KR101843541B1 - Multifunctional Raman inspection system for research of cultural property - Google Patents

Abstract

The present invention relates to a multifunctional Raman inspection system for research of a cultural property. More specifically, to measure components constituting a cultural property through Raman analysis in a place where the cultural property is located, it is supported to grasp mobility and damage when measuring the component of the cultural property. At the same time, a common structure of micro Raman and macro Raman is supported, the reliability and accuracy of a corresponding component analysis result can be improved. According to the present invention, laser light used in micro Raman analysis for precision analysis of a sample is supported to be expanded from a micro unit into a macro unit. Thus, devices for the micro Raman analysis are partially separated, and Raman analysis can be performed at a place where the cultural property is located. A common structure is provided such that the devices can be partially used as a tool for mobile macro Raman analysis. At the same time, the common structures is provided such that various piece of component information obtained through fixed micro Raman analysis for precision analysis of a cultural property with component information obtained through mobile macro Raman analysis using a cultural property exclusive probe device. Accordingly, precision analysis is also supported by Raman analysis system which is portable and movable, and at the same time the accuracy of a component analysis result of the cultural property can be improved.

Description

{Multifunctional Raman inspection system for researching cultural property}

The present invention relates to a multifunctional Raman inspection system for the study of cultural properties, and more particularly to a system for measuring the components constituting the cultural property in a place where the cultural property is located, And a multifunctional Raman inspection system for researching cultural properties that can support the common structure of micro Raman and macro Raman to increase the reliability and accuracy of the analysis results of the corresponding components.

A Raman analyzer using a laser that supports Raman analysis to identify various samples constituting the present material is provided. The Raman analyzer can irradiate a specimen collected from a material with a laser beam of a specific wavelength through a scanning device Scanning, and collecting the scattered wavelength of the sample through the Raman spectrometer and displaying it as a spectrum.

Through this, the Raman analyzer can compare the intrinsic wavelength of each sample with the corresponding spectrum to provide information on various samples constituting the material.

Such a Raman analyzer is used for crack inspection, foreign matter inspection, and micro-sample analysis of semiconductor wafers which require precise analysis. Since the weight and size of the scanning equipment required for such precision analysis are comparatively large, have.

Accordingly, a portable Raman analyzer that supports Raman analysis is provided in fields such as the field of pharmaceuticals, the field of detection of dangerous substances such as drugs and explosives, and the like, and an average component And provides quantitative analysis.

That is, unlike the Raman analysis apparatus for precision analysis that supports component analysis on a micro-scale, the portable Raman analysis apparatus analyzes the components of the substance only with limited constituent information, thereby limiting the measurement object. Perform component analysis.

In recent years, there have been attempts to analyze the characteristics of constituents of cultural properties by applying the Raman analysis to cultural properties. However, since cultural properties are placed at specific storage sites, it is difficult to construct a Raman analysis apparatus for precision analysis. However, it is necessary to perform Raman analysis. However, there are various kinds of cultural properties such as paintings, Buddhist statues, buildings, etc., and various constituents of cultural properties are also varied. Also, the portable Raman analysis device There is a problem that there is a limitation in understanding the characteristics of the sample of the cultural property.

In addition, since the protection of cultural properties must be essential due to the characteristics of cultural properties, it is necessary to check the location of the measurement target for the Raman analysis to determine whether it is damaged. However, There is a problem that it is difficult to apply the Raman analysis to the measurement of the composition of the cultural property due to the damage concern.

Korean Patent No. 10-1234603

The present invention supports the extension of the laser light used for micro-Raman analysis for micro-analysis of a sample in units of micro-units, thereby separating some of the equipment for micro-Raman analysis, , Which can be used as a device for analyzing the moving macroscopic Raman, and it is also possible to compare the components analyzed through macro-Raman analysis with the various component information obtained through precise analysis through the corresponding common structure The purpose of this study is to support the easiness of Raman analysis on cultural properties and to improve the accuracy of analysis results of cultural properties.

