KR101552901B1 - Semiconducter Substrate Protect Film Auto Peeler - Google Patents
Semiconducter Substrate Protect Film Auto Peeler Download PDFInfo
- Publication number
- KR101552901B1 KR101552901B1 KR1020140076680A KR20140076680A KR101552901B1 KR 101552901 B1 KR101552901 B1 KR 101552901B1 KR 1020140076680 A KR1020140076680 A KR 1020140076680A KR 20140076680 A KR20140076680 A KR 20140076680A KR 101552901 B1 KR101552901 B1 KR 101552901B1
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- KR
- South Korea
- Prior art keywords
- substrate
- film
- taping
- pair
- scratch
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
Abstract
The upright loading apparatus 10 comprises an upright positioning step S10 for erecting the substrate upright such that one of the line segments connecting the substrate to the substrate vertex is parallel to the gravity direction; The taping unit transfer means 20 is configured so that two taping units T1 and T2 on which adhesive tapes are mounted face each other on both sides of the substrate so as to face each other at a square corner portion of the films F attached to both sides of the substrate Attaching a taping unit (S20); A preliminary peeling step (S30) by a taping unit in which the taping unit transfer means (20) moves the taping units (T1, T2) at the same time in the opposite direction and the film is peeled from the upper square hole of the substrate; A present peeling step (S40) in which the clamper elevating means (40) peels the film off the substrate by raising the clamper (41) clamping the upper rectangular corner portion of the substrate; And a pair of the taping units.
Description
The present invention provides a film peeling apparatus and a peeling method for a semiconductor using a pair of taping units.
The printed circuit board (PCB) or the substrate for semiconductor manufacturing is protected by the protective film on the upper and lower surfaces of the substrate, . Therefore, in order to mount various components such as semiconductor, capacitor, and resistance on such a substrate, the protective film attached to the substrate surface must be removed.
As a conventional technique, there is a patent application No. 10-1119571 (patentee: COM, applicant), and in the prior art, film peeling progresses in a horizontal lying state as a substrate to enlarge the structure of the apparatus, There are many problems.
The present invention provides a film peeling apparatus and a peeling method for a semiconductor using a pair of taping units which can be miniaturized and compacted by reducing the feeding amount of the substrate and the feeding amount of the peeling apparatus, .
The present invention relates to a semiconductor film peeling apparatus and a peeling method using a pair of taping units which can accurately and completely peel a protective film of a substrate and can increase a working efficiency per hour while handling a substrate of 30 to 80 cm in size, .
The
The taping unit transfer means 20 is configured so that two taping units T1 and T2 on which adhesive tapes are mounted face each other on both sides of the substrate so as to face each other at a square corner portion of the films F attached to both sides of the substrate Attaching a taping unit (S20);
A preliminary peeling step (S30) by a taping unit in which the taping unit transfer means (20) moves the taping units (T1, T2) at the same time in the opposite direction and the film is peeled from the upper square hole of the substrate;
A present peeling step (S40) in which the clamper elevating means (40) peels the film off the substrate by raising the clamper (41) clamping the upper rectangular corner portion of the substrate;
And a pair of the taping units.
According to the present invention, there is provided a semiconductor film peeling apparatus and a peeling apparatus using a pair of taping units which are capable of miniaturizing and compacting the apparatus by reducing the feeding amount of the substrate and the feeding amount of the peeling apparatus, Method is provided.
In addition, according to the present invention, it is possible to accurately and completely peel the protective film of the substrate, while increasing the working efficiency per hour while handling a substrate of 30 to 80 cm in size, and using a pair of taping units having excellent durability, And a peeling apparatus are provided.
BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a flow chart of a film stripping method for a semiconductor using a pair of taping units of the present invention.
2 is a conceptual explanatory view of a film peeling method for a semiconductor using a pair of taping units according to the present invention.
3 is a conceptual diagram of a film peeling apparatus for a semiconductor using a pair of taping units according to the present invention.
4 is a conceptual diagram of an upright loading device of the present invention.
5 is a conceptual view of a scratch-forming unit of the present invention.
6 is a conceptual view of the adhesive unit and the adhesive unit transfer means of the present invention.
