KR101096710B1 - A method for forming a sealant using a sealant device for a liquid crystal device - Google Patents

Abstract

The present invention relates to a sealing material coating method using a sealing material coating device for a liquid crystal display device that can prevent scratches of the stage and shorten the working time, and includes a stage on which a substrate is seated and an upper portion of the stage. In the sealing material coating method using a sealing material coating device for a liquid crystal display device comprising a head, a gap sensor provided in the head to face the stage, the guide is movable to the head, the gap sensor is used Measuring flatness of the stage; Mounting a substrate on the stage; Installing a sealing material nozzle on the head: and applying a sealing material on the substrate.

Liquid Crystal Display, Seal Material Coating Device, Scratch, Gap Sensor, Micro Gauge

Description

A method for forming a sealant using a sealant coating device for a liquid crystal display device {A method for forming a sealant using a sealant device for a liquid crystal device}

1 is a view showing a liquid crystal cell process using a conventional vacuum injection method

2 is a block diagram of a conventional seal material applying apparatus

3 is a view for explaining a method of measuring the flatness of the stage using a conventional seal material coating device for a liquid crystal display device;

Figure 4 is a flow chart showing a sealing material coating method using a conventional sealing material coating device for a liquid crystal display device.

5 is a flow chart showing a sealing material coating method using the sealing material coating device for a liquid crystal display device according to an embodiment of the present invention.

6A to 6C are views for explaining a sealing material applying method using the sealing material coating device for a liquid crystal display device according to an embodiment of the present invention.

7 is a table showing the flatness of the stage measured by the seal material coating device for a liquid crystal display device according to an embodiment of the present invention.

FIG. 8 is a three-dimensional graph showing values for the table of FIG.

* Explanation of symbols on the main parts of the drawings

51S: Stage Flatness Measurement 52S: Nozzle Mount                 

53S: substrate seating 54S: sealing material applied

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a manufacturing apparatus for a liquid crystal display device, and more particularly, to a sealing material coating method using a sealing material coating device for a liquid crystal display device which can prevent scratches on a stage and shorten working time.

As the information society develops, the demand for display devices is increasing in various forms, and in recent years, the LCD (Lipuid Crystal Display Device), PDP (Plasma Display Panel), ELD (Electro Luminescent Display), and VFD (Vacuum Fluorescent) Various flat panel display devices such as displays have been studied, and some of them are already used as display devices in various devices.

Among them, liquid crystal displays are the most widely used, replacing the cathode ray tubes for mobile image display devices because of their excellent image quality, light weight, thinness, and low power consumption. In addition to the same mobile type, various developments have been made for television monitors.

Such liquid crystal displays are largely manufactured through an array process, a color filter process, a liquid crystal cell process, and the like.

The array process is a process of forming a thin film transistor (TFT) and a pixel electrode on a first substrate by repeating deposition, photolithography, and etching processes.

In the color filter process, a black matrix is formed on the second substrate to prevent light leakage in regions other than the region where the pixel electrode is formed, and red and green colors are formed using dyes or pigments. After manufacturing a blue color filter, it is a process of forming an indium tin oxide (ITO) film for common electrodes.

The liquid crystal cell process maintains a constant cell gap between the first substrate and the second substrate by using a spacer, joins both substrates using a sealing material, cuts the unit panel, and injects liquid crystal to complete the liquid crystal cell. It is a process.

Hereinafter, a conventional liquid crystal cell process will be described in detail with reference to the accompanying drawings.

1 is a view showing a liquid crystal cell process using a conventional vacuum injection method.

As can be seen in FIG. 1, first, an alignment material is applied onto a TFT substrate and a color filter substrate, and then an alignment process 1S is performed so that the liquid crystal molecules have uniform orientation. The alignment step (1S) proceeds in order of washing before application of the alignment film, alignment film printing, alignment film firing, alignment film inspection, and rubbing process.

After the alignment process 1S, a gap process proceeds. In the gap process, each of the TFT substrate and the color filter substrate is cleaned (2S), and then a spacer (3S) for maintaining a constant cell gap on the TFT substrate is spread (3S), and the outer portion of the color filter substrate After the seal material is applied (4S) to the TFT, the TFT substrate and the color filter substrate are applied to each other to form a bonding process (5S).

Such a gap process proceeds with a two-line double line process in which the TFT substrate and the color filter substrate each proceed in different lines, and in the bonding process, it proceeds as a single-line single line. In other words, the gap process is a process consisting of a complex line in which the process proceeds in a two-line double line and then the process proceeds to a single-line single line.

