KR101636838B1 - Terminal device and method for measuring radiation using the same - Google Patents

Abstract

The present invention relates to a terminal and a radiation measuring method using the same, and more particularly, to a terminal mounted on a display with a radiation measuring instrument using a semiconductor for imparting a radiation measuring function to a smart device such as a smart phone or a smart watch, and a radiation measuring method using the same . A terminal according to an embodiment of the present invention includes: a semiconductor dosimeter for sensing a radiation and outputting a signal; A display on which the semiconductor dosimeter is mounted; And a processor for receiving and processing signals output from the semiconductor dosimeter to provide radiation exposure information.

Description

TECHNICAL FIELD [0001] The present invention relates to a terminal and a method of measuring radiation using the same,

The present invention relates to a terminal and a radiation measuring method using the same, and more particularly, to a terminal mounted on a display with a radiation measuring instrument using a semiconductor for imparting a radiation measuring function to a smart device such as a smart phone or a smart watch, and a radiation measuring method using the same .

A dosimeter is an instrument for measuring the dose of radiation, and measures the absorbed dose received during irradiation. Among them, film gauge type dosimeter, thermal fluorescence dosimeter and pocket type dosimeter are used as an instrument for measuring personal exposure.

One Digilert 100, one of the pocket-type dosimeters currently on the market, uses Geiger-Muller tubes for radiation measurements. The Geiger-Mueller tube radiates radiation when the material in the tube is ionized as the radiation passes through the tube, and the amount of radiation is measured based on the amount of propagation.

However, this radiation measuring instrument has a considerable space occupied by the Geiger-Mueller tube, which limits the miniaturization of the apparatus. In addition, recently, a smart device (for example, a smart phone, a smart watch, a smart glass, etc.) in which the amount of supply is rapidly increasing is pursued a compact design by reducing its size as much as possible. It is difficult to do.

Embodiments of the present invention provide a terminal that provides a radiation measurement function without increasing the size of a terminal and a method of measuring a radiation using the terminal.

A terminal according to an embodiment of the present invention includes: a semiconductor dosimeter for sensing a radiation and outputting a signal; A display on which the semiconductor dosimeter is mounted; And a processor for receiving and processing signals output from the semiconductor dosimeter to provide radiation exposure information.

The semiconductor dosimeter may be formed on a substrate on which TFT elements of the display are formed.

The semiconductor dosimeter may be formed in a groove formed on the substrate.

A plurality of the semiconductor dosimeters can be mounted on the display.

The processing unit may determine the sensed radiation dose as a valid measurement value when the semiconductor dosimeter of the plurality of semiconductor dosimeters senses a radiation dose exceeding a predetermined first threshold value.

The processing unit may ignore the detected radiation dose when the semiconductor dosimeter below the reference dose among the plurality of semiconductor dosimeters senses the radiation dose exceeding the first threshold value.

The reference quantity may be a value obtained by multiplying the number of the semiconductor dosimeters by a predetermined sensitivity parameter.

The processing unit may calculate and output an average of the radiation doses sensed by the plurality of semiconductor dosimeters when the semiconductor dosimeter of the reference number or more among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value .

The processor may provide an alarm to warn the user of a radiation exposure if an average of the radiation dose above a predetermined second threshold is sensed beyond a predetermined threshold time.

The terminal may further include a storage unit for storing the radiation exposure information, and the processing unit may store the average and the detection time of the radiation dose in the storage unit.

A plurality of semiconductor dosimeters are disposed around the periphery of the display,

The processing unit may process the amount of radiation sensed by the semiconductor dosimeter in the area of the display corresponding to each semiconductor dosimeter based on the amount of radiation sensed by the plurality of semiconductor dosimeters.

The processing unit may process the amount of radiation to be represented by at least one of an image, a number, a symbol, and a symbol.

The processing unit may process the image so that images corresponding to different amounts of radiation sensed by each semiconductor dosimeter are intermittently or continuously displayed over the area of the display.

