KR102037733B1 - Apparatus for measuring amount of incident light and apparatus for measuring angle of incident light using photodiode - Google Patents

Abstract

Disclosed is a light incident amount measuring apparatus, the light incident amount measuring apparatus comprising: a light transmissive substrate; A photodiode (PD) unit disposed on the lower surface of the light transmissive substrate at intervals from each other; And a light absorbing member provided to cover the bottom surface of the PD unit to prevent at least some of the light passing through the light transmissive substrate from being reflected and incident on at least some of the PD units.

Description

Optical incident amount measuring device and optical incident angle measuring device using PD {APPARATUS FOR MEASURING AMOUNT OF INCIDENT LIGHT AND APPARATUS FOR MEASURING ANGLE OF INCIDENT LIGHT USING PHOTODIODE}

The present application relates to a light incident amount measuring device for measuring an incident amount of light such as sunlight using a PD such as a thin film type PD (Photodiode) and a light incident angle measuring device for measuring an incident angle of light such as sunlight.

Solar cells can generate power using sunlight. Therefore, the magnitude of the amount of light incident on the solar cell can be very important. In particular, the maximum amount of incident light must be maintained in order to maintain the maximum power output of the solar cell. Since the light can be scattered by clouds, water vapor, etc., the amount of incident light can be reduced due to these factors. In addition, the amount of incident light may vary depending on the angle of the sun.

One conventionally known method for measuring the amount of incident light is to measure the amount of incidence using a solar system. The solar system is a device that measures the amount of insolation of light by using the principle of thermocouple. It is a method of measuring the amount of insolation through the temperature difference by changing the temperature of the thermocouple according to the incident amount of light.

However, the price of the thermocouple used in the solar system is very expensive, and the size of the solar equipment is large, requiring additional space for installation. Accordingly, applying the incident amount measuring method using solar radiation to large-area photovoltaic power generation requires a lot of costs, due to the margin of the installation space was not able to use the limited space efficiently.

The background technology of the present application is disclosed in Korean Unexamined Patent Publication No. 10-2017-0108567.

The present application is to solve the above-mentioned problems of the prior art, an object of the present invention to provide a light incident amount measuring device and a light incident angle measuring device that can reduce the manufacturing cost and installation space compared to the prior art.

As a technical means for achieving the above technical problem, the light incident amount measuring device according to the first aspect of the present application, a light transmissive substrate; A photodiode (PD) unit disposed on the lower surface of the light transmissive substrate at intervals from each other; And a light absorbing member provided to cover the bottom surface of the PD unit to prevent at least some of the light passing through the light transmissive substrate from being reflected and incident on at least some of the PD units.

The light incident angle measuring device according to the second aspect of the present application, a light transmissive substrate; A PD array unit including a plurality of photodiode (PD) units disposed on the lower surface of the light transmissive substrate at intervals; And a shielding film disposed to cover at least a portion of the upper surface of the light transmissive substrate except for the opening region, and to transmit incident light to the PD array unit only through the opening region. The light arrival PD unit to which light arrives among the PD units may be determined corresponding to the angle formed with respect to the opening area.

The above-mentioned means for solving the problems are merely exemplary and should not be construed as limiting the present application. In addition to the above-described exemplary embodiments, additional embodiments may exist in the drawings and detailed description of the invention.

According to the above-described problem solving means of the present application, the light incident amount can be measured by measuring the amount of current generated by the PD unit by using the property of the PD unit to generate current with light energy when light is incident, Since at least a part of the light passing through the light transmissive substrate is prevented from being reflected and incident on the PD unit by the light absorbing member provided to cover the bottom surface of the unit, the light incident amount can be accurately measured. According to this, the light incident amount measuring apparatus which can reduce the size and installation space compared to the conventional and manufacturing cost can be implemented.

In addition, according to the above-described problem solving means of the present application, the light incident to the PD unit perpendicularly to the PD unit is not incident to the light incident after being scattered in the air by the screen is selectively incident through the opening area, corresponding to each incident angle Since the incident light may be incident on the PD unit, the incident angle of light may be calculated by the PD unit generating current among the plurality of PD units. According to this, the light incident amount measuring apparatus which can reduce the size and installation space compared to the conventional and manufacturing cost can be implemented.