In addition, the present invention supports measurement points easily through a dedicated probe when performing Raman analysis on macroscopic units of cultural properties, thereby enabling detection of damage to measurement points in Raman analysis of cultural properties The purpose of this study is to ensure the stability of Raman analysis on cultural properties.

The multifunctional Raman inspection system for cultural property research supporting both stationary micro Raman analysis for precise analysis of cultural properties and movable macro Raman analysis for basic analysis of cultural properties according to an embodiment of the present invention includes a scanner section for micro Raman analysis A Raman spectrometer for performing Raman analysis, and a short-wavelength laser unit selectively connected to the scanner unit and the cultural-property-specific probe unit, wherein the short-wavelength laser unit is connected to the cultural- And a mode scrambler unit for extending the focus of the short-wavelength laser when the laser beam is scattered by the object to be measured, wherein the cultural-property-dedicated probe apparatus irradiates the object to be measured with the laser light provided from the short- mountain That the optical system and the visible light for the camera portion and the recording of the visible image for photographing a visible image of the object to be measured for transmitting light to the Raman spectrometer equipped with a light source provided in the optical system may be characterized.

In one embodiment of the present invention, the short-wavelength laser unit provides a selected one of a plurality of different wavelengths to the mode scrambler unit, and the mode scrambler unit transmits the laser light to the cultural- And the focus of the laser beam is expanded to the macro-Raman magnification.

As an example related to the present invention, the cultural-property-dedicated probe apparatus irradiates the laser light to be measured provided through the short-wavelength laser section, transmits scattered light scattered by the object to be measured to the Raman spectrometer, The visible light for the measurement point corresponding to the laser light irradiated to the measurement object is generated through the camera unit by irradiating the visible light to the object and transmitting the reflected light reflected by the measurement object to the camera unit through the optical system .

As an example related to the present invention, the Raman spectrometer is connected to the above-described cultural-property-specific probe apparatus through optical fibers, and collects the scattered light transmitted through the optical fiber from the cultural-property-dedicated probe apparatus to generate a Raman spectrum-related image .

As an example related to the present invention, the image received from the Raman spectrometer may be analyzed and compared with previously stored characteristic information of each component through the precise analysis, and a component of at least one component detected corresponding to the point where the laser light is irradiated And an external device for providing detection information.

In one embodiment of the present invention, the scanner unit is configured to be selectively connectable to the short-wavelength laser unit, and when the laser unit is connected to the short-wavelength laser unit, the laser light transmitted through the optical fiber from the short- Irradiating the object to be measured and scanning the object, and providing scattered light scattered by the object to be measured to the Raman spectrometer.

In one embodiment of the present invention, the cultural-property-dedicated probe apparatus includes a light source unit that provides visible light, a first reflector that transmits the laser light and the scattered light provided from the short-wavelength laser unit and reflects the visible light, An objective lens unit that collects the scattered light or reflected light generated by condensing light or visible light and then irradiates the object to be measured, and transmits the laser light or visible light incident through the first reflector to the objective lens unit, A first condenser lens unit collecting the scattered light or the reflected light provided from the objective lens unit and transmitting the scattered light or the reflected light to the first reflector, a second condenser lens unit collecting and transmitting the reflected light reflected by the first reflector, And reflects the visible light emitted by the light source unit and transmits the visible light through the second condenser lens unit A measuring point at which the laser light is irradiated to the object to be measured, based on a mirror for reflecting the reflected light incident from the second condenser lens part and reflected light incident on the mirror, And a camera unit for generating a visible image for determining whether or not the image is damaged.

As an example related to the present invention, the cultural-property-dedicated probe apparatus may further include a laser light source for providing laser light provided from the short-wavelength laser unit to the first reflector, removing noise other than the scattered light, and transmitting the scattered light to the Raman spectrometer And a filter unit.

