KR101680800B1 - System for live test of protection IED and method therefor - Google Patents

System for live test of protection IED and method therefor Download PDF

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KR101680800B1
KR101680800B1 KR1020150089927A KR20150089927A KR101680800B1 KR 101680800 B1 KR101680800 B1 KR 101680800B1 KR 1020150089927 A KR1020150089927 A KR 1020150089927A KR 20150089927 A KR20150089927 A KR 20150089927A KR 101680800 B1 KR101680800 B1 KR 101680800B1
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South Korea
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ied
test
protected
control command
unit
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KR1020150089927A
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Korean (ko)
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유종걸
한아
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한국산업기술시험원
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R11/00—Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption
    • G01R11/02—Constructional details
    • G01R11/25—Arrangements for indicating or signalling faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/06—Arrangements for measuring electric power or power factor by measuring current and voltage
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C19/00—Electric signal transmission systems
    • G08C19/02—Electric signal transmission systems in which the signal transmitted is magnitude of current or voltage

Abstract

The present invention relates to a live test system and method for protected IEDs, and more particularly to a live test system for protected IEDs, and more particularly to a live IED test system for testing a power system configured with a protected IED in an operating state of a power system, Protected IED Live test system and method thereof.
According to the present invention, it is possible to logically separate a protected IED from a power system without physically separating it, and to perform a functional test while in operation, It is possible to maintain the trust in the system by preparing against the risk and damage.

Description

[0001] IED and method therefor [0002]

The present invention relates to a live test system and method for protected IEDs, and more particularly to a live test system for protected IEDs in which a power system configured with a protected IED is tested in the operating state of the power system, Protected IED Live test system and method thereof.

Currently, IED (Intelligent Power Devices), which constitute digital substations, provide communication protocols according to IEC 61850 standards. Therefore, IED manufacturers basically use IEC 61850 conformance test And receive a certificate.

However, even if the IED passes the conformance test, if it is configured in the same power system as the actual substation according to the logic designed by the engineer, it may cause problems in performing the function of the application unit, thereby reducing the reliability of the whole system.

Functional tests that verify whether multiple IEDs behave according to the previously designed logic sequence in an actual operating power system environment are the most important factors in the technology implementation of smart power devices, but if not verified, system instability and user safety Can have a significant impact.

According to the "IED performance evaluation method" of the domestic patent application publication No. 10-2008-0094476, the air conditioner, the vibration device and the electromagnetic wave generator are installed in the test room where the IED to be evaluated is installed, And the test device is connected to the IED to separate the respective functions of the IED and to inspect the device by element.

In order to confirm whether a certain IED performs a specific function in such an operating system, it is difficult to test it without affecting the operating system because the corresponding IED must be separated from the system.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a protection IED for testing whether a protected IED (intelligent power device) normally performs the function of an application in the entire logic of the power system, Live test system and method therefor.

And to provide a live test system and method for protected IEDs that allow logical isolation without physically separating the IED from the power system and enable functional testing while in operation.

The present invention includes a merging unit IED unit 110 for transferring a measured current value to a protected IED unit; A test set IED unit 120 for transferring a virtual current value for a test to a protected IED unit to be tested; And an on / off control command of the switch according to whether the abnormal current of the virtual current value is sensed or not is transmitted to the test set IED unit And a protection IED unit (130).

Meanwhile, the live test method of the protected IED includes: (a) receiving data of the measured current value from the protected IED attachment unit IED unit; (b) receiving data of a virtual current value for testing from the test set IED portion of the protected IED portion; And (c) generating an on / off control command for system protection by sensing an abnormal current among the data received by the protected IED unit, and controlling on / off control of the on / off switch according to whether the abnormal current of the virtual current value is sensed, And transmitting the information to the second server.

According to the present invention, it is possible to logically separate a protected IED from a power system without physically separating it, and to perform a functional test while in operation, It is possible to maintain the trust in the system by preparing against the risk and damage.