That is, the above-described problem solving means of the present application, by using a thin film-type PD (Photodiode) that can sense the light can propose the design of the PD array for measuring the incident amount of light and analyzing the angle of light. It is very inexpensive and has a small footprint, allowing for efficient use of space. In addition, when combined with the Internet of Things (IoT), which is currently being issued, individual output values may be calculated to provide greater stability.

In addition, the above-described problem solving means of the present application can be installed in many areas because the use of a thin-film PD can replace the conventional solar system and because less space and less cost consumption occurs. Accordingly, easy battery output tracking may be possible and may help increase stability. In addition, it can be applied to IoT to help expand the solar cell base.

1 is a schematic cross-sectional view of a light incident amount measuring apparatus according to an exemplary embodiment of the present application.
2 is a schematic cross-sectional view of a substratesolar cell.
3 is a schematic cross-sectional view of a superstratesolar cell.
4 is a schematic conceptual cross-sectional view for describing the incidence of light to the light incident angle measuring device according to an embodiment of the present application.
5 is a schematic cross-sectional view of a light incident angle measuring apparatus according to an exemplary embodiment of the present disclosure.
6 and 7 are schematic plan views of the light incident angle measuring apparatus according to an embodiment of the present application.
8A and 8B are schematic conceptual cross-sectional views for describing an increase in a thickness of a light transmissive substrate of a light incident angle measuring apparatus according to an exemplary embodiment of the present disclosure.

DETAILED DESCRIPTION Hereinafter, exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present disclosure. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention. In the drawings, parts irrelevant to the description are omitted for simplicity of explanation, and like reference numerals designate like parts throughout the specification.

Throughout this specification, when a portion is "connected" to another portion, this includes not only "directly connected" but also "electrically connected" with another element in between. do.

Throughout this specification, when a member is said to be located on another member "on", "upper", "top", "bottom", "bottom", "bottom", this means that any member This includes not only the contact but also the presence of another member between the two members.

Throughout this specification, when a part is said to "include" a certain component, it means that it can further include other components, without excluding the other components unless specifically stated otherwise.

In the description of the embodiments of the present application, terms related to the direction and position (upper, upper, lower, lower surface, etc.) are set based on the arrangement state of the respective components shown in the drawings. For example, as shown in FIGS. 1 to 5, the 12 o'clock direction is generally the upper side, the overall 12 o'clock direction is the upper surface, the 6 o'clock is the lower side, and the overall surface is the 6 o'clock, etc. This can be

The present application relates to a light incident amount measuring device and a light incident angle measuring device.

First, a light incident amount measuring apparatus (hereinafter referred to as a 'main light incident amount measuring apparatus') according to an embodiment of the present application will be described.

The light incident amount measuring device is a device for measuring the incident amount of light incident from the upper side.

1 is a schematic cross-sectional view of a light incident amount measuring apparatus according to an exemplary embodiment of the present application.

Referring to FIG. 1, the light incident amount measuring apparatus may include a light transmissive substrate 1. Light may pass through the light transmissive substrate 1. For example, the thickness t of the light transmissive substrate 1 may be 2 mm or more and 5 mm or less. In addition, the light transmissive substrate 1 may be a glass substrate, and for example, may be one of quartz, soda lime, borosilicate, and the like.

In addition, referring to FIG. 1, the present light incident amount measuring apparatus includes a PD (Photodiode) unit 21 disposed on a bottom surface of a light transmissive substrate. The PD unit 21 may generate a current by light energy due to light incident thereto. Specifically, if external energy is absorbed in the PN junction, electrons may transition to generate a current. Products using the same may include solar cells and PDs. These products can be used not only to generate current, but also to sense light. The present light incident amount measuring device can apply this PD to the PD unit 21.

That is, the light incident amount measuring apparatus may calculate the amount of light incident on the PD unit 21 as the amount of light incident based on the amount of current generated by the PD unit 21.

The PD unit 21 may be a thin film PD having a thickness of 10 μm or less. In addition, the shape of the cross section of the PD unit 21 may be circular. In addition, the radius of the PD unit 21 may be 10 um or more and 200 um or less. In addition, the material of the PD unit 21 may include one or more of silicon, CIGS, GaAs, and the like.