The present invention supports the extension of the laser light used for micro-Raman analysis for micro-analysis of a sample in units of micro-units, thereby separating some of the equipment for micro-Raman analysis, And a movable macro Raman analyzer capable of carrying out a microarray analysis. The microarray analysis method for precise analysis of cultural properties was applied to various component information obtained from the movable macro Raman analysis It is possible to support precision analysis through a portable and movable Raman analysis system and improve the accuracy of the result of analysis of the composition of the cultural property.

In addition, since the present invention can provide a visual image of a measurement point irradiated with a laser beam on a cultural asset, the present invention has an effect of ensuring convenience, reliability, and safety of Raman analysis on cultural property by clearly determining whether or not the cultural property is damaged.

1 is a block diagram of a multifunctional Raman inspection system for studying cultural properties according to an embodiment of the present invention.
FIG. 2 is a block diagram of micro-Raman analysis for precise analysis of a multifunctional Raman inspection system for cultural property research according to an embodiment of the present invention.
FIG. 3 is a block diagram of a movable macro Raman analysis for measuring the composition of a cultural property of a multifunctional Raman inspection system for cultural property research according to an embodiment of the present invention.
4 is a configuration diagram of a mode scrambler according to an embodiment of the present invention;
Fig. 5 is a configuration diagram of a cultural-purpose-dedicated probe apparatus according to an embodiment of the present invention; Fig.

Hereinafter, detailed embodiments of the present invention will be described with reference to the drawings.

The multifunctional raman inspection system for cultural properties according to the present invention supports both fixed micro Raman analysis for precise analysis of cultural properties and movable macro Raman analysis for basic analysis of cultural properties, It is possible to extend the focus size of the laser light used for fixed microranalysis with focus in macroscope and apply it to portable and mobile movable Raman analysis. To support Raman analysis and to facilitate Raman analysis for difficult cultural assets.

1 is a block diagram of a multifunctional Raman inspection system for cultural properties according to an embodiment of the present invention. As shown in FIG. 1, a micro Raman analysis (A) A Raman spectrometer 50 for Raman analysis, a probe dedicated to cultural properties for Macro-Raman analysis (B), a scanner dedicated to the scanner 10, And a short wavelength laser part 21 selectively connected to the light source 40.

As shown in FIG. 2, the multi-functional Raman inspection system for the cultural property includes a short-wavelength laser unit 21 and the Raman spectrometer 50 for supporting micro-Raman analysis (A) (10).

The short-wavelength laser part 21 can irradiate laser light having a selected wavelength among a plurality of different wavelengths, and the short-wavelength laser part 21 emits laser light having a wavelength shorter than that of the short-wavelength laser part 21 according to the type of cultural property (for example, It is possible to vary the wavelength of the laser light irradiated by the light source 21.

Alternatively, the multifunctional Raman inspection system may comprise a plurality of different short wavelength laser units 21 for irradiating laser lights of different wavelengths, and may selectively select one of the plurality of different short wavelength laser units 21 And may be connected to the scanner unit 10 or the cultural-purpose-specific probe apparatus 40.

For example, as shown in the figure, the plurality of different short wavelength laser units 21 can emit laser beams corresponding to 473 nm, 532 nm, and 633 nm, respectively.

The scanner unit 10 is connected to the short-wavelength laser unit 21 via an optical fiber, and irradiates the laser light from the short-wavelength laser unit 21 to the measurement target through the optical fiber , The scattered light scattered by the object to be measured can be transmitted to the Raman spectrometer (50).

At this time, the object to be measured may be a sample related to cultural properties.

In addition, the scanner unit 10 can irradiate the laser light to the current scan point of the measurement target while scanning the measurement target according to a preset scan method, and the position related to the scan point and the scan progress degree Can be generated.

The Raman spectrometer 50 may detect a Raman spectrum corresponding to the scattered light based on the scattered light transmitted from the scanner unit 10 and may be a CCD (Charge Coupled Device) ) Detector may be used to record the Raman spectrum. At this time, the CCD detector can generate the Raman spectrum related image.