Hereinafter, a film peeling method and a peeling apparatus for a semiconductor using a pair of taping units according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. 2 is a conceptual diagram for explaining a film peeling method for a semiconductor using a pair of taping units according to the present invention. Fig. 3 is a cross-sectional view showing a pair of taping units according to the present invention. Fig. 4 is a conceptual view of the upright loading device of the present invention, Fig. 5 is a conceptual view of the scratch forming unit of the present invention, and Fig. 6 is a conceptual view of the adhesive unit and the adhesive unit transfer means of the present invention.
1 to 6, in the upright positioning step S10, the
In the preliminary peeling step S30 by the taping unit, the taping unit transfer means 20 simultaneously moves the taping units T1 and T2 in the opposite direction so that the film reaches the opposite square corner of the vertex closest to the surface of the substrate . At this time, the same two degree of freedom movement mechanism as that of the embodiment of FIG. 6 can be used for retreating (lowering) and lowering of the taping units T1 and T2, but a cam mechanism for moving along a specific curve can be used. Description of known technologies relating to a two-degree-of-freedom linear motion mechanism or a curved cam mechanism is omitted.
In this peeling step (S40), the film is peeled from the substrate by lifting the clamper (41) clamping the opposite square corner portions of the vertex closest to the paper surface of the substrate. 1 or 2, it is preferable that the clamping operation of the clamper 41 is performed after the preliminary peeling step S30. However, in the case where there is a blank region in which the film existing on the edge of the substrate is not adhered, It is also possible to clamp before the peeling step. However, it is preferable that the rising of the clamper 41 proceeds after the preliminary peeling step S30.
As shown in FIGS. 1 to 6, in the simultaneous peeling method for a vertical double-sided roll type semiconductor film according to one embodiment of the present invention, before the upright positioning step (S10), or before the upright positioning step (S10) A scratch forming step (S50) in which a scratch forming unit (50) forms scratches for assisting in film peeling at the square corners of the film adhered to both sides of the substrate (S) during a taping unit attaching step (S20) As shown in FIG.
5, the scratch-forming
1 to 6, a film peeling method for a semiconductor using a pair of taping units according to the present invention is characterized in that a film F on which the taping units T 1 and T 2 are peeled off is attached to the
As shown in FIGS. 1 to 6, in the film peeling apparatus for a semiconductor using a pair of taping units according to the present invention, one of the diagonal lines connecting the vertex of the substrate , which is in a horizontal state with the ground , and an
As shown in FIGS. 1 to 6, the film peeling apparatus for a semiconductor using a pair of taping units according to the present invention is characterized in that the taping units (T1, T2) are attached to both sides of the substrate It is preferable to further comprise a
5 and 6B, the
4, the simultaneous peeling apparatus for a vertical double-sided roll type semiconductor film according to the present invention is characterized in that the
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, ≪ RTI ID = 0.0 > and / or < / RTI >
It is to be understood that the appended claims are intended to supplement the understanding of the invention and should not be construed as narrowly interpreted to imply that the scope of the claims does not affect the interpretation of the scope of the claims
10: upright loading device
20: Taping unit feeding means
40: clamper elevating means
41: clamper
50: Scratch-forming unit
51: Straight motion type scratch
53: Turning ring ring
55: Contactless laser
60: Film collection roller
T1, T2: Taping unit
F: Film
Claims (8)
The taping unit transfer means 20 is configured so that two taping units T1 and T2 on which adhesive tapes are mounted face each other on both sides of the substrate so as to face each other at a square corner portion of the films F attached to both sides of the substrate Attaching a taping unit (S20);
The pre-peeling step S30 (FIG. 3) by the taping unit in which the taping unit transfer means 20 moves the taping units T1 and T2 simultaneously in opposite directions and the film is peeled from the opposed square edges of the vertex closest to the surface of the substrate )Wow;
A present peeling step (S40) in which the clamper elevating means (40) raises the clamper (41) clamping the opposite square corner portions of the vertexes closest to the ground surface of the substrate so that the film is peeled off the substrate;
And a pair of the taping units.
