KR101609787B1 - Gauge for measurement of structural damage - Google Patents

Abstract

A high ductile band layer in which a conductor wire capable of measuring electric resistance is buried is attached to the joint portion of the structure and the surface of the member where cracks can occur and the electric resistance is measured for a long time and continuously using a predetermined measuring device It is also possible to measure the degree of damage and crack progression by the cracks of the structure and to use the material which can be easily attached to other wide range such as tape form as a medium, A gauge for structural damage measurement is provided, which can be measured over a relatively wide range as it widens.

Description

{GAUGE FOR MEASUREMENT OF STRUCTURAL DAMAGE}

The present invention relates to the measurement of damage to a structure, and more particularly, to a method of measuring a damage to a structure damaged by an electric wire capable of measuring an electric resistance within a high- And a measurement gauge.

Generally, it is possible to measure the strain of a structure by various strain gages, a digital image processing method, a laser image measurement method, an ultrasonic wave measurement method, And a method of determining the damage location.

1A and 1B are diagrams for explaining the structure of a strain gauge according to a conventional technique, wherein FIG. 1A is a diagram showing the structure of a strain gauge, FIG. 1B is a diagram illustrating a Wheatstone bridge circuit, Is a diagram showing how damage to a structure is measured using a strain gauge according to the prior art.

1A, a conventional strain gauge 10 includes a carrier 11, a grid 12, a solder tab 13a and 13b, and an alignment mark 14 At this time, the lead wires 20a and 20b drawn out from the solder tabs 13a and 13b are connected to the measuring device 30.

Specifically, the carrier 11 is adhered to a portion to be attached to the structure by an adhesive, and the strain transmitted to the carrier 11 is transmitted to the grid 12 and connected to the solder tabs 13a and 13b, The measuring device 30 is connected to the lead wires 20a and 20b.

Accordingly, as shown in Fig. 1B. A change in the electrical resistance value of the grid 12 is measured using a Wheatstone bridge in the measurement device 30 and the strain of the structure can be measured.

On the other hand, the strain gauge 10 shown in FIG. 1A is attached as follows.

First, the portion attached to the structure 40 shown in Fig. 2 is closed, and the strain gauge 10 is attached to the attachment assisting tape.

Thereafter, an adhesive is applied to the back surface of the strain gauge 10, and the adhesion assisting tape is removed while the strain gauge 10 is adhered to the attaching portion of the structure 40.

In this case, the conventional strain gauge 10 is for measuring a minute strain (0 to 2000 μm) in most cases. As shown in FIG. 2, when the crack is generated outside the fine measurement range and the crack width is increased , The breakage of the grid 12 of the type shown in FIG. 1A is easily generated, so that the use of the strain gage 10 can no longer be used, and furthermore, it is impossible to continuously monitor the area where the damage occurs.

On the other hand, in the case of a horseshoe-shaped crack gauge for measuring cracks, it is possible to measure the crack width according to the progress of the crack, unlike the strain gauge. However, when cracks do not occur at the corresponding positions It is difficult to monitor the presence or absence of cracks and the crack width.

Although it is possible to install a large number of crack gauges at the predicted positions, it is practically difficult to precisely locate cracks in the case of concrete members. In view of the fact that it is difficult to accurately locate the cracks, many crack gauges, which are higher in price than general strain gauges, There is a problem that it is difficult to obtain.

In addition, in the case of a measuring method using an optical equipment or an image of a laser or a method using an ultrasonic wave, expensive equipment is required, and continuous monitoring is impossible because only an occasional and temporary measurement by the operator is possible .

Also, in the case of the method of detecting the damage position by measuring the rate of heat application to the outside of the structure, there is a limitation in applying heat as a whole to a large structure having a very wide measurement range, .

SUMMARY OF THE INVENTION In order to solve the above problems, the present invention has been made in order to solve the above problems, and an object of the present invention is to provide a high- The present invention is to provide a gauge for measuring the damage of a structure capable of measuring damage or damage due to cracking of the structure and the degree of crack propagation by measuring electrical resistance for a long period of time and continuously using a measuring apparatus of the present invention.

Another technical problem to be solved by the present invention is to use a material that can be easily attached to a wide range such as a tape form as a medium, so that it can measure not only local damage and cracks but also a relatively wide range To provide a gauge for structural damage measurement.

According to the present invention, there is provided a gauge for measuring damage to a structure, the damage gauge being capable of measuring a damage to a joint of a structure or a member capable of cracking, At least one unit conductor each having a wire and an internal electrode terminal; 1. A band layer comprising an upper layer and a lower layer, wherein the at least one unit conductor is embedded; An adhesive layer formed under the high-soft-band layer and adhering the high-soft-band layer to the structure; An external electrode terminal exposed to the outside of the high-soft-band layer so that terminals of the structure damage measurement device can be connected; And an internal connection wire embedded in the high-soft-band layer so as to connect the internal electrode terminal of the unit conductor to the external electrode terminal, wherein the high-soft-band layer is formed by cutting the conductor wire Wherein the conductor wire of the unit conductor is formed of a flexible wire having a predetermined bending shape as a conduction resistor whose electrical resistance changes in accordance with the damage of the structure, And the measuring device measures a change in resistance of the conductor wire.

