KR101262289B1 - Method for analyzing failure rate and computer readable record-midium on which program for excuting method thereof - Google Patents

Abstract

PURPOSE: A failure rate analysis method using RBD mechanism and recording medium having recorded in a program executing the failure rate analysis method are provided to utilize actual failure data and to apply an RBD mechanism, thereby accurately estimating a failure rate about a target subject. CONSTITUTION: BOM(Bill Of Material) data of which facilities installed in an industrial site are obtained(S110). Actual failure data obtained through actually operating a target subject corresponding to first BOM data are collected and modified(S120). A first failure rate is calculated on an arbitrary failure analysis item having the actual failure data(S130). If the first failure rate is greater than the second failure rate as a result of comparing the first failure rate, a procedure of estimating an actual failure rate on the target subject is performed using an RBD(Reliability Block Diagram)(S140). [Reference numerals] (S110) Step of collecting first BOM data required for an analysis based on the BOM data of a target subject; (S120) Step of collecting actual failure data corresponding to first BOM data; (S130) Step of calculating a first failure rate on an arbitrary failure analysis item reflecting the actual failure data; (S140) Step of predicting an actual failure rate of the target subject using an RBD if the first failure rate is greater than a second failure rate of the BOM data as a result of comparison

Description

Recording medium recording failure rate analysis method and program executing failure rate analysis method {METHOD FOR ANALYZING FAILURE RATE AND COMPUTER READABLE RECORD-MIDIUM ON WHICH PROGRAM FOR EXCUTING METHOD THEREOF}

The present invention relates to a recording medium on which a failure rate analysis method and a program for executing the failure rate analysis method are recorded, and more particularly, a failure rate analysis method that can more accurately analyze failure rates of operating equipment and facilities to increase reliability of results. And a recording medium on which a program for executing the failure rate analysis method is recorded.

Conventionally, failure data obtained while operating operating equipment and facilities are collected and processed by analyzing Failure Reporting Analysis and Corrective Action System (FRACAS) and Failure Modes Effects Analysis (FMEA). It was conducted in the form of checking or replacing operating equipment and facilities by using.

However, the above method has a problem that the reliability of the failure rate of the operating equipment and facilities is significantly lower.

As a representative example, a defect data management system and a control method thereof are disclosed in Korean Patent No. 0604074, filed and registered on July 30, 2004. Accumulating defect generation data generated during mass production of products in order to manage defect data generated during mass production of a product using a failure mode effect analysis (FMEA) technique; Selecting defects having a defective rate greater than or equal to a predetermined criterion among the accumulated defect occurrence data; Requesting an operator to input defect data including a cause, a symptom, a countermeasure, a history, etc., of a defective state through a network, for the defect having the defective rate higher than a predetermined criterion; Receiving, in real time, defective data including a cause, a symptom, a countermeasure, a history, and the like from a worker through the network; Assigning a computer code to each of the received defective data; Storing the computer-coded defective data in correspondence with each other according to mutual correlation; According to the operator's selection through the network, the computerized coded defect data were processed into a table and displayed.

However, such a method has advantages in collecting and accumulating bad data, encoding the accumulated bad data, managing them in an organic state according to the correlation between the data, and processing the coded data into charts and lists. In practice, no technique has been applied to improve the reliability of failure rates of operating equipment and facilities.

The present invention has been made in order to solve the above-described problems, by utilizing the actual failure data, and applying the RBD mechanism to the failure rate analysis method and failure rate analysis method for predicting the failure rate for a more accurate object than conventional The purpose is to provide a recording medium on which a program is recorded.

In order to accomplish the objects of the present invention as described above and to carry out the characteristic functions of the present invention described below, features of the present invention are as follows.