A method of measuring radiation according to an embodiment of the present invention is performed by a terminal equipped with a plurality of semiconductor dosimeters on a display, wherein a semiconductor dosimeter having a predetermined reference number or more of the plurality of semiconductor dosimeters exceeds a predetermined first threshold When detecting the radiation dose, the detected radiation dose can be determined as a valid measurement value and used for radiation measurement.

When the semiconductor dosimeter below the reference dose among the plurality of semiconductor dosimeters senses the radiation dose exceeding the first threshold value, the detected dose of radiation can be ignored.

The reference quantity may be a value obtained by multiplying the number of the semiconductor dosimeters by a predetermined sensitivity parameter.

Calculating the average of the radiation doses sensed by the plurality of semiconductor dosimeters when the semiconductor dosimeter of the reference number or more among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value; And providing an alarm to warn the user of a radiation exposure if an average of the radiation dose above a predetermined second threshold is sensed beyond a predetermined threshold time.

Wherein the plurality of semiconductor dosimeters are arranged around the periphery of the display, the method comprising the steps of: determining, based on the amount of radiation sensed by the plurality of semiconductor dosimeters, And displaying the detected radiation dose.

The step of displaying the amount of radiation may comprise: displaying the amount of radiation with at least one of an image, a number, a symbol and a symbol.

Wherein the step of displaying the amount of radiation as at least one of an image, a number, a symbol and a symbol comprises: displaying an image corresponding to different amounts of radiation sensed by each semiconductor dosimeter to change intermittently or continuously over the area of the display Step < / RTI >

The radiation measurement method according to an embodiment of the present invention may be implemented as a computer-executable program and recorded on a computer-readable recording medium.

According to an embodiment of the present invention, it is possible to provide a radiation measurement function to the terminal without increasing the size of the terminal.

According to the embodiment of the present invention, a plurality of semiconductor dosimeters can be used to increase the reliability of the radiation measurement.

1 is an exemplary block diagram of a terminal according to an embodiment of the present invention.
2 is a view illustrating an example of a mounting position of a semiconductor dosimeter in a terminal according to an embodiment of the present invention.
3 is an exemplary side view of a display panel on which a semiconductor dosimeter is mounted according to one embodiment of the present invention.
4 is an exemplary cross-sectional view of a semiconductor dosimeter mounted on a display panel according to an embodiment of the present invention.
5 is an exemplary cross-sectional view of a semiconductor dosimeter mounted on a display panel according to another embodiment of the present invention.
FIGS. 6 and 7 are graphs exemplarily showing radiation doses sensed by semiconductor dosimeters in accordance with an embodiment of the present invention. FIG.
FIG. 8 is a graph exemplarily showing a transition of a dose of radiation sensed by a semiconductor dosimeter according to an embodiment of the present invention with time. FIG.
FIGS. 9 and 10 are illustrations showing an image of a radiation dose distribution around a terminal sensed by semiconductor dosimeters in accordance with an embodiment of the present invention. FIG.
11 is an exemplary flow chart of a radiation measurement method according to an embodiment of the present invention.

Other advantages and features of the present invention and methods for accomplishing the same will be apparent from the following detailed description of embodiments thereof taken in conjunction with the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the invention to those skilled in the art. Is provided to fully convey the scope of the invention to those skilled in the art, and the invention is only defined by the scope of the claims.

Unless defined otherwise, all terms (including technical or scientific terms) used herein have the same meaning as commonly accepted by the generic art in the prior art to which this invention belongs. Terms defined by generic dictionaries may be interpreted to have the same meaning as in the related art and / or in the text of this application, and may be conceptualized or overly formalized, even if not expressly defined herein I will not.

The terminology used herein is for the purpose of illustrating embodiments and is not intended to be limiting of the present invention. In the present specification, the singular form includes plural forms unless otherwise specified in the specification. As used herein, the terms' comprise 'and / or various forms of use of the verb include, for example,' including, '' including, '' including, '' including, Steps, operations, and / or elements do not preclude the presence or addition of one or more other compositions, components, components, steps, operations, and / or components. The term 'and / or' as used herein refers to each of the listed configurations or various combinations thereof.

