KR101017164B1 - Image display device - Google Patents

Abstract

The present invention provides an image display device having a circuit for eliminating the baking phenomenon without increasing its scale. An image display device comprising a display portion constituted by a plurality of display elements, a signal line for inputting a display signal voltage to the display portion, and a display control portion for controlling the display signal voltage, comprising: a detection power supply and a current of the detection power supply; A switching switch flowing through the display element, a detection circuit for detecting a current flowing through the display element, and a detection information storage circuit for storing information detected by the detection circuit and correcting the display signal voltage based on the information. And detecting the current by setting the first current measurement range by the first reference voltage, and then feeding back the detected amount of current, thereby detecting the second current by a second reference voltage different from the first reference voltage. The current detection range is set by setting the current measurement range.

7 to 3 decoder, reference voltage control means, upper reference voltage generating means, lower reference voltage generating means, detection timing control means

Description

Image display device {IMAGE DISPLAY DEVICE}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image display device, and relates to an image display device that constitutes a display area by, for example, an EL (Electro Luminescence) element or an organic EL element or other self-luminous type display element (pixel).

This type of image display apparatus has a property that the light emission luminance of the display element (self-emitting element) is proportional to the amount of current flowing through the element, and gray scale display is made possible by controlling the amount of current flowing through the element.

However, for example, an organic EL element has the property that a luminance difference arises in the pixel which is displayed continuously and the pixel which is not displayed by the deterioration of the element characteristic.

Then, the luminance difference between these display elements is recognized by the human eye as a "swept phenomenon", which is a factor of reducing the lifespan as an image display device.

Therefore, for example, as described in Patent Document 1 (Patent Publication No. 2004-38209) below, a means for measuring the amount of current flowing through each display element and correcting the thermal content in accordance with the measured amount of current is provided. In this way, a technique for solving the above-described "baking phenomenon" is disclosed.

Here, the image display device disclosed in Patent Document 1 includes, for example, a current measuring device comprising an A / D converter in order to measure the amount of current flowing through each display element.

However, in the current meter, the measuring range is required to be quite wide. The reason is that the current fluctuation due to deterioration of each display element is large, and the current fluctuation due to temperature or manufacturing fluctuation can be sufficiently coped with.

In this case, it is concerned that the circuit scale of the current meter is increased. Therefore, while it is required to avoid an increase in the circuit scale of the current measuring device, Patent Document 1 does not describe this point in consideration of this.

An object of the present invention is to provide an image display device having a circuit for eliminating the baking phenomenon without increasing its scale.

The image display device of the present invention is caused by deterioration of the display element by feeding back the current amount of the reference voltage of the detection means (current meter) for measuring the amount of current flowing through the display element in order to detect a relatively large current variation due to temperature. A small current change was switched to a reference voltage capable of detecting the current, and the current measurement range of the detection means was made to follow the temperature variation. Thereby, the same detection means made it possible to detect both the fluctuation of the amount of current due to the large temperature fluctuation and the fluctuation of the amount of current due to the element deterioration with a small fluctuation.

The structure of this invention can be made as follows, for example.

(1) An image display device according to the present invention includes, for example, a display portion constituted by a plurality of display elements, a signal line for inputting a display signal voltage to the display portion, and a display control portion for controlling the display signal voltage. As an image display device,

A detection power supply, a switching switch for flowing a current of the detection power supply to the display element, a detection circuit for detecting a current flowing through the display element, and information detected by the detection circuit, and storing A detection information storage circuit for correcting the display signal voltage,

The detection circuit measures a second current by a second reference voltage different from the first reference voltage by setting a first current measurement range based on a first reference voltage to perform current detection, and then feeding back the detected current amount. It is characterized by setting a range and performing a current detection.

(2) The image display device according to the present invention assumes, for example, the configuration of (1), and the switching switch is in a period other than a period in which the display signal voltage is output in one display period. The detection power supply and the display element are connected.

(3) The image display device according to the present invention is assuming, for example, the configuration of (1) that the power source for detection is a constant current source.

(4) The image display device according to the present invention assumes, for example, the configuration of (1), that the detection circuit determines the level of the degradation element, and the detection information storage circuit is one screen degradation element. It is characterized by storing the state of.

(5) The image display device according to the present invention is assuming, for example, the configuration of (1) that the display control circuit corrects display data input to the deterioration element.

(6) The image display device according to the present invention time-divisions each signal that is responsible for red, green, and blue in the display unit in the supply of the display signal voltage, assuming, for example, the configuration of (1). It is characterized by installing a switching switch for supplying.

(7) The image display device according to the present invention is assuming, for example, the configuration of (1) that the width of the first current measurement range and the width of the second current measurement range are the same.

