KR101022906B1 - 전력반도체 모듈 및 그 제조방법 - Google Patents
전력반도체 모듈 및 그 제조방법 Download PDFInfo
- Publication number
- KR101022906B1 KR101022906B1 KR1020090066060A KR20090066060A KR101022906B1 KR 101022906 B1 KR101022906 B1 KR 101022906B1 KR 1020090066060 A KR1020090066060 A KR 1020090066060A KR 20090066060 A KR20090066060 A KR 20090066060A KR 101022906 B1 KR101022906 B1 KR 101022906B1
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- Prior art keywords
- metal plate
- hole
- cooling member
- layer
- semiconductor module
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 59
- 238000004519 manufacturing process Methods 0.000 title claims description 20
- 239000010410 layer Substances 0.000 claims abstract description 133
- 229910052751 metal Inorganic materials 0.000 claims abstract description 101
- 239000002184 metal Substances 0.000 claims abstract description 101
- 238000001816 cooling Methods 0.000 claims abstract description 75
- 238000002048 anodisation reaction Methods 0.000 claims abstract description 67
- 239000011347 resin Substances 0.000 claims abstract description 26
- 229920005989 resin Polymers 0.000 claims abstract description 26
- 238000005538 encapsulation Methods 0.000 claims abstract description 20
- 239000000463 material Substances 0.000 claims abstract description 10
- 239000011229 interlayer Substances 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 31
- 229910052782 aluminium Inorganic materials 0.000 claims description 20
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 19
- 239000008393 encapsulating agent Substances 0.000 claims description 16
- 239000003507 refrigerant Substances 0.000 claims description 14
- 239000012790 adhesive layer Substances 0.000 claims description 12
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 11
- 229910000838 Al alloy Inorganic materials 0.000 claims description 10
- 238000007789 sealing Methods 0.000 claims description 6
- 239000010407 anodic oxide Substances 0.000 claims 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 17
- 230000017525 heat dissipation Effects 0.000 description 13
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000008151 electrolyte solution Substances 0.000 description 4
- 238000012546 transfer Methods 0.000 description 3
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000004327 boric acid Substances 0.000 description 2
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007772 electroless plating Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000007743 anodising Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
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- H—ELECTRICITY
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- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
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- H01L25/071—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next and on each other, i.e. mixed assemblies
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- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
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- H01L2224/4813—Connecting within a semiconductor or solid-state body, i.e. fly wire, bridge wire
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- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/732—Location after the connecting process
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Abstract
Description
Claims (20)
- 제1 관통홀을 구비하고, 상기 제1 관통홀 내부을 포함하여 그 표면에 양극산화층이 형성된 금속플레이트;양면에 상기 금속플레이트가 부착되며, 상기 제1 관통홀에 대응하는 위치에 제2 관통홀을 구비한 쿨링부재;상기 양극산화층에 형성되며, 상기 제1 관통홀 및 상기 제2 관통홀 내부에 형성된 비아를 통해 층간 연결된 회로층;상기 회로층에 연결된 전력소자;상기 회로층과 상기 전력소자를 감싸는 수지봉지재; 및상기 수지봉지재의 봉입공간을 형성도록 상기 금속플레이트에 설치되는 하우징;을 포함하는 전력반도체 모듈.
- 청구항 1에 있어서,상기 금속플레이트는 알루미늄 또는 알루미늄 합금으로 이루어지고, 상기 양극산화층은 알루미늄 양극산화층(Al2O3)인 것을 특징으로 하는 전력반도체 모듈.
- 청구항 1에 있어서,상기 쿨링부재의 양면과 상기 양극산화층이 형성된 상기 금속플레이트 사이에 형성된 열전도접착층을 더 포함하는 것을 특징으로 하는 전력반도체 모듈.
- 청구항 1에 있어서,상기 쿨링부재는 내부에 냉매가 흐르는 히트 파이프인 것을 특징으로 하는 전력반도체 모듈.