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Here, the high-soft-band layer is formed by continuously forming at least one conductor wire having the predetermined bent shape and continuously measuring damage and cracks without disconnection of the conductor wire even when the damage or crack width of the structure is large. In the form of a tape-like adhesive layer which can be attached to a wide range of the structure.

Here, the at least one unit conductor is embedded in the high-soft-band layer continuously in the transverse and longitudinal directions.

Here, the shape of the conductor wire of the unit conductor, the length of the unit conductor in the transverse direction and the length of the unit conductor in the longitudinal direction can be controlled, so that the accuracy of the damage measurement of the structure can be controlled.

Here, the length L of the conductor wire of the unit conductor is determined on the basis of the allowable length of the gauge for damage measurement of the structure and the expected crack range of the structure, and the number of overlaps in the transverse direction of the conductor wire The length may be determined based on the type of the conductor wire, the voltage used in the structure damage measurement device, and the accuracy of the measurement.

According to the present invention, a high-soft-band layer in which a conductor wire capable of measuring electric resistance is buried is attached to a joint portion of a structure and a surface of a member on which cracks may occur, and a long- By measuring the electrical resistance, it is possible to measure the damage caused by cracks in the structure and the degree of progress of the cracks.

According to the present invention, it is possible to measure to a relatively wide range as the attachment length is widened as well as the local damage and cracks of the structure by using a material which can be easily attached to other wide range such as a tape form.

According to the present invention, since the range of measurable crack width is large as compared with the conventional strain gauge, there is little risk that the conductor wire is disconnected, and it can be used for a relatively long period of time.

FIGS. 1A and 1B are views for explaining the structure of a strain gauge according to a conventional technique.
2 is a diagram showing damage to a structure using a strain gauge according to the prior art.
3 is a view showing a gauge for damage measurement of a structure according to an embodiment of the present invention.
4A and 4B are views showing a unit conductor of a gauge for measuring damage to a structure according to an embodiment of the present invention.
5 is a view illustrating an example in which a gauge for measuring damage to a structure according to an embodiment of the present invention is installed by attaching the structure in a horizontal direction.
FIG. 6 is a view illustrating an example in which a gauge for measuring damage to a structure according to an embodiment of the present invention is installed in a vertical direction of a structure.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings, which will be readily apparent to those skilled in the art. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention, parts not related to the description are omitted, and similar parts are denoted by like reference characters throughout the specification.

Throughout the specification, when an element is referred to as "comprising ", it means that it can include other elements as well, without excluding other elements unless specifically stated otherwise.

3 (a) is a plan view, and FIG. 3 (b) is a cross-sectional view taken along line AA, and FIGS. 4 (a) and 4 (b) are views showing a gauge for measuring damage to a structure according to an embodiment of the present invention. FIG. 5 is a view showing a unit conductor of a gauge for measuring damage to a structure according to an embodiment of the present invention; FIG.

3, the gauge 100 for measuring damage to a structure according to an embodiment of the present invention includes unit conductors 110, a high-soft-band layer 120, an adhesive layer 130, internal connection wires 140a and 140b, And external electrode terminals 150a and 150b.

At least one unit conductor 110 is provided, and each unit conductor 110 includes a conductor wire 111 and internal electrode terminals 112a and 112b, respectively. Here, the conductor wire 111 of the unit conductor 110 may be formed of a flexible wire having a predetermined curvature shape and having a variable electrical resistance to measure damage to the structure, Thus, for example, the structure damage measuring apparatus 30 can measure the resistance change of the conductor wire 111. [

The high-soft-band layer 120 is a band layer composed of an upper layer 120a and a lower layer 120b, and the at least one unit conductor 110 is embedded. At this time, the high-soft-band layer 120 is formed of a high-soft material so as to prevent disconnection of the conductor wire 111 due to damage to the structure. In addition, the high-soft-band layer 120 is formed by embedding at least one conductor wire 111 having the predetermined bending shape, and even when the structure is damaged or cracked, And adheres to a tape-like adhesive layer which can be attached to a wide range of the structure to continuously measure damage and cracks without breaking.

An adhesive layer 130 is formed under the high-soft-band layer 120 to bond the high-soft-band layer 120 to the structure.

The internal connection wires 140a and 140b are formed in the high-soft-band layer 120 so as to connect the internal electrode terminals 112a and 112b of the unit conductor 110 to the external electrode terminals 150a and 150b, respectively .

The external electrode terminals 150a and 150b are exposed to the outside of the high-soft-band layer 120 so that terminals of the structure damage measurement device 30 can be connected, for example.

The gauge 100 for measuring damage to a structure according to an exemplary embodiment of the present invention may be constructed in consideration of the adhesive strength of the adhesive layer 130 adhered to the high-frequency band layer 120 and the electrical characteristics of the conductive material of the unitary conductor 110 , Various materials can be used.