(8) The image display device according to the present invention is assuming, for example, the configuration of (1) that the width of the first current measurement range and the width of the second current measurement range are different from each other.

(9) An image display device according to the present invention includes, for example, a display portion constituted by a plurality of display elements, a data signal line for inputting a display signal voltage to the display portion, and a display control portion for controlling the display signal voltage. As an image display device to

A detection power supply, a switching switch for passing the current of the detection power supply through the detection signal line to the display element, a detection circuit for detecting the current flowing through the display element, and information detected by the detection circuit; A detection information storage circuit for correcting the display signal voltage based on the information, wherein the data signal line and the detection signal line are composed of a common signal line switched by a switching circuit,

The detection circuit measures a second current by a second reference voltage different from the first reference voltage by setting a first current measurement range based on a first reference voltage to perform current detection, and then feeding back the detected current amount. It is characterized by setting a range and performing a current detection.

(10) The image display device according to the present invention assumes, for example, the configuration of (9), and the changeover switch is in a period separate from the period in which the display signal voltage is output in one display period. The detection power supply and the display element are connected.

(11) The image display device according to the present invention is based on the configuration of (9), for example, and the detection power source is a constant current source.

(12) The image display device according to the present invention assumes, for example, the configuration of (9), that the detection circuit determines the level of the deterioration element, and the detection information storage circuit is one screen deterioration element. It is characterized by storing the state of.

(13) The image display device according to the present invention is based on, for example, the configuration of (9), and the display control circuit is characterized in that it corrects display data input to the deterioration element.

(14) The image display device according to the present invention assumes each signal in charge of red, green, and blue in the display unit in the supply of the display signal voltage, assuming, for example, the configuration of (9). It is characterized by installing a switching switch for time-division supply.

(15) The image display device according to the present invention is assuming, for example, the configuration of (9) that the width of the first current measurement range and the width of the second current measurement range are the same.

(16) The image display device according to the present invention is assuming, for example, the configuration of (9) that the width of the first current measurement range and the width of the second current measurement range are different from each other.

In addition, this invention is not limited to the above structure, A various change is possible in the range which does not deviate from the technical idea of this invention. In addition, the example of the structure of this invention other than the above-mentioned structure becomes clear from description or drawing of the whole this specification.

According to the image display device according to the present invention, a circuit for eliminating the baking phenomenon can be provided without increasing the scale.

Other effects of the present invention will become apparent from the description of the entire specification.

The above and other objects, features, and advantages of the present invention will become more apparent from the following detailed description of preferred embodiments with reference to the accompanying drawings.

An embodiment of the present invention will be described with reference to the drawings. In addition, in each figure and each Example, the same code | symbol is attached | subjected to the same or similar component, and description is abbreviate | omitted.

Herein, reference numeral 6 denotes a display and detection controller, 11 data line driving means, 13 voltage generation means for light emission, 15 scanning line driving means, 17 self-light emitting element display, 18 element characteristic detection scanning means, 21: Baking detection and position determining means, 24: baking information storing means, 26: baking pixel data correction means, 28: driving timing generating means, 37: baking correction amount calculating means, 44: first R selection switch, 45: first G selection Switch, 46: first B selection switch, 47: second R selection switch, 62: data write switch, 63: write capacitance, 64: drive transistor, 65: organic EL, 73: power supply for detection, 74: first detection Line switch, 75: second detection line switch, 76: third detection line switch, 77: fourth detection line switch, 79: shift register, 84: A / D conversion means, 85: sweeping pixel position information generating means, 94 : Organic EL current vs voltage characteristic, 97: deterioration element organic EL current vs voltage characteristic, 101: high temperature organic EL current versus voltage characteristics, 103: high temperature degradation element organic EL current vs voltage characteristics, 108: first comparator, 109: second comparator, 110: third comparator, 111: fourth comparator, 112: fifth Comparator, 113: sixth comparator, 114: seventh comparator, 137: 7 to 3 decoder, 141: reference voltage control means, 143: upper reference voltage generating means, 145: lower reference voltage generating means, 147: detection timing control means 151: upper reference voltage switching means, 152: lower reference voltage switching means, 156: display / detection switching control section, 158: data line driving and firing position discrimination means, 160: data line and detection line common self-emitting device display, 161 : 1 horizontal latch and analog conversion means, 167: first data line detection switching switch, 168: second data line detection switching switch, 169: third data line detection switching switch, 170: fourth data line detection switching switch, 175: RGB switching control means.

<1st embodiment>

EMBODIMENT OF THE INVENTION Hereinafter, 1st Embodiment of this invention is described in detail using drawing.

1 shows an image display device according to an embodiment of the present invention, and shows an example of a self-luminous element display device.

