KR101608352B1 - Complex circuit test apparatus - Google Patents

Complex circuit test apparatus Download PDF

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Publication number
KR101608352B1
KR101608352B1 KR1020150105644A KR20150105644A KR101608352B1 KR 101608352 B1 KR101608352 B1 KR 101608352B1 KR 1020150105644 A KR1020150105644 A KR 1020150105644A KR 20150105644 A KR20150105644 A KR 20150105644A KR 101608352 B1 KR101608352 B1 KR 101608352B1
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South Korea
Prior art keywords
substrate
power supply
circuit
connector
board
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Application number
KR1020150105644A
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Korean (ko)
Inventor
이동현
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이동현
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
    • G09B23/00—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes
    • G09B23/06—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics
    • G09B23/18—Models for scientific, medical, or mathematical purposes, e.g. full-sized devices for demonstration purposes for physics for electricity or magnetism

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Business, Economics & Management (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Computational Mathematics (AREA)
  • Educational Administration (AREA)
  • Educational Technology (AREA)
  • Theoretical Computer Science (AREA)
  • Algebra (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention relates to a convergence circuit testing device capable of testing a circuit designed by various devices in various ways and outputting various kinds of electric power required during a circuit test as one single input voltage. The convergence circuit testing device comprises: a substrate; a component disposing board mounted on the substrate and coupled with a circuit device pin; an electric power supply board connected with an electric power supply unit and supplying electric power to a circuit device coupled with the component disposing board; and an electric power supply converter integrally mounted on the substrate. The electric power supply converter may apply and process various levels of voltages required by the circuit device mounted on the component disposing board as one single input voltage or output an input voltage intactly.

Description

{Complex circuit test apparatus}

The present invention relates to a fused composite circuit tester, which is capable of testing circuits designed by various devices in various ways, and is capable of outputting various types of power required for circuit testing with a single input voltage And it is not necessary to separately mount or separate additional components such as a sensor or a switch.

In general, a circuit tester is called a breadboard or a breadboard, and is used for the purpose of constructing a circuit experimentally using various types of electric circuit elements.

[Background Art] [0002] A conventional circuit tester mainly includes a power supply unit for applying power to external circuit components on the board, a power supply board for applying power supplied from the power supply unit to a plurality of electrical and electronic circuit components, And a component placement board for supporting a circuit formed by using an electronic circuit component.

The power supply unit includes a ground terminal for applying a ground potential from the outside to the board, a first potential terminal for applying a first potential and a second potential different from the outside to the circuit board, And the like.

However, since a conventional circuit tester must be supplied with power from the outside, an external power source necessary for operating a circuit implemented on a circuit tester must be prepared in advance. Also, if more than two types of constant voltage are required, It is not easy to simultaneously supply a voltage to the gate electrode.

In addition, a conventional circuit tester has a disadvantage in that a test module such as a speaker, a switch, and an LED lamp is not provided in order to test a designed circuit, so that a user needs to prepare a test module separately.

In addition, in order to test a circuit having a sensor or the like, it is necessary to connect a sensor to be tested to a circuit tester. In this case, the test of various sensors is inconvenient and the test takes a long time.

Therefore, in recent years, researches have been required to provide various types of power sources on a circuit tester and integrate various test modules, and related prior art documents are disclosed in Korean Utility Model Publication No. 20-2013- There is a 'breadboard' of 0007080.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a fusion compound circuit tester in which various test modules are integrated so that a designed circuit can be easily tested.

In addition, the present invention can provide a fusion multiconductor tester capable of processing power of various sizes required for a test module or a designed circuit with a single input voltage without additional power supply.

In addition, the present invention can output the input voltage as it is, and can be used for circuit testing. Since the communication module itself is provided, it is possible to perform a test for the cloud server interlock sensor for the Internet for exclusive use of the Internet, A composite tester can be provided.