1 is a configuration diagram of a live test system of a protected IED according to an embodiment of the present invention,
FIG. 2 is an overall flowchart of a test method using a live test system of a protected IED according to an embodiment of the present invention,
3 is a detailed flowchart showing a step of transmitting an on / off control command of a switch to a test set IED in a live test method of a protected IED according to the present invention,
FIG. 4 is a diagram illustrating a general operation procedure for operating the switch according to the overcurrent detection of the protective IED.
5 is a system configuration diagram in which a test set IED is added to an existing system to perform a live test of a protected IED according to an embodiment of the present invention.
FIG. 6 is a sequence diagram illustrating a live test procedure of a protected IED according to an embodiment of the present invention.
FIG. 7 is a graph showing the difference between the IED output according to the test state change of Mod, control, and GOOSE services of the IED.
FIG. 8 is a diagram showing differences in output when the IED Mod value is set to "test" and "test / blocked", respectively.
Fig. 9 is a diagram showing addition of opRcvd, opOK, tOpOk which can reflect control information in IEC 61850 Ed.2.

BRIEF DESCRIPTION OF THE DRAWINGS The present invention will become more apparent by describing in detail preferred embodiments thereof with reference to the attached drawings in which: FIG.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a configuration diagram of a live test system of a protected IED according to an embodiment of the present invention. As shown in this figure, the live test system of the protected IED according to an embodiment of the present invention includes a merging unit IED unit 110, a test set IED unit 120, a protected IED unit 130, (140).

The merging unit IED unit 110 transfers the measured current value to the protected IED unit.

The test set IED unit 120 is a configuration for transferring the virtual current value for the test to the protected IED unit to be tested.

The test set IED unit 120 sets the data object mode of the logical node to a test-blocked mode in a state in which the power system is activated, blocks the external output of the protected IED under test, Control command of the protected IED part subject to the addition of the value. Here, the external output is an on / off control command of the switch depending on whether an abnormal current of the virtual current value is sensed or not. At this time, the protected IED unit to be tested transmits an on / off control command of the switch when the abnormal current of the measured current value is sensed to the IED unit of the bay controller, and transmits an on / off control command of the switch to the test set IED .

The protection IED unit 130 detects an abnormal current among the data received from the merging unit IED unit 110 and the test set IED unit 120 to generate an open / close control command for system protection, The on / off control command of the switch depending on whether the abnormal current of the current value is sensed or not can be transmitted to the bay controller IED unit or the test set IED unit. The protection IED unit 130 for performing such a function may include a first sensing module 131, a second sensing module 132, a first transmission module 133, and a second transmission module 134.

The first detection module 131 generates an on / off control command of the switch according to whether the abnormal current of the measured current value is detected among the received data, and the second detection module 132 generates an abnormal The first transmission module 133 transmits a control command of the first sensing module to the switch via the bay controller IED unit 140, The transmission module 134 causes the test set IED unit 120 to transmit a control command of the second detection module.

The bay controller IED unit 140 receives and processes the on / off control command of the switch according to whether the abnormal current of the measured current value is sensed from the protection IED unit.

Meanwhile, the live test method of the protected IED using the live test system of the protected IED will be described as follows.

2 is a schematic flow chart of a live test method of a protected IED according to the present invention. As shown in FIG. 2, (a) data is received from the protected IED portion merging unit IED portion, and then (b) the virtual current value for the protected IED portion test is read from the test set IED portion (C) generating an on / off control command for protecting the system by sensing an abnormal current among data received by the protected IED unit, and controlling the on / off control command of the switch according to whether the abnormal current of the virtual current value is sensed To the test set IED portion. Here, in the step (c), the external object is set by setting the data object mode of the logical node to the blocking test mode in a state in which the test set IED portion power system is activated, and when the external I / Command can be received.

