KR101763581B1 - Machine vision system for supporting various image sensor - Google Patents

Machine vision system for supporting various image sensor Download PDF

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KR101763581B1
KR101763581B1 KR1020150187072A KR20150187072A KR101763581B1 KR 101763581 B1 KR101763581 B1 KR 101763581B1 KR 1020150187072 A KR1020150187072 A KR 1020150187072A KR 20150187072 A KR20150187072 A KR 20150187072A KR 101763581 B1 KR101763581 B1 KR 101763581B1
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image
unit
image sensor
clock
contour
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KR1020150187072A
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KR20170081770A (en
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강용우
최성환
남욱원
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한국 천문 연구원
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    • H04N5/232—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • H04N5/2254—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

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  • Computer Vision & Pattern Recognition (AREA)
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Abstract

The present invention relates to a machine vision system that supports various image sensors, and more particularly, to a machine vision system that supports various image sensors, including an image sensor module that acquires a video signal and includes an image sensor detachably mounted thereon, And an image analyzing unit connected to the image processing unit and analyzing the image signal.

Description

TECHNICAL FIELD [0001] The present invention relates to a machine vision system that supports various image sensors,

The present invention relates to a machine vision system supporting various image sensors that can be replaced by image sensors.

A machine vision system is a kind of factory automation system that uses a camera and a computer to replace the work of detecting human eyes and detecting defects, etc., and is a system in which a computer analyzes and processes image information obtained from a camera.

Machine vision systems are mainly used for automation inspection in production sites. For automation inspection, machine vision system obtains image data by using electric, optical, and non-contact technology, processes and analyzes the image, Technology.

In recent years, it has been actively applied to inspection for inspection of electronic products, automobile manufacturing, clinical diagnostic devices, document handling, aerospace manufacturing, PCB inspection, pharmaceutical and medical fields, and packaging.

In particular, machine vision technology has been widely used in industrial fields as it is developed not only for simple measurement, but also for acquired image processing,

Conventional machine vision systems have produced one machine vision system using one image sensor.

Accordingly, in the measurement using the machine vision system, a different machine vision system must be used depending on the measurement environment such as illumination and the object to be measured, so that various machine vision systems must be provided.

Korean Patent Publication No. 10-2013-0080999

SUMMARY OF THE INVENTION It is an object of the present invention to provide a machine vision system that supports various image sensors that can be used by selectively replacing an image sensor.

According to an aspect of the present invention, there is provided an image sensor comprising: an image sensor module that acquires a video signal and includes an image sensor detachably mounted thereon; a display unit coupled to the image sensor module to provide a clock and a driving voltage according to the image sensor; There is provided a machine vision system supporting various image sensors including an image processor for processing a video signal and an image analyzer connected to the image processor for analyzing the image signal.

As described above, the machine vision system supporting the various image sensors according to the embodiment of the present invention is configured to selectively replace the image sensor, so that one machine vision system can select the image sensor according to the measurement environment and the measurement target It is possible to perform precise measurement through the machine vision system optimized for the measurement environment and the object to be measured, and it is possible to reduce the cost because there is no need to provide a plurality of machine vision systems.

1 is a block diagram illustrating a machine vision system supporting various image sensors in accordance with an embodiment of the present invention;
FIG. 2 is a block diagram showing the image processing unit of FIG. 1; FIG.
FIG. 3 is a block diagram showing the image analysis unit of FIG. 1; FIG.

Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. However, this is merely an example and the present invention is not limited thereto.

In the following description, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

FIG. 1 is a block diagram illustrating a machine vision system supporting various image sensors according to an exemplary embodiment of the present invention. FIG. 2 is a block diagram illustrating the image processing unit of FIG. 1, and FIG. FIG.

1, a machine vision system supporting various image sensors according to an exemplary embodiment of the present invention includes an image sensor module 120, an image processing unit 130, and an image analysis unit 140. As shown in FIG.

The image sensor module 120 acquires an image signal, and the image sensor 121 may be detachably attached to the lens unit 110.