After the bonding process, a process of cutting and processing into unit panels is performed (6S).

Thereafter, liquid crystal is injected into the unit panel, and the injection hole is sealed (7S) to form a liquid crystal layer.

Thereafter, the cut surface of each unit panel is polished, and then a liquid crystal display device is fabricated by performing an appearance and electrical defect inspection 8S of the unit panel.

On the other hand, the sealing material coating device is used in the process of applying the sealing material, a conventional sealing material coating device will be described in more detail as follows.

2 is a configuration diagram of a conventional seal material applying apparatus.

In the conventional seal material coating apparatus, as shown in FIG. 2, the stage 200 on which the substrate 210 is mounted, the head 220 provided on the stage 200, and the head 220. A gap sensor 230 disposed at the head 220 to measure a distance between the head 220 and the substrate 210, and a nozzle provided at the head 220 to apply the sealing material 290 on the substrate 210. 240.

The gap sensor 230 is for measuring the flatness of the substrate 210, the gap sensor 230 emits a laser light incident on the surface of the substrate 210 and, The light receiving unit 230b receives laser light reflected from the surface of the substrate 210.                         

Here, the position of the light incident on the light receiving portion 230b is changed according to the distance between the substrate 210 and the head 220. The gap sensor 230 is connected to the head 220 using this principle. The distance between the substrates 210 is measured. The measured distance makes it possible to know how much the surface of the substrate 210 protrudes. That is, the flatness of the substrate 210 can be known.

If this is explained in more detail as follows.

The distance between the nozzle 240 and the substrate 210 should always be maintained at an appropriate distance, which is when the distance between the nozzle 240 and the substrate 210 becomes too narrow or too wide. This is because the width of the seal member 290 discharged from the tube may be different. This results in the Z-axis or the head 220 according to the flatness in each part of the substrate 210 so that the nozzle 220 is installed between the head 220 and the substrate 210 at appropriate intervals. -Means to move in the Z-axis direction.

To this end, the gap sensor 230 measures the flatness of the portion of the substrate 210 where the head 220 is located, and transmits the measured value to the controller. Then, the controller moves the head 220 in the Z-axis or -Z-axis direction based on the measured value.

On the other hand, before measuring the flatness of the substrate 210, the operation of checking the flatness of the stage 200 on which the substrate 210 is seated should be preceded. That is, since the substrate 210 is seated on the stage 200, the stage 200 must first be flattened.                         

This will be described in more detail with reference to the accompanying drawings.

3 is a view for explaining a method of measuring the flatness of the stage using a conventional sealant coating device for a liquid crystal display device, Figure 4 shows a sealant coating method using a conventional sealant coating device for a liquid crystal display device. Flowchart.

3, the micro gauge 333 is mounted on one side of the head 220, and the head 220 on which the micro gauge 333 is mounted is positioned above the stage 200. . When the head 220 is moved along the front surface of the stage 200, the micro gauge 333 mounted to the head 220 is also moved along the front surface of the stage 200. At this time, the measuring needle of the micro gauge 333 is in contact with the surface of the substrate 210, the flatness of the stage 200 is measured.

In this case, the operator may cut the surface of the stage 200 based on the calculated flatness to maintain the overall flatness of the stage 200 uniformly.

As described above, the seal material forming method using the conventional seal material applying apparatus, as shown in Figure 4, mounting the micro gauge 333 to the head 220, and the micro gauge 333 Measuring the flatness of the stage 200 using the same, detaching the micro gauge 333 from the head 220, mounting the nozzle 240 to the head 220, The substrate 210 is mounted on the stage 200, and the sealing material 290 is applied onto the substrate 210 using the nozzle 240.

However, the method of measuring the flatness of the stage using a conventional seal material coating apparatus has the following problems.

First, when measuring the flatness of the stage, scratches may occur in the stage because the measuring needle of the micro gauge and the stage contact each other.

Second, when measuring the flatness of the stage, the micro gauge should be attached to the head. When the flatness measurement of the stage is completed, the micro gauge attached to the head needs to be detached. There was a problem that the working time is increased.

The present invention is to solve the above problems, by measuring the flatness of the stage using a gap sensor measuring the flatness of a conventional substrate, the process step can be reduced, the liquid crystal does not cause scratches on the substrate It is an object of the present invention to provide a sealing material coating method using a sealing material coating device for a display device.