The present invention provides a semiconductor device comprising: a substrate; A component placement board mounted on the substrate and to which circuit element pins are coupled; And a power supply board connected to the power supply unit to supply power to the circuit elements coupled to the component placement board. And a power supply conversion unit integrally mounted on the substrate, wherein the power supply conversion unit applies voltages of various sizes required by circuit elements mounted on the component placement board to one input voltage, Or the input voltage can be output as it is.

Further, on the substrate, at least one test module for testing a circuit element designed on the component placement board may be formed integrally with the substrate.

The test module may include at least one of a switch unit, a light source unit, a sound source unit, and a sensor unit.

The power supply conversion unit may be implemented by a regulator or a DC-DC converter, and may include a step-down circuit designed to have a voltage level to be output.

In addition, the substrate may be provided with a component storage unit for storing the circuit elements to be tested according to specifications.

In addition, the substrate may be provided with a microcontroller, and the microcontroller may be detachably attached to the substrate or may be embedded in the substrate.

In addition, an external connector may be provided on the substrate.

In addition, the external connector may include a connector for connecting an external 2-wire module or a connector for connecting an external cable.

In addition, a screw hole for docking with an external control device may be formed on the bottom surface of the substrate.

In addition, the fusion compound tester can be applied to a training device for learning object Internet sensors using a server.

Since the various test modules are integrally provided on the substrate, the designed integrated circuit can be tested for various devices in various ways according to the embodiment of the present invention.

In addition, according to one embodiment of the present invention, a power supply of various sizes required for a test module or a designed circuit can be processed with a single input voltage without additional power supply, so that a separate power supply or power converter .

In addition, since the connector for connecting various communication modules is provided in the integrated circuit tester according to one embodiment of the present invention, it is possible to conduct a circuit test by wired or wireless using a smart phone, the Internet, or the like.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a fusion compound circuit testing machine according to an embodiment of the present invention; FIG.
2 is a plan view of a fusion compound circuit tester according to an embodiment of the present invention.
3 is a bottom view of a fusion compound circuit tester according to an embodiment of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS The advantages and features of the present invention, and the manner of achieving them, will be apparent from and elucidated with reference to the embodiments described hereinafter in conjunction with the accompanying drawings.

The present invention is not limited to the embodiments disclosed below but may be embodied in various forms without departing from the spirit and scope of the invention. To fully disclose the scope of the invention to a person skilled in the art, and the invention is only defined by the scope of the claims.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, referring to FIG. 1 to FIG. 3, a detailed description will be made of a fusion compound circuit testing apparatus according to an embodiment of the present invention. In describing the present invention, a detailed description of known functions and configurations incorporated herein will be omitted so as not to obscure the gist of the invention.

A fused composite circuit testing apparatus 100 according to an embodiment of the present invention includes a substrate 110 and a component placement board 120 mounted on the substrate 110 and coupled with circuit element pins A power supply board 130 for supplying power to circuit elements or various test electronic components coupled to the component placement board 120, and a power supply conversion unit (not shown) integrally mounted on the board 110 140).

The substrate 110 has a size such that the test modules 210, 220, 230 and 240, the component storage unit 250 and the microcontroller 400 can be mounted thereon. And can be electrically connected.

A microprocessor may be mounted instead of the microcontroller 400 and the microcontroller 400 may be detachably mounted on the substrate 110 or may be provided in the substrate 110. [

A bus circuit pattern (not shown) and a power supply pattern (not shown), which are electrically connected to the component placement board 120 and the power supply board 130, respectively, are formed on the board 110 . Here, it is also possible to form a breadboard including the board for component placement 120, the power supply board 130, the bus circuit pattern, and the power supply pattern.

The component placement board 120 may be mounted on the substrate 110 to correspond to a bus circuit pattern formed on the board 110. In addition, the component placement boards 120 may be arranged on the substrate 110 in a plurality of rows, and a plurality of element insertion holes into which the circuit element pins can be inserted are formed in five rows in an embodiment of the present invention .

