KR101779028B1 - The method of characterization technique of 4-port coupled lines - Google Patents

The method of characterization technique of 4-port coupled lines Download PDF

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KR101779028B1
KR101779028B1 KR1020160019082A KR20160019082A KR101779028B1 KR 101779028 B1 KR101779028 B1 KR 101779028B1 KR 1020160019082 A KR1020160019082 A KR 1020160019082A KR 20160019082 A KR20160019082 A KR 20160019082A KR 101779028 B1 KR101779028 B1 KR 101779028B1
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mode structure
mode
parameter
coupled line
field coupling
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KR20170097395A (en
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어영선
유대규
김준현
민경준
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(주) 와이팜
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/16—Auxiliary devices for mode selection, e.g. mode suppression or mode promotion; for mode conversion

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  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

A method for characterizing a 4-port coupled line is provided. The coupled line characterization method according to the embodiment of the present invention is characterized by combining three new two-port network structures (H-mode, O-mode, G-mode) The frequency dependent circuit model parameters of the line are determined to characterize the 4-port coupled line. As a result, the parasitic effect can be removed more effectively, so that it becomes possible to determine the circuit model parameters of the coupled line accurately.

Description

[0001] The present invention relates to a method for characterizing a 4-port coupled line,

The present invention relates to a method for characterizing a 4-port coupled line, and more particularly to a method for determining and characterizing a frequency dependent circuit model parameter of a 4-port coupled line.

As the operating speed of the system increases, the performance of the system is significantly degraded due to coupling noise, frequency dependent transmission line characteristics, and process variations. Thus, high-speed operation is achieved in various ways to minimize noise in a high-speed system.

Accurate experimental characterization of the two wires, the coupling lines, must be performed in a high speed system design. Also, the characterization technique of the two wirings is indispensable for examining the physical characteristics of multi-lines.

To characterize the coupled line, a 4-port network measurement sample and a 4-port network measurement are required. Since the measurement sample consists of a contact pad for probing, an access line, and the wiring to be measured, the parasitic effect of the contact pads and connection lines must be removed through a de-embedding technique .

The method of eliminating the parasitic effect by applying the concept of the Y-parameter de-embedding technique widely used in the 2-port network to the 4-port scattering coefficient can not be used because the measurement error is too large. In particular, a process variation of a Y-parameter of a test sample and a dummy pad for de-embedding is inevitable due to changes in the process of the test sample.

In addition, Y-parameter de-embedding causes resonance due to the inherent discontinuity between the measurement sample and the measurement system. Since the method of completely removing the resonance phenomenon does not exist so far, it is impossible to completely remove the parasitic effect, and accurate scattering number extraction is impossible.

The extraction of inaccurate scattering numbers ultimately determines inaccurate circuit model parameters, which is a fatal problem in high frequency circuit system design.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a new two-port network structure (H-mode, O-mode, G mode coupled line by characterizing the frequency-dependent circuit model parameters of the coupled line through characterization of the 4-port coupled-line.

According to an aspect of the present invention, there is provided a method of characterizing a coupled line, the method comprising: a first mode structure of a two-port network structure in which two lines are connected to one signal pad; A first determination step of determining a serial impedance of a second mode structure that is a two-port network structure in which only one wiring is connected to a signal pad; A third mode structure that is a two-port network structure in which only one of the two wirings is connected to the signal pad and the other wiring is connected to the ground, and a second determination that determines the parallel admittance of the first mode structure step; And a third determining step of determining a circuit model parameter of the coupled line using the decided series impedance and the parallel admittance.

The first mode structure may be a two-port network structure in which there is no electric-field coupling between two wirings and only magnetic-field coupling exists.

In addition, the second mode structure is characterized in that the other wiring is floating (floating or separated), and there is no electric-field coupling and magnetic-field coupling between the two wirings Port network architecture.

The third mode structure may be a two-port network structure in which electric-field coupling and magnetic-field coupling exist between two wirings.

Also, the first determining step determines the serial impedance of the first mode structure and the second mode structure according to the following equation using the propagation constant and the characteristic impedance determined in the first mode structure and the second mode structure: And,

Figure 112016016178543-pat00001

Figure 112016016178543-pat00002

Here, subscript H denotes a first mode structure, O denotes a parameter of a second mode structure, and subscripts 11 and 12 denote self and coupling parameters in the coupled line.

The third determining step may include using a serial impedance of the first mode structure and the second mode structure,

Figure 112016016178543-pat00003

The serial impedance of the coupled line can be determined according to the above equation.

The second determining step determines the parallel admittance of the third mode structure and the first mode structure according to the following equation using the propagation constant and the characteristic impedance determined in the third mode structure and the first mode structure: And,

Figure 112016016178543-pat00004

Figure 112016016178543-pat00005

Here, subscript G denotes a third mode structure, H denotes a parameter of the first mode structure, and subscripts 11 and 12 denote self and coupling parameters of the coupled line.

The third determining step may include using the parallel admittance of the third mode structure and the first mode structure,

Figure 112016016178543-pat00006

The parallel admittance of the coupled line can be determined according to the above equation.