The multifunctional Raman inspection system for a cultural property according to the present invention may include an external terminal 100 for analyzing the components of the object to be measured and the external terminal 100 is connected to the scanner unit 10 and the Raman spectrometer Or may be interconnected via a wired or wireless communication scheme. At this time, the external terminal 100 may be composed of a personal computer (PC) or a server

The external terminal 100 receives the scan information related to the measurement point, which is the scan point of the measurement object and the laser light is irradiated from the scanner unit 10, and transmits the scan information from the Raman spectrometer 50 Related image associated with the measurement point, and may display or store the scan information and the spectrum-related image by matching each other.

In addition, the external terminal 100 may store a plurality of different characteristic information for each component generated through the precise analysis of the sample constituting the cultural material using the scanner unit 10, The spectrum of the image and the characteristic information of each component may be compared with each other to detect the components having mutually identical wavelengths, and then the component detection information for one or more components constituting the measurement object may be generated and displayed.

At this time, the external terminal 100 may be configured as a controller, and the controller generates the component detection information through comparison analysis of the spectrum and the characteristic information for each component, Can be displayed through.

In the above-described configuration, when the scanner unit 10, the laser wavelength unit, and the Raman spectrometer 50, which support micro-Raman analysis for precise analysis, are used for Raman analysis on the cultural property, It is difficult to apply the configuration of the Raman system for precise analysis to the cultural property which is fixed in a specific place because the mobility is not guaranteed because the size and the weight are considerable.

In addition, the scanner unit 10 irradiates the laser light provided through the short-wavelength laser unit 21 with a focus of a micro-unit (or a micro-scale). Since the characteristic of the cultural material must be prevented from being damaged, It is essential to grasp whether or not the measurement point of the laser beam irradiated is damaged.

As a result, it is necessary to perform the inspection directly through the Raman analysis at the site where the cultural property is located, so that the mobility of the Raman inspection system is required.

Recently, portable Raman analyzers have been developed for providing portability and portability. However, when the conventional portable Raman analyzer is used to focus laser light on a micro-unit focus and irradiate the laser light to the measurement object, It is difficult to identify the point where the survey was conducted, and it is difficult to determine whether the cultural property is damaged due to difficulty in identifying the measurement point.

In addition, since the existing portable Raman analyzer is used independently of the scanner unit 10 for precision analysis, it can be used as a conventional micro Raman analyzer that does not support any interworking with a portable Raman analyzer applicable to Raman analysis of cultural properties. There is a problem that it is difficult to apply the related system to micro-Raman analysis of the cultural property.

In order to solve this problem, the present invention provides a method for supporting a movable macro Raman analysis supporting separation of a laser wavelength part and a Raman spectrometer 50 connected to the scanner unit 10 to support mobility and portability for Raman analysis of cultural properties And by providing a dedicated probe device 40 for cultural properties, it is possible to easily identify the measurement point irradiated with the laser light during Raman analysis, which is the object of measurement of cultural property, and at the same time, It is possible to easily identify whether or not the image is damaged, and to provide a common structure with the conventional scanner unit 10.

Accordingly, the present invention can provide a Raman analysis system which can be used for both micro-Raman analysis (A) for precision analysis and macro-Raman analysis (B) for basic analysis supporting mobility, Will be described in detail.

3, the short-wavelength laser unit 21 and the Raman spectrometer 50 connected to the scanner unit 10 are configured to be detachable or connectable from the scanner unit 10, and the short- The laser scanner 20 may be connected to a mode scrambler 22 to support a moving macro Raman analysis B from the scanner unit 10, The laser unit 20 may be configured to be connected to a probe device 40 dedicated to cultural properties for Raman analysis of cultural properties.

