CN111473745A - Light-emitting surface microscopic three-dimensional measurement method based on multi-frequency phase shift scheme - Google Patents
Light-emitting surface microscopic three-dimensional measurement method based on multi-frequency phase shift scheme Download PDFInfo
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- CN111473745A CN111473745A CN202010577091.0A CN202010577091A CN111473745A CN 111473745 A CN111473745 A CN 111473745A CN 202010577091 A CN202010577091 A CN 202010577091A CN 111473745 A CN111473745 A CN 111473745A
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- 238000000691 measurement method Methods 0.000 title claims abstract description 9
- 238000005259 measurement Methods 0.000 claims abstract description 17
- 238000010587 phase diagram Methods 0.000 claims abstract description 7
- 208000003164 Diplopia Diseases 0.000 claims abstract description 4
- 208000029444 double vision Diseases 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 22
- 229920006395 saturated elastomer Polymers 0.000 claims description 9
- 238000012937 correction Methods 0.000 claims description 2
- 238000005516 engineering process Methods 0.000 abstract description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 4
- 229910052759 nickel Inorganic materials 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
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- 238000012545 processing Methods 0.000 description 1
- 238000001314 profilometry Methods 0.000 description 1
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- 238000005316 response function Methods 0.000 description 1
- 238000004441 surface measurement Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
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Abstract
The invention discloses a micro three-dimensional measurement method for a luminous target based on a multi-frequency phase shift technology. The invention uses standard phase shift algorithm to calculate the phase value under the condition of no saturation; in the saturation region, calculating a wrapping phase by using a generalized phase shift algorithm; for oversaturated regions with an intensity of less than 3 for non-saturation, the final phase map is filled with the phases that might be extracted in the low frequency fringe image to improve the integrity of the measurement. And the high-precision three-dimensional reconstruction of the light-emitting surface is realized by the double-vision telecentric measurement system after phase expansion and stereo matching. The invention calculates the phase of the highlighted area from the subset of the phase shift stripe image which is not affected by light intensity saturation, provides a multi-frequency phase shift scheme to improve the integrity of the final phase diagram of the luminous surface, and realizes complete and high-precision three-dimensional reconstruction by combining a micro telecentric stereo vision system on the basis.
Description
Technical Field
The invention belongs to the technical field of optical measurement, and particularly relates to a light-emitting surface micro three-dimensional measurement method based on a multi-frequency phase shift scheme.
Background
The structured light and triangulation principles find wide application in the field of three-dimensional optical metrology. A periodic sinusoidal fringe pattern is projected onto the object to be inspected, and the modulation of the object to be inspected distorts the fringes. In order to quantitatively calculate the modulation amount and reconstruct the three-dimensional result of the target, it is necessary to accurately retrieve the phase values encoded in the fringe pattern. Currently, two commonly used phase recovery algorithms are fourier transform-based algorithms and phase shift-based algorithms. The dynamic measurement algorithm based on Fourier transform is a commonly used algorithm in dynamic measurement, and the dynamic measurement algorithm based on phase shift is more suitable for high-precision measurement due to the independent mathematical operation characteristic of pixels. Recent work has shown that with phase-based stereo matching methods, the intrinsic non-linear response function of digital projectors can be neglected, since the phase errors in the different views are automatically eliminated. However, the phase-based stereo matching method is prone to fail when dealing with objects with glossy surfaces. The integrity of the reconstructed model is affected by the highlight regions because the phase of these regions cannot be computed with dense fringe images.
The glossy surface has strong reflectivity, so the light intensity cannot be linearly changed due to the limited dynamic range of the digital camera. For this case, one of the most advanced techniques is called high dynamic range three-dimensional shape measurement, and can be divided into two categories: device-based techniques and algorithm-based techniques. For this set of device-based technologies, the optimal parameters of the device, such as the exposure time of the camera or the exposure time of the projector, are needed to help form visible stripes in light and dark areas. Other optically-based methods, such as scanning luminescent objects using polarizers, have also been investigated, based on which the polarized light intensity can be effectively suppressed. Furthermore, there are also hybrid methods by modifying the camera exposure, but strategies to introduce additional devices, change the viewing position, or adjust the projector parameters to capture high speed dynamic range images are also contemplated. Based on maximum intensity modulation, a fast high-speed dynamic range solution is proposed that employs a high-speed projector that projects a fringe image of light intensity variations at 700 Hz.