In addition, after step (c), (d) receiving the ON / OFF control command of the switch according to whether the abnormal current of the measured current value is sensed from the protected IED unit and processing it into the bay controller IED unit.

FIG. 3 is a detailed flowchart illustrating a step of transmitting an on / off control command of a switch to a test set IED in a Live test method of a protected IED according to the present invention.

The step (c) includes the steps of: (c-1) generating an on / off control command of the switch according to whether the abnormal current of the measured current value is detected among data received by the protected IED unit; (C-3) a control command of the protection IED section (c-1) in accordance with whether or not an abnormal current of the virtual current value is sensed in the data, , And transmitting the control command of the (c-2) -step to the test set IED unit.

A live test system and method of a protected IED (Intelligent Electronic Device) based on IEC 61850 Ed.2 according to the present invention will be described in detail as follows.

Several countries around the world, including Korea, follow IEC 61850 Ed.1, an international standard for substation automation in building substation systems. However, as the need for smart grids has increased in recent years, efforts are being made to switch to Ed.2, which is expanded to automation of the entire power network as well as the substation. If the IED developed based on IEC 61850 Ed.2 and the substation system using it are built, Live test is possible. Here, the Live test is a system-level application function test in a real environment, in which a power system composed of IEDs expected to perform their functions individually performs functions of the application normally according to logic designed by an engineer In the actual pressurized state. IEC 61850 Ed.1 supports conformance testing of individual IEDs and limited interoperability testing. However, there was instability and unreliability of unproven systems because it does not support system-level application function testing in actual operating conditions where pressurization occurs. However, for IEDs and systems where IEC 61850 Ed2.0 technology is introduced, it is possible to provide reliability through the Live test, which verifies that several IEDs operate according to the sequence desired by the user in the system under pressure. The additions and modifications of Ed.2 to enable the Live test are part of the IEC 61850 standard document as follows: The items of IEC 61850 Ed.2 that enable the live test are IEC 61850-7-2, IEC 61850-7-3, IEC 61850-7-4, which are described as follows.

IEC 61850-7-2 supports the transmission of control messages for test purposes by adding a "Test" item to the parameters of the control service. By adding the "Simulation" parameter to the GOOSE and SV (Sampled Values) services, it is possible to test live mode by distinguishing between messages for actual operation and virtual messages for testing.

IEC 61850-7-3 defines the test attribute in the Quality type. If the Mod (Mode) of the Logical Node (LN) is set to {test, test-blocked}, by setting the test flag of q (quality) to {true} Value can be distinguished.

IEC 61850-7-4 has one of the eight DOs added to Common LN, Mod has one of the values {on, blocked, test, test-block, off}. In particular, by setting it to one of {test, test- blocked}, the specific function of the IED can be separated and tested. The state change of the IED due to this control is reflected in the Beh (Behavior) DO value. In addition, Sim (DO) DS is added to the LPHD LN to control GOOSE and SV messages received in the simulation, and LGOS and LSVS to check the status of the GOOSE and SV messages, and LTRK to control the service tracking Can be added.

The Live test is a functional test of individual devices and systems in the Live environment under actual pressure, and can be performed using the functions added in IEC 61850 Ed.2. Even if the IED satisfies both the conformance and interoperability tests, it is difficult to confirm the situation of the current system which is difficult to confirm even though it may cause problems in the functioning of the actual system according to the logic designed by the engineer. It can be a good solution to improve the reliability of the IED and system and prevent potential problems.

FIG. 4 is a diagram illustrating a general operation procedure for operating the switch according to the overcurrent detection of the protective IED.

The protection IED is an intelligent power device that provides protection by monitoring and controlling the substation. Figure 4 shows a general operation procedure for operating the switch due to the overcurrent detection of the protected IED. In detail, the protected IED receives the current value measured by the merging unit IED as a sampled value (SV) service and sends a GOOSE message for trip to the bay controller IED when an abnormal current such as an overcurrent is detected. (CB_OFF) of the appropriate switch for the open / close operation. If the abnormal current is no longer detected by the same method, the opened switch is closed (CB-ON) according to the discrimination of the protection IED. Table 1 shows the IEC 61850 logical node of FIG. 4, briefly depicted to illustrate the overcurrent protection function of the protected IED.