In Fig. 1, reference numeral 1 denotes a horizontal synchronizing signal, 2 denotes a vertical synchronizing signal, 3 denotes a data enable, 4 denotes display data, and 5 denotes a synchronous clock. The vertical synchronization signal 1 is a signal of one display period (one frame period), the horizontal synchronization signal 2 is a signal of one horizontal period, and the data enable signal 3 is a period in which the display data 4 is valid (display Valid period). All these signals are input in synchronization with the synchronous clock 5. In the present embodiment, these display data are sequentially transmitted in a raster scan format from pixels on the upper left side, for example, information for one pixel is composed of 6 bits of digital data. Reference numeral 6 denotes a display and detection control unit, 7 a data line control signal, 8 a scan line control signal, 9 a detection scan line control signal, and 10 a detection line control signal. The display and detection control section 6 uses the vertical synchronizing signal 1, the horizontal synchronizing signal 2, the data enable signal 3, the display data 4, and the synchronizing clock 5 to control the data lines for display control. The control signal 7 and the scan line control signal 8 and the detection scan line control signal 9 and the detection line control signal 10 for detecting the characteristics of the display element described later are generated. Reference numeral 11 is a data line driving means, and 12 is a data line driving signal. The data line driving means 11 generates a signal voltage and a triangular wave signal (to be described later) to be written to the pixel (described later) constituted by the self-luminous element in accordance with the data line control signal 7 as the data line driving signal 12. Output Reference numeral 13 is a light emitting voltage generating means, and 14 is a light emitting voltage. The light emitting voltage generating means 13 generates a power supply voltage for supplying a current for emitting the light emitting element (described later), and outputs it as the light emitting voltage 14. Reference numeral 15 is a scanning line driving means, and 16 is a scanning line selection signal. Reference numeral 17 is a self-luminous element display. The self-luminous element display 17 refers to a display using a light emitting diode, an organic EL or the like as a display element. The self light emitting element display 17 has a plurality of self light emitting elements (pixel portions) arranged in a matrix. The display operation on the self-luminous element display 17 is a data line driving output from the data line driving means 11 to a pixel selected and write controlled by the scanning line driving signal 16 output from the scanning line driving means 15. It operates by writing data to the pixel and the triangle wave signal according to the signal voltage of the signal 12. The voltage for driving the self-luminous element is supplied as the light emission voltage 14. In addition, the data line driving means 11 and the scanning line driving means 15 may be realized in each LSI, may be realized in one LSI, or may be formed on the same glass substrate as the pixel portion. The self-luminous element display 17 has a resolution of 240 x 320 dots, for example, and one dot is comprised from three pixels of R (red), G (green), and B (blue) from the left side. That is, the horizontal direction of the display 17 is composed of 720 pixels. The self-luminescent element display 17 can adjust the brightness which the self-luminescent element emits by the amount of current flowing through the self-luminescent element and the lighting time of the self-luminescent element. The greater the amount of current flowing through the self-light emitting device, the higher the brightness of the self-light emitting device. The longer the lighting time of the self-light emitting device is, the higher the brightness of the self-light emitting device is. Reference numeral 18 is an element characteristic detection scanning means, and 19 is a detection scan line selection signal. The element characteristic detection operating means 18 generates a detection scan line selection signal 19 for selecting a scan line for detecting the deterioration state of the self-luminescence element of the self-luminescence element display 17. Reference numeral 20 is a detection line output signal, 21 is burn detection and position discriminating means, 22 is burn detection result, and 23 is position information. The detection line output signal 20 is a result of detecting the state of deterioration of the self-light emitting element on one horizontal line selected by the detection scan line selection signal 19 of the self-luminescent element display 17, and the detection detection and position discriminating means ( 21 outputs the bake detection result 22 and the positional information 23 on the self-luminous display 17 corresponding to the result. Reference numeral 24 denotes a baking information storage means, and 25 is baking correction pixel information. The baking information storage means 24 once stores the baking detection result 22 in accordance with the positional information 23 and outputs it as baking correction pixel information 25. The bake detection result 22 indicates the level of deterioration, and the position information 23 is output as address information indicating the position on the screen. The baking information storing means 24 stores the level of degradation at the address according to the positional information 23, so that the baking correction pixel information 25 is outputted with the level of degradation in accordance with the display timing.

