KR101040444B1 - 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 - Google Patents

서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 Download PDF

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KR101040444B1
KR101040444B1 KR1020080087433A KR20080087433A KR101040444B1 KR 101040444 B1 KR101040444 B1 KR 101040444B1 KR 1020080087433 A KR1020080087433 A KR 1020080087433A KR 20080087433 A KR20080087433 A KR 20080087433A KR 101040444 B1 KR101040444 B1 KR 101040444B1
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South Korea
Prior art keywords
particles
size distribution
real
channel
channels
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KR1020080087433A
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English (en)
Korean (ko)
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KR20100028409A (ko
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황정호
박규태
박동호
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연세대학교 산학협력단
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Priority to KR1020080087433A priority Critical patent/KR101040444B1/ko
Priority to PCT/KR2009/004975 priority patent/WO2010027196A2/fr
Publication of KR20100028409A publication Critical patent/KR20100028409A/ko
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Publication of KR101040444B1 publication Critical patent/KR101040444B1/ko

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0266Investigating particle size or size distribution with electrical classification
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038Investigating nanoparticles

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  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
KR1020080087433A 2008-09-04 2008-09-04 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법 KR101040444B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020080087433A KR101040444B1 (ko) 2008-09-04 2008-09-04 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법
PCT/KR2009/004975 WO2010027196A2 (fr) 2008-09-04 2009-09-03 Chargeur par diffusion multicanaux servant à mesurer en temps réel la granulométrie de particules submicroniques, et procédé pour mesurer en temps réel la granulométrie de particules submicroniques au moyen dudit chargeur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020080087433A KR101040444B1 (ko) 2008-09-04 2008-09-04 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법

Publications (2)

Publication Number Publication Date
KR20100028409A KR20100028409A (ko) 2010-03-12
KR101040444B1 true KR101040444B1 (ko) 2011-06-09

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KR1020080087433A KR101040444B1 (ko) 2008-09-04 2008-09-04 서브마이크론 입자의 실시간 크기분포 측정을 위한다중채널형 확산하전기 및 이를 이용한 서브마이크론입자의 실시간 크기분포 측정방법

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KR (1) KR101040444B1 (fr)
WO (1) WO2010027196A2 (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101156104B1 (ko) 2011-12-28 2012-06-20 서울대학교산학협력단 Cseof를 이용한 입자 생성 및 성장 현상 판독 방법
KR101551289B1 (ko) * 2014-05-22 2015-09-09 한국과학기술연구원 미세 입자 측정 장치 및 이를 이용한 미세 입자 측정 방법

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101146302B1 (ko) * 2010-06-28 2012-05-21 한국표준과학연구원 미세입자 크기분포 실시간 측정장치
KR101328522B1 (ko) * 2012-08-06 2013-11-20 김제원 입자 측정방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100567789B1 (ko) * 2006-02-20 2006-04-05 주식회사 현대교정인증기술원 입자측정기 및 입자측정방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004028741A (ja) * 2002-06-25 2004-01-29 Matsushita Electric Ind Co Ltd パーティクルカウンタ装置およびパーティクル計数方法
JP4442506B2 (ja) * 2005-04-27 2010-03-31 株式会社島津製作所 ナノ粒子分級捕集装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100567789B1 (ko) * 2006-02-20 2006-04-05 주식회사 현대교정인증기술원 입자측정기 및 입자측정방법

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Particle and Aerosol Research, Vol.3[1], 2007, 김성배 외, 복합 하전기 시스템을 이용한 서브마이크론 입자의 실시간 크기 분포 측정용 데이터 환산 기법 연구, pp. 21-27*

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101156104B1 (ko) 2011-12-28 2012-06-20 서울대학교산학협력단 Cseof를 이용한 입자 생성 및 성장 현상 판독 방법
KR101551289B1 (ko) * 2014-05-22 2015-09-09 한국과학기술연구원 미세 입자 측정 장치 및 이를 이용한 미세 입자 측정 방법

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Publication number Publication date
WO2010027196A3 (fr) 2010-06-17
WO2010027196A2 (fr) 2010-03-11
KR20100028409A (ko) 2010-03-12

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