It should be noted that the terms such as '~', '~ period', '~ block', 'module', etc. used in the entire specification may mean a unit for processing at least one function or operation. For example, a hardware component, such as a software, FPGA, or ASIC. However, '~ part', '~ period', '~ block', '~ module' are not meant to be limited to software or hardware. Modules may be configured to be addressable storage media and may be configured to play one or more processors. ≪ RTI ID = 0.0 >

Thus, by way of example, the terms 'to', 'to', 'to block', 'to module' refer to components such as software components, object oriented software components, class components and task components Microcode, circuitry, data, databases, data structures, tables, arrays, and the like, as well as components, Variables. The functions provided in the components and in the sections ~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~ ' , '~', '~', '~', '~', And '~' modules with additional components.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings attached hereto.

1 is an exemplary block diagram of a terminal according to an embodiment of the present invention.

As shown in FIG. 1, the terminal 100 may include a semiconductor dosimeter 110, a display 120, and a processing unit 130.

The semiconductor dosimeter 110 may sense radiation and output a signal. The display 120 may mount the semiconductor dosimeter 110. The processing unit 130 may receive and process signals output from the semiconductor dosimeter 110 to provide radiation exposure information.

According to one embodiment, the semiconductor dosimeter 110 may be a device made of a MOSFET and having a threshold voltage V _th changed according to a radiation dose.

The semiconductor dosimeter 110 may comprise a layer composed of an insulating material such as SiO ₂ . When the insulating layer is irradiated with radiation having an energy exceeding a band gap, holes and electrons are separated in the insulating layer, and the holes are confined in the insulating layer.

The semiconductor dose meter 110 used in the embodiment of the present invention can sense the radiation dose, that is, the radiation dose, by using the phenomenon that holes trapped in the insulating layer move the threshold voltage V _th of the device.

According to an embodiment of the present invention, the terminal 100 may further include an initialization unit 150. The initialization unit 150 may initialize the threshold voltage V _th of the semiconductor dosimeter 110 changed due to the radiation exposure to the original voltage value.

For example, the initialization unit 150 applies a negative voltage to the gate of the semiconductor dosimeter 110 made of a MOSFET to flow a FN (Fowler-Nordheim) tunnel current to remove holes accumulated in the insulating layer can do.

According to an embodiment of the present invention, the semiconductor dosimeter 110 may be mounted on the display 120 of the terminal 100. In other words, the terminal 100 may be equipped with a semiconductor dosimeter 110 made of a MOSFET in an extra space of the display 120, rather than having a Geiger-Mueller tube in a terminal like a conventional pocket-type dosimeter.

The number of semiconductor dosimeters 110 mounted on the display 120 may be one or more.

For example, the display 120 may include a total of four semiconductor dosimeters 110 with one semiconductor dosimeter at each corner, but may have more than one (e.g., 16) if space permits . As described later, if the number of the semiconductor dosimeters 110 is increased, the sensitivity and reliability of radiation detection can be increased.

According to one embodiment, the semiconductor dosimeter 110 may be provided at a corner of the display 120.

2 is a view illustrating an example of a mounting position of a semiconductor dosimeter in a terminal according to an embodiment of the present invention.

2, in the case of a terminal 100 having a general rectangular display 120, according to an embodiment of the present invention, one or more of the four corners of the display 120 The semiconductor dosimeters 111, 112, 113, and 114 may be provided.

However, the position of the semiconductor dosimeter is not limited to the corner of the display 120, and may be any point within the display 120.

According to one embodiment, the semiconductor dosimeters 111, 112, 113, and 114 may be formed on a substrate on which the TFT elements of the display 120 are formed.

3 is an exemplary side view of a display panel on which a semiconductor dosimeter is mounted according to one embodiment of the present invention.

3, the display 120 according to the embodiment of the present invention may include semiconductor dosimeters 111 and 112 on a substrate 121 on which TFT elements 122 are provided.

When the semiconductor dosimeters 111, 112, 113 and 114 are made of MOSFETs having the same structure as the TFT elements 122 as described above, the semiconductor dosimeters 111, 112, 113, < RTI ID = 0.0 > 114). ≪ / RTI >

4 is an exemplary cross-sectional view of a semiconductor dosimeter mounted on a display panel according to an embodiment of the present invention.

