KR101173668B1 - method and apparatus for measuring depth of three dimensional object with multiple spatial frequencies - Google Patents

method and apparatus for measuring depth of three dimensional object with multiple spatial frequencies Download PDF

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KR101173668B1
KR101173668B1 KR1020100008088A KR20100008088A KR101173668B1 KR 101173668 B1 KR101173668 B1 KR 101173668B1 KR 1020100008088 A KR1020100008088 A KR 1020100008088A KR 20100008088 A KR20100008088 A KR 20100008088A KR 101173668 B1 KR101173668 B1 KR 101173668B1
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depth
projector
spatial frequency
dimensional object
light
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KR20110046222A (en
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이병호
김은희
한준구
휘 김
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서울대학교산학협력단
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Abstract

In the depth measuring method of a 3D object using a multi-spatial frequency, a light pattern having an arbitrary spatial frequency is projected onto a 3D object by using a projector, and an object is photographed by using a digital camera. Since patterns with arbitrary spatial frequencies show different bends and shapes depending on the depth at the surface of the object, the shape, or depth, of the object is measured using geometric variables for specific bends and shapes depending on the depth.

Description

Method and apparatus for measuring depth of three dimensional object with multiple spatial frequencies

The present invention relates to a method for measuring the depth of a three-dimensional object, and more particularly, to a method and apparatus for measuring the depth of a three-dimensional object using multiple spatial frequencies.

As a method of measuring the depth of a three-dimensional object, there is a method using Moir technology. Moirre technology is a method of extracting the depth of the object in the form of different bends and shapes appearing on the surface of the object by projecting the pattern of the grid pattern on the surface of the object using a variety of light sources.

However, the conventional method requires an additional algorithm called an unwrapping algorithm in extracting the depth of a 3D object from an image captured through experiments. Specifically, a light signal projected on the surface of a 3D object has a trigonometric function, and an unwrapping algorithm is required to convert the signal into a signal having depth information. However, because the unwrapping algorithm is very complex, it takes a lot of time to perform it and in some cases errors are easy to occur.

In addition, existing methods have limitations in extracting the depth of a plurality of discontinuous objects.

In addition, the conventional method extracts the depth of the three-dimensional object from the image using only the position of the projector, the position of the digital camera and the view-angle, so that an error is likely to occur in the depth of the extracted object.

The technical problem to be achieved by the present invention is to more simply provide a method and apparatus for measuring the depth of a three-dimensional object.

Another object of the present invention is to provide a method and apparatus for measuring a depth of a three-dimensional object more simply and accurately using a multi-spatial frequency pattern.

Another object of the present invention is to provide a method and apparatus for measuring the depth of a three-dimensional object more simply and accurately without performing an unwrapping algorithm.

Depth measuring device according to a feature of the present invention is a device for measuring the depth of a three-dimensional object, and projecting the corresponding light according to a multi-spatial frequency pattern including a pattern according to at least two or more spatial frequencies to the three-dimensional object A projector; A photographing unit which photographs an image of the 3D object on which the light is projected and outputs a digital image signal corresponding thereto; And a measuring unit calculating a depth of the object based on the digital image signal.

In addition, the depth measuring method according to another aspect of the present invention, a method for measuring the depth of a three-dimensional object, generating a multi-spatial frequency pattern comprising a pattern according to at least two or more spatial frequencies with the three-dimensional object ; Using a projector, the corresponding light is projected onto the three-dimensional object while the phase is shifted in steps of setting the pattern according to the spatial frequency constituting the multi-spatial frequency pattern, and each time the light is projected using the photographing unit, the 3 Photographing an image of a dimensional object; And calculating a depth of the object from the photographed image.

According to an embodiment of the present invention, the depth of a three-dimensional discontinuous object can be efficiently measured without performing an additional algorithm for calculating the depth of the three-dimensional object. As a result, errors and time waste caused by the depth measurement can be reduced.

1 is a structural diagram of a depth measuring apparatus using multiple frequencies according to an embodiment of the present invention.
2 is a flowchart illustrating a depth measuring method using multiple frequencies according to an exemplary embodiment of the present invention.
3 is a graph showing a spatial frequency pattern according to an embodiment of the present invention.
4 is a diagram illustrating a result of projecting light having a spatial frequency pattern onto an object according to an exemplary embodiment of the present invention.
5 is a diagram illustrating a concept for measuring a depth of an object in a depth measuring apparatus according to an exemplary embodiment of the present disclosure.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention. In the drawings, parts irrelevant to the description are omitted in order to clearly describe the present invention, and like reference numerals designate like parts throughout the specification.