Here, the lens unit 110 may transmit the light reflected from the measurement object to the image sensor 121. At this time, the lens unit 110 may be composed of one lens, or a plurality of lenses may be stacked. In particular, when the lens unit 110 is composed of one lens, it may be constituted by a polarizing lens or a flat lens. However, the present invention is not limited thereto.

In addition, the lens unit 110 may be replaceable according to the image sensor 121. For example, the lens unit 110 may be replaced with a lens unit 110 that is optimized according to a measurement environment and an object to be measured.

The image sensor module 120 may include an image sensor 121. Here, the image sensor 121 converts the light transmitted through the lens unit 110 into an image signal, which is an electrical signal, and outputs the image signal, thereby acquiring a video signal.

At this time, the image sensor module 120 may be detachably attached to the image sensor 121.

That is, the image sensor module 120 may be provided to selectively replace the image sensor 121 according to the measurement environment and the measurement object. For example, although not shown in the drawing, the image sensor module 120 may be provided with a socket-type adapter, and the image sensor 121 may be selectively detached from the adapter. However, the present invention is not limited thereto, and any configuration can be used as long as the image sensor module 120 is detachably mounted on the image sensor module 120.

Accordingly, since one machine vision system can selectively measure and replace the image sensor 121 in accordance with the measurement environment and the measurement object, accurate measurement can be performed through the machine vision system optimized for the measurement environment and the measurement object, Since there is no need to have a plurality of machine vision systems, the cost can be reduced.

1 and 2, the image processor 130 is connected to the image sensor module 120 to provide a clock and a driving power according to the image sensor 121, and processes an image signal A clock generating unit 131, a power supply unit 132, and a control unit 133.

The clock generation unit 131 may generate a clock provided to the image sensor 121 as shown in FIG. Here, the clock generator 131 may generate a clock for controlling the driving of the image sensor 121 and provide the clock to the image sensor 121. That is, the clock generation unit 131 may generate and provide an initialization signal for initializing all the pixels of the image sensor 121, and may generate a vertical transmission clock for transmission of the video signal output from the image sensor 121, A horizontal transfer clock can be generated and provided.

The power supply unit 132 may supply driving power for driving the image sensor 121, as shown in FIG. The power supply unit 132 may supply driving power to the image sensor 121 according to the type of the image sensor 121.

2, the control unit 133 controls the clock generation unit 131 and the power supply unit 132. The control unit 133 controls the clock generation unit 131 and the power supply unit 132 according to the image sensor 121. [ 132).

The control unit 133 controls the clock generation unit 131 and the power supply unit 132 such that a clock and a driving power for driving the image sensor 121 are provided to the image sensor 121 according to the image sensor 121, Can be controlled.

That is, the controller 133 controls the clock generator 131 and the power supply unit 132 to control the voltage value of the driving power required for driving the image sensor 121 according to the type of the image sensor 121 And can control the number of clocks, the clock frequency, the clock waveform, and the clock voltage level required for driving the image sensor 121 according to the type of the image sensor 121.

Meanwhile, the controller 133 may store set values for the clock and the driving power according to the image sensor 121. [ Here, the clock and the driving power for driving the image sensor 121 may be different depending on the type of the image sensor 121. The set value may be a clock and a driving power for driving the image sensor 121, (121). At this time, although not shown in the figure, the control unit 133 can be connected to a PC, and a setting value can be set through a PC.

2, the image processing unit 130 may further include an image output unit 134 for processing and outputting a video signal according to a clock generated by the clock generation unit 131. In addition,

The image output unit 134 may include an amplification unit 135, a sample hold unit 136, and an A / D unit 137 as shown in FIG.

The amplification unit 135 amplifies the image signal output from the image sensor 121 and outputs the amplified image signal.

The sample hold unit 136 may sample the amplified image signal from the amplification unit 135 and output the sampled image signal.

In addition, the A / D unit 137 may convert a video signal into a digital video signal and output the digital video signal.