Name Description TVTR Voltage transformer TCTR Current transformer LLN0 Logical node zero PDIS Distance PTOC Time over current RREC Auto re-closing PTRC Protection trip conditioning XCBR Circuit breaker

The protection and control functions of substation systems are carried out through the cooperation and cooperation of several IEDs. Therefore, in order to check the performance of a specific IED in the Live system environment in which the power system is active, the relevant IED must be disconnected from the system. However, when IEC 61850 Ed.2 is applied, IEDs can be logically separated without physical disassembly, and organic tests can be performed. It is possible to test the application function without affecting the overall system operation while the system is in operation.

FIG. 5 is a system configuration diagram in which a test set IED is added to an existing system to perform a live test of a protected IED. The test set IED sends an SV message to the protected IED that is the subject of the test to transmit a virtual current value for the test and a Trip GOOSE message that the protected IED passes to control the opening of the switch when an abnormal current is detected . When the system environment is configured, the protected IED receives and processes the measured current value from the actual process bus delivered by the merging unit IED, and when it receives the virtual SV message generated by the test set IED for testing, It is possible to do. In the case of the Trip GOOSE message transmitted by the protection IED according to the detection of the abnormal current, the processing according to the actual current value received from the merging unit IED is transmitted to the bay controller IED, and the processing according to the virtual abnormal current value is transmitted to the test set IED It is possible to prevent the test result from affecting the actual system.

6 is a sequence diagram of the live test procedure of the protected IED. As shown in FIG. 4, the merging unit IED transmits the actual current value measured from the process bus to the protected IED. When the abnormal current is detected, the protection IED opens the switch to protect the system. In order to perform the Live test in this real-life system environment, the protected IED must first be switched to the blocking test mode. In other words, for the specific functions to be tested among the various functions provided by the specific IED, the mode of the LNs configured to support it must be set according to the test purpose.

More specifically, an IED can support various functions, and each function is composed of a Logical Device (LD), which is a set of LNs. In some cases, LDs providing small functions are hierarchically connected to constitute one large LD in order to provide one large function. The hierarchy between these LDs is expressed in the GrRef DO of LLN0 LN where there is only one LD per LD. Therefore, by changing the Mod (Mode) of LLN0, not only the mode of the remaining LNs constituting LD but also the LD It is possible to change the mode of all lower LDs included. Of course, it is also possible to change the mode of each LN individually. However, if the mode of the upper LNN0 is different from the mode of the specific LN, the final mode of the LN is determined according to the priority specified in IEC 61850.

In this way, in FIG. 5, the Behavior of all LNs constituting the protected IED is changed to "test / blocked" by changing the Mod DO of the LLN0 LN of the protected IED to "test / blocked & It is set to "off" again individually.

In addition, Sim DO of the LPHD LN is set to {true} to receive the virtual SV message transmitted from the test set IED. Due to this setting, the protected IED receives and processes the SV delivered from the merging unit IED, and after receiving the SV of the test set IED set to {sim = true, q = test}, the protection function according to the virtual SV is tested .

That is, {sim = false, q = normal} SV and GOOSE messages received from the merging unit IED such as 1.11-12 are no longer reacted and {sim = true, q = test } Is checked for the trip current. According to this feature, while not shown in FIG. 4, while testing the function of the protected IED, other protected IEDs, which perform overcurrent protection according to the actual SV of the merging unit IED, must be configured in the system to maintain system protection.

In this way the test is passed if the protective IED senses anomalous current according to the imaginary SV and generates a control command for opening the switch by correctly performing the overcurrent protection function. However, if the actual switch is opened, it will seriously affect the operating system and will not meet the purpose of the Live test.