Throughout the specification, when a part is said to "include" a certain component, it means that it can further include other components, without excluding other components unless specifically stated otherwise.

Embodiments of the present invention will now be described with reference to the accompanying drawings.

1 is a structural diagram of a depth measuring apparatus using multiple frequencies according to an embodiment of the present invention.

As shown in FIG. 1, a depth measuring device (hereinafter, referred to as a depth measuring device for convenience of description) according to an embodiment of the present invention includes a projector 10, a photographing unit 20, And a measuring unit 30.

The projector 10 projects light onto an object to be measured and, in particular, projects light having a multi-spatial frequency pattern according to an embodiment of the present invention onto an object. To this end, the projector 10 according to an embodiment of the present invention is a projection pattern generation unit 11 for generating a multi-spatial frequency pattern, the light projection unit 12 for generating light according to the multi-spatial frequency pattern to project to the object It includes. A method of generating a multi-spatial frequency pattern will be described in detail later.

The photographing unit 20 photographs an object and outputs a digital image signal corresponding thereto. In particular, the photographing unit 20 photographs an object on which a multi-spatial frequency pattern is projected and outputs a digital image signal corresponding thereto. The photographing unit 20 may be a digital camera, and generating a digital image signal by photographing an object is a well-known technique, and thus detailed description thereof will be omitted.

The measuring unit 30 extracts depth information about the object photographed from the digital image signal. A method of extracting depth information, that is, measuring depth information will be described in detail later.

Next, a depth measurement method of a three-dimensional object using multiple frequencies according to an embodiment of the present invention will be described.

Depth measurement method according to an embodiment of the present invention is obtained based on such an object scanning method, while providing an object scanning method with local illumination, to project the light to the object based on a phase shift method using a pattern having a multi-space frequency Depth information of the object is extracted based on the image of the 3D object. In other words, when light having an arbitrary spatial frequency is projected onto an object, the pattern shows different bends and shapes depending on the depth at the surface of the object. Extract.

The depth measuring method according to the embodiment of the present invention may be referred to as a phase shift profile by using a multi-spatial frequency.

2 is a flowchart illustrating a depth measuring method using multiple frequencies according to an exemplary embodiment of the present invention.

According to an embodiment of the present invention, in order to extract the depth of a 3D object, a multi-spatial frequency having a luminance amount equal to or greater than a set value to distinguish an arbitrary point from a domain photographed by the photographing unit 20 from another point Projected by strong light with a pattern, the depth of the object is extracted by considering the spatial frequency combination, phase-shifting process and geometrical variables.

To this end, as shown in FIG. 2, first, a multi-frequency pattern is generated (S100).

In an exemplary embodiment of the present invention, a pattern having an arbitrary spatial frequency projecting a point on the x-axis of the domain including the object as the strongest light may be represented by Equation 1 below.

Figure 112010006158241-pat00001

Here, s represents the position where the function value is largest on the x-axis of the domain. For example, if the domain is defined from 1 to 1024, when s has a value of 512, it has an impulse signal having a vertex at a point that becomes 512 on the x-axis. n represents the coefficient of the spatial frequency.

The spatial frequency f n can be expressed as Equation 2 below.

Figure 112010006158241-pat00002

The spatial frequency of the pattern can be defined as a function using the coefficients of the Fourier expansion.

One pattern with arbitrary spatial frequency is phase shifted in four steps, respectively, by a phase-shifting method. For example, phases are shifted for each of four stages of 0, π / 2, π, and 3π / 2, so that a total of four patterns may be generated for one spatial frequency.

In an embodiment of the present invention, a plurality of spatial frequency patterns are generated by performing a phase shift having a set number of steps for each spatial frequency satisfying Equation 2 above. E.g,

Figure 112010006158241-pat00003
,
Figure 112010006158241-pat00004
,… ,
Figure 112010006158241-pat00005
As shown in FIG. 4, 36 spatial frequency patterns may be generated by performing phase shifts of 4, that is, 0, π / 2, π, and 3π / 2 for each of 9 spatial frequencies. In this way, the spatial frequency patterns generated through the phase shift of a predetermined number or more for different spatial frequencies may be collectively referred to as a "multi-spatial frequency pattern".