(식 1)
상기 병렬구조에 따른 상기 (식 1)에 의해 상기 복수개의 유닛에 대한 상기 실제 고장률을 계산하는 고장률 분석 방법을 제안한다. According to an aspect of the present invention, a failure rate analysis method performed by the control of the microprocessor provided in the failure rate analysis device, (a) a first required for analysis based on the BOM (Bill Of Material) information of the object provided from the manufacturer Collecting BOM information, (b) collecting and changing actual failure information obtained by actually operating the object in response to the collected first BOM information, and (c) any reflecting the changed actual failure information. Calculating a first failure rate for the failure analysis item; and (d) comparing the first failure rate with a second failure rate of the BOM information to obtain a Reliability Block Diagram (RBD) when the first failure rate is greater than the second failure rate. Predicting an actual failure rate for the object by using the step (a), wherein the unit name included in the object is based on the BOM information, Extracting the first BOM information including a plurality of reliability, unreliability, failure rate (second failure rate), reference time and unit information, and the step (b) is performed through the failure reporting and corrective action system (FRACAS). Collecting information, and the step (c) includes the first step for the failure analysis item including Mean Time Between Failures (MTBF), Mean Time to Repair (MTTR), failure rate and availability per hour, predicted MTBF and predicted MTTR. 1 calculates a failure rate, and step (d) calculates the actual failure rate using the RBD generated in at least one of a serial structure, a parallel structure, a standby state structure, and a complex structure, and the step (d). Is,

(Equation 1)
A failure rate analysis method for calculating the actual failure rate for the plurality of units by the above equation (1) according to the parallel structure is proposed.

Here, the step (a) according to an aspect of the present invention includes a plurality of unit names, reliability, unreliability, failure rate (second failure rate), reference time and unit information provided in the object based on the BOM information. The first BOM information may be extracted.

In addition, the step (b) according to an aspect of the present invention may collect the actual failure information through the Failure Reporting and Corrective Action System (FRACAS).

In addition, the step (c) according to an aspect of the present invention includes the failure analysis items including Mean Time Between Failures (MTBF), Mean Time to Repair (MTTR), failure rate and availability per hour, predicted MTBF and predicted MTTR. It is possible to calculate the first failure rate with respect to.

In addition, in the step (d) according to an aspect of the present invention, the actual failure rate may be calculated using the RBD generated in at least one of a serial structure, a parallel structure, a standby state structure, and a complex structure.

In addition, in the step (d) according to an aspect of the present invention, the actual failure rate may be calculated by adding each failure rate of the plurality of units to the series structure in which a plurality of units are connected in series.

In addition, the complex structure of step (d) according to an aspect of the present invention may be a mixture of the serial structure, parallel structure and the standby state structure.

According to another aspect of the present invention, there is provided a recording medium on which a program for executing the failure rate analysis method described above is recorded.

As described above, according to the present invention, by applying the RBD technique that reflects the actual failure data for the actual object by avoiding the existing inspection or replacement-oriented management, by reducing the failure rate to improve the performance, maintenance cost and reliability of the object In addition, it helps to introduce new forms of construction and to bring about various changes in equipment introduction and configuration of equipment.

In addition, according to the present invention, by focusing mainly on failure analysis items including Mean Time Between Failures (MTBF), Mean Time to Repair (MTTR), hourly failure rate and availability, predicted MTBF and predicted MTTR, Can contribute.

In addition, according to the present invention, by using the RBD technique for generating at least one or more forms of a serial structure, a parallel structure, a standby state structure and a complex structure, it is possible to further contribute to the above-described effect.

1 is a view showing a failure rate analysis method (S100) according to an embodiment of the present invention by way of example.
2 to 8 is a configuration diagram for additionally explaining each step of the failure rate analysis method (S100) according to an embodiment of the present invention.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings, so that those skilled in the art can easily carry out the present invention. In the drawings, like reference numerals refer to the same or similar functions throughout the several views.

1 is a view showing a failure rate analysis method (S100) according to an embodiment of the present invention by way of example, Figures 2 to 8 add each step of the failure rate analysis method (S100) according to an embodiment of the present invention It is a block diagram for demonstrating normally. 2 to 8 will be described as additional elements while describing FIG.