FIG. 2 is a diagram illustrating an embodiment of a configuration inside the display and detection control unit 6. In Fig. 2, reference numeral 26 denotes a sequential pixel data correction means, and 27 denotes display correction data. The baking pixel data correction means 26 corrects the display data 4 according to the baking correction amount described later, and outputs it as the display correction data 27. Reference numeral 28 is a drive timing generating means, 29 is a horizontal start signal, 30 is a horizontal shift clock, 31 is a vertical start signal, and 32 is a vertical shift clock. The drive timing generating means 28 selects the horizontal start signal 29 indicating the head of the display horizontal position, the horizontal shift clock 30 which becomes the timing of latching the display data 4 by one pixel, and the head of the display vertical position. The vertical start signal 31 shown and the vertical shift clock 32 for sequentially shifting the scanning line selection are generated. Reference numeral 33 is a vertical detection start signal, 34 is a vertical detection shift clock, 35 is a horizontal detection start signal, and 36 is a horizontal detection shift clock. The drive timing generating means 28 has the vertical detection start signal 33 indicating the head in the vertical direction of the detection operation, the vertical detection shift clock 34 for sequentially shifting the detection scan line, and the horizontal indicating the head of the horizontal position of the detection. A detection start signal 35 and a horizontal detection shift clock 36 for sequentially shifting the horizontal position of the detection are generated. Reference numeral 37 is a bake correction amount calculation means, and 38 is a bake correction amount. The baking correction amount calculating means 37 determines the baking level from the baking correction pixel information 25, calculates a correction amount, and outputs it as the baking correction amount 38.

3 is a diagram showing an embodiment of the configuration of the interior of the self-luminous element display 17. An example in the case of using an organic electroluminescent element as a self-luminous element, for example is shown. In Fig. 3, reference numeral 39 is a first data line output, 40 is a second data line output, 41 is an R selection signal, 42 is a G selection signal, 43 is a B selection signal, 44 is a first R selection switch, and 45 is The first G select switch, 46 is the first B select switch, and 47 is the second R select switch. The first data line output 39 includes a first R selection switch 44 switched by the R selection signal 41, a first G selection switch 45 switched by the G selection signal 42, and a B selection. Is connected to the first B select switch 46, which is switched by signal 43, and then the second, third,... The data line outputs are all connected to the selection switch of RGB. The R selection signal 41, the G selection signal 42, and the B selection signal 43 are signals which are divided into three horizontal periods and turned into an "ON" state. The R, G, and B signals are output by one data line output. The signal voltage is output to three data lines. Reference numeral 48 is a first R data line, 49 is a first G data line, 50 is a first B data line, 51 is a second R data line, 52 is a first scan line, 53 is a second scan line, and 54 is a first line. Row first column R pixel, 55 is first row first column G pixel, 56 is first row first column B pixel, 57 is first row second column R pixel, 58 is second row first column R pixel , 59 is a second row, second column G pixels, 60 is a second row, first column B pixels, and 61 is a second row, second column R pixels. The first R data line 48, the first G data line 49, the first B data line 50, and the second R data line 51 are data lines for inputting respective signal voltages to the pixel. . The first scanning line 52 and the second scanning line 53 are signal lines for inputting the first scanning line selection signal and the second scanning line selection signal (to be described later) to the pixels, respectively. A signal voltage is written to each pixel on the scan line selected by each scan line selection signal via each data line, and the luminance of the pixel is controlled in accordance with the signal voltage. The power supply for light emission at this time becomes the light emission voltage 14. Here, the internal structure of the pixels is shown only in the first row and the first column R pixels 54, but the first row and the first column G pixels 55, the first row and the first column B pixels 56 and the first row are shown. Second row R pixel 57, second row first column R pixel 58, second row first column G pixel 59, second row first column B pixel 60, second row second The same applies to the column R pixels 61. Reference numeral 62 denotes a data write switch, 63 denotes a write capacitor, 64 denotes a driving transistor, and 65 denotes an organic EL element. The data write switch 62 is turned on by the first scan line 52, and stores the signal voltage from the first R data line 48 in the write capacitor 63. The drive transistor 64 supplies the organic EL element 65 with a drive current corresponding to the signal voltage accumulated in the write capacitor 63. Therefore, the light emission luminance of the organic EL element 65 indicates that the light emission luminance is determined by the signal voltage and the light emission voltage 14 to be written in the write capacitor 63. In addition, as described above, the number of pixels of the self-luminous element display 17 has a resolution of 240 × 320, and the scan lines include 320 lines in the horizontal direction from the first line to the 320th line in the vertical direction. The data lines are assumed to be R, G, B, and 240 lines in the vertical direction, respectively, in the horizontal direction from 240 to 240 dots in total, 720 total. Reference numeral 66 denotes a detection switch, 67 denotes a first detection scan line, 68 denotes a second detection scan line, 69 denotes a first detection line, 70 denotes a second detection line, 71 denotes a third detection line, and 72 denotes a fourth detection line. The detection switch 66 is a switch that outputs the characteristics of the organic EL element 65 to the first detection line 69 when the detection switch 66 is selected by the first detection scanning line 67. The second detection scan line 68, the second detection line 70, the third detection line 71, and the fourth detection line 72 are similarly connected to the organic EL element via the detection switch of each pixel. Here too, 720 detection lines are listed, for example.