3 is a graph showing a spatial frequency pattern according to an embodiment of the present invention. In particular, FIG. 3 is a graph for estimating how many frequencies are synthesized in using a pattern having multiple spatial frequencies in an embodiment of the present invention.

The multi-spatial frequency pattern according to an embodiment of the present invention may be defined as impulse signals obtained by synthesizing the spatial frequencies. For example, when one screen is regarded as an area that can be photographed using the photographing unit 20, it may be arbitrarily set to generate a desired impulse signal at the center of the x-axis. At this time, the impulse signal should be generated at a sharp angle above the set angle so that it can respond to even small curvature of the object surface.

3 (a) shows that a single spatial frequency

Figure 112010006158241-pat00006
Figure 3 shows the impulse signal, and Figure 3 (b) shows the impulse signals when two spatial frequencies are synthesized. In this case, the spatial frequencies are
Figure 112010006158241-pat00007
Wow
Figure 112010006158241-pat00008
to be.

3 (c) shows impulse signals when two spatial frequencies are synthesized as in FIG. 3 (b), but spatial frequencies are different. Where the spatial frequency is

Figure 112010006158241-pat00009
Wow
Figure 112010006158241-pat00010
to be.

3 (d) shows impulse signals when nine spatial frequencies are synthesized. In this case, the synthesized spatial frequencies

Figure 112010006158241-pat00011
,
Figure 112010006158241-pat00012
,… ,
Figure 112010006158241-pat00013
to be.

Referring to the graphs of (a) to (d) of FIG. 3, when a plurality of spatial frequencies, such as 9, are synthesized as shown in (d) of FIG. 3, compared to other cases ((a) to (c)) It can be seen that the most sharp impulse signals are generated.

Therefore, in the embodiment of the present invention, the projection pattern generation unit 11 of the projector 10 combines at least two or more spatial frequencies satisfying Equation 2 to include multi-spatial frequencies including patterns for each spatial frequency. Create a pattern.

Next, the light projection unit 12 projects a light pattern corresponding to the optical signals according to each spatial frequency pattern included in the multi-spatial frequency pattern provided from the projection pattern generator 11 onto the surface of the object (S110). The photographing unit 20 photographs an object on which the light pattern is projected. The photographing unit 20 photographs an object on which the light pattern corresponding to the multi-spatial frequency pattern is projected, and generates a digital image signal of an image corresponding to the photographed object. At this time, as the image is processed into a digital signal, an image signal corresponding to light projected in an arbitrary pattern is obtained by digital quantization.

For example, when nine spatial frequencies are used, phase shifts are performed in four stages for each spatial frequency, and the optical signals of the patterns according to phase shifts are projected onto the object, and the projected object is photographed. As the projection and photographing process is performed in phase shifting steps for each spatial frequency, a total of 36 image signals are obtained. Through a series of calculations through the 36 images obtained through this process, it has the same effect as scanning the vertical light for a single object from a predetermined direction.

In more detail, when the light of one pattern is projected onto the surface of the three-dimensional object, the two patterns overlap on one object due to the projected pattern and the quantization characteristics of the digital camera used for photographing. do. This phenomenon generates an arbitrary characteristic scattering pattern depending on the curvature and shape of the object on the surface of the object. In particular, since the pattern projected by the projector 10 according to the embodiment of the present invention has impulse signals of sharp angles by combining a plurality of spatial frequencies, the impulse signals are subjected to a phase shift method for the entire image including an object. As it moves, it is scanned into an object.

Specifically,

Figure 112010006158241-pat00014
The first pattern having a spatial frequency of is photographed by projecting on an object, and the image is successively photographed while moving the first pattern in a phase shifting manner. The phase shift method according to the embodiment of the present invention includes four step methods, and includes steps of 0, π / 2, π, and 3π / 2.

As described above, one spatial frequency pattern is projected while phase shifting in four stages, so that four images are acquired for one spatial frequency pattern. Accordingly, according to an embodiment of the present invention, when nine spatial frequencies are used as shown in FIG. 3 (d), a total of 36 images are acquired. Properly calculating the coefficient of Fourier expansion based on these images allows us to find the combination of frequency and phase shifting stages at which each point of the object will shine brightest, and trace the combination back to the geometry at that time. Apply a variable to extract the depth.

4 is a diagram illustrating a result of projecting light having a spatial frequency pattern onto an object according to an exemplary embodiment of the present invention.