In addition, although one PD unit 21 is illustrated in FIG. 1, the number of PD units 21 is not limited thereto, and a plurality of PD units 21 may be provided as necessary.

In addition, the present light incident amount measuring apparatus includes a light absorbing member 4. The light absorbing member 4 is provided to cover the lower surface of the PD unit 21 to prevent at least a part of the light passing through the light transmissive substrate 1 from being reflected and incident on the PD unit 21. That is, the light absorbing member 4 can prevent the light passing through the light transmissive substrate 1 from being incident (absorbed) into the PD unit 21. Thus, the incident amount can be measured accurately. For example, since the light that has been incident to the PD unit 21 can be prevented from re-incident into the PD unit 21, the incident amount can be accurately measured.

The material of the light absorbing member 4 may include one or more of chromium, graphene, and the like. In addition, the thickness of the light absorbing member 4 may be several tens of um. Specifically, the thickness of the light absorbing member 4 may be 100 um or less, more specifically 10 um or more and 100 um or less. In addition, the width of the light absorbing member 4 may be several mm ² . Specifically, the width of the light absorbing member 4 may be 10 mm ² or less.

For reference, the light incident from the light incident amount measuring device may be sunlight. In addition, the present light incident amount measuring apparatus may be disposed so as to correspond to the horizontal direction in which the plane direction of the light transmissive substrate 1 is horizontal. In addition, the incident amount of light may correspond to the amount of solar radiation.

In addition, all spring insolation is an amount of incidence incident on a horizontal plane on the ground, and may include measurement of scattered light. Therefore, the covering film may not be provided in the light transmissive substrate 1.

As described above, an all-in-one solar radiation measuring system (apparatus) using a thin film type PD array may be proposed.

2 is a schematic cross-sectional view of a substratesolar cell, and FIG. 3 is a schematic cross-sectional view of a superstratesolar cell.

In addition, the light incident amount measuring device can be applied to a solar cell. Solar cells can be broadly classified into two types: substratesolar cells and superstratesolar cells. Specifically, referring to FIG. 2, the substratesolar cell is provided on the back sheet 6, the upper side of the lower substrate 6, and the EVA film 9 and the EVA film 9 covering the lower substrate 6. A solar cell 8 formed on the solar cell 8, an EVA film 9 provided on the solar cell 8, and an upper glass 1 provided on the EVA film 9 to cover the EVA film 9. It may include. In addition, referring to FIG. 3, the superstrate solar cell is provided on the lower substrate 6, the lower substrate 6, and is formed on the EVA film 9 and the EVA film 9 covering the lower substrate 6. It may include a top glass (1) provided on the cell (8) and solar cell (8). The present light incident amount measuring device may be provided for the upper glass 1 of the solar cell. That is, the upper glass 1 of the solar cell can be applied to the light transmissive substrate 1 of the present light incident amount measuring apparatus, and the PD unit 21, the absorber 4, etc. of the present light incident amount measuring apparatus are the upper glass. It may be provided with respect to the lower surface of (1).

Hereinafter, a light incident angle measuring apparatus (hereinafter referred to as a 'main light incident angle measuring apparatus') according to an exemplary embodiment of the present application will be described.

4 is a schematic conceptual cross-sectional view for describing the incidence of light to the light incident angle measuring apparatus according to an embodiment of the present application, Figure 5 is a schematic cross-sectional view of the light incident angle measuring apparatus according to an embodiment of the present application, Figure 6 7 is a schematic plan view of a light incident angle measuring apparatus according to an embodiment of the present application, and FIGS. 8A and 8B illustrate an increase in the thickness of a light transmissive substrate of the light incident angle measuring apparatus according to an embodiment of the present disclosure. Is a schematic conceptual cross-sectional view.

Referring to FIG. 4, the present light incident angle measuring device includes a light transmissive substrate 1. Light may pass through the light transmissive substrate 1. For example, the thickness t of the light transmissive substrate 1 may be 2 mm or more and 5 mm or less. In addition, the light transmissive substrate 1 may be a glass substrate, and for example, may be one of quartz, soda lime, borosilicate, and the like.