Failure rate analysis method (S100) according to an embodiment of the present invention is a method for predicting a more improved failure rate by changing the structure of each unit of the object, it is executed by the control of a microprocessor computerized and provided in the failure rate analysis device It works.

The failure rate analysis apparatus is a hardware configuration for supporting the operation of a programmed failure rate analysis method, such as a microprocessor, a memory, a hardware module, and a communication module, for software control of the program when the failure rate analysis method S100 is programmed. Of course it is provided.

Such a failure rate analysis device may take the form of any one of a computer, a personal terminal, a notebook, a PDA, and a specific device equipped with a microprocessor capable of operating a programmed software program. Each step operated by the failure rate analysis device includes steps S110 to S140.

As shown in FIG. 1, first, in step S110 according to the present invention, a bill of material (BOM) information of an object provided from a manufacturer, for example, an equipment installed in an industrial site, such as operating equipment and equipment, is obtained.

The BOM information is a bill of material (BOM) for an object, and means a state diagram indicator indicating how the object is configured through a plurality of units (parts).

Therefore, in step S110 according to the present invention, first BOM information required for analysis is collected based on the obtained BOM information. In this case, the first BOM information is data obtained by extracting only information necessary for analysis among data provided by the BOM information, and includes, for example, a unit name, reliability, unreliability, failure rate, reference time, and unit information included in the object.

The extracted first BOM information is input, stored, and displayed by an analysis tool that substantially performs the failure rate analysis method S100 of the present invention. An analysis tool for inputting, storing, and displaying the first BOM information may be represented as an example as shown in FIG. 2.

2, the analysis tool according to the present invention includes an input 110 of first BOM information and a display window 120 of first BOM information. The input window 120 of the first BOM information receives first BOM information including the extracted unit name, reliability, unreliability, failure rate (second failure rate), reference time and unit information.

On the other hand, in the display window 120 of the first BOM information, the inputted first BOM information is stored in a database, and the stored first BOM information is displayed in a list format. In this case, the list format is represented by each unit name, and is connected to a plurality of main units and sub units of each main unit. This type of directory is shown in the left pane of the display window 120 of the first BOM information.

Next, in the step S120 according to the present invention collects and changes the actual failure information obtained while actually operating the object in response to the first BOM information collected by step S110. At this time, the actual failure information is different from the information such as failure rate included in the above-described BOM information. That is, the actual failure information is preferably collected through the Failure Reporting and Corrective Action System (FRACAS).

Such FRACAS is generally well known and description thereof is omitted. As a result, more accurate actual failure information can be collected. The collected actual fault information is confirmed and then inputted and modified (corrected) by the analysis tool. This analysis tool is shown in FIG.

Referring to FIG. 3, the analysis tool according to the present invention includes an input window 130 of actual failure information and a display window 140 of actual failure information. The input window 130 of the actual failure information is inputted the actual failure information changed (modified) to the data to be analyzed.

In this case, the actual failure information is changed to exclude data not included in the analysis or a function configured to correct error data of the first inputter of the measured data.

The importance of this correction function must be corrected in the case of faulty information that is incorrectly written in the actual data analysis because it contains data that is not included in the analysis when there is no failure or error in the actual operation and regular inspection data is included in the operation. Because it becomes.

In addition, in the input window 130 of the actual failure information according to the present invention to match the failure rate of a specific time provided from the manufacturer with the failure rate inquiry time in the actual operation, the actual time set in the same time for calculating the factory rate of the same time Get fault information.

On the other hand, the actual failure information changed in the display window 140 of the actual failure information according to the present invention is displayed as a list form.

Next, in step S130 according to the present invention, the first failure rate is calculated for any failure analysis item that reflects the actual failure information changed by step S120. Here, failure analysis items to be applied may include Mean Time Between Failures (MTBF), Mean Time to Repair (MTTR), hourly failure rate and availability, predicted MTBF, and predicted MTTR.