4 is a diagram showing an embodiment of the configuration of the inside of the burnt detection and position determining means 21. In Fig. 4, reference numeral 73 denotes a detection power supply, 74 denotes a first detection line switch, 75 denotes a second detection line switch, 76 denotes a third detection line switch, 77 denotes a fourth detection line switch, and 78 denotes a detection output line. to be. The first detection line switch 74, the second detection line switch 75, the third detection line switch 76, and the fourth detection line switch 77 are sequentially shifted in the horizontal direction by a shift register described later. The detection power source 73, which is a constant current source, is selected as the first detection line 69, the second detection line 70, the third detection line 71, the fourth detection line 72, and so on. And the characteristics of the organic EL element when sequentially connected to the 720th detection line are output to the detection output line 78. Reference numeral 79 is a shift register, 80 is a first detection line selection signal, 81 is a second detection line selection signal, 82 is a third detection line selection signal, and 83 is a fourth detection line selection signal. In accordance with the horizontal detection start signal 35 and the horizontal detection shift clock 36, the first detection line selection signal 80, the second detection line selection signal 81, The third detection line selection signal 82 and the fourth detection line selection signal 83 are output. Reference numeral 84 is an A / D conversion means. The characteristics of the organic EL element output from the detection output line 78 which is an analog value are digitally converted and output as the baking detection result 22. Reference numeral 85 denotes a sequential pixel position information generating means, which determines the position of the pixel from the horizontal detection start signal 35 and the horizontal detection shift clock 36, and outputs it as position information 23.

5 is a diagram illustrating a display example in the case where baking occurs in the self-luminous display 17. Fig. 5A shows the case where most of the display area is displayed in black. Reference numeral 86 is a display outer frame, 87 is a black display, and 88 is a fixed display pattern. The background of the effective display area in the display outer frame 86 is a black display 87, and the state in which the fixed display pattern 88 is displayed at the same position for a long time is shown. 5B illustrates a case where the entire display area is displayed in white. Reference numeral 89 denotes a white mark, 90 denotes a baking pattern, and 91 denotes the same horizontal line. When the fixed pattern 88 is displayed for a long time, deterioration proceeds as compared with the surrounding black display 87. For this reason, the baking pattern 90 is seen by the pixel which displayed the fixed pattern 88 which deteriorated when the white display 89 was made. Therefore, on the same horizontal line 91 of the display area, pixels without baking and pixels with baking are arranged.

6 is a diagram illustrating detection characteristics of the organic EL element 65. In Fig. 6, reference numeral 92 denotes a current axis, 93 denotes a voltage axis, 94 denotes current versus voltage characteristics of an organic EL element, 95 denotes a constant current condition, and 96 denotes a voltage upon application of a constant current. The current versus voltage characteristic 94 is a curve showing the relationship between the voltage and current applied to the organic EL element 65. Here, since the detection power supply 73 which is a constant current source is connected at the time of characteristic detection, the voltage at the time of constant current application which becomes a value of the voltage at the time of applying the constant current condition 95 on the curve of the current-voltage characteristic 94 is 96 ) Is the characteristic voltage to be detected. Reference numeral 97 denotes a current versus voltage characteristic when the organic EL element deteriorates, and 98 denotes a voltage upon application of current when the organic EL element deteriorates. The current vs voltage characteristic 97 has a slope smaller than the current vs voltage characteristic 94 at the time of deterioration, and when the constant current condition 95 is applied at this time, it becomes the voltage 98 at the time of applying the constant current. It shows that the detection voltage is increased.

FIG. 7 is a diagram showing the voltage when the constant current is applied to the pixels on the same horizontal line 91 shown in FIG. 5. In Fig. 7, reference numeral 99 is a horizontal display position, and 100 is a detection voltage. Since the vertical axis is the voltage axis 93, the detection voltage 100 of the pixels on the same horizontal line 91 is a voltage 96 when applying a constant current in a pixel without baking, and a voltage when applying a constant current in a pixel in which baking occurs. (98) is shown.