4, the light incident angle measuring device includes a PD array unit 2 including a plurality of PD (Photodiode) units 21 disposed on a lower surface of the light transmissive substrate 1 at intervals. Include. The PD unit 21 may generate a current by light energy due to light incident thereto. Specifically, if external energy is absorbed in the PN junction, electrons may transition to generate a current. Products using the same may include solar cells and PDs. These products can be used not only to generate current, but also to sense light. The present light incident amount measuring device can apply this PD to the PD unit 21.

In addition, the material of the PD unit 21 may include one or more of silicon, CIGS, GaAs, and the like. In addition, the shape of the cross section of the PD unit 21 may be circular. In addition, the radius of the PD unit 21 may be 10 um or more and 200 um or less. In addition, the thickness of the PD unit 21 may be several um. Specifically, the PD unit 21 may be a thin film PD having a thickness of 10 μm or less.

In addition, referring to FIG. 4, the light incident angle measuring device is provided to cover at least a portion of the upper surface of the light transmissive substrate 1 except for the opening region 31. And a shielding film 3 to be delivered to (2). The shielding film 3 may be formed of a material that does not transmit light. By way of example, chromium, which is generally used in lithographic processes, may be included in the material of the shielding film 3. In addition, the thickness of the shielding film 3 may be several hundred um or more and several mm or less. Specifically, the thickness of the shielding film 3 may be 100 μm or more and 10 mm or less. By the shielding film 3, light incident perpendicularly to the PD unit 21 may be selectively incident through the opening region 31, not light incident after being scattered in the atmosphere.

The present light incident angle measuring device may measure an incident angle of light. The incident angle of light measured by the light incident angle measuring device may mean an angle formed between a direction of incidence of light and a normal to an upper surface of the light transmissive substrate 1. For reference, FIG. 4 exemplarily shows an incident angle (see θ in FIG. 4) of light incident on the rightmost PD unit 21 positioned to the right of the PD unit 21 positioned among the plurality of PD units 21. It was.

Referring to FIG. 4, the angle of incidence θ of the light extends through both the opening region 31 (in particular, the central portion of the opening region 31) and the light reaching PD unit (in particular, the central portion of the light reaching PD unit). It may mean an angle formed by the straight line and the normal of the upper surface of the light transmissive substrate 1. For example, referring to FIG. 4, light having an incident angle θ of 0 ° is located in the center of the PD unit 21 (the three PD units 21 of FIG. 4) which face the opening area 31. May be incident on the PD unit 21. As another example, light having an incident angle θ of an acute angle corresponding thereto may be incident on the PD unit 21 positioned on the left or right side of the three PD units 21 of FIG. 4. As such, light having an incident angle θ corresponding to the position of the PD unit 21 relative to the opening area 31 may be incident on the PD unit 21. As described above, since the PD unit 21 generates a current when light is incident, the incident of the light into the corresponding PD unit 21 and the position of the PD unit 21 according to whether the PD unit 21 is generated or not. the incident angle _(θ) of the incident can be determined.

Therefore, each of the plurality of PD units 21 is t × from the point where the straight line extending downward from the central portion of the opening region 31 meets the light transmissive substrate 1 with respect to the incident angle θ of the light to be measured, respectively. It can be positioned so as to have a distance of tan θ (t: thickness of the light transmissive substrate 1). For example, the PD unit 21 arranged to measure the angle of incidence of light having an angle of incidence of 15 ° is t from a point where a straight line extending downward from the center portion of the opening region 31 meets the light transmissive substrate 1. Can be arranged at a distance of × tan15˚.

Thus, as an example, when the PD array unit 2 is provided to measure the angle of incidence in a predetermined unit, referring to FIG. 5, the plurality of PD units 21 are arranged at a predetermined interval S from each other. The predetermined interval S may be an interval considering the plurality of incident angles to be measured and the thickness t of the light transmissive substrate 1. For example, referring to FIGS. 6 and 7, the PD unit 21 may be provided to measure an incident angle in units of 5 °. In this case, the predetermined interval S between the PD units 21 may be t × tan5 °. That is, when the increment or decrease unit of the plurality of incident angles measured is constantly Δθ, the preset interval S may be t × tanΔθ. For reference, referring to FIG. 5, the predetermined interval S may mean an interval between centers of PD units 21 neighboring each other.