Prior to the upright positioning step S10,
Alternatively, between the standing position step S10 and the taping unit attaching step S20,
A scratch forming step (S50) in which the scratch-forming unit (50) forms scratches for assisting film separation at the square corners of the film attached to both sides of the substrate (S);
And a pair of the taping units.
The scratch-forming unit (50)
A linear motion type scratch 51 having a sharp front end that linearly moves and scratches the film,
A rotatable knurling hole 53 formed on the outer circumferential surface to form irregularities to form a scratch on the film by contact rotation,
And a non-contact type laser (55) for forming a scratch by irradiating a laser on a flaw forming region. The film peeling method for a semiconductor using a pair of taping units according to claim 1,
(S60) of attaching the peeled film (F) to the film collection roller (60) by the taping units (T1, T2);
Further comprising a step (S70) of rotating the film collection roller (60) by the film collection roller rotating means (70) to roll the separated film (F) and collecting the same A method for peeling a film for semiconductor use.
A pair of taping units (T1, T2) spaced apart from each other with the upright loading device (10) interposed therebetween;
The taping units T1 and T2 are disposed on both sides of the substrate so as to face each other at the same time so as to be attached to the square corners of the films F attached to both sides of the substrate, A taping unit transfer means (20) for transferring the film away from the substrate to peel the film from the opposite square corner of the vertex closest to the surface of the substrate ;
A clamper (41) located on top of said upright loading device (10) and clamping opposite square corner portions of vertices closest to the ground of the substrate ;
Clamper lifting means (40) coupled to the clamper (41) and lifting the clamper (41) to cause the film to peel off the substrate;
And a pair of taping units each having a pair of taping units.
Before the taping units T1 and T2 are attached to the square corner portions of the films F attached to both sides of the substrate by the tapping unit transfer means 20,
A scratch forming unit (50) for forming scratches on the square corners of the film adhered to both sides of the substrate to assist film separation;
And a pair of taping units each including a pair of taping units.
The scratch-forming unit (50)
A linear motion type scratch 51 having a sharp front end that linearly moves and scratches the film,
A rotatable knurling hole 53 formed on the outer circumferential surface to form irregularities to form a scratch on the film by contact rotation,
And a non-contact type laser (55) for forming a scratch by irradiating a laser on a flaw forming area. The film peeling apparatus for a semiconductor using a pair of taping units.
The upright loading device (10)
One side support roller frame 11 in which the support rollers r are arranged in parallel in one plane,
The other supporting roller frame 12 is disposed in parallel to the one supporting roller frame 11 in parallel and spaced apart from the one supporting roller frame 11,
A frame rotating means 15 for integrally rotating the one supporting roller frame 11 and the other supporting roller frame 12,
And a pair of taping units each having a pair of taping units.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140076680A KR101552901B1 (en) | 2014-06-23 | 2014-06-23 | Semiconducter Substrate Protect Film Auto Peeler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140076680A KR101552901B1 (en) | 2014-06-23 | 2014-06-23 | Semiconducter Substrate Protect Film Auto Peeler |
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KR101552901B1 true KR101552901B1 (en) | 2015-10-01 |
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KR1020140076680A KR101552901B1 (en) | 2014-06-23 | 2014-06-23 | Semiconducter Substrate Protect Film Auto Peeler |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006008276A (en) | 2004-06-23 | 2006-01-12 | Tdk Corp | Peeling device and peeling method |
WO2006003816A1 (en) | 2004-07-02 | 2006-01-12 | Sharp Kabushiki Kaisha | Method and device for peeling off film |
KR101119571B1 (en) | 2011-09-19 | 2012-03-06 | 주식회사 코엠에스 | Semiconducter substrate protect film auto peeler |
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2014
- 2014-06-23 KR KR1020140076680A patent/KR101552901B1/en active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006008276A (en) | 2004-06-23 | 2006-01-12 | Tdk Corp | Peeling device and peeling method |
WO2006003816A1 (en) | 2004-07-02 | 2006-01-12 | Sharp Kabushiki Kaisha | Method and device for peeling off film |
KR101119571B1 (en) | 2011-09-19 | 2012-03-06 | 주식회사 코엠에스 | Semiconducter substrate protect film auto peeler |
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