FIG. 8 is a diagram showing fluctuations in detection characteristics of the organic EL element 65 at high temperatures. In Fig. 8, reference numeral 101 denotes a current versus voltage characteristic of the organic EL element 65 at a high temperature, and 102 denotes a voltage upon application of a constant current at that time. As described above, the detection power supply 73, which is a constant current source, is connected at the time of characteristic detection, and therefore, when detecting in a high temperature state, the constant current condition 95 on the curve of the current versus voltage characteristic 101 is applied. When the constant current is applied, which is the value of the voltage in the case, the voltage 102 becomes a characteristic voltage to be detected. Reference numeral 103 denotes a current versus voltage characteristic of the organic EL element 65 deteriorated by high temperature, and 104 denotes a voltage at the time of constant current application. As described above, the current vs voltage characteristic 103 has a slope smaller than the current vs voltage characteristic 101 at the time of deterioration, and the voltage at the time of applying the constant current by applying the constant current condition 95 at this time ( 104), indicating that the detection voltage is increased during deterioration. Here, both the voltage 102 at the time of applying the constant current and the voltage 104 at the time of applying the constant current are changed in a direction that becomes smaller than the voltage 96 at the time of applying the constant current at room temperature and the voltage 98 at the time of applying the constant current, Large compared to fluctuations.

FIG. 9 is a diagram showing that the voltage during constant current application of the pixels on the same horizontal line 91 shown in FIG. 7 fluctuates at high temperature. In Fig. 9, reference numeral 105 is a detection voltage at high temperature, and 100 is a detection voltage at normal temperature. It can be seen that the detection voltage 105 at high temperature is smaller than the overall detection voltage 100 at normal temperature.

FIG. 10 is a diagram illustrating an example of reference voltage setting in A / D conversion so that a detection voltage can be obtained at either normal temperature or high temperature. In Fig. 10, reference numeral 106 denotes a room temperature voltage setting range, and 107 denotes a high temperature voltage setting range. In the normal temperature voltage setting range 106, the maximum value is the voltage 98 at the time of constant current application at the time of deterioration of the organic EL element 65, and the minimum value is the voltage 96 at the time of constant current application. In this example, the detection level of the bake is detected at seven levels, that is, the analog value from the maximum value to the minimum value of the reference voltage in A / D conversion with seven levels of resolution, converted into three bits of digital data, and output.

At this time, since the detected voltage 105 at a high temperature is out of the room temperature voltage setting range 106, the high temperature voltage setting range 107 including the reference voltage of the A / D conversion also includes the room temperature voltage setting range 106. Needs to be extended to As the A / D converter, in order to correspond to the high temperature voltage setting range 107, a plurality of A / D converters are provided, or an A / D converter having a wider voltage setting range and a higher resolution is required. Anything inevitably leads to an increase in circuit scale.

FIG. 11: is a figure which shows one Embodiment of the internal structure of the A / D converter 84 shown in FIG. In FIG. 11, reference numeral 108 denotes a first comparator, 109 a second comparator, 110 a third comparator, 111 a fourth comparator, 112 a fifth comparator, 113 a sixth comparator, 114 a seventh comparator, and 115 The first comparison voltage, 116 is the second comparison voltage, 117 is the third comparison voltage, 118 is the fourth comparison voltage, 119 is the fifth comparison voltage, 120 is the sixth comparison voltage, 121 is the seventh comparison voltage, 122 is the first comparison voltage 1 is a comparison result, 123 is a second comparison result, 124 is a third comparison result, 125 is a fourth comparison result, 126 is a fifth comparison result, 127 is a sixth comparison result, and 128 is a seventh comparison result. Each comparator 108-114 compares the voltage of the detection output line 78 with each of the comparison voltages 115-121, and outputs the result as the comparison results 122-128. For example, when the voltage of the detection output line 78 is larger than the comparison voltage, "1" is output as a comparison result. Reference numeral 129 denotes a first voltage divider resistor, 130 a second voltage divider resistor, 131 a third voltage divider resistor, 132 a fourth voltage divider resistor, 133 a fifth voltage divider resistor, 134 a fifth voltage divider resistor, and 135 a seventh voltage divider resistor. 136 is the eighth voltage divider resistance. Each of the divided resistors 129 to 136 divides the upper reference voltage and the lower reference voltage to be described later to generate the respective comparison voltages 115 to 121. The first voltage divider resistor 129 and the eighth voltage divider resistor 136 are almost 0 ohms, the first comparison voltage 115 is the same reference voltage as the upper reference voltage, and the seventh comparison voltage 121 is the same voltage as the following reference voltage. The second divided resistor 130 to the seventh divided resistor 135 have the same resistance value, and the second comparison voltage 116 to the sixth comparison voltage 120 divide the voltage equally between the upper reference voltage and the lower reference voltage. do. Reference numeral 137 denotes a 7 to 3 decoder, 138 denotes a digital third bit output, 139 denotes a digital second bit output, and 140 denotes a digital first bit output. The 7 to 3 decoder 137 decodes the comparison results 122 to 128 and outputs them as 3 bit digital outputs 138 to 140. As described above, the comparison results 122 through 128 are divided into eight types of "0000000", "0000001", "0000011", "0000111", "0001111", "0011111", "0111111", and "1111111". As shown in the figure, the conversion is made to "000", "001", "010", "011", "100", "101", "110", and "111", respectively. Reference numeral 141 denotes a reference voltage control means, 142 denotes a reference voltage when detecting burnout, 143 denotes a reference voltage generating means above, 144 denotes a reference voltage above detecting burnout, 145 denotes a reference voltage generating means below, and 146 denotes a reference voltage below when detecting burnout. 147 is a detection timing control means, 148 is a detection switching signal, 149 is a reference voltage above when detecting temperature, 150 is a reference voltage below when detecting temperature, 151 is a reference voltage switching means, 152 is a reference voltage switching means, and 153 is The upper reference voltage 154 is the lower reference voltage. The detection timing control means 147 generates a detection switch signal 148 for switching the timing of temperature detection and burn detection. The upper reference voltage switching means 151 and the lower reference voltage switching means 152 are respectively according to the detection switching signal 148, when the temperature is detected, the upper reference voltage 149 at the temperature detection, and the lower reference voltage 150 at the temperature detection. ) Is changed during burn detection, and the upper reference voltage 144 at burn detection and the lower reference voltage 146 at burn detection are outputted as the upper reference voltage 153 and the lower reference voltage 154, respectively. The reference voltage control means 141 generates from the comparison results 122 to 128 at the time of temperature detection, the reference voltage 142 at the time of sweep detection, which is a reference of the up and down reference voltage at the time of the sweep. The upper reference voltage generating means 143 and the lower reference voltage generating means 145 are based on the reference voltage 142 at the detection of the sweep, respectively, the upper reference voltage 144 at the detection of sweep and the lower reference voltage 146 at the detection of sweep. ).