The at least one unit conductor 110 is embedded in the high-soft-band layer 120 continuously in the transverse and longitudinal directions, and the shape and shape of the conductor wire 111 of the unit conductor 110, The longitudinal and longitudinal lengths of the unit conductors 110 can be adjusted to control the accuracy of the damage measurement of the structure. For example, in the case of the unit conductor 110 according to the embodiment of the present invention, when the conductor wire 111 is formed in the shape as shown in FIG. 4A or the conductor wire 111 'is formed as shown in FIG. 4B . ≪ / RTI >

The length L of the conductor wire 111 of the unit conductor 110 is determined based on the allowable length of the gauge 100 for structural damage measurement and the expected crack range of the structure, Can be determined on the basis of the kind of the conductor wire 111, the operating voltage of the structure damage measuring apparatus 30, and the accuracy of the measurement.

5 (a) is a plan view, and FIG. 5 (b) is a cross-sectional view taken along the line BB of FIG. 5. FIG. 5 is a view showing a gauge for damage measurement of a structure according to an embodiment of the present invention, FIG. 6 is a view illustrating an example in which a gauge for damage measurement of a structure according to an embodiment of the present invention is installed by attaching the gauge in the vertical direction of the structure.

In order to measure a wide range of cracks in the structure, it is possible to install the gauge 100 for structural damage measurement continuously in the transverse and longitudinal directions as shown in Figs. 5 and 6.

That is, FIG. 5 shows measurement of the damage in the horizontal direction of the structure by installing a plurality of structural damage gauges 100 in the lateral direction of the structure. In this case, in addition to the measurement of crack occurrence and crack width, Can be measured.

FIG. 6 can measure a plurality of cracks occurring in the structure by installing a plurality of structural damage gauges 100 in the longitudinal direction of the structure.

In the case of a gauge 100 for measuring damage to a structure according to an embodiment of the present invention, the gauge has improved durability in order to prevent the structure from being easily disconnected easily when cracks occur. For example, in the case of a large structure , Allowing a longer measurement time with one application.

It will be understood by those skilled in the art that the foregoing description of the present invention is for illustrative purposes only and that those of ordinary skill in the art can readily understand that various changes and modifications may be made without departing from the spirit or essential characteristics of the present invention. will be. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.

The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

100: Gauge for structural damage measurement
110: unit conductor
111. 111 ': conductor wire
112a, 112b: internal electrode terminal
120, 120a, 120b: a high ductile band layer
130: Adhesive layer
140a, 140b: internal connection wires
150a, 150b: external electrode terminal

Claims (6)

A gauge for damage measurement of a structure capable of measuring damage to a joint of a structure or a member capable of cracking,
At least one unit conductor 110 having a conductor wire 111 and internal electrode terminals 112a and 112b, respectively;
A band layer comprising an upper layer (120a) and a lower layer (120b), wherein the at least one unit conductor (110) is embedded;
An adhesive layer 130 formed under the high-soft-band layer 120 and adhering the high-soft-band layer 120 to the structure;
External electrode terminals (150a, 150b) exposed to the outside of the high-soft-band layer (120) so that terminals of the structure damage measurement device can be connected; And
Internal connection wires 140a and 140b embedded in the highly flexible band layer 120 to connect the internal electrode terminals 112a and 112b of the unit conductors 110 to the external electrode terminals 150a and 150b,
≪ / RTI >
The high-soft-band layer 120 is formed of a high-soft material to prevent disconnection of the conductor wire 111 due to damage of the structure,
The conductor wire 111 of the unit conductor 110 is formed of a flexible wire having a predetermined bending shape as a conduction resistor whose electrical resistance changes in accordance with the damage of the structure, And the change in resistance of the conductor wire (111) is measured. delete The method according to claim 1,
The high-soft-band layer 120 is formed by embedding at least one conductor wire 111 having the predetermined bending shape, and even if the structure is damaged or cracked, the conductor wire 111 is not broken Characterized in that the gauge is glued to the adhesive layer (130) in the form of a tape which can be attached to a wide range of the structure to continuously measure damage and cracks. The method according to claim 1,
Wherein the at least one unit conductor (110) is embedded in the high-soft-band layer (120) continuously in the transverse and longitudinal directions. 5. The method of claim 4,
Wherein the shape of the conductor wire (111) of the unit conductor (110), the length in the transverse direction and the length in the longitudinal direction of the unit conductor (110) are adjusted to control the accuracy of the damage measurement of the structure gauge. 6. The method of claim 5,
The length L of the conductor wire 111 of the unit conductor 110 is determined based on the allowable length of the gauge 100 for structural damage measurement and the expected crack range of the structure, Wherein the number of overlaps in the transverse direction and the total length in the transverse direction are determined on the basis of the type of the conductor wire (111), the operating voltage of the structure damage measuring apparatus, and the accuracy of the measurement.

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