The power supply board 130 may be mounted on the substrate 110 to correspond to a power supply circuit pattern formed on the substrate 110. The power supply board 130 may be disposed on both sides of the board 110 and may be electrically connected to the power connector 115 mounted on the board 110.

The external power supply connector 115 can receive a predetermined power from an external power supply (not shown). At this time, the power supply conversion unit 140 may vary the power within a preset range applied to the external power supply connector 115. That is, the power supply conversion unit 140 adjusts the magnitude of the voltage and current provided within the set range so that the user can use more various power sources during the circuit test.

Therefore, a user who performs the circuit test can use a power source of a predetermined size and a power source that is varied by the power supply conversion unit 140, so that it is not necessary to separately provide a voltage supply for outputting various constant voltages.

The power supply conversion unit 140 may be connected to an external power supply unit to supply the power required for the integrated circuit testing apparatus 100. The power supply conversion unit 140 receives DC 9 to 24 V (voltage), converts the DC 9 to 24 V, and outputs DC 3.3V, DC 5V, and the like. In addition, the power supply conversion unit 140 according to an embodiment of the present invention may output the input voltage as it is. Therefore, compared to the existing technology, the MFD 100 according to the embodiment of the present invention can output various outputs such as DC 3.3V and DC 5V as well as 24V, so that various devices and sensors can be tested And there is no need for a separate power conversion unit for these tests.

An external power connector 115 and a power switch may be provided on one side of the power supply conversion unit 140.

The power supply conversion unit 140 may be implemented by a regulator or a DC-DC converter. The power supply conversion unit 140 may include a step-down circuit designed to have a desired voltage level .

Test modules 210, 220, 230, and 240 for testing various circuit elements, sensors, or switches designed on the component placement board 120 may be integrally mounted on the substrate 110.

1 and 2, the test modules 210, 220, 230, and 240 may be disposed at an edge of the substrate 110 and include a switch 210, a light source 220, And may include a sensor unit 230 and a sensor unit 240.

The test modules 210, 220, 230, and 240 may be disposed on one side of the power supply board 130 and along the edge of the substrate 110. The number of the test modules 210, 220, 230, and 240 can be increased by disposing the test modules 210, 220, 230, and 240 in a row along the edge of the substrate 110, 130 and the like and the user's hands that control the module can be prevented from colliding with or coming into contact with each other.

The test modules 210, 220, 230, and 240 can receive an electrical signal from a plurality of circuit elements designed on the component placement board 120 and display the operation abnormality of the designed circuit element by light or sound have.

The switch unit 210 of the test modules 210, 220, 230 and 240 electrically connects a plurality of circuit elements designed on the component placement board 120 to output signals generated from the circuit elements, (220) or the tone generator (230).

The switch unit 210 may be implemented in various switch systems. In an embodiment of the present invention, the toggle switch 211, the rotary switch 213, the push button switch 215 and the DIP switch 217 ), Or the like. Here, the push button switch 215 may be replaced with a tack switch.

Although not shown, a shift register may be provided between the toggle switch 211 and the rotary switch 213. The shift register is a device for supplying a discrete digital signal or a waveform.

When the switch unit 210 is operated, the light source unit 220 can emit light by receiving an output signal from the circuit device. The light source unit 220 includes a normal LED lamp 221 or a full color LED lamp 223 emitting various colors. . ≪ / RTI > Since the light source 220 can visually give information to the user about the output confirmation or the like by using the LED lamp 221 or the like, the user can perform the test in a state in which the test execution status is correctly recognized.

Although not shown, it is preferable that a plurality of LED lamps 221 are provided, and a variable resistor may be provided on one side thereof.

When the switch unit 210 is operated, the sound source unit 230 may receive an output signal from the circuit device and output a sound. The sound source unit 230 may be implemented by a conventional speaker. In an embodiment of the present invention, a buzzer button is used to output a sound such as a warning sound. However, the tone generator 230 may use a buzzer as well as a buzzer.