The MTBF means the average failure time, which is a measure of how long the object or each unit has no failure, that is, how long the failure time is, which is an important factor in selecting each unit configuration of most objects. do.

MTTR, on the other hand, means the average of the repair time of any object or each unit element of that object. The failure rate is the probability that each unit of any object fails up to a specific time period, and the availability means the use rate of the object up to the analysis time period.

Therefore, in step S130 according to the present invention, the first failure rate is calculated differently for each failure analysis item including MTBF, MTTR, failure rate and availability per hour, prediction MTBF, and prediction MTTR.

Here, the input and the result of each failure analysis item may be represented as an analysis tool as shown in FIG. 4 as an example. The analysis tool analyzes an input window 150 for calculating a failure analysis item and a first failure rate, and a BOM to be analyzed to display an analysis result of the entire BOM and the analysis results for each unit that is the components of the object. 1 includes a failure rate display window (160).

Next, in step S140 according to the present invention, if the first failure rate is greater than the second failure rate by comparing the first failure rate calculated by step S130 with the second failure rate (failure rate) of the BOM information described in step S110, RBD (Reliability). Block diagram) is used to predict the actual failure rate of the object.

Herein, RBD refers to an analysis tool that generates at least one or more of a serial structure, a parallel structure, an atmospheric state structure, and a complex structure, and the analysis tool of each structure is shown in FIGS. 5 to 8.

The analysis tool illustrated in FIGS. 5 to 7 includes three display screens 180 including a property explorer window 170, 200, 230 in which first BOM information and the like are recorded, a serial structure, a parallel structure, a standby state structure, and a mixed structure. , 210, 240, and the mixed structure is not displayed) and the selected structure includes display windows 190, 220, and 250 for displaying a connection relationship between each unit.

RBD composed of these four structures has different results according to each structure. The results are as follows.

Prior to the description, in this embodiment, it is assumed that the BOM information, which is the basic data submitted from the manufacturer, is as shown in Table 1 below, and the actual failure information changed through FRACAS is as shown in Table 2 below.

(표 1)

(Table 1)

(표 2)

Table 2

First, when a serial structure menu provided in the display screen 180 illustrated in FIG. 5 is selected, a serial structure is generated in the display window 190. The serial structure indicates a state in which a plurality of units 191, 192, and 193 are connected in series. In this case, the serial structure calculates an actual failure rate by adding each failure rate of the plurality of units 191, 192, and 193.

For example, as shown in FIG. 5, the actual failure rate due to the serial structure = Bill Unit [failure rate] + Receipt Printer [failure rate] + Slip Printer [failure rate] = 7.2 + 3.5 + 3.5 = 14.2.

 On the other hand, when the parallel structure menu provided in the display screen 210 shown in FIG. 6 is selected, the parallel structure is generated in the display window 220. The parallel structure calculates the actual failure rate for the plurality of units 221 to 224 by the following equation (1).

For example, as shown in FIG. 6, the actual failure rate of the bill units 221 and 222 based on the parallel structure is 4.884043. Therefore, the actual failure rate for a plurality of units (221 to 224) = Bill Unit [parallel failure rate] + Receipt Printer [failure rate] + Slip Printer [failure rate] = 4.884043 +3.5 + 3.5 = 11.884043.

...... (식 1)

(Eq. 1)

In addition, when the standby state structure menu provided on the display screen 240 illustrated in FIG. 7 is selected, the standby state structure is generated in the display window 250. The standby state structure calculates an actual failure rate for the plurality of units 251 to 254 according to Equation 2 below.

..... (식 2)

..... (Equation 2)

For example, as shown in FIG. 7, the actual failure rate of the Bill Units 251 and 252 according to the formula of Equation 2 is calculated as 3.013953, and the actual failure rate for all the units 251 to 254 = Bill Unit [Standby state]. ] + Receipt Printer [failure rate] + Slip Printer [failure rate] = 3.013953 +3.5 + 3.5 = 10.0139533.