4A is a diagram illustrating a case in which a pattern having a spatial frequency lower than a set frequency is projected onto an object, and FIG. 4B is a case of projecting a pattern having a spatial frequency higher than a set frequency to an object. Drawing. Referring to FIGS. 4A and 4B, it can be seen that the curvature and shape of the pattern are different depending on the depth of the object.

In addition, Figure 4 (c) is a view showing a case in which the local illumination in a pattern using a multi-spatial frequency in accordance with an embodiment of the present invention to scan the object, Figure 4 (d) is in accordance with an embodiment of the present invention When the multi-spatial frequency pattern is projected using a projector, the diagram shows the intensity of light projected onto the surface of an object. Referring to FIGS. 4C and 4D, since the left object is positioned in front of the right object, the intensity of light on the surface of the left object is greater than the intensity of light on the surface of the right object.

As such, different curvature and shape patterns appear according to the surface curvature and the surface shape of the 3D object, and thus the light intensity is different. In an embodiment of the present invention, the photographing unit 20 acquires images of the 3D object from which the corresponding light is projected while at least two or more spatial frequencies are phase shifted from the projector 10 according to a multi-spatial frequency pattern. By superimposing the one image to generate a digital image representing the light intensity of each part of the three-dimensional object different from each other (S120). The depth of the object is calculated using geometrical variables according to an embodiment of the present invention based on the difference in intensity of light shown in the digital image.

5 is a diagram illustrating a concept for measuring a depth of an object in a depth measuring apparatus according to an exemplary embodiment of the present disclosure.

The measuring unit 30 measures the depth of the object as follows based on the digital image signals and the geometric variables obtained from the photographing unit 20 (S130).

In an embodiment of the present invention, the light pattern is not projected onto the object in the form of dots, but is projected in a vertical line pattern, for example, to measure the depth of the object using x and z for the object.

First, the coordinates x 'and z' obtained from the obtained image signal may be expressed as follows.

Figure 112010006158241-pat00015

Figure 112010006158241-pat00016

Here, x CCD and z CCD represent positions of the imaging unit 20, and x PRJ and z PRJ represent positions of the projector 10.

Since the photographing unit 20 and the projector 10 are not vertically positioned with respect to the object, a vertical reference line with respect to the object is set so that the viewing angles of the photographing unit 20 and the projector 10 overlap each other, Define the angle of inclination of each viewing angle. That is, the inclination angle (or first inclination angle) of the viewing angle of the imaging unit with respect to the vertical reference line

Figure 112010006158241-pat00017
And the tilt angle (or second tilt angle) of the viewing angle of the projector with respect to the vertical reference line.
Figure 112010006158241-pat00018
.

In addition, when the amount of light projected at any one point on the x-axis of the domain is the largest, the angle (or first angle) with respect to the point measured by the imaging unit among the viewing angles of the imaging unit is defined as θ Detect , and the viewing angle of the projector angle (or second angle) with respect to the point that the projector and the projection θ of the Local It is defined as.

Geometrical variables according to an embodiment of the present invention are x CCD , z CCD , x PRJ , z PRJ , θ Detect , θ Local ,

Figure 112010006158241-pat00019
,
Figure 112010006158241-pat00020
It includes, and the geometric meaning of each variable is as shown in FIG. These variables are values that the depth measuring device knows before measuring the object shape. In addition, in FIG.
Figure 112010006158241-pat00021
Is the field of view of the photographing part,
Figure 112010006158241-pat00022
Indicates the field of view of the projector.

Based on the equations (3) and (4), in order to obtain the position (x, z) of the object to be measured, the following equation can be obtained by canceling x 'and z'.

Figure 112010006158241-pat00023

Also for the position of the projector 10, when x 'and z' are erased as in Equation 5 above, Equation 6 is obtained.

Figure 112010006158241-pat00024

By arranging Equations 5 and 6 calculated as described above, positional coordinates x and z of the object to be measured can be obtained as follows.

Figure 112010006158241-pat00025

Figure 112010006158241-pat00026

The measuring unit 30 measures the position (x, z) of the object to be measured as described above, and calculates the depth of the object along the z-axis based on the measured position of the object.

According to the exemplary embodiment of the present invention, the depth of the 3D object is determined by using geometric parameters preset from the light patterns using the multi-spatial frequency, the phase shift of the light patterns, and the images acquired according to the phase shift of the light patterns. By extracting, a separate algorithm (e.g., an unwrapping algorithm) for calculating the depth of the object is not required, thereby saving time and arithmetic errors that may occur in performing additional calculations. As a result, the depth of the three-dimensional object can be extracted more efficiently.