To solve this problem, IEC 61850 Ed.2 adds opRcvd, opOk and tOpOk which can mirror control information to the controllable CDC. If the mode of the protected IED is set to Test-blocked, the output control command, which is the processing result of the corresponding IED, is not transmitted to the outside. Instead, if the ctlVal value of the Controllable CDC for the Control service is changed, opRcvd is set to check the value change, and tOpOk is added to the opOk, .

That is, it is possible to internally check whether the IED value can be changed or not, without generating an actual external output.

Figs. 7 to 9 show further explanations for IEC 61850 Ed. 2.

FIG. 7 is a graph showing the difference between the IED output according to the test state change of Mod, control, and GOOSE services of the IED. If the Mod = "on" of the IED is set, the corresponding IED shall support all communication services as normal operation status, not test mode. Therefore, when the control and GOOSE service that is not set to test (Test = FALSE) is requested, the IED performs an operation according to the request of the corresponding service and generates an output to the outside. However, even if the IED is set to "on", if the received service is received for testing purposes, it will not generate any output for it.

FIG. 8 is a diagram showing differences in output when the IED Mod value is set to "test" and "test / blocked", respectively. First, if IED is set to Mod = "test", if a service that is not set to test is received, no output is provided for it. However, when Mod = "test", when a service set to "Test = TURE" is requested, the output is generated outside the IED. This is different from not generating an external output when Mod = "test / blocked". In other words, the biggest difference that occurs when you set Mod to "test" and "test / blocked" can be summarized as the presence or absence of external output for the requested service for testing purposes.

Fig. 9 is a diagram showing addition of opRcvd, opOK, tOpOk which can reflect control information in IEC 61850 Ed.2. Testing is needed to ensure that the IED generates data changes to the requested service and thus the expected external output. However, if IED Mod = "test" is set in order to check whether or not the external output of the IED is generated, generating the external output according to the test message may affect the operation of the actual system, which is a risk. To solve this problem, Ed2 added opRcvd, opOk, and tOpOk, which can mirror control information as shown in Fig. This is the DA (Data Attribute) included in SPC, DPC, INC, ENC, CDC for control information representation. If the ctlVal value of the CDC according to the control service is changed, opRcvd is set so that the change of the value can be checked. The opOk indicating the change immediately before the external output is completed or tOpOk having the time value added to the opOK is set do. Therefore, it is possible to check whether the value of the IED can be changed and the external output is possible without generating an actual external output. As a result, it is safe to test IED with opRcvd and opOk with IED Mod = "test / blocked".

Functional tests that verify whether multiple IEDs behave according to a user's desired sequence in a live operating system environment are the most important factors in the technology implementation of smart power devices. Failure to verify can cause significant system instability and user safety. In addition, securing the technology for live test of smart power application in digital substation can be applied to test method for securing stability of power system in other fields in conjunction with spread of all fields of smart grid of IEC 61850 standard to be developed in the future. It is expected to play an important role in improving the reliability of various systems.

According to the present invention, it is possible to logically separate a protected IED from a power system without physically separating it, and to perform a functional test while in operation, It is possible to maintain the trust in the system by preparing against the risk and damage.

110: merging unit IED unit 120: test set IED unit
130: Protection IED unit 131: First detection module
132: second detection module 133: first transmission module
134: second transmission module 140: bay controller IED unit

Claims (8)