6 and 7, the plurality of incident angles to be measured may include a plurality of incident angles corresponding to latitude of the sun and a plurality of incident angles corresponding to the longitude of the sun. Specifically, in the light incident angle measuring device, the incident light may be sunlight. In addition, the present light incident angle measuring device is a ground direction in which the plane direction of the light transmissive substrate 1 is horizontal so that at least part of the latitude range and the longitude range of the sun with respect to the area where the present light incident angle measuring device is installed can be measured. It may be arranged to correspond to.

In this case, referring to FIG. 6, the plurality of incidence angles may include a plurality of incidence angles corresponding to latitude and longitude, such as (latitude: X °, longitude: Y °), and the PD array unit 2 includes the plurality of incidence angles. The PD unit 21 may be arranged to allow the incidence angle measurement at the latitude and the plurality of longitudes. In this case, as shown in FIG. 6, the increase / decrease unit size (Δθ) between the plurality of incident angles with respect to the latitude change direction of the sun may be the same as the increase / decrease unit size (Δθ) between the plurality of incident angles with respect to the sun's longitudinal change direction But. It is not limited only to this.

For example, in certain regions, the sun's latitude changes by up to 50 degrees depending on the season and the longitude varies by 180 degrees over time. Thus, the arrangement of the PD unit 21 can be designed such that the measurement of the angle of incidence is made within a range of approximately 50 degrees latitude (e.g., 25 degrees latitude of the Republic of Korea in the case of Korea), and in terms of hardness the solar cell is actually The angle of incidence may be designed to be measured within a hardness range of 20 ° or more and 160 ° or less, which is a criterion having a power generation angle. As such, the arrangement of the PD unit 21 may vary depending on the latitude and longitude of the measurement area. For reference, the arrangement of the PD unit 21 illustrated in FIG. 6 (the arrangement in which the PD unit corresponding to latitude 0 ° is located at the center of the plurality of PD units) may be suitable for an area having a latitude of 0 °.

As described above, the light incident angle measuring device can calculate the angle of incidence, altitude (altitude), latitude, longitude, and the like of the sun. First, the altitude angle of the sun is 90 degrees-(the ceiling angle), and as described above, when the present light incident angle measuring device is disposed so that the plane direction of the light transmissive substrate 1 corresponds to the horizontal plane direction, it is perpendicular to the ground. Since one direction and the normal direction of the light transmissive substrate 1 may correspond (parallel), the incidence angle measured by the light incident angle measuring device may be a ceiling angle (an angle formed between the vertical direction and the incidence direction of the sun from the ground). have. In this case, it may be estimated that the sun's elevation angle = 90 °-(incidence angle of light).

In addition, in the case of the latitude and longitude of the sun, as described above, since the PD unit 21 is arranged to measure the angle of incidence according to the latitude and longitude of the sun, the light reaches the light among the plurality of PD units 21. When the PD unit 21 generates a current, the latitude and longitude and the angle of incidence of the sun can be estimated based on the fact that the light arriving PD unit 21 is arranged to calculate the angle of incidence of the sun with a particular latitude and longitude, The altitude of the sun may be estimated based on the angle of incidence.

Therefore, the predetermined interval S between the plurality of PD units 21 is an interval in consideration of the plurality of incident angles to be measured and the thickness of the light transmissive substrate 1, and the incident angle with respect to the direction of latitude change of the sun and the It may be set corresponding to the incident angle with respect to the hardness change direction.

For reference, referring to FIGS. 6 and 7, the PD units 21 may be arranged radially. FIG. 6 illustrates an example in which the PD units 21 are arranged in a lattice, and FIG. 7 shows the PD units. An example in which 21 is arranged in a hexagonal lattice is shown. As shown in FIG. 6, when the PD units 21 are arranged in a lattice and arranged to measure incident angles in units of 5 °, the thickness of the light transmissive substrate 1 is at a minimum when the radius of the PD unit 21 is 200 μm. 5 mm or more, and the thickness of the light transmissive substrate 1 may vary at any time according to the size of the PD unit 21 and the unit of measurement angle of incidence. In addition, when the PD units 21 are arranged in a hexagonal lattice as shown in FIG. 7, and are arranged to measure incident angles in units of 5 °, the thickness of the light transmissive substrate 1 is 200 μm when the radius of the PD unit 21 is 200 μm. It may be at least 5mm, and the thickness of the light transmissive substrate 1 may vary at any time according to the size of the PD unit 21 and the unit of measurement angle of incidence.