In addition, since the position coordinates x and z of the object measured according to the embodiment of the present invention are absolute coordinates, the depth of the discontinuous surface of the object may be easily extracted.

The embodiments of the present invention are not limited to the above-described apparatuses and / or methods, but may be implemented through a program for realizing functions corresponding to the configuration of the embodiment of the present invention, a recording medium on which the program is recorded And such an embodiment can be easily implemented by those skilled in the art from the description of the embodiments described above.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, It belongs to the scope of right.

10: projector, 20: photographing unit, 30: measuring unit

Claims (10)

In a device that measures the depth of a three-dimensional object,
A projector for projecting light corresponding to a multi-spatial frequency pattern including a pattern according to at least two or more spatial frequencies to the three-dimensional object;
A photographing unit which photographs an image of the 3D object on which the light is projected and outputs a digital image signal corresponding thereto;
A measuring unit for calculating the depth of the object based on the digital image signal
Including,
The projector
Apparatus for depth measurement of a three-dimensional object using a multi-spatial frequency to project the corresponding light to the three-dimensional object while the phase shifted each step of setting the pattern according to the spatial frequency constituting the multi-space frequency pattern. delete The method of claim 1
The photographing unit
Acquire images of the three-dimensional object from which the corresponding light is projected while at least two or more spatial frequencies are phase shifted from the projector according to the multi-spatial frequency pattern,
And overlapping the obtained images to output a digital image signal in which the intensity of light of each part of the three-dimensional object is different from each other. The method according to claim 1 or 3
The measurement unit may include the inclination angle of the viewing angle of the photographing unit inclined based on the position of the photographing unit, the position of the projector, the vertical reference line set with respect to the object, the inclination angle of the viewing angle of the projector with respect to the vertical reference line, from the digital image signal. And a depth of the object is calculated based on an angle of the photographing unit corresponding to a set point of a digital image signal and an angle of the projector corresponding to the set point. The method of claim 4
And the set point is a point where the intensity of light is the greatest in the digital image signal. In the method of measuring the depth of a three-dimensional object,
Generating a multi-spatial frequency pattern including the pattern according to at least two or more spatial frequencies with the three-dimensional object;
Using a projector, each phase of the pattern according to the spatial frequency constituting the multi-spatial frequency pattern, the corresponding light is projected to the three-dimensional object while the phase is shifted, and each time the light is projected using the imaging unit Photographing an image of a three-dimensional object; And
Calculating a depth of the object from the captured image
Depth measurement method of the three-dimensional object using a multi-spatial frequency comprising a. The method of claim 6
The photographing step,
Acquire images of the three-dimensional object from which the corresponding light is projected while at least two or more spatial frequencies are phase shifted from the projector according to the multi-spatial frequency pattern, and overlapping the obtained images, Depth measurement method of a three-dimensional object using a multi-spatial frequency to obtain a digital image showing different light intensity. The method of claim 7, wherein
The calculating may include the inclination angle of the viewing angle of the photographing unit inclined based on the position of the photographing unit, the position of the projector, the vertical reference line set with respect to the object, the inclination angle of the viewing angle of the projector with respect to the vertical reference line, from the digital image. And calculating a depth of the object based on an angle of the photographing unit corresponding to a set point of the digital image signal and an angle of the projector corresponding to the set point. The method of claim 8, wherein
The depth of the object is calculated based on the following conditions, depth measurement method of a three-dimensional object using a multi-spatial frequency.
Figure 112012014969084-pat00027

Figure 112012014969084-pat00028

x CCD , z CCD : location of image
x PRJ , z PRJ : Projector Position
Figure 112012014969084-pat00029
: Tilt angle of the viewing part's viewing angle with respect to the vertical reference line set with respect to the object
Figure 112012014969084-pat00030
The angle of inclination of the viewing angle of the projector relative to the vertical reference line set for the object.
θ Detect : of domain
Figure 112012014969084-pat00031
In the case where the amount of light projected at any one point on the axis is the largest, the angle with respect to the point measured by the imaging unit of the viewing angles of the imaging unit
θ Local : of domain
Figure 112012014969084-pat00032
If the amount of light projected at any one point on the axis is largest, the angle of the projector's field of view relative to that point projected by the projector The method according to any one of claims 6 to 9
The method of defining the spatial frequency is a method of measuring the depth of a three-dimensional object using a multi-space frequency, using the coefficient of Fourier expansion.















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