratio measurement of CPC and IPC of each invention pattern (S, T, E, I) to which four invention patterns are applied to the derived representative technology.

Tables 6 to 8 are representative technologies derived from _{the research institutes (I 1} , I ₂ , I ₃ ), companies (C ₁ , C ₂ , C ₃ ) and schools (U ₁ , U ₂ , U _{3 ) of Table 5.} is a table showing the results of measuring the frequency of CPC and IPC for each of the four invention patterns (S52).

Referring to Table 6, it can be seen that the research institute shows a high ratio of expansion (E), and it can be seen that the tendency to proceed with the invention while broadening the scope of the technology by this result is large.

On the contrary, referring to Table 7, in the case of companies, it can be seen that the ratio of the same (S) and expansion (E) is high, and the tendency to proceed with invention while expanding the scope of technology based on the same technology is large. can be seen to appear.

And referring to Table 8, in the case of schools, it can be seen that the ratio of independence (I) is the highest in all three places at a ratio of about 97%, and it can be seen that there is a large tendency to develop independent inventions.

Furthermore, the step of analyzing the trend of invention by deriving the patent classification code of the representative technology occupying a high ratio with the measured frequency (S53) is to analyze the trend of the invention with the patent classification code of the representative technology occupying the highest ratio. may be a step.

Table 9 shows the same (S), transition (T), and extension (E) with the highest ratio in 9 institutions based on Tables 6 to 8 in order to derive the patent classification code of the representative technology that occupies the highest ratio. This is the result table presented.

Independent (I) is to exclude in order to get an accurate picture of how technologies are progressing and affecting trends.

In the step of continuously analyzing the trend (S53), it is possible to analyze the trend by obtaining the rate by year with the patent classification code of the representative technology occupying the highest rate.

Graphs 1 to 2 are graphs of analysis trend results of representative technical classifications by same (S), transition (T), and extension (E) of CPC and IPC only _{of the Institute (I 1} ) among the nine applicants in Table 9.

[Graph 1]

[Graph 2]

In laboratory I ₁ , it can be confirmed that G06F17/30 shows high rates in both CPC and IPC in the same (S), transition (T), and expansion (E).

In this way, by using the invention pattern analysis method using the invention pattern analysis system using the patent classification code of the present invention, it is easy to extract the representative technology of each applicant's invention, and by clustering similar technologies, the analysis target between the technology areas is clearly defined. It has the advantage of being able to analyze it.

In addition, since it is not limited by language, it is possible to accurately analyze domestic and foreign inventions, and thus there is an advantage in that the cost and time for multilingual processing can be saved.

In addition, by analyzing the patented invention using the four invention patterns, there is an advantage in that it is possible to easily analyze the change in the invention trend for each applicant.

In addition, by extracting the applicant's common patterns and representative technologies and analyzing the trends of inventions, there is an advantage in that it is possible to identify future technology trends and identify the proportion of representative technologies in the field.

In addition, by analyzing the applicant's technological invention trend, there is an advantage that can be utilized in the representative technology trend analysis by performing trend analysis on the main invention fields of the owned technology, continuous invention technology, and newly invented technology.

Although the embodiments of the present invention have been described above with reference to the accompanying drawings, those of ordinary skill in the art to which the present invention pertains can implement the present invention in other specific forms without changing the technical spirit or essential features of the present invention. You will understand that there is Accordingly, the embodiments described above are illustrative in all respects and not restrictive.

10: Invention pattern analysis system using patent classification code
100: search terminal
200: main server
210: intellectual property database
220: collection unit
230: preprocessor
240: comparison unit
250: analysis unit
260: extraction unit
261: derivation part
262: measurement unit
263: Trend analysis unit

Claims (10)

In the invention pattern analysis system using the patent classification code,
a search terminal that receives applicant information; and
and a main server for receiving the applicant information from the search terminal and extracting the applicant's technical invention using a patent classification code,
The main server is
intellectual property database;
a collection unit for collecting invention data of the applicant from the intellectual property database;
a pre-processing unit for refining the invention data collected by the collection unit using CPC and IPC including sections, classes, sub-classes, main groups and sub-groups and structures below;
a comparison unit for deriving a result value using CPC and IPC for the invention data refined by the preprocessor;
an analysis unit that analyzes the invention data refined by the pre-processing unit; and
An invention pattern analysis system using a patent classification code including an extraction unit for extracting a patent classification code of a representative technology that occupies the highest ratio in the invention data analyzed by the analysis unit.
delete The method of claim 1,
The intellectual property database is
Invention pattern analysis system using patent classification code, characterized in that it collects and stores invention data from one or two or more sets of web servers that provide information on Korean Patent Information (KIPRIS), USPTO, EPO, and patent literature.
The method of claim 1,
The preprocessor is
Invention pattern analysis system using a patent classification code, characterized in that the collected applicant's invention data is purified by leaving CPC and IPC in sections, classes, subclasses, main groups and subgroups, and removing the rest.
The method of claim 1,
The analysis unit analyzes by applying four invention patterns,
The invention pattern analysis system using the patent classification code, characterized in that the four invention patterns include the same (S; Same), T; Transition, E; Expansion, and I; independent. .
6. The method of claim 5,
The same (S) is when the CPC and IPC of the invention data purified by the preprocessor are the same up to the subgroup,
The transition (T) is when the CPC and IPC of the invention data purified by the pre-processing unit are different from the subgroup,
The extension (E) is a case where the CPC and IPC of the invention data refined by the preprocessor are different from the main group,
The independent (I) is an invention pattern analysis system using a patent classification code, characterized in that the CPC and IPC of the invention data refined by the preprocessor differ from subclass or higher.
6. The method of claim 5,
The extraction unit,
a derivation unit for deriving a representative technology using CPC and IPC from the invention data analyzed by the analysis unit;
A measurement unit that measures the frequency of CPC and IPC for each of the four invention patterns using the representative technology derived by the derivation unit;
An invention pattern analysis system using a patent classification code, comprising a trend analysis unit that analyzes the trend of invention by deriving a patent classification code of a representative technology that has a high ratio with the frequency measured by the measurement unit.
Invention pattern analysis method using patent classification code,
receiving applicant information for transmission to the main server from a search terminal;
collecting the applicant's invention data using the applicant's information by a collection unit of the main server;
refining the collected invention data by the preprocessor of the main server using CPC and IPC including sections, classes, subclasses, main groups and subgroups and structures therebelow;
analyzing the refined invention data by the analysis unit of the main server; and
Invention pattern analysis method using a patent classification code, comprising the step of extracting a patent classification code of a representative technology having a high ratio in the analyzed invention data by the extraction unit of the main server.
9. The method of claim 8,
The step of purifying using the CPC and IPC,
Invention pattern analysis method using a patent classification code, characterized in that it further comprises the step of deriving a result value using the purified invention data using CPC and IPC.

9. The method of claim 8,
The step of extracting the patent classification code of the representative technology is,
deriving a representative technology using CPC and IPC from the analyzed invention data;
Measuring the frequency of CPC and IPC for each of the four invention patterns of the same (S), transition (T), extension (E) and independent (I) of the derived representative technology; and
Invention pattern analysis method using the patent classification code, characterized in that it comprises the step of analyzing the trend of the invention by deriving a patent classification code of the representative technology occupying a high ratio with the measured frequency.

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