In addition, as the thickness t of the light transmissive substrate 1 increases, the number of PD units 21 that can be disposed within a predetermined incident angle range to be measured may increase. Specifically, comparing the light transmissive substrate 1 of FIG. 8B with a thickness t2 thicker than the light transmissive substrate 1 of FIG. 8A and the light transmissive substrate 1 of FIG. 4, the light transmissive substrate 1 of FIG. When the thickness is thick, the number of PD units 21 that can be disposed within the same incident angle range may increase. According to this, if the incident angle can be measured in units of 10 degrees when the light transmissive substrate 1 is t1 thick, the number of possible positions of the PD unit 21 when the light transmissive substrate 1 has a thickness t2 thicker than t1 is possible. Is increased to allow the measurement of the incident angle in more precisely smaller units, for example, 5 °. In this manner, the thickness of the light transmissive substrate 1 may be set according to the unit of the incident angle to measure (the number of PD units 21 within the same measured incident angle range).

Referring to FIG. 5, the width W of the opening region 31 is obtained by subtracting the width 2R of the PD unit 21 at a predetermined interval S between two neighboring PD units 21. It may be formed to a width less than the value (S-2R). For reference, referring to FIG. 5, the predetermined interval S may mean an interval between centers of two neighboring PD units 21. Thus, the value (S-2R) which subtracted the width 2R of the PD unit 21 by the space | interval S which the width | variety of the opening area | region 31 (when the cross section of the opening area | region 31 is circular, diameter 2R) is preset. Or less), it is possible to prevent a case where light passing through the opening region 31 is incident on at least a portion of each of two or more PD units 21 adjacent to each other simultaneously. For reference, as described above, when the predetermined interval S between the PD units 21 is constant such that the plurality of incident angles are measured at predetermined unit increments Δθ, the predetermined interval S is t × Since tanΔθ, the width of the opening region 31 may be t × tanΔθ-2R or less.

If the width of the opening area 31 (when the cross section of the opening area 31 is circular, the diameter 2R) is obtained by subtracting the width 2R of the PD unit 21 at a predetermined interval S (S- In the case of exceeding 2R), the light may be incident to the plurality of PD units 21 adjacent to each other. In this case, the optical incident angle measuring device may calculate and correct the incident angle by an average value of the incident angles measured by each of the plurality of PD units 21. Alternatively, when light is incident on a plurality of PD units 21 adjacent to each other, the light incident angle measuring device may interpolate an incident angle based on the amount of current generated by each of the plurality of PD units 21. For example, the amount of current generated by one PD unit 21 corresponding to the incident angle of 40 degrees and the amount of current generated by the neighboring PD unit 21 adjacent to the one PD unit 21 and corresponding to the incident angle of 45 degrees If the ratio is 4: 1, the angle of incidence can be interpolated to 41 degrees.

In addition, the opening region 31 may be formed to have a width equal to or less than the width of the PD unit 21. For example, when the cross section of the PD unit 21 has a circular shape, the width of the opening area 31 may be limited to twice or less 2R of the radius of the PD unit 21.

4, the light incident angle measuring device is provided to cover the lower surface of the plurality of PD units 21, so that at least a part of the light passing through the light transmissive substrate 1 is reflected to the plurality of PD units ( It may include a light absorbing member (4) to prevent the absorption in at least a portion of (21). That is, the light absorbing member 4 can prevent the light passing through the light transmissive substrate 1 from being incident (absorbed) into the PD unit 21. Thus, the incident amount can be measured accurately. For example, since the light that has been incident to the PD unit 21 can be prevented from re-incident into the PD unit 21, the incident amount can be accurately measured. The material of the light absorbing member 4 may include one or more of chromium, graphene, and the like.