- 청구항 1에 있어서,상기 금속플레이트는 상기 쿨링부재를 기준으로 대칭되도록 부착된 것을 특징으로 하는 전력반도체 모듈.
- 쿨링부재의 양면에 금속플레이트가 부착된 결합체;상기 결합체를 관통하도록 형성된 관통홀 내부을 포함하여 상기 결합체의 표면에 형성된 양극산화층;상기 양극산화층에 형성되며, 상기 관통홀 내부에 형성된 비아를 통해 층간 연결된 회로층;상기 회로층에 연결된 전력소자;상기 회로층과 상기 전력소자를 감싸는 수지봉지재; 및상기 수지봉지재의 봉입공간을 형성도록 상기 금속플레이트에 설치되는 하우징;을 포함하는 전력반도체 모듈.
- 제 6항에 있어서,상기 금속플레이트는 알루미늄 또는 알루미늄 합금으로 이루어지고, 상기 양극산화층은 알루미늄 양극산화층(Al2O3)인 것을 특징으로 하는 전력반도체 모듈.
- 제 6항에 있어서,상기 쿨링부재의 양면과 상기 금속플레이트 사이에 형성된 열전도접착층을 더 포함하는 것을 특징으로 하는 전력반도체 모듈.
- 제 6항에 있어서,상기 쿨링부재는 내부에 냉매가 흐르는 히트 파이프인 것을 특징으로 하는 전력반도체 모듈.
- 제 6항에 있어서,상기 금속플레이트는 상기 쿨링부재를 기준으로 대칭되도록 부착된 것을 특징으로 하는 전력반도체 모듈.
- (A) 금속플레이트에 제1 관통홀을 형성하고 상기 제1 관통홀 내부을 포함하여, 그 표면에 양극산화층을 형성하는 단계;(B) 상기 제1 관통홀에 대응하는 위치에 제2 관통홀을 구비한 쿨링부재의 양면에 상기 양극산화층이 형성된 상기 금속플레이트를 부착하는 단계;(C) 상기 제1 관통홀 및 상기 제2 관통홀 내부에 형성되는 비아를 포함하여 상기 양극산화층에 회로층을 형성하는 단계;(D) 상기 회로층에 전력소자를 연결하고 상기 금속플레이트에 상기 전력소자를 감싸는 하우징을 형성하는 단계; 및(E) 상기 하우징 내의 봉입공간에 수지봉지재를 주입하는 단계;를 포함하는 전력반도체 모듈의 제조방법.
- 청구항 11에 있어서,상기 (A) 단계에서,상기 금속플레이트는 알루미늄 또는 알루미늄 합금으로 이루어지고, 상기 양극산화층은 알루미늄 양극산화층(Al2O3)인 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 11에 있어서,상기 (B) 단계에서,상기 쿨링부재의 양면과 상기 양극산화층이 형성된 상기 금속플레이트 사이에 열전도접착층을 형성하는 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 11에 있어서,상기 (B) 단계에서,상기 쿨링부재는 내부에 냉매가 흐르는 히트 파이프인 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 11에 있어서,상기 (B) 단계는,상기 쿨링부재를 기준으로 상기 금속플레이트를 대칭되도록 부착하는 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- (A) 쿨링부재 양면에 금속플레이트를 부착한 후 관통홀을 형성하며, 상기 관통홀 내부을 포함하여 그 표면에 양극산화층을 형성하는 단계;(B) 상기 관통홀 내부에 형성되는 비아를 포함하여 상기 양극산화층에 회로층을 형성하는 단계;(C) 상기 회로층에 전력소자를 연결하고 상기 금속플레이트에 상기 전력소자를 감싸는 하우징을 형성하는 단계; 및(D) 상기 하우징 내의 봉입공간에 수지봉지재를 주입하는 단계;를 포함하는 전력반도체 모듈의 제조방법.