The sealing material coating method using the sealing material for a liquid crystal display device according to the present invention for achieving the above object is provided with a stage on which the substrate is seated, a head provided on the stage, the head to face the stage A sealing material coating method using a sealing material coating device for a liquid crystal display device comprising a gap sensor and a guide in which the head is movably coupled, the method comprising: measuring the flatness of the stage using the gap sensor; Mounting a substrate on the stage; Installing a sealing material nozzle on the head: characterized in that it comprises a step of applying a sealing material on the substrate.

Hereinafter, a sealing material coating method using the sealing material coating device for a liquid crystal display device according to an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings.

5 is a flowchart illustrating a sealing material coating method using the sealing material coating device for a liquid crystal display device according to an exemplary embodiment of the present invention.

That is, as shown in Figure 5, according to the present invention, the step of measuring the flatness using the gap sensor (51S), mounting the nozzle (52S), and the step of mounting the substrate on the stage ( 53S) and the step of applying the sealing material on the substrate (54S), that is, the sealing material can be applied on the substrate through a process consisting of a total of four steps.

If this is explained in more detail as follows.

6A to 6C are views for explaining a sealing material applying method using a sealing material coating device for a liquid crystal display device according to an exemplary embodiment of the present invention, and FIG. 7 is a seal material coating for a liquid crystal display device according to an embodiment of the present invention. A table showing the flatness of the stage measured by the device, Figure 8 is a three-dimensional graph showing the values for the table of FIG.

First, the operator inputs the measurement range 640 in the stage 600 and the number of measurement regions 655 in the measurement range 640 to an input of a control unit (not shown). Here, the front of the control unit is provided with an input unit for the operator to input the necessary instructions for the seal material applying apparatus, and a display unit for displaying a variety of data.                     

In more detail, as illustrated in FIG. 6A, the operator inputs the coordinates of the start point 611a and the end point 611b of the stage 600 to an input unit of the operation unit so that the stage ( A measurement range 640 of 600 is set.

As shown in FIG. 6B, a point number is input to set the number of measurement areas 655 to be measured within the measurement range 640.

In this case, as the number of the measurement regions 655 is increased, the flatness of the stage 600 can be known more accurately. In addition, the measurement range 640 is preferably set at least the substrate 610 larger than the area.

When the number of the measurement range 640 and the measurement area 655 is input to the input of the controller as shown in FIG. 6C, the controller responds to the head 620 and the guide (not shown). ) So that the gap sensor 530 of the head 620 faces one of the measurement areas 655.

In addition, the controller reciprocates the head 620 in the X-axis and -X-axis directions, and the measurement area 655 at which the head 620 is located at the end of the X-axis direction and the end of the -X-axis direction. The guide is moved in the Y-axis direction at the moment of complete movement. Then, the head 620 moves through the measurement areas 655 while moving in a zigzag form. In this case, the gap sensor 530 provided in the head 620 measures the distance between the respective measurement areas 655 of the stage 600 and the head 620. At this time, the movement in the Z-axis direction of the head 620 is fixed.

Here, the gap sensor 530 is divided into a light emitting unit 530a and a light receiving unit 530b. The light emitting unit 530a emits laser light, which is the stage 600 (or the substrate 610). ) And a laser beam reflected from the stage 600 (or the substrate 610) is incident to the light receiving unit 530b.

Here, the gap sensor 530 is an imaginary line formed along the laser light emitted from the light receiving unit 530b and incident on the stage 600 (or the substrate 610), and from the substrate 610. Since the interior of the vertices of the imaginary lines formed along the laser light reflected and incident on the light-receiving unit 530b is always kept constant, the stage 600 (or the substrate 610) and the head are operated. The position of the laser light incident on the light receiving unit 530b is changed according to the distance between the 620 and the gap sensor 530 analyzes the displacement of the laser light to the stage 600 (or the substrate 610). Measure the distance between the head 620 and

The value measured from the gap sensor 530 is displayed on the display unit provided on the front of the controller. That is, in the display unit, as shown in FIG. 7, the measured value in each measurement area 655 is numerically displayed, and as shown in FIG. 8, the measurement for each measurement area 655 is performed. The values are represented in a three-dimensional graph. Therefore, the operator can know the flatness of the stage 600 by checking the display unit.

That is, the smaller the measured value of the measuring area 655 is, the closer the distance between the measuring area 655 and the head 620 is, and the larger the measured value, the larger the measured area 655 and the head 620 are. The distance between them is far. This means that the smaller the measurement value, the more protruding of each measurement area 655 toward the head 620. The larger the measurement value, the larger the measurement value 655 is directed toward the head 620 direction. Means less protruded.