In this way, the actual failure rate calculated can be found to be in the best state of the Bill Unit to the manufacturer's request to manufacture in the standby state, or if it is possible to take action in the field, it is possible to see the effect that the failure rate can be obtained by taking action in the field. To this end, by notifying the manufacturer of the output (eg, FIG. 8) output as shown in FIG. 7, it is possible to maintain a better object (eg, equipment, operating equipment).

Meanwhile, the complex structure not shown in FIGS. 5 to 7 may be viewed as a combination of the above-described serial structure, parallel structure, and standby structure.

Embodiments according to the present invention described above can be implemented in the form of program instructions that can be executed by various computer means to be recorded on a recording medium (computer readable medium). The recording medium may include program instructions, data files, data structures, and the like, alone or in combination. The program instructions recorded on the medium may be those specially designed and constructed for the present invention or may be available to those skilled in the art of computer software.

Examples of recording media (computer readable recording media) include magnetic media such as hard disks, floppy disks and magnetic tape, optical media such as CD-ROMs, DVDs, and floppy disks. Magneto-optical media, and hardware devices specifically configured to store and execute program instructions, such as ROM, RAM, flash memory, and the like.

Examples of program instructions include not only machine code generated by a compiler, but also high-level language code that can be executed by a computer using an interpreter or the like. The hardware device described above may be configured to operate as one or more software modules to perform the operations of the present invention, and vice versa.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the exemplary embodiments or constructions. You can understand that you can do it. The embodiments described above are therefore to be considered in all respects as illustrative and not restrictive.

110: first BOM information input window 120: first BOM information display window
130: actual fault information input window 140: actual fault information display window
150: first failure rate input window 160: first failure rate display window
170, 200, 230: Explorer window 180, 210, 240: Display screen
190, 220, 250: Display window

Claims (10)

A failure rate analysis method performed by control of a microprocessor included in a failure rate analysis device,
(a) collecting first BOM information required for analysis based on bill of material (BOM) information of an object provided from a manufacturer;
(b) collecting and changing actual failure information obtained by actually operating the object in response to the collected first BOM information;
(c) calculating a first failure rate for any failure analysis item that reflects the changed actual failure information; And
(d) comparing the first failure rate with a second failure rate of the BOM information and predicting an actual failure rate for the object by using a reliability block diagram (RBD) when the first failure rate is greater than the second failure rate; It includes, step (a),
Based on the BOM information, the first BOM information including a plurality of unit names, reliability, unreliability, failure rate (second failure rate), reference time and unit information included in the object is extracted, and the step (b) may include: FRACAS (Failure Reporting and Corrective Action System) to collect the actual failure information, and step (c), Mean Time Between Failures (MTBF), Mean Time to Repair (MTTR), hourly failure rate and availability, predictive MTBF And calculating the first failure rate with respect to the failure analysis item including a predictive MTTR, and the step (d) comprises: generating the RBD generating at least one of a serial structure, a parallel structure, a standby state structure, and a complex structure; To calculate the actual failure rate,
The step (d)

(Equation 1)
The failure rate analysis method, characterized in that for calculating the actual failure rate for the plurality of units by the equation (1) according to the parallel structure. delete delete delete delete The method of claim 1,
The step (d)
And calculating the actual failure rate by adding each failure rate of the plurality of units to the serial structure in which a plurality of units are connected in series. delete The method of claim 1,
The step (d)

(Equation 2)
And calculating the actual failure rate for the plurality of units by the equation (2) according to the standby state structure. The method according to any one of claims 1, 6 and 8,
The composite structure of step (d),
Failure rate analysis method characterized in that the structure is a mixture of the serial structure, parallel structure and the standby structure. A recording medium on which a program for executing the failure rate analysis method according to any one of claims 1, 6 and 8 is recorded.

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