As shown in FIG. 4, the semiconductor dosimeter 111 may be made of a MOSFET. The semiconductor dose meter 111 includes a semiconductor layer 1113 doped with a p-type, an n-type well 1114 formed on the semiconductor layer 1113, and an n-type well 1114 formed between the n-type well 1114 Type well 1114 and an electrode 1116 formed on the insulating layer 1115. The insulating layer 1115 may be formed of an insulating layer 1115,

Although the semiconductor dosimeter 111 shown in FIG. 4 is configured as an N-type MOSFET, the present invention is not limited thereto and may be configured as a P-type MOSFET according to an embodiment.

The semiconductor dose meter 111 may further include an insulating layer 1112 formed under the semiconductor layer 1113 and a semiconductor layer 1111 formed under the insulating layer 1112 . That is, the semiconductor dose meter 111 may further include an insulating layer 1112 between the two semiconductor layers 1111 and 1113.

The insulating layer 1112 is formed to increase the threshold voltage transfer amount V _th due to the radiation exposure of the semiconductor dosimeter 111 and includes a space for generating holes in addition to the insulating layer 1115 corresponding to the gate insulating layer in the case of radiation exposure The radiation sensitivity of the semiconductor dosimeter 111 can be further improved.

5 is an exemplary cross-sectional view of a semiconductor dosimeter mounted on a display panel according to another embodiment of the present invention.

4, the semiconductor dose meter 111 shown in FIG. 5 may be formed in a groove formed on the substrate 121 of the display panel. That is, according to this embodiment, a groove having a predetermined depth is formed on the substrate 121 before the semiconductor dosimeter 111 is manufactured.

The depth of the groove may be the same as the depth of the semiconductor layer 1111 corresponding to the lowest layer of the semiconductor dosimeter 111 and the depth of the insulator layer 1112 formed on the semiconductor layer 1111 .

The groove may be formed deeper than the height of the semiconductor layer 1111 and the insulator layer 1112 so as to control the extent to which the semiconductor dosimeter 111 protrudes from the substrate 121. [

This embodiment is characterized in that when the semiconductor dosimeter 111 further includes a semiconductor layer 1111 and an insulator layer 1112 in a general MOSFET for improving the sensitivity, Or may be applied to fill the semiconductor dosimeter 111 so that it does not protrude from the substrate 121.

As described above, the semiconductor dosimeter 110 according to the embodiment of the present invention may be mounted on the display 120, or two or more may be mounted.

According to an embodiment of the present invention, when a plurality of semiconductor dosimeters 110 are provided on the display 120, the radiation measurement reliability of the terminal 100 can be increased as described later.

According to an embodiment of the present invention, when the semiconductor dosimeter of a predetermined number of reference doses or more among a plurality of semiconductor dosimeters senses a radiation dose exceeding a predetermined first threshold value, It can be determined by the measured value.

When the semiconductor dosimeter of the plurality of dosimeters senses a radiation dose exceeding the first threshold value, the processing unit 130 can ignore the sensed dose of radiation without using the radiation dose.

According to an embodiment of the present invention, the reference quantity may be a value obtained by multiplying the number N of semiconductor dosimeters included in the terminal 100 by a predetermined sensitivity parameter K. The sensitivity parameter K may be preset in the terminal 100 and may be set by a user of the terminal 100 according to an embodiment.

For example, if four semiconductor dosimeters are provided in the terminal 100 and the sensitivity parameter K is set to 0.75, the reference quantity may be determined as 4 x 0.75 = 3.

As another example, if the terminal 100 has a total of 16 semiconductor dosimeters and the sensitivity parameter K is set to 0.5, the reference quantity may be determined as 16 x 0.5 = 8.

FIGS. 6 and 7 are graphs exemplarily showing radiation doses sensed by semiconductor dosimeters in accordance with an embodiment of the present invention. FIG.