As described above, according to the embodiments of the present invention, three new two-port network structures (H-mode, O-mode, G -mode), it is possible to eliminate the parasitic effect more effectively, and it becomes possible to determine the circuit model parameter of the coupled line accurately.

Since the circuit model parameters of coupled lines directly affect simulation for performing high speed system design and verification and are one of the important factors in considering the physical characteristics of multiple interconnects, embodiments of the present invention enable optimization of the system design do.

1 is a flowchart of a method of characterizing a coupled line using a new three two-port network structure according to an embodiment of the present invention;
FIG. 2 is a diagrammatic electromagnetic field distribution of the H-mode, O-mode and G-mode structures proposed in the embodiment of the present invention.
3 is an H-mode structural diagram presented in an embodiment of the present invention.
FIG. 4 is an O-mode structural diagram presented in an embodiment of the present invention; FIG.
FIG. 5 is a G-mode structure diagram presented in an embodiment of the present invention. FIG.
6 is a cross-sectional view of a test pattern structure used in an embodiment of the present invention.
7 is a graph showing resistance and inductance per unit length determined by a method of characterizing a coupled line according to an embodiment of the present invention.
8 is a graph showing capacitance and conductance per unit length determined by a method of characterizing a coupled line according to an embodiment of the present invention.

Hereinafter, the present invention will be described in detail with reference to the drawings.

In an embodiment of the present invention, a method of experimentally determining and characterizing a frequency dependent circuit model parameter of a 4-port coupled line is presented. In the 4-port coupled line characterization method according to the embodiment of the present invention, frequency dependent circuit model parameters, i.e., resistance, inductance, capacitance, and conductance are determined to characterize the coupled line.

1 is a flow chart provided in the description of a 4-port coupled line characterization method according to an embodiment of the present invention. As shown in FIG. 1, in the embodiment of the present invention, three new mutually independent two-port network structures (H-mode, O-mode, G-mode) To characterize the 4-port coupled lines by determining the frequency dependent circuit model parameters of the coupled lines.

The two-port scattering coefficient obtained by measuring each structure shows the propagation coefficient of the transmission line (

Figure 112016016178543-pat00007
) And characteristic impedance (
Figure 112016016178543-pat00008
) Can be expressed by a circuit model parameter as shown in the following equation (1).

Figure 112016016178543-pat00009

Figure 112016016178543-pat00010

Here X is used to represent three different structures. The propagation constant and the characteristic impedance determined through Equation (1) are used to determine the serial impedance of each structure

Figure 112016016178543-pat00011
) And parallel admittance (
Figure 112016016178543-pat00012
) Can be derived as shown in the following equation (2).

Figure 112016016178543-pat00013

Figure 112016016178543-pat00014

Therefore, the resistance determined in each structure (

Figure 112016016178543-pat00015
), Inductance (
Figure 112016016178543-pat00016
), Capacitance
Figure 112016016178543-pat00017
), Conductance (
Figure 112016016178543-pat00018
) Can determine the circuit model parameters of the coupled line, it is possible to characterize the coupled line without a 4-port network measurement.

In the embodiment of the present invention, three two-port network structures are used, each consisting of one signal pad and two wires. Fig. 2 shows the schematic electromagnetic field distribution of the three structures, and the structure is the same as Fig. 3 to Fig. 5, and the sectional view is the same as Fig.

As shown in the left side of FIG. 2, in the first structure, there is no electric-field coupling between two wirings and only magnetic-field coupling exists, , Simply, H-mode).

As shown in FIG. 3, the H-mode structure is a two-port network structure in which two wires are connected to one signal pad.

And, as shown in the center of FIG. 2, the second structure is called a magnetic-field coupling free mode (simply, O-mode) because the magnetic field coupling is completely removed.

As shown in FIG. 4, the O-mode structure is a two-port network structure in which only one of the two wires is connected to the signal pad and the other wire is floating (floating or remote). There is no electric-field coupling and magnetic-field coupling between the two wires.

Further, as shown in the right side of FIG. 2, the third structure is referred to as a ground mode (ground mode, simply, G-mode) because one of the two wires is connected to the ground.

That is, as shown in FIG. 5, the G-mode structure is a 2-port network structure in which one of two wirings is connected to a signal pad and the other wiring is connected to ground (ground). There is electric-field coupling and magnetic-field coupling between the two wires.

The serial impedance of the H-mode and the O-mode can be derived by using the propagation constant and the characteristic impedance determined in the H-mode structure and the O-mode structure, as shown in Equation 3 below.

Figure 112016016178543-pat00019

Figure 112016016178543-pat00020

Here, subscript H denotes a parameter extracted from the H-mode structure, and O denotes a parameter extracted from the O-mode structure. The subscript 11 is the self-parameter of the coupled line, and 12 is the coupling-parameter.

For the H-mode structure, the self-parameter and coupling-parameter of the coupled line can be determined because it includes magnetic-field coupling. In the O-mode structure, the magnetic-field Since it does not include coupling (magnetic field coupling), only self-parameters can be determined.