However, for glossy surfaces, the saturation problem may sometimes not be easily solved merely by reducing the exposure time or the intensity of the projection light. Therefore, researchers have also developed algorithm-based techniques that rely primarily on well-designed algorithms to extract phase values from the original fringe image without allowing the camera or projector exposure time to change freely or without additional equipment.
However, in microscopic imaging, due to the short depth of field of the microscopic projection system, the portion of the light emitting illuminated by the black stripe is no longer purely black, but rather is affected by the white stripe. In this case, there are more saturation regions when higher frequency fringes are used.
Disclosure of Invention
The invention provides a light-emitting surface microscopic three-dimensional measurement method based on a multi-frequency phase shift scheme.
The specific technical scheme of the invention is as follows:
a light-emitting surface microscopic three-dimensional measurement method based on a multi-frequency phase shift scheme comprises the following steps:
calculating a phase value by using a standard phase shift algorithm in an unsaturated area of a light-emitting surface, and calculating a wrapping phase by using a generalized phase shift algorithm in a saturated area of the light-emitting surface;
for the oversaturated area with the unsaturated intensity less than 3, filling a final phase diagram by using phases possibly extracted from the low-frequency fringe image so as to improve the integrity of measurement;
and step three, the high-precision three-dimensional reconstruction of the light-emitting surface is realized by the double-vision telecentric measurement system after phase expansion and stereo matching.
Preferably, in step one, based on the controllable phase shift amount, the recorded phase shift fringe pattern is represented by formula (1),
wherein
Is the pixel coordinates of the camera and,
is the average intensity，
Is the contrast of the fringes,
is the phase distribution to be measured and,
is a shifted reference phase, N =1, …, N;
wrapped phase
Corresponding measured phase distribution
Represented by the formula (2),
wherein,
coefficient of performance
，i=1,2,3，j=1,2,3，
Due to the fact that
Is strictly controlled, and can obtain two-dimensional wrapping phase distribution
。
Preferably, if
Quilt
Integer within the range
Equally dividing, the standard phase shift algorithm is simplified as in equation (5),
preferably, the second step is as follows:
step 2.1, considering the saturation degree of different fringe periods, and referring to the stored information in the phase expansion stage to calculate the saturation intensity of each pixel in the image;
step 2.2, calculating the phase of the partially saturated phase shift fringe image through general phase shift by applying a generalized phase shift algorithm corresponding to an equation;
and 2.3, automatically fusing to ensure the correctness of phase unwrapping through a multi-frequency high dynamic range.
Preferably, step three is as follows:
step 3.1. projecting the sine curve graph encoded with the horizontally increasing phase diagram from the digital projector in sequence, and obtaining the absolute phase values of the two cameras by using the proposed method based on the multi-frequency fringe
；
Step 3.2, performing telecentric polarity correction on the stripe pattern, taking the left camera as a main camera on the premise of not losing generality, and regarding the left camera with a phase value
Is formed by a plurality of pixels
Task is the second in the right image
Find the corresponding pixel in the line
；
Step 3.3. obtaining integral pixels
The pixel is at
The phase value in the row being closest to
In a phase of
And then calculating sub-pixel coordinates based on inverse linear interpolation
，
And 3.4, after the left and right consistency check is completed in the stereo matching, obtaining matched pixel pairs, and realizing the three-dimensional reconstruction of the high-precision light-emitting surface.
Compared with the prior art, the invention has the following remarkable advantages: microscopic fringe projection profilometry is a powerful three-dimensional measurement technique with theoretical measurement accuracy better than one micron, however, defocusing of dense fringes and complex surface reflection characteristics often result in saturation of the intensity and degradation of the quality of the fringes, which makes complete three-dimensional reconstruction difficult. In order to solve the problem, the invention calculates the phase of the highlighted area from the subset of the phase shift fringe image which is not affected by light intensity saturation, provides a multi-frequency phase shift scheme to improve the integrity of the final phase diagram of the luminous surface, and realizes complete and high-precision three-dimensional reconstruction by combining a microscope telecentric stereo vision system on the basis.
Drawings
Fig. 1 is a schematic flow chart of a three-dimensional measurement method according to an embodiment of the present invention.