A merging unit IED for transferring the measured current value to the protected IED unit;
A test set IED portion for transmitting a virtual current value for the test to the protected IED portion of the object under test; And
A protection IED unit for generating an on / off control command for system protection by sensing an abnormal current among received data, and transmitting an on / off control command of the switch according to whether the abnormal current of the virtual current value is sensed to the test set IED unit; The live test system of the protected IED. The method according to claim 1,
And a bay controller IED unit for receiving and processing an on / off control command of the switch according to whether the abnormal current of the measured current value is sensed from the protected IED unit. The method according to claim 1,
The test set IED unit,
The data object mode of the logic node is set to the test mode in a state in which the power system is activated to interrupt the external output and receive the switch control command of the IED unit to which the external output generation time value is added Protected IED Live test system. The method according to claim 1,
The protected IED portion,
A first sensing module for generating an on / off control command of the switch according to whether the abnormal current of the measured current value is detected among the received data;
A second sensing module for generating an on / off control command of the switch according to whether the abnormal current of the virtual current value is detected among the received data;
A first transmission module for transmitting a control command of the first sensing module to a switch; And
And a second transmission module for transmitting a control command of the second sensing module to the test set IED unit. (a) receiving data of the protection IED attachment measurement current value;
(b) receiving data of a virtual current value for the protection IED addition test; And
(c) generating an on / off control command for system protection by sensing an abnormal current among the data received by the protection IED unit, and controlling the on / off control of the switch according to whether the abnormal current of the virtual current value is sensed, Wherein the method comprises the steps of: 6. The method of claim 5,
After the step (c)
(d) receiving an on / off control command of the switch according to whether the abnormal current of the measured current value is sensed from the protected IED unit and processing the on / off control command to the bay controller IED unit . 6. The method of claim 5,
The step (c)
Setting a data object mode of a logical node to a test mode in a state in which the test set IED addition power system is activated to interrupt an external output and receiving an open / close control command of the protected IED unit to which the external output generation time value is added; Gt; IED < / RTI > 6. The method of claim 5,
The step (c)
(c-1) generating an on / off control command of the switch according to whether the abnormal current of the measured current value is detected among the data received by the protected IED unit;
(c-2) generating an ON / OFF control command of the switch according to whether the abnormal current of the virtual current value is detected among the received data of the protected IED unit; And
(c-3) transmitting the control command of the (c-1) th step to the switch, and transmitting the control command of the (c-2) th step to the test set IED unit Characterized by a live IED test method.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019194369A1 (en) * 2018-04-05 2019-10-10 한국전력공사 Apparatus for testing intelligent electronic device and method for testing intelligent electronic device by using same
KR20220023409A (en) * 2020-08-21 2022-03-02 엘에스일렉트릭(주) Intelligent Electronic Device
US20230254228A1 (en) * 2022-02-04 2023-08-10 Schweitzer Engineering Laboratories, Inc. Redundant generic object oriented substation event (goose) messages

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KR100843130B1 (en) 2007-01-30 2008-07-03 명지대학교 산학협력단 Apparatus and method for diagnosing ied abnormal state on-line in substation automation system based on iec61850

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Publication number Priority date Publication date Assignee Title
KR100843130B1 (en) 2007-01-30 2008-07-03 명지대학교 산학협력단 Apparatus and method for diagnosing ied abnormal state on-line in substation automation system based on iec61850

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019194369A1 (en) * 2018-04-05 2019-10-10 한국전력공사 Apparatus for testing intelligent electronic device and method for testing intelligent electronic device by using same
KR102014643B1 (en) * 2018-04-05 2019-10-21 한국전력공사 Test apparatus for intelligent electronic device and testing method of intelligent electronic device using the same
KR20220023409A (en) * 2020-08-21 2022-03-02 엘에스일렉트릭(주) Intelligent Electronic Device
KR102435293B1 (en) * 2020-08-21 2022-08-22 엘에스일렉트릭(주) Intelligent Electronic Device
US20230254228A1 (en) * 2022-02-04 2023-08-10 Schweitzer Engineering Laboratories, Inc. Redundant generic object oriented substation event (goose) messages
US11831529B2 (en) * 2022-02-04 2023-11-28 Schweitzer Engineering Laboratories, Inc. Redundant generic object oriented substation event (GOOSE) messages

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