Here, the mode scrambler unit 22 may be included in the short wavelength laser unit 21. In this case, the laser unit 20 may include a short wavelength laser unit 21 including the mode scrambler unit 22, ≪ / RTI >

Accordingly, the short wavelength laser part 21 constituting the laser part 20 is connected to the mode scrambler part 22 through the optical fiber to provide laser light to the mode scrambler part 22, The mode scrambler unit 22 configured in the short wavelength laser unit 20 can provide the laser light transmitted from the short wavelength laser unit 21 to the culture material specific probe apparatus 40. [

At this time, since the confirmation of the measurement point is required to determine whether or not the measurement point of the laser beam irradiated to the cultural property is damaged when the Raman analysis is performed, the mode scrambler unit 22 ) Can extend the focus of a micro unit (size) to a macro unit (size).

4, the mode scrambler unit 22 connects the short-wavelength laser unit 21 and the cultural-property-specific probe apparatus 40 to form a laser beam (not shown) provided by the short-wavelength laser unit 21, The microfluidic device can selectively extend the focus of the laser light to the macro-Raman size (or micro-scale) (or macro unit) by selectively pressurizing the optical fiber that transmits the ultrasound probe 40 to the cultural-

Meanwhile, the cultural-property-specific probe apparatus 40 transmits the laser light expanded in macro units through the mode scrambler unit 22 through the optical fiber, and designates a specific portion of the cultural material as a measurement object, 40 can be irradiated to the object to be measured.

In addition, the cultural-property-specific probe apparatus 40 collects the scattered light generated by scattering the laser light irradiated to the measurement object by the measurement object through the optical system constituted in the cultural-property-specific probe apparatus 40, Can be transmitted through the optical fiber to the Raman spectrometer 50 connected to the device 40 via optical fibers.

At this time, the cultural-property-specific probe apparatus 40 includes a camera section and a light source section for providing a visible image to a measurement point, which is an irradiation point of the laser light irradiated to the cultural property, and irradiates the cultural property through the light source section and the optical system. The reflected light generated by reflecting the visible light by the cultural property is transmitted to the camera unit to generate a visible image, and the visible image can be stored.

Meanwhile, the Raman spectrometer 50 may generate a spectral-related image through Raman analysis based on the scattered light received through the optical fiber from the cultural-property-specific probe apparatus 40, and then transmit the spectrum-related image to the external terminal 100.

Through the above-described configuration, the external terminal 100 compares characteristic information for various components collected through the Raman analysis performed through the scanner unit 10 with the spectrum-related image corresponding to the cultural property, It is possible to detect the components constituting the measurement object measured by the probe apparatus 40 and thereby generate and display the component detection information for one or more components constituting the cultural property.

In other words, the conventional portable Raman analyzer has a limited range of identifiable components through analysis of Raman, and there are limitations on analyzing the components of various cultural heritages such as pictures, towers, Buddha statues, etc., By providing a common structure so that various component information obtained through the fixed micro Raman analysis for precise analysis can be compared with the component information obtained through the mobile macro Raman analysis using the cultural property specific probe device 40, In addition to being capable of supporting precise analysis through the Raman analysis system, it is also possible to provide a visual image of the measurement point irradiated on the cultural property of the laser beam, so that it is possible to clearly determine whether the cultural property is damaged through the visual image, Ensure ease of analysis, reliability and safety .

5, the cultural-property-specific probe apparatus 40 includes a filter unit 41, a light source unit 32, a camera unit (not shown) The first reflecting mirror 44, the second reflecting mirror 48 and the mirror 49, and the first condensing lens unit 45 and the second condensing lens unit 47, the objective lens unit 46, the first reflecting mirror 44, As shown in FIG.

At this time, the first and second condenser lens units 45 and 47, the objective lens unit 46, the first reflector 44, the second reflector 48, and the mirror 49, And may be configured as an optical system configured in the dedicated probe apparatus 40. [

The light source unit may be a light emitting diode (LED) module.

A separate additional condenser lens 42 and an additional mirror 43 may be formed between the filter unit 41 and the first reflector 44. The first and second condenser lens units 45, 47 may be composed of a plurality of lenses.