As described above, in the present invention, since the distance between the stage 600 and the head 620 is measured by using the gap sensor 530, the scratch of the stage 600 by a conventional micro gauge can be prevented.

In addition, since the resolution of the gap sensor 530 is much better than that of the micro gauge, when the flatness of the stage 600 is measured using the gap sensor 530 as in the present invention, The flatness of the value can be obtained.

Subsequently, the operator may scrape the surface of the stage 600 based on the calculated flatness to maintain the overall flatness of the stage 600 uniformly.

Next, as shown in FIG. 6D, a nozzle 640 is installed in the head 620, and the substrate 610 is seated on the stage 600. The head 620 and the guide are moved to position the nozzle 640 to face the substrate 610.

Thereafter, as shown in FIG. 6E, the head 620 and the guide are moved to apply the sealing material 690 discharged from the nozzle 640 onto the substrate 610.

In this case, the gap sensor 530 provided in the head 620 measures the distance between the substrate 610 and the head 620. That is, the gap sensor 530 measures the distance between all the surfaces of the substrate 610 through which the head 620 passes and the head 620, and transmits the measured value to the controller. Then, the controller moves the head 620 in the Z-axis and -Z-axis directions based on the measured value.

Specifically, the control unit pre-stores the reference measurement value for the proper distance between the head 620 and the substrate 610, the control unit is to measure the measurement value and the reference measurement value transmitted from the gap sensor 530 In comparison, when the measured value is larger than the reference measured value (that is, when the distance between the head 620 and the substrate 610 is larger than an appropriate distance), the head 620 is moved in the -Z axis direction. By lowering, the head 620 and the substrate 610 are maintained at an appropriate distance. On the other hand, when the measured value is smaller than the reference measured value (that is, when the distance between the head 620 and the substrate 610 is smaller than the proper distance), the head 620 is elevated in the Z-axis direction The head 620 and the substrate 610 are maintained at an appropriate distance.

Therefore, the distance between the nozzle 640 attached to the head 620 and the substrate 610 is always kept constant.

As described above, in the present invention, since the gap sensor 530 is used to measure the flatness of the stage 600, the scratch of the substrate 610 can be prevented. In addition, since the process of attaching and detaching the micro gauge as in the prior art is not necessary, the working time can be shortened.

The present invention described above is not limited to the above-described embodiment and the accompanying drawings, and it is common in the art that various substitutions, modifications, and changes can be made without departing from the technical spirit of the present invention. It will be evident to those who have knowledge of.

The sealing material coating method using the sealing material coating device for a liquid crystal display device according to the embodiment of the present invention as described above has the following effects.

In the present invention, since the flatness of the stage is measured using a non-contact gap sensor instead of the conventional micro gauge, it is possible to prevent occurrence of scratches on the stage.

In addition, since the gap sensor exhibits a higher resolution than the micro gauge, it is possible to obtain a more precise flatness using the gap sensor.

In addition, since the process of detaching and attaching the micro gauge is not necessary, the working time can be shortened.

Claims (2)

A seal material coating apparatus for a liquid crystal display device comprising a stage on which a substrate is seated, a head provided on the stage, a gap sensor provided on the head so as to face the stage, and a guide in which the head is movable. In the used sealing material coating method, A step of setting the measurement range of the stage by inputting the coordinates of the start point and the end point of the stage; Setting a number of measurement areas to be measured within the measurement range by inputting a point number; Moving the head and the guide so that a gap sensor of the head faces one of the measurement areas; In a state in which the movement of the head in the Z-axis and -Z-axis directions is fixed, the head is moved in the X-axis direction, -X-axis direction and Y-axis direction so that the head moves in the zigzag form and passes through the measurement areas. D step; Measuring the flatness of the stage by allowing the gap sensor provided in the head to measure the distance between the respective measuring regions and the head when the head passes through the measuring regions; Based on the measured flatness of the stage, cutting the surface of the stage to maintain the overall flatness of the stage uniformly; A step G for mounting a substrate on the stage; H step of installing a sealing material nozzle on the head: And, Moving the head and the guide to apply the sealing material discharged from the sealing material nozzle onto the substrate; In the step A, the measuring range is set larger than the area of the substrate; Step I, I-1 step of measuring the distance between the substrate and the head using the gap sensor; And, By moving the head in the Z-axis or -Z-axis direction based on the measured distance to maintain a predetermined predetermined distance between the substrate and the head, the distance between the sealing material nozzle attached to the head and the substrate is kept constant Sealing material coating method using a sealing material coating device for a liquid crystal display device characterized in that it comprises a step I-2. delete

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