At this time, the image output unit 134 may be controlled by the control unit 133. [ Here, the controller 133 controls the sampling and holding of the video signal by controlling the sample hold unit 136, and controls the A / D unit 137 to convert the video signal into a digital video signal, have.

The image output unit 134 may further include a delay unit 138 for delaying a clock for controlling operation of the sample hold unit 136. [ At this time, the delay unit 138 may be a capacitor.

Specifically, when the image sensor 121 is provided with an initialization signal and a video signal is output for each pixel, a predetermined time is required due to the characteristics of the image sensor 121 storing the charge. Since the clock for controlling the operation of the sample hold unit 136 is delayed and provided to the sample hold unit 136 through the delay unit 138, sampling of the video signal in the sample hold unit 136 is delayed . Accordingly, the delay unit 138 delays the clock for controlling the operation of the sample hold unit 136 so that the time when the image signal is output from the image sensor 121 and the time when the image signal is sampled from the sample hold unit 136 It is possible to minimize the loss of charges output from each pixel to obtain a video signal.

The image processor 130 removes noise from the clock provided to the image sensor 121 from the clock generator 131 and removes noise from the clock provided to the sample hold unit 136 139).

The noise filter unit 139 removes the noise of the vertical transfer clock and the horizontal transfer clock supplied from the clock generator 131 to the image sensor 121 so that an accurate image signal is output from the image sensor 121 . Since the noise filter unit 139 removes the noise of the clock supplied to the sample hold unit 136, the image sensor 121 and the sample hold unit 136 can be operated in synchronization with each other, The loss can be minimized and a high quality video signal can be obtained.

3, the image analysis unit 140 is connected to the image processing unit 130 and is capable of analyzing the image signal. The image analysis unit 140 includes an outline detection unit 141, a storage unit 142, and a change amount detection unit 143 ).

Here, the contour detection unit 141 can detect an outline image of a measurement object from a video signal. At this time, the outline image is a feature indicating the boundary of the region within the image of the object to be measured, and may be a discontinuous point of the pixel brightness, that is, the brightness of the pixel suddenly changes. Accordingly, the outline image is a place where there is a difference in brightness within the image of the object to be measured, and may be a place corresponding to the boundary of the object to be measured.

On the other hand, the contour detecting unit 141 can detect the column-direction contour image Lx and the row-direction contour image Ly through the Sobel mask.

That is, the column direction contour image Lx

Figure 112015127275543-pat00001
, And the row direction contour image Ly can be detected through
Figure 112015127275543-pat00002
As shown in FIG. Here, L may be a video signal.

In addition, the contour detecting unit 141 may detect the contour image through completing the square using the column direction contour image Lx and the row contour image Ly.

Accordingly, the contour image (L)

Figure 112015127275543-pat00003
As shown in FIG.

The storage unit 142 may store the contour image detected by the contour detecting unit 141. [

At this time, the storage unit 142 may accumulate and store the contour images detected by the contour detection unit 141. For example, the storage unit 142 may accumulate and accumulate sequentially from the first contour image detected from the first measured video signal to the n'th contour detected from the nth measured video signal.

The change amount detecting unit 143 may compare the contour image stored in the storage unit 142 and detect the amount of change of the contour line according to the comparison result.

That is, the change amount detecting unit 143 compares the n-th contour image stored in the storage unit 142 with the n + 1-th contour image stored in the storage unit 142, and calculates the change amount of the contour through the difference according to the comparison result Can be detected.

Reference throughout this specification to " one embodiment ", etc. of the principles of the invention, and the like, as well as various modifications of such expression, are intended to be within the spirit and scope of the appended claims, it means. Thus, the appearances of the phrase " in one embodiment " and any other variation disclosed throughout this specification are not necessarily all referring to the same embodiment.

It will be understood that the term " connected " or " connecting ", and the like, as used in the present specification are intended to include either direct connection with other components or indirect connection with other components. Also, the singular forms in this specification include plural forms unless the context clearly dictates otherwise. Also, components, steps, operations, and elements referred to in the specification as " comprises " or " comprising " refer to the presence or addition of one or more other components, steps, operations, elements, and / or devices.