As shown in FIG. 2, the terminal 100 includes four semiconductor dosimeters 111, 112, 113 and 114, the sensitivity parameter K is set to 0.5, and four semiconductors When three of the dosimeters 111, 112, 113 and 114 sense a radiation dose larger than the first threshold value, the radiation dose may be determined as a valid measurement value and used as basic data of the radiation measurement.

On the other hand, if only one of the four semiconductor dosimeters 111, 112, 113 and 114 detects a radiation amount larger than the first threshold value as shown in FIG. 7, the radiation amount is an invalid measurement value It can not be used for radiation measurement and can be ignored.

As described above, the embodiment of the present invention can prevent a user from using incorrectly measured data due to noise or the like by using a plurality of semiconductor dosimeters, and to provide incorrect radiation measurement results to the user.

According to an embodiment of the present invention, when the semiconductor dosimeter of the reference number or more among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value, The mean can be calculated and used for radiation measurements.

For example, when the four semiconductor dosimeters 111, 112, 113 and 114 detect the radiation dose corresponding to E ₁ , E ₂ , E ₃ and E ₄ , respectively, as shown in FIG. 6, The processing unit 130 calculates the average of the radiation doses E ₁ (E ₁₎ , E ₂ + E ₂ + E ₃ + E ₄ ) / 4, and determine the average value as the radiation dose sensed by the terminal 100.

Also, according to an embodiment of the present invention, when the average of the radiation dose exceeds a predetermined second threshold value and is maintained over a predetermined threshold time, the processing unit 130 may notify the user of an alarm Can be provided.

FIG. 8 is a graph exemplarily showing a transition of a dose of radiation sensed by a semiconductor dosimeter according to an embodiment of the present invention with time. FIG.

As shown in FIG. 8, when the average radiation dose detected by the terminal 100, for example, the radiation doses detected by the semiconductor dosimeters 111, 112, 113, and 114 exceeds the second threshold value, The processing unit 130 may provide an alarm to the user to warn of radiation exposure.

According to one embodiment, the terminal 100 may store the radiation exposure information obtained using the semiconductor dosimeter in the storage unit 140. [ For example, the processing unit 130 may store the average of the radiation dose measured at predetermined time intervals in the storage unit 140 together with the measurement time.

As a result, the processing unit 130 may display the graph as shown in FIG. 8 on the display 120 based on the stored data.

According to an embodiment of the present invention, the processing unit 130 may display the radiation distribution pattern around the terminal 100 on the display 120 based on the radiation dose sensed by the plurality of dosimeters.

FIGS. 9 and 10 are illustrations showing an image of a radiation dose distribution around a terminal sensed by semiconductor dosimeters in accordance with an embodiment of the present invention. FIG.

The semiconductor dosimeters 111, 112, 113, 114 may be disposed around the display 120, such as a bezel portion. For example, as shown in FIG. 9, the semiconductor dosimeters 111, 112, 113, and 114 may be disposed at the corners of the display 120.

Based on the radiation dose sensed by the plurality of semiconductor dosimeters 111, 112, 113, and 114, the processing unit 130 may determine the areas 1201, 1202, 1203, and 1203 of the display 120 corresponding to the respective semiconductor dosimeters, 1204 can display an image of the radiation dose detected by the dosimeter.

According to this embodiment, the display area of the display 120 is divided into a plurality of regions 1201, 1202, 1203, and 1204 according to the number of the semiconductor dosimeters 111, 112, 113, and 114 and the distance therebetween. .

9, when the semiconductor dosimeters 111, 112, 113, and 114 are disposed at the corners of the display 120, the display area of the display 120 is divided into four areas (for example, 1201, 1202, 1203, and 1204, respectively. Each of the regions 1201, 1202, 1203, and 1204 may be partitioned adjacent to the semiconductor dosimeters 111, 112, 113, and 114 corresponding thereto.

The processing unit 130 determines the area of the display 1201 corresponding to each of the semiconductor dosimeters 111, 112, 113, and 114 based on the amount of radiation sensed by the semiconductor dosimeters 111, 112, 113, and 114, 1202, 1203, and 1204 to display an image of the radiation dose detected by the dosimeter.