12 is a diagram for explaining the operation of the A / D converter 84. FIG. In FIG. 12, FIG. 12A shows a temperature detection operation and FIG. 12B shows a bake detection operation. Reference numeral 155 is a temperature detection point. When the temperature is detected, the upper reference voltage 153 is referred to as the upper reference voltage 149 (see FIG. 11) when the temperature is detected, and the lower reference voltage 154 as the lower reference voltage 150 (see FIG. 11) when the temperature is detected. The comparison voltages 115 to 121 are at levels equally divided therebetween. Here, in the present embodiment, the upper reference voltage 149 at the temperature detection, the lower reference voltage 150 at the temperature detection is assumed to have a range corresponding to the variation of the characteristics with respect to the temperature change of the environment in which the product is used. It demonstrates as operation | movement when temperature is high. From the result of the temperature detection, the range of the reference voltage is approximately from the seventh comparison voltage 121 to the fourth comparison voltage 118, and reflects this result in the reference voltage 142 at the time of burning detection. In this embodiment, the measurement result of the temperature detection point 155 is set to the reference voltage 142 at the time of burning detection, and the following reference voltage 146 at the time of burning detection at the same level as the reference voltage 142 at the time of burning detection (FIG. 11). And the upper reference voltage 144 (see FIG. 11) at the time of burn detection, which is a value obtained by adding the maximum width to be detected to the reference voltage 142 at the time of burn detection. 153). Thereby, the comparison voltages 115-121 at the time of baking detection can be made finer than at the time of temperature detection, and it can respond to the slighter fluctuations.

FIG. 13 is a view corresponding to FIG. 8, and is a diagram showing a case where variation in the detection characteristics of the organic EL element 65 at different temperatures shows different characteristics as shown in FIG. 8. As in FIG. 8, reference numeral 101 denotes a current versus voltage characteristic of the organic EL element 65 at a high temperature, and 102 denotes a voltage at a constant current application at a high temperature. Reference numeral 183 denotes a current versus voltage second characteristic of the deteriorated organic EL element 65 at high temperature, and 184 is a second voltage when a constant current is applied to the deteriorated organic EL element 65 at high temperature. The current vs voltage second characteristic 183 has a large variation in the current vs voltage characteristic 101 compared with normal temperature due to a small slope at the time of deterioration, and when the constant current condition 95 is applied at this time, It can be seen that when the constant current is applied, the second voltage 184 becomes large, and when deterioration, the detection voltage is larger than the normal temperature.

FIG. 14 is a diagram corresponding to FIG. 9, wherein a variation in voltage at the time of applying a constant current of a pixel on the same horizontal line 91 shown in FIG. 7 at a high temperature is different from that in FIG. 9. In FIG. 14, reference numeral 185 denotes the high temperature detection second voltage, and the overall level is smaller than the detection voltage 100 at normal temperature, and the amplitude is compared with the high temperature detection voltage 105 shown in FIG. The width of the current measurement range is large.