FIG. 2 is a comparison of fringe saturation for different frequencies according to an embodiment of the present invention; (a) and (b) an untreated fringe image; (c) and (d) amplifying details of the saturated portion; (e) and (f) an index showing a region where the unsaturated state is less than 3.
Fig. 3 is a flowchart of algorithm 1 in the embodiment of the present invention.
Fig. 4 is a flowchart of algorithm 2 in an embodiment of the present invention.
Fig. 5 is a flowchart of algorithm 3 in an embodiment of the present invention.
FIG. 6 is a comparison of an embodiment of the present invention when processing partially saturated targets with a conventional method.
FIG. 7 is a schematic diagram of an experiment performed on a nickel plated plate of a mechanical watch according to an embodiment of the present invention.
FIG. 8 is a graph of data from experiments conducted on a nickel plate of a mechanical watch in accordance with an embodiment of the present invention.
FIG. 9 is another data plot of experiments performed on a nickel plate of a mechanical watch according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In the present embodiment, the method for measuring the microscopic three-dimensional size of the light-emitting surface based on the multi-frequency phase shift scheme includes the following steps.
Calculating a phase value by using a standard phase shift algorithm in an unsaturated area of the light-emitting surface, and calculating a wrapping phase by using a generalized phase shift algorithm in a saturated area of the light-emitting surface.
Based on the controllable phase shift amount, the recorded phase shift fringe pattern is represented by formula (1),
wherein
Is the pixel coordinates of the camera and,
is the average intensity of the light emitted by the light source,
is the contrast of the fringes,
is the phase distribution to be measured and,
is a shifted reference phase, N =1, …, N;
wrapped phase
Corresponding measured phase distribution
Represented by the formula (2),
wherein,
coefficient of performance
，i=1,2,3，j=1,2,3，
Due to the fact that
Is strictly controlled, and can obtain two-dimensional wrapping phase distribution
. If it is not
Quilt
Integer within the range
Equally dividing, the standard phase shift algorithm is simplified as in equation (5),
and step two, for the oversaturated region with the unsaturated intensity less than 3, filling a final phase map by using phases possibly extracted from the low-frequency fringe image so as to improve the integrity of measurement.
In the conventional multi-frequency phase shift method, a reference phase diagram is provided for phase unwrapping by using a fringe image with a lower frequency, and the final measurement accuracy is determined by using a fringe image with a highest frequency. In fact, in the saturation region, the final phase value may be replaced by the phase value of the low-density fringe image with lower saturation intensity. In this way, the three-dimensional reconstruction can be made as complete as possible. Therefore, a high-speed dynamic range surface measurement scheme based on multi-frequency stripes is provided. The high-precision microscopic three-dimensional measurement of the light-emitting surface is realized through three steps of image data preprocessing, saturation detection and compensation algorithm, phase three-dimensional matching and the like.
The first step is an image data pre-processing stage, which includes image acquisition, image correction and classification according to streak frequency. The fringe pattern is projected in turn with the trigger signal to achieve camera synchronization. The second step is the main part, corresponding to the proposed scheme based on multi-frequency fringes, i.e. the unwrapped phase map is calculated by three algorithms, as shown in figures 3, 4 and 5, respectively.
And step three, the high-precision three-dimensional reconstruction of the light-emitting surface is realized by the double-vision telecentric measurement system after phase expansion and stereo matching.
Sinusoidal plots encoded with horizontally increasing phase maps are projected sequentially from a digital projector. By using the proposed method based on multi-frequency fringes, the absolute phase values of two cameras can be obtained
And the method is used for stereo matching. The fringe image is first telecentrically polarity corrected. And on the premise of no loss of generality, the left camera is taken as a main camera. For left camera with phase value
Image ofVegetable extract
Task is the second in the right image
Find the corresponding pixel in the line
. Since the fringe direction is vertical, the unwrapped phase values increase in the horizontal direction. First, integral pixels are obtained
The pixel is at
The phase value in the row being closest to
In a phase of
. Then, sub-pixel coordinates are calculated based on inverse linear interpolation
，
And after the left-right consistency check is completed in the stereo matching, a matched pixel pair is obtained, and the high-precision three-dimensional reconstruction of the light-emitting surface is realized.
