KR101040444B1 - 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 - Google Patents
서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 Download PDFInfo
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- KR101040444B1 KR101040444B1 KR1020080087433A KR20080087433A KR101040444B1 KR 101040444 B1 KR101040444 B1 KR 101040444B1 KR 1020080087433 A KR1020080087433 A KR 1020080087433A KR 20080087433 A KR20080087433 A KR 20080087433A KR 101040444 B1 KR101040444 B1 KR 101040444B1
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- particles
- size distribution
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- 239000002245 particle Substances 0.000 title claims abstract description 196
- 238000009826 distribution Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000009792 diffusion process Methods 0.000 title claims description 19
- 239000000443 aerosol Substances 0.000 claims abstract description 32
- 238000005259 measurement Methods 0.000 claims abstract description 27
- 238000004422 calculation algorithm Methods 0.000 claims abstract description 10
- 150000002500 ions Chemical class 0.000 claims description 26
- 238000002474 experimental method Methods 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000005494 condensation Effects 0.000 description 7
- 238000009833 condensation Methods 0.000 description 7
- 230000014509 gene expression Effects 0.000 description 5
- 239000013618 particulate matter Substances 0.000 description 5
- 238000009795 derivation Methods 0.000 description 4
- 239000011882 ultra-fine particle Substances 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000006467 substitution reaction Methods 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010419 fine particle Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 239000000809 air pollutant Substances 0.000 description 1
- 231100001243 air pollutant Toxicity 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011981 development test Methods 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 210000002345 respiratory system Anatomy 0.000 description 1
- 208000023504 respiratory system disease Diseases 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0266—Investigating particle size or size distribution with electrical classification
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0038—Investigating nanoparticles
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- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080087433A KR101040444B1 (ko) | 2008-09-04 | 2008-09-04 | 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 |
PCT/KR2009/004975 WO2010027196A2 (fr) | 2008-09-04 | 2009-09-03 | Chargeur par diffusion multicanaux servant à mesurer en temps réel la granulométrie de particules submicroniques, et procédé pour mesurer en temps réel la granulométrie de particules submicroniques au moyen dudit chargeur |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080087433A KR101040444B1 (ko) | 2008-09-04 | 2008-09-04 | 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100028409A KR20100028409A (ko) | 2010-03-12 |
KR101040444B1 true KR101040444B1 (ko) | 2011-06-09 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080087433A KR101040444B1 (ko) | 2008-09-04 | 2008-09-04 | 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101040444B1 (fr) |
WO (1) | WO2010027196A2 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101156104B1 (ko) | 2011-12-28 | 2012-06-20 | 서울대학교산학협력단 | Cseof를 이용한 입자 생성 및 성장 현상 판독 방법 |
KR101551289B1 (ko) * | 2014-05-22 | 2015-09-09 | 한국과학기술연구원 | 미세 입자 측정 장치 및 이를 이용한 미세 입자 측정 방법 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101146302B1 (ko) * | 2010-06-28 | 2012-05-21 | 한국표준과학연구원 | 미세입자 크기분포 실시간 측정장치 |
KR101328522B1 (ko) * | 2012-08-06 | 2013-11-20 | 김제원 | 입자 측정방법 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100567789B1 (ko) * | 2006-02-20 | 2006-04-05 | 주식회사 현대교정인증기술원 | 입자측정기 및 입자측정방법 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004028741A (ja) * | 2002-06-25 | 2004-01-29 | Matsushita Electric Ind Co Ltd | パーティクルカウンタ装置およびパーティクル計数方法 |
JP4442506B2 (ja) * | 2005-04-27 | 2010-03-31 | 株式会社島津製作所 | ナノ粒子分級捕集装置 |
-
2008
- 2008-09-04 KR KR1020080087433A patent/KR101040444B1/ko active IP Right Grant
-
2009
- 2009-09-03 WO PCT/KR2009/004975 patent/WO2010027196A2/fr active Application Filing
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100567789B1 (ko) * | 2006-02-20 | 2006-04-05 | 주식회사 현대교정인증기술원 | 입자측정기 및 입자측정방법 |
Non-Patent Citations (1)
Title |
---|
Particle and Aerosol Research, Vol.3[1], 2007, 김성배 외, 복합 하전기 시스템을 이용한 서브마이크론 입자의 실시간 크기 분포 측정용 데이터 환산 기법 연구, pp. 21-27* |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101156104B1 (ko) | 2011-12-28 | 2012-06-20 | 서울대학교산학협력단 | Cseof를 이용한 입자 생성 및 성장 현상 판독 방법 |
KR101551289B1 (ko) * | 2014-05-22 | 2015-09-09 | 한국과학기술연구원 | 미세 입자 측정 장치 및 이를 이용한 미세 입자 측정 방법 |
Also Published As
Publication number | Publication date |
---|---|
WO2010027196A3 (fr) | 2010-06-17 |
WO2010027196A2 (fr) | 2010-03-11 |
KR20100028409A (ko) | 2010-03-12 |
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