The sound source unit 230 may be used not only to provide an auditory signal to the user about the test execution status but also to perform a sound source test control exercise.

The sensor unit 240 may include an optical sensor 241 and a temperature sensor 243 for sensing the brightness of the light emitted from the light source unit 220 or the temperature of the light emitted by the light source unit 220.

Accordingly, the user may measure the resistance value varying according to the brightness of the light emitted from the light source 220 or the temperature of the light. In addition, since the sensor unit 240 is integrated with the substrate 110, it is possible to easily perform a circuit test including a sensor, There is also an advantage that the operation of the tester 100 itself can be sensed.

The sensor unit 240 may include a humidity sensor, a gas sensor, an ultrasonic sensor, an IR sensor (infrared ray sensor), a PIR sensor (passive infrared ray sensor), a dust sensor, and a distance sensor as well as an optical sensor or a temperature sensor.

In addition, the component storage unit 250 may be integrally provided on the substrate 110. [ Various types of circuit elements used for circuit testing may be stored in the component storage unit 250 and may be configured to allow the user to take out the circuit elements when necessary.

The component storage unit 250 may be detachably attached to the upper surface or the lower surface of the substrate 110. When the component storage unit 250 is provided on the lower surface of the substrate 110, By providing the component storage unit 250 integrally with the substrate 110, it is possible to reduce the possibility of losing the device under test, and the convenience of the operation can be improved when the same device is repeatedly tested.

In addition, the substrate 110 may be provided with a cable connection type module or an external connector 260 that can be connected to the external 2-column module. To this end, the external connector 260 may include an external two-column module connector 261 or an external cable connector 262. Here, a sensor may be attached to the external cable connector 262.

It is not possible to connect the module connected with the connector or the module connected with the cable to the circuit tester or the breadboard according to the related art in two rows. However, the external connector 260 provided in the integrated circuit testing machine 100 according to an embodiment of the present invention includes the external double-module connecting connector 261 or the external cable connecting connector 262 Therefore, the disadvantages of the prior art can be overcome. Here, the external 2-column module connector 261 may be provided in two rows of pin connectors, and the external cable connector 262 may be provided in the form of a mating connector. Therefore, since the two-row connector or the cable connector can be easily connected to the MFD tester 100 according to the embodiment of the present invention, it is possible to reduce the restriction due to the type of device or part to be tested or the connection structure. The external cable connection connector 262 includes a horizontal portion 262a mounted on the board 110 and a vertical portion 262b formed upwardly from the horizontal portion 262a and provided with a connector to which an external cable is connected. And a portion 262b. 2, one end of the horizontal portion 262a may be connected to the edge of the substrate 110, and the other end may protrude outward from the edge of the substrate 110. [ The vertical part 262b may be connected to the other end of the horizontal part 262a protruding outward from the edge of the substrate 110 and may be disposed outside the edge of the substrate 110. [ The external cable connection connector 262 having the above structure is connected to an external cable through a vertical portion 262b disposed outside the edge of the substrate 110. Therefore, And the external cable are prevented from interfering with each other, so that the user can easily carry out the test work.

Therefore, the MFD tester 100 according to the embodiment of the present invention can be manufactured by mounting a module or a cable, in which a coupling pin is arranged in different rows and rows, on a substrate 110 via the external connector 260 As shown in Fig.

A connector (not shown) for attaching an ultrasonic sensor may be mounted on the substrate 110 of the fusion integrated circuit testing machine 100 according to an embodiment of the present invention. In addition, a connector for connecting an external communication module such as Bluetooth, Wi-Fi, radio-frequency (RF) communication module, or NFC may be incorporated.