The filter unit 41 may transmit the laser light provided from the short wavelength laser unit 21 to the first reflector 44, The laser light incident through the filter unit 41 is incident on the first reflector 44 through the additional condenser lens 42 and the additional mirror 43 formed between the filter unit 41 and the first reflector 44, Lt; / RTI >

The first reflector 44 transmits the laser light and transmits the laser light to the first condenser lens unit 45. The first condenser lens unit 45 transmits the laser light to the objective lens unit 45, (46).

Accordingly, the objective lens unit 46 can condense the laser light having passed through the first condenser lens unit 45 to irradiate the laser light to a specific point of the cultural material to be measured, The scattered light generated by the laser light collision can be collected and provided to the first condenser lens unit 45.

At this time, the objective lens unit 46 may be formed of a microscope, and the laser light incident at a macro size can be irradiated onto the measurement target with a macro size (or unit) of focus.

The first condenser lens unit 45 may collect scattered light provided from the objective lens unit 46 and provide the scattered light to the first reflector 44. The first reflector 44 reflects the scattered light And can be supplied to the filter unit 41.

At this time, the first reflector 44 may provide the scattered light to the filter unit 41 through the additional condenser lens 42 and the additional mirror 43.

Accordingly, the filter unit 41 can remove the noise other than the scattered light provided from the first reflector 44 and provide the scattered light to the Raman spectrometer 50 through the optical fiber.

Meanwhile, the light source unit 32 reflects visible light through the mirror 49 to generate an image of the point where the laser light is irradiated to the measurement object, and transmits the visible light to the second condenser lens unit 47, And the objective lens unit 46 through the first condenser lens unit 44 and the first condenser lens unit 45.

Accordingly, the objective lens unit 46 irradiates the visible light to the object to be measured, collects the reflected light generated by the visible light reflected by the object to be measured, 1 reflection mirror 44 and the second condenser lens unit 47 to the second reflector 48. [

At this time, the first reflector 44 and the second reflector 48 may reflect visible light incident on the front surface and transmit visible light incident on the rear surface.

In addition, the second condenser lens unit 47 may transmit the visible light or the reflected light so that the visible light or the reflected light is incident upon the visible light or the reflected light.

The second reflector 48 reflects the reflected light having passed through the second condenser lens unit 47 and can transmit the reflected light to the camera unit 31 through which the camera unit 31 reflects the reflected light And generate a visual image of the measurement point irradiated with the laser beam on the measurement object. At this time, the camera unit 31 may store the visible image or transmit the visible image to the outside.

As described above, the cultural-property-specific probe apparatus 40 can collect the scattered light irradiated with the laser light through the optical system and the camera unit 31, and transmit the scattered light to the Raman spectrometer 50 In addition, by providing a visual image of the measurement point irradiated by the laser light on the cultural material, it is possible to clearly identify the measurement point of the cultural property through the visual image, and to judge whether or not the cultural property is damaged To provide a safe Raman analysis for cultural properties that require confirmation of measurement points and damage.

As described above, the present invention supports laser light used for micro-Raman analysis for micro-analysis of a sample to be extended in macro units in micro units, thereby separating some of the equipment for micro-Raman analysis, The present invention provides a common structure that can be used as a device for analyzing a movable macro Raman which can perform Raman analysis in a place where a macro Raman analysis is performed, It is possible to support Raman analysis easiness of cultural property and to improve the accuracy of analysis result of cultural property.