In addition, the light incident angle measuring device can be applied to a solar cell. Solar cells can be broadly classified into two types: substratesolar cells and superstratesolar cells. Specifically, referring to FIG. 2, the substratesolar cell is provided on the back sheet 6, the upper side of the lower substrate 6, and the EVA film 9 and the EVA film 9 covering the lower substrate 6. A solar cell 8 formed on the solar cell 8, an EVA film 9 provided on the solar cell 8, and an upper glass 1 provided on the EVA film 9 to cover the EVA film 9. It may include. In addition, referring to FIG. 3, the superstratesolar cell is provided on the lower substrate 6 and the lower substrate 6 to form an EVA film 9 covering the lower substrate 6 and a solar cell formed on the EVA film 9. 8 and the upper glass 1 provided on the solar cell 8. The present light incident angle measuring device may be provided with respect to the upper glass 1 of the solar cell. That is, the upper glass 1 of the solar cell can be applied to the light transmissive substrate 1 of the present light incident angle measuring device, and the PD unit 21, the absorber 4, and the like are provided with respect to the lower surface of the upper glass 1. The shielding film 3 may be provided with respect to the upper surface of the upper glass 1.

According to the above, an altitude measurement system (apparatus) of the sun using a thin film PD array may be proposed. In addition, according to the above, a latitude and longitude measurement system (apparatus) of the sun using a thin film type PD array may be proposed.

That is, according to the present application, it is possible to propose a design of all solar radiation, solar altitude and solar latitude and longitude measurement system using a thin film PD array.

The above-described light incidence measuring device and the light incidence angle measuring device can be applied when all kinds of solar cells are installed, and can be applied to curtains or blinds in which a smart vinyl house or IoT is grafted. In addition, as the current IoT market develops, the application range of the present application may be widened.

The above description of the present application is intended for illustration, and it will be understood by those skilled in the art that the present invention may be easily modified in other specific forms without changing the technical spirit or essential features of the present application. Therefore, it should be understood that the embodiments described above are exemplary in all respects and not restrictive. For example, each component described as a single type may be implemented in a distributed manner, and similarly, components described as distributed may be implemented in a combined form.

The scope of the present application is indicated by the following claims rather than the above description, and it should be construed that all changes or modifications derived from the meaning and scope of the claims and their equivalents are included in the scope of the present application.

1: light transmissive substrate
2: PD array unit
21: PD unit
3: screen
31: opening area
4: light absorbing member
6: lower substrate
8: solar cell
9: EVA film

Claims (10)

delete delete delete In the device for measuring the incident angle of light incident from the image side,
Light transmissive substrate;
A PD array unit including a plurality of photodiode (PD) units disposed on a lower surface of the light transmissive substrate at intervals;
A shielding film provided to cover at least a portion of the upper surface of the light transmissive substrate except for an opening region, and transmits incident light to the PD array unit only through the opening region; And
And a light absorbing member provided to cover the lower surfaces of the plurality of PD units to prevent at least some of the light passing through the light transmissive substrate from being reflected and incident on at least some of the plurality of PD units.
The incident angle of the light is determined corresponding to the angle formed by the light arriving PD unit to which the light has arrived among the plurality of PD units with respect to the opening area,
The incident light is sunlight,
The device is arranged such that the plane direction of the light transmissive substrate corresponds to a horizontal ground direction so that at least a portion of the sun's latitude range and at least a portion of the longitude range for the region in which the device is installed can be measured;
The plurality of incidence angles to be measured includes a plurality of incidence angles corresponding to the latitude of the sun and a plurality of incidence angles corresponding to the longitude of the sun,
The plurality of PD units are arranged at a predetermined interval from each other,
The predetermined interval is an interval in consideration of the plurality of incident angles to be measured and the thickness of the light transmissive substrate, and is set corresponding to the incident angle with respect to the direction of latitude change of the sun and the incident angle with respect to the longitudinal direction of the sun,
The increase and decrease unit sizes between the plurality of incidence angles with respect to the latitude change direction of the sun are constant, and the increase and decrease unit sizes between the plurality of incidence angles with respect to the sun hardness change direction are constant so that the PD array unit measures the incidence angle in a predetermined unit,
The opening region is formed to have a width equal to or less than the width of the PD unit at a predetermined interval, which is an interval between the centers of two neighboring PD units, and is formed to have a width less than or equal to the width of the PD unit. , Light incident angle measuring device. delete delete delete delete delete delete

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