Fig. 6, 7, 8 and 9 are experimental graphs of the present example. Specifically, fig. 6 is a comparison of the embodiment to a conventional method when dealing with partially saturated targets, wherein (a) shows an edge image of a logo applied to a metal wristband; (e) representing an edge image of the printed circuit board. FIG. 7 is a graph showing the experiment of applying the method of the present embodiment to mechanically surface a nickel-plated plateWhere, graph (a) is a sample picture, graph (b) is a fringe image of the bottom surface of the sample, graph (c) is a fringe image of the top of the sample, graph (D) is a reconstructed 3D model of the bottom, and graph (e) is a reconstructed 3D model of the top. FIG. 8 and FIG. 9 are data graphs showing the mechanical chart of the nickel-plated sheet according to the method of the present embodiment, wherein (A), (B), (C), (D), (E), (
）-（
) A cross-sectional view of data represented by the line marked in (d), (b)
）-（
) The cross-sectional view of the data is indicated by the line marked in (e).
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (5)
1. A light-emitting surface microscopic three-dimensional measurement method based on a multi-frequency phase shift scheme is characterized by comprising the following steps:
calculating a phase value by using a standard phase shift algorithm in an unsaturated area of a light-emitting surface, and calculating a wrapping phase by using a generalized phase shift algorithm in a saturated area of the light-emitting surface;
for the oversaturated area with the unsaturated intensity less than 3, filling a final phase diagram by using phases possibly extracted from the low-frequency fringe image so as to improve the integrity of measurement;
and step three, the high-precision three-dimensional reconstruction of the light-emitting surface is realized by the double-vision telecentric measurement system after phase expansion and stereo matching.
2. The method of claim 1, wherein the method comprises:
in the first step, based on the controllable phase shift amount, the recorded phase shift fringe graph is represented by formula (1),
wherein
Is the pixel coordinates of the camera and,
is the average intensity of the light emitted by the light source,
is the contrast of the fringes,
is the phase distribution to be measured and,
is a shifted reference phase, N =1, …, N;
wrapped phase
Corresponding measured phase distribution
Represented by the formula (2),
wherein,
coefficient of performance
，i=1,2,3，j=1,2,3，
Due to the fact that
Is strictly controlled, and can obtain two-dimensional wrapping phase distribution
。
3. The method of claim 2, wherein the method comprises: if it is not
Quilt
Integer within the range
Halving, the standard phase shift algorithm is simplified as（5），
4. The method according to claim 1, wherein the second step is as follows:
step 2.1, considering the saturation degree of different fringe periods, and referring to the stored information in the phase expansion stage to calculate the saturation intensity of each pixel in the image;
step 2.2, calculating the phase of the partially saturated phase shift fringe image through general phase shift by applying a generalized phase shift algorithm corresponding to an equation;
and 2.3, automatically fusing to ensure the correctness of phase unwrapping through a multi-frequency high dynamic range.
5. The method according to claim 1, wherein the three steps are as follows:
step 3.1. projecting the sine curve graph encoded with the horizontally increasing phase diagram from the digital projector in sequence, and obtaining the absolute phase values of the two cameras by using the proposed method based on the multi-frequency fringe
；
Step 3.2, performing telecentric polarity correction on the stripe pattern, taking the left camera as a main camera on the premise of not losing generality, and regarding the left camera with a phase value
（
，
) Pixel of (a)
，
) Task is the second in the right image
Find the corresponding pixel in the line
；
Step 3.3. obtaining integral pixels
The pixel is at
The phase value in the row being closest to
（
，
) In a phase of
And then calculating sub-pixel coordinates based on inverse linear interpolation
，
And 3.4, after the left and right consistency check is completed in the stereo matching, obtaining matched pixel pairs, and realizing the three-dimensional reconstruction of the high-precision light-emitting surface.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111998799A (en) * | 2020-08-20 | 2020-11-27 | 四川大学 | Multi-frequency projection three-dimensional surface shape measurement motion area detection method and system |
| CN112747693A (en) * | 2020-12-25 | 2021-05-04 | 南京理工大学智能计算成像研究院有限公司 | Three-dimensional measurement method based on color image detection for high-reflectivity object |
| CN114326352A (en) * | 2021-12-31 | 2022-04-12 | 南京理工大学智能计算成像研究院有限公司 | Real-time cell three-dimensional analysis method based on digital holography |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114326352A (en) * | 2021-12-31 | 2022-04-12 | 南京理工大学智能计算成像研究院有限公司 | Real-time cell three-dimensional analysis method based on digital holography |
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