The various devices and components described herein may be implemented by hardware circuitry (e.g., CMOS-based logic circuitry), firmware, software, or a combination thereof. For example, it can be implemented utilizing transistors, logic gates, and electronic circuits in the form of various electrical structures.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or essential characteristics thereof. Therefore, the embodiments disclosed in the present invention are intended to illustrate rather than limit the scope of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

10: scanner part 20: laser part
21: short wavelength laser part 22: mode scrambler part
40: Probe device dedicated to cultural property
50: Raman spectrometer 100: External terminal

Claims (8)

In a multifunctional Raman inspection system that supports both stationary micro Raman analysis for precise analysis of cultural properties and movable macro Raman analysis for basic analysis of cultural properties,
A scanner unit for micro-Raman analysis;
Probe device dedicated to cultural properties for macro Raman analysis;
A Raman spectrometer for performing Raman analysis; And
And a short wavelength laser unit selectively connected to the scanner unit and the cultural property specific probe unit,
Wherein the short-wavelength laser unit includes a mode scrambler unit for extending the focus of the short-wavelength laser when connected to the cultural-
The above-mentioned cultural property specific probe apparatus comprises an optical system for irradiating the object to be measured with the laser light provided from the short-wavelength laser part and delivering the scattered light generated by the laser light scattered by the object to be measured to the Raman spectrometer, And a light source unit for providing a visible light for photographing the visible image to the optical system. The multifunctional Raman inspection system for cultural property research.
The method according to claim 1,
Wherein the short wavelength laser section provides a selected wavelength of a plurality of different wavelengths to the mode scrambler section,
Characterized in that the mode scrambler unit selectively expands the optical fiber for transmitting the laser light to the cultural-property-dedicated probe apparatus when connected to the cultural-property-dedicated probe apparatus, thereby extending the focus of the laser light to the Macro-Raman size. Inspection system.
The method according to claim 1,
Wherein the cultural-property-dedicated probe apparatus irradiates the measurement object with the laser light provided through the short-wavelength laser unit, transmits scattered light scattered by the measurement object to the Raman spectrometer, irradiates the measurement object with the visible light, Wherein the reflected light reflected by the measurement target is transmitted to the camera unit through the optical system and the visible image is generated with respect to the measurement point corresponding to the laser light irradiated to the measurement target through the camera unit. Raman inspection system.
The method according to claim 1,
Wherein the Raman spectrometer is connected to the probing device dedicated to the cultural property via optical fibers to collect the scattered light transmitted through the optical fiber from the probing device dedicated to cultural properties to generate a Raman spectrum related image. Raman inspection system.
The method of claim 4,
An external device that compares the image received from the Raman spectrometer with the property information of each component stored in advance through the precise analysis and provides component detection information for at least one component corresponding to the point where the laser light is irradiated A multifunctional Raman inspection system for the study of cultural properties.
The method according to claim 1,
The scanner unit is configured to be selectively connectable to the short-wavelength laser unit. The scanner unit irradiates the laser light transmitted through the optical fiber from the short- Characterized in that scattered light scattered by the object to be measured is provided to the Raman spectrometer.
The method according to claim 1,
The cultural-property-dedicated probe apparatus
A light source unit for providing visible light;
A first reflector that transmits the laser light and the scattered light provided from the short wavelength laser portion and reflects the visible light;
An objective lens unit for collecting the scattered light or reflected light generated by condensing the laser light or visible light and irradiating the object to be measured;
A first condenser lens unit that transmits the laser light or visible light incident through the first reflector to the objective lens unit, collects scattered light or reflected light provided from the objective lens unit, and transmits the collected scattered light or reflected light to the first reflector;
A second condenser lens unit for collecting and transmitting the reflected light reflected by the first reflector;
A mirror which reflects the visible light emitted by the light source unit and provides the reflected light to the first reflector through the second condenser lens unit and reflects the reflected light incident from the second condenser lens unit; And
A camera unit for generating a visible image for grasping a measurement point where the laser light is irradiated to the measurement target based on the reflected light reflected on the mirror and whether the cultural material is damaged to the measurement point,
Multifunctional Raman inspection system for cultural property research including.
The method of claim 7,
The cultural property specific probe device further comprises a filter unit for providing laser light provided from the short wavelength laser unit to the first reflector and for removing noise other than the scattered light and delivering the scattered light to the Raman spectrometer Multifunctional Raman Inspection System for Cultural Properties Research.

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