According to one embodiment, the processing unit 130 may display the distribution of the dose of radiation sensed by the semiconductor dosimeter on the display 120 through a change in brightness or color.

For example, as shown in FIG. 6, the semiconductor dosimeters 111, 112, 113, and 114 detect radiation amounts corresponding to E ₁ , E ₂ , E _3, and E ₄ , respectively, _2> E _3> If the E _1> E _4, with the processing unit 130 as shown in Figure 9 and shows the brightness of the second region 1202 corresponds to a second semiconductor dosimeter 112, the lowest, The brightness of the third region 1203 corresponding to the third semiconductor dosimeter 113 is displayed lower after the second region 1202 and the brightness of the first region 1201 corresponding to the first semiconductor dosimeter 111 is The brightness of the fourth region 1204 corresponding to the fourth semiconductor dosimeter 114 can be displayed with the highest brightness after the third region 1203.

That is, the processing unit 130 may darken the area of the display 120 corresponding to the higher radiation dose detected by the semiconductor dosimeter, and brightly display the area of the corresponding display 120 as the radiation dose is lower .

In addition to the embodiment in which the distribution of the radiation dose is displayed by varying the contrast, the embodiment of the present invention can use any method that visually shows the distribution of the radiation dose around the terminal 100.

For example, the processing unit 130 displays the area of the display 120 corresponding to the higher radiation dose detected by the semiconductor dosimeter in red, and displays the corresponding display area in green as the radiation dose is lower have. In other words, the processing unit 130 may visually display the amount of radiation distributed around the terminal 100 through a change in color, in addition to the contrast.

As shown in FIG. 9, according to one embodiment, the display 120 may further display a compass in the center. As a result, the user can predict the area where the risk of radiation exposure is high by checking the distribution and orientation of the radiation dose together using the compass.

9, the processing unit 130 determines whether the image corresponds to a different dose of radiation detected by each of the semiconductor dosimeters 111, 112, 113, and 114, 1201, 1202, 1203, and 1204, respectively.

According to another embodiment, as shown in FIG. 10, the processing unit 130 may determine that the image corresponds to a different dose of radiation sensed by each semiconductor dosimeter 111, 112, 113, 114, (1201, 1202, 1203, and 1204).

That is, regions 1201, 1202, 1203, and 1204 of the display 120 corresponding to the respective semiconductor dosimeters 111, 112, 113, and 114 display the same image (e.g., the same brightness or color) One can display an image distinguishable from an image of an adjacent area.

11 is an exemplary flow chart of a radiation measurement method according to an embodiment of the present invention.

The radiation measurement method 200 may be performed by the terminal 100 according to the embodiment of the present invention described above.

As shown in FIG. 11, the radiation measurement method 200 includes a step S210 of receiving a signal relating to a radiation dose from a plurality of semiconductor dosimeters, a step (S210) If the number of semiconductor dosimeters senses a radiation dose exceeding a predetermined first threshold value (YES in S220), the detected radiation dose may be determined as a valid measurement value and used for radiation measurement (S230) .

Here, the reference water quantity may be a value obtained by multiplying the number N of semiconductor dosimeters by a sensitivity parameter K.

In the case where the processing unit 130 detects the amount of radiation exceeding the first threshold value by the semiconductor dosimeter below the reference amount among the plurality of semiconductor dosimeters (NO in S220) (S240) of ignoring the radiation dose.

According to an embodiment of the present invention, when the semiconductor dosimeter of the reference number or more among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value, the radiation measuring method (200) (S250), and if the average of the radiation dose is detected to exceed a preset threshold time exceeding a predetermined second threshold value (YES in S260 and S270), the user is informed And providing an alarm to warn of radiation exposure (S280).

According to an embodiment of the present invention, the plurality of semiconductor dosimeters 111, 112, 113 and 114 are arranged around the display 120 of the terminal 100, Based on the amount of radiation sensed by the plurality of semiconductor dosimeters 111, 112, 113 and 114, the corresponding semiconductor dosimeters are detected in regions 1201, 1202, 1203, and 1204 of the display 120 corresponding to the respective semiconductor dosimeters, And displaying a dose of radiation.