3, a screw hole 116 is formed on the bottom surface of the substrate 110 to connect or dock the substrate 110 with various control devices such as a motor driving unit and a sensor module (not shown) May be spaced apart from each other at a predetermined distance from the edge of the substrate 110 and the central portion of the substrate 110. Therefore, the fusion compound circuit testing apparatus 100 according to an embodiment of the present invention can be utilized as a control unit itself by using a motor driving unit and a sensor.

In addition, since it is possible to mount and fix the fusion compound circuit tester 100 according to an embodiment of the present invention on a vehicle running using the screw hole 116, the composite compound circuit tester 100 according to an embodiment of the present invention 100) can be used not only in fixed locations but also in moving situations or places.

Meanwhile, the above-described hybrid integrated circuit testing machine 100 according to the present invention can be applied to a training device for practicing sensors, motors, and the like using a real server, And may be used for practice tests such as data acquisition or control of sensors and the like using the Internet. In addition, the fusion compound circuit tester according to the present invention can be applied to a training apparatus or an exercise apparatus for learning object Internet (IoT) sensors using a server.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments.

Therefore, the scope of the present invention should not be limited by the described embodiments, but should be determined by the scope of the appended claims and equivalents thereof.

100: circuit tester 110: substrate
120: part placement board 130: power supply board
140: power supply conversion unit 210: switch unit
220: light source unit 230: sound source unit
240: Sensor part 250: Parts storage box
260: External connector

Claims (10)

Board;
A component placement board mounted on the substrate and to which circuit element pins are coupled;
A power supply board connected to the power supply unit to supply power to circuit elements coupled to the component placement board; And
And a power supply conversion unit integrally mounted on the substrate,
Wherein the power supply conversion unit applies voltages of various sizes required by the circuit elements mounted on the component placement board to one input voltage or processes the input voltages,
An external connector is formed on the board, the external connector including a connector for connecting an external 2-column module and a connector for connecting an external cable provided in the form of a connector,
Wherein the connector for connecting an external cable includes a horizontal portion and a vertical portion bent upward in the horizontal portion, the horizontal portion being mounted on the substrate, the vertical portion being mounted on the substrate so as to protrude outward beyond an edge of the substrate,
Wherein the connector for connecting the external 2-column module is mounted on the substrate so as to be positioned inside the edge of the substrate,
Wherein a screw hole for docking with an external control device is formed on the bottom surface of the substrate at a plurality of spaced apart from each other at a corner portion of the substrate and a central portion of the substrate.
The method according to claim 1,
Wherein at least one test module for testing circuit elements designed on the component placement board is formed integrally with the substrate on the substrate.
3. The method of claim 2,
Wherein the test module includes at least one of a switch unit, a light source unit, a sound source unit, and a sensor unit.
The method according to claim 1,
Wherein the power supply conversion unit is implemented by a regulator or a DC-DC converter, and is provided with a step-down circuit designed to have a voltage level to be output.
The method according to claim 1,
Wherein the substrate is provided with a component storage section for storing the circuit elements to be tested according to specifications.
The method according to claim 1,
Wherein the substrate is provided with a microcontroller, and the microcontroller is detachably mounted on the substrate or embedded in the substrate.
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KR1020150105644A 2015-07-27 2015-07-27 Complex circuit test apparatus KR101608352B1 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101882627B1 (en) * 2017-11-29 2018-07-26 이성신 Educational Kit
KR101891804B1 (en) * 2018-02-14 2018-08-27 이은경 Controller with extensibility of function using Arduino nano module and expansion module for the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100603861B1 (en) * 2005-01-19 2006-07-24 송기홍 A system for the electric experiment

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100603861B1 (en) * 2005-01-19 2006-07-24 송기홍 A system for the electric experiment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101882627B1 (en) * 2017-11-29 2018-07-26 이성신 Educational Kit
KR101891804B1 (en) * 2018-02-14 2018-08-27 이은경 Controller with extensibility of function using Arduino nano module and expansion module for the same

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