(3), the serial impedance of the coupled line can be derived / determined as shown in Equation (4) below.

Figure 112016016178543-pat00021

Similarly, the parallel admittance of G-mode and H-mode can be derived by using the propagation constant and characteristic impedance of G-mode and H-mode as shown in Equation (5).

Figure 112016016178543-pat00022

Figure 112016016178543-pat00023

Where the subscript G is the parameter extracted from the G-mode structure. In the case of the G-mode structure, the coupling-parameter of the capacitance and conductance can be determined because one wiring is connected to the ground, and the electric-field coupling is eliminated in the H-mode, The capacitance and conductance self-parameter for the wiring can be determined.

(5), the parallel admittance of the coupled line can be derived / determined as shown in Equation (6) below.

Figure 112016016178543-pat00024

Then, the circuit model parameters of the coupled line are determined using the series impedance of the coupled line determined through Equation (4) and the parallel admittance of the coupled line determined through Equation (6).

Thus, the circuit model parameters of the coupled line can be determined using the H-mode, the O-mode, and the G-mode structure.

The resistance and inductance per unit length determined by the method of characterizing the coupled line according to the embodiment of the present invention are shown in Fig. 7, and the capacitance and conductance per unit length are shown in Fig.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, It will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the present invention.

H-mode / O-mode / G-mode
S: Signal pad
G: Ground

Claims (8)

A first mode structure of a two-port network structure in which two wirings are connected to a signal pad and a second mode structure of a two-port network structure in which only one of the two wirings is connected to a signal pad A first determining step of determining a serial impedance;
A third mode structure that is a two-port network structure in which only one of the two wirings is connected to the signal pad and the other wiring is connected to the ground, and a second determination that determines the parallel admittance of the first mode structure step; And
And determining a circuit model parameter of the coupled line by using the determined serial impedance and the parallel admittance.
The method according to claim 1,
Wherein the first mode structure comprises:
Port network structure in which there is no electric-field coupling between two wirings and only magnetic-field coupling is present.
The method according to claim 1,
Wherein the second mode structure comprises:
Port network structure in which the other wiring is separated and electric-field coupling and magnetic-field coupling are not present between the two wirings.
The method according to claim 1,
Wherein the third mode structure comprises:
Port network structure in which electric-field coupling (magnetic field coupling) and magnetic-field coupling (magnetic field coupling) exist between two wirings.
The method according to claim 1,
Wherein the first determining step comprises:
Determining a serial impedance of the first mode structure and the second mode structure according to the following equation using the propagation constant and the characteristic impedance determined in the first mode structure and the second mode structure,
Figure 112017060406738-pat00025

Figure 112017060406738-pat00026

Here, the subscript H denotes a first mode structure, O denotes a parameter of a second mode structure, and subscripts 11 and 12 indicate a self-parameter (coupling parameter) and a coupling-parameter / RTI >
The method of claim 5,
Wherein the third determining step comprises:
Using the serial impedance of the first mode structure and the second mode structure,
Figure 112016016178543-pat00027

Wherein the series impedance of the coupled line is determined according to the above equation.
The method according to claim 1,
Wherein the second determining step comprises:
Determining a parallel admittance of the third mode structure and the first mode structure according to the following equation using the propagation constant and the characteristic impedance determined in the third mode structure and the first mode structure,
Figure 112017060406738-pat00028

Figure 112017060406738-pat00029

Here, the subscript G indicates a parameter of a third mode structure, H the parameter of a first mode structure, and the subscripts 11 and 12 indicate a self-parameter (coupling parameter) and a coupling-parameter / RTI >
The method of claim 7,
Wherein the third determining step comprises:
Using the parallel admittance of the third mode structure and the first mode structure,
Figure 112016016178543-pat00030

Wherein the parallel admittance of the coupled line is determined according to the above equation.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210085765A (en) * 2019-12-31 2021-07-08 (주) 와이팜 The method of modeling characteristic parameters of coupled transmission lines

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100764660B1 (en) 2006-11-01 2007-10-08 삼성전기주식회사 Signal transient simulation of multi-coupled frequency-variant transmission lines
US20130093451A1 (en) 2011-10-14 2013-04-18 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for de-embedding
KR101393423B1 (en) 2013-04-09 2014-05-12 (주) 와이팜 Frequency-variant transmission line parameter determination method using frequency-variant complex permittivity

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100764660B1 (en) 2006-11-01 2007-10-08 삼성전기주식회사 Signal transient simulation of multi-coupled frequency-variant transmission lines
US20130093451A1 (en) 2011-10-14 2013-04-18 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for de-embedding
KR101393423B1 (en) 2013-04-09 2014-05-12 (주) 와이팜 Frequency-variant transmission line parameter determination method using frequency-variant complex permittivity

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210085765A (en) * 2019-12-31 2021-07-08 (주) 와이팜 The method of modeling characteristic parameters of coupled transmission lines
KR102394417B1 (en) 2019-12-31 2022-05-06 (주) 와이팜 The method of modeling characteristic parameters of coupled transmission lines

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