According to one embodiment, the step of displaying the amount of radiation may comprise the step of displaying the amount of radiation with at least one of an image, a number, a symbol and a symbol.

9 and 10, the step of displaying the radiation dose as an image may include displaying an image corresponding to a different dose of radiation sensed by each semiconductor dosimeter on the display Intermittently or continuously over the regions 1201, 1202, 1203, and 1204 of the display 120, as shown in FIG.

The radiation measurement method 200 according to the embodiment of the present invention may be stored in a computer-readable recording medium that is manufactured as a program to be executed in a computer. The computer-readable recording medium includes all kinds of storage devices in which data that can be read by a computer system is stored. Examples of the computer-readable recording medium include ROM, RAM, CD-ROM, magnetic tape, floppy disk, optical data storage, and the like.

While the present invention has been described with reference to the exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. Those skilled in the art will appreciate that various modifications may be made to the embodiments described above. The scope of the present invention is defined only by the interpretation of the appended claims.

100: terminal
110: Semiconductor dosimeter
111: first semiconductor dosimeter
112: second semiconductor dosimeter
113: Third semiconductor dosimeter
114: Fourth semiconductor dosimeter
120: Display
130:
140:

Claims (21)

A semiconductor dosimeter for detecting radiation and outputting a signal;
A display on which the semiconductor dosimeter is mounted; And
A processor for receiving and processing a signal output from the semiconductor dosimeter and providing radiation exposure information;
/ RTI >
Wherein the semiconductor dosimeter is formed of a MOSFET having the same structure as that of the TFT element on a substrate on which the TFT element of the display is formed and is mounted so as to correspond to each of a plurality of display areas of the display,
Wherein the processing unit comprises:
And determines a detected radiation amount as a valid measurement value when the semiconductor dosimeter more than a predetermined reference number among the plurality of semiconductor dosimeters senses a radiation amount exceeding a predetermined first threshold value. delete The method according to claim 1,
Wherein the semiconductor dosimeter is formed in a groove formed on the substrate. delete delete The method according to claim 1,
Wherein the processing unit comprises:
And ignores the detected radiation dose when the semiconductor dosimeter below the reference dose among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value. The method according to claim 1,
Wherein the reference quantity is a value obtained by multiplying the number of the semiconductor dosimeters by a predetermined sensitivity parameter. The method according to claim 1,
Wherein the processing unit comprises:
And calculates and outputs an average of the radiation dose detected by the plurality of semiconductor dosimeters when the semiconductor dosimeter of the reference number or more among the plurality of semiconductor dosimeters senses a radiation dose exceeding the first threshold value. 9. The method of claim 8,
Wherein the processing unit comprises:
And provides an alarm to warn the user of radiation exposure if an average of the radiation dose exceeding a predetermined second threshold is sensed beyond a predetermined threshold time. 9. The method of claim 8,
Wherein the terminal further comprises a storage unit for storing the radiation exposure information,
Wherein the processing unit stores the average of the radiation dose and the detection time in the storage unit. A semiconductor dosimeter for detecting radiation and outputting a signal;
A display on which the semiconductor dosimeter is mounted; And
A processor for receiving and processing a signal output from the semiconductor dosimeter and providing radiation exposure information;
/ RTI >
Wherein the semiconductor dosimeter is formed of a MOSFET having the same structure as the TFT element on the substrate on which the TFT element of the display is formed and arranged so as to correspond to each of the plurality of display regions around the periphery of the display,
Wherein the processing unit comprises:
And processes the amount of radiation sensed by the semiconductor dosimeter to the area of the display corresponding to each semiconductor dosimeter based on the radiation dose detected by the plurality of semiconductor dosimeters. 12. The method of claim 11,
Wherein the processing unit processes the amount of radiation to be represented by at least one of an image, a number, a symbol and a symbol. 13. The method of claim 12,
Wherein the processing unit comprises:
And an image corresponding to a different dose of radiation sensed by each semiconductor dosimeter is intermittently or continuously changed over an area of the display. delete delete delete delete delete delete delete delete

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