The present invention has been described with reference to the preferred embodiments. It is to be understood that all embodiments and conditional statements disclosed herein are intended to assist the reader in understanding the principles and concepts of the present invention to those skilled in the art, It will be understood that the invention may be embodied in various other forms without departing from the spirit or essential characteristics thereof. Therefore, the disclosed embodiments should be considered in an illustrative rather than a restrictive sense. The scope of the present invention is defined by the appended claims rather than by the foregoing description, and all differences within the scope of equivalents thereof should be construed as being included in the present invention.

110: lens unit 120: image sensor module
121: image sensor 130: image processor
131: clock generating unit 132: power supply unit
133: Control unit 134: Video output unit
135: amplification unit 136: sample hold unit
137: A / D unit 138: delay unit
139: Noise filter unit 140: Image analysis unit
141: contour detection unit 142:
143:

Claims (7)

An image sensor module acquiring a video signal and detachably mounting an image sensor;
An image processor connected to the image sensor module to provide a clock and a driving voltage according to the image sensor, and to process the image signal; And
And an image analysis unit connected to the image processing unit and analyzing the image signal,
The image processing unit
A clock generator for generating a clock provided to the image sensor;
A power supply unit for supplying driving power for driving the image sensor; And
And a controller for controlling the clock generator and the power supply unit according to the image sensor,
The control unit is connected to a personal computer (PC), and sets a clock number, a clock frequency, a clock waveform, and a clock voltage level of the clock necessary for driving the image sensor according to the image sensor through the PC, Wherein the image sensor includes a plurality of image sensors for setting a voltage value of the driving voltage for each pin.
delete The method according to claim 1,
The control unit
And various image sensors in which set values of the clock and the driving voltage are stored according to the image sensor.
The method according to claim 1,
The image processing unit
And a video output unit for processing and outputting the video signal according to a clock generated by the clock generator,
The image output unit
An amplifier for amplifying the video signal;
A sample hold unit for sampling the image signal amplified by the amplifying unit; And
An A / D unit for converting a video signal sampled by the sample hold unit into a digital video signal;
A machine vision system that supports a variety of image sensors.
5. The method of claim 4,
The image output unit
And a delay unit for delaying the clock for controlling the operation of the sample hold unit.
The method according to claim 1,
The image analysis unit
An outline detection unit for detecting an outline image of the measurement object from the image signal;
A storage unit for storing the contour image detected by the contour detection unit; And
A change amount detecting unit for comparing the contour image stored in the storage unit and detecting a change amount of the contour line according to the result;
A machine vision system that supports a variety of image sensors.
The method according to claim 6,
The contour detection unit detects the contour image (L) through the column direction contour image (Lx) and the row contour image (Ly) through the Sobel mask,
The column direction contour image Lx
Figure 112015127275543-pat00004
ego,
The row direction contour image Ly is
Figure 112015127275543-pat00005
Lt;
The contour image (L)
Figure 112015127275543-pat00006
, ≪ / RTI >
Where L is the image signal, supporting various image sensors.
KR1020150187072A 2015-12-28 2015-12-28 Machine vision system for supporting various image sensor KR101763581B1 (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338736A (en) * 2002-05-20 2003-11-28 Nikon Corp Sampling circuit
JP2007208513A (en) * 2006-01-31 2007-08-16 Matsushita Electric Ind Co Ltd Apparatus and method for detecting image shift
JP2012089920A (en) * 2010-10-15 2012-05-10 Hitachi Kokusai Electric Inc Image pick-up device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003338736A (en) * 2002-05-20 2003-11-28 Nikon Corp Sampling circuit
JP2007208513A (en) * 2006-01-31 2007-08-16 Matsushita Electric Ind Co Ltd Apparatus and method for detecting image shift
JP2012089920A (en) * 2010-10-15 2012-05-10 Hitachi Kokusai Electric Inc Image pick-up device

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