- 청구항 16에 있어서,상기 (A) 단계에서,상기 금속플레이트는 알루미늄 또는 알루미늄 합금으로 이루어지고, 상기 양 극산화층은 알루미늄 양극산화층(Al2O3)인 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 16에 있어서,상기 (A) 단계에서,상기 쿨링부재의 양면과 상기 금속플레이트 사이에 열전도접착층을 형성하는 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 16에 있어서,상기 (A) 단계에서,상기 쿨링부재는 내부에 냉매가 흐르는 히트 파이프인 것을 특징으로 하는 전력반도체 모듈의 제조방법.
- 청구항 16에 있어서,상기 (B) 단계는,상기 쿨링부재를 기준으로 상기 금속플레이트를 대칭되도록 부착하는 것을 특징으로 하는 전력반도체 모듈의 제조방법.
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KR1020090066060A KR101022906B1 (ko) | 2009-07-20 | 2009-07-20 | 전력반도체 모듈 및 그 제조방법 |
US12/551,238 US8058722B2 (en) | 2009-07-20 | 2009-08-31 | Power semiconductor module and method of manufacturing the same |
CN200910176194XA CN101958307B (zh) | 2009-07-20 | 2009-09-25 | 功率半导体模块及其制造方法 |
US13/246,615 US8309399B2 (en) | 2009-07-20 | 2011-09-27 | Power semiconductor module and method of manufacturing the same |
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KR101343233B1 (ko) | 2011-11-28 | 2013-12-18 | 삼성전기주식회사 | 전력 모듈 패키지 |
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US8804339B2 (en) * | 2011-02-28 | 2014-08-12 | Toyota Motor Engineering & Manufacturing North America, Inc. | Power electronics assemblies, insulated metal substrate assemblies, and vehicles incorporating the same |
KR101255935B1 (ko) | 2011-07-08 | 2013-04-23 | 삼성전기주식회사 | 전력 모듈 패키지 및 그 제조방법 |
KR101255944B1 (ko) * | 2011-07-20 | 2013-04-23 | 삼성전기주식회사 | 전력 모듈 패키지용 기판 및 그 제조방법 |
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JP5928974B2 (ja) * | 2011-10-19 | 2016-06-01 | 住友電気工業株式会社 | リアクトル、コンバータ、及び電力変換装置 |
EP2892074B1 (en) * | 2012-08-31 | 2018-01-03 | Mitsubishi Materials Corporation | Power module substrate and power module |
CN104185365B (zh) | 2013-05-23 | 2018-06-26 | 比亚迪股份有限公司 | 一种线路板及其制备方法 |
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JPH08125109A (ja) * | 1994-10-24 | 1996-05-17 | Sanyo Electric Co Ltd | 混成集積回路装置 |
KR20030028980A (ko) * | 2001-10-05 | 2003-04-11 | 삼성전자주식회사 | 반도체 패키지 |
WO2006064666A1 (ja) | 2004-12-13 | 2006-06-22 | Daikin Industries, Ltd. | パワーモジュールとその製造方法および空気調和機 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101321282B1 (ko) | 2011-06-17 | 2013-10-28 | 삼성전기주식회사 | 전력 모듈 패키지 및 이를 구비한 시스템 모듈 |
US8941220B2 (en) | 2011-06-17 | 2015-01-27 | Samsung Electro-Mechanics Co., Ltd. | Power module package and system module having the same |
KR101343233B1 (ko) | 2011-11-28 | 2013-12-18 | 삼성전기주식회사 | 전력 모듈 패키지 |
Also Published As
Publication number | Publication date |
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US8309399B2 (en) | 2012-11-13 |
US8058722B2 (en) | 2011-11-15 |
KR20110008634A (ko) | 2011-01-27 |
US20110012252A1 (en) | 2011-01-20 |
CN101958307A (zh) | 2011-01-26 |
US20120015484A1 (en) | 2012-01-19 |
CN101958307B (zh) | 2013-01-02 |
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