FIG. 15 is a diagram corresponding to FIG. 10, illustrating an embodiment in a case where the characteristic at high temperature of the reference voltage setting in the A / D conversion is different from that in FIG. 10. In FIG. 15, the room temperature voltage setting range 106 and the high temperature voltage setting range 107 are similar to those shown in FIG. 10, so that the detection voltage 185 at a high temperature is outside the room temperature voltage setting range 106. It is necessary to widen the reference voltage of the D conversion to the high temperature voltage setting range 107. In order to cope with this, it is necessary to provide a plurality of A / D converters, widen the voltage setting range, and increase the resolution, resulting in an increase in the circuit scale. In addition, in FIG. 15, the range of the detection voltage 185 at the high temperature is significantly larger than in the case of FIG.

FIG. 16 is a diagram corresponding to FIG. 12, and is a diagram showing an embodiment in the case where fluctuations at the high temperature of the operation of the A / D converter 84 shown in FIG. 11 exhibit different characteristics from those of FIG. 12. In Fig. 16, the operation is the same as in the case of Fig. 12, but since the range of the detection voltage 185 at high temperature is larger than that of the detection voltage 100 at room temperature, the comparison voltages 115 to 121 at the time of detection are detected. Is larger than the high temperature shown in FIG. 16 or the high temperature shown in FIG. In addition, the range of the detection voltage 185 at high temperature can be calculated in advance from the characteristics shown in FIG. 13, and the comparison voltages 115 to 121 at the time of burning detection are set based on this calculation data.

Hereinafter, the baking detection corresponding to a temperature change is demonstrated using FIG. 1 thru | or FIG. 16 mentioned above. First, the flow of display data in the image display device will be described with reference to FIG. 1. In FIG. 1, the display and detection control means 6 is connected to the self-luminescent element display 17 by the horizontal synchronizing signal 1, the vertical synchronizing signal 2, the data enable 3, and the synchronizing clock 5. The data line control signal 7 and the scan line control signal 8 to be the display timing are generated. In addition to this generation, the detection scan line control signal 9 and the detection line control signal 10, which are timings for detecting the state of the pixels of the self-luminous element display 17, are generated. Details will be described later. The operations of the data line driving means 11, the scanning line driving means 15, and the light emitting voltage generating means 13 are the same as in the prior art. The element characteristic detection scanning means 18 generates the detection scan line selection signal 19 from the detection scan line control signal 9 for scanning the pixels to be detected in the detection period set separately from the period of the display operation. The burn-out detection and position determination means 21 detects the deterioration state of the element from the state of the detection line output signal 20 which becomes the characteristic of the pixel on the scan line selected by the detection scan line selection signal 19, and also detects the line. By determining the position of the pixel from the signal 10, the position information 23, which is address information for storing in the burnout information storage means 24, and the burnout detection result 22 indicating the level of element degradation are generated. Details will be described later. The bake correction pixel information 25 is information for reading the level of element deterioration from the bake information storage means 24 in accordance with the display timing. Next, the detail of the operation | movement of the said display and detection control means 6 is demonstrated using FIG. In FIG. 2, the baking pixel data correction means 26 corrects only the data of the deteriorated pixel in the display data 4 by the baking correction amount 38, and does not correct other pixels as the display correction data 27. FIG. Output Details will be described later. The drive timing generating means 28 generates the horizontal start signal 29, the horizontal shift clock 30, the vertical start signal 31, and the vertical shift clock 32 in the same manner as in the prior art. In addition, the drive timing generating means 28 is the vertical detection start signal 33 and the vertical detection shift clock 34 which are timing signals for scanning the detection scan line in the detection period set separately from the display period in one display period. And a horizontal detection start signal 35 and a horizontal detection shift clock 36, which are timing signals for sequentially outputting the state of the pixel on the selected detection scanning line in the horizontal direction. Next, in FIG. 3, the organic EL elements of the respective pixels through the detection switches of the respective pixels by the scan line selection signals sequentially output through the first detection scan line 67 and the second detection scan line 68. 65 is connected to the 320th detection line (not shown) from the 1st detection line 69, the 2nd detection line 70, the 3rd detection line 71, and the 4th detection line 72, respectively, The characteristic is output as the detection line output signal 20.

In FIG. 4, only the characteristics of the corresponding pixel are output to the detection output line 78 by switching the detection line selection signal and the detection line switch corresponding to the temperature detection point described later when the temperature characteristic is detected. At the time of burning detection, the first detection line selection signal 80 and the second detection line selection signal 81 generated by the shift register 79 in accordance with the detection horizontal start signal 35 and the detection horizontal shift clock 36. In accordance with the third detection line selection signal 82 and the fourth detection line selection signal 83, the first detection line switch 74, the second detection line switch 75, the third detection line switch 76, The fourth detection line switch 77 sequentially shifts and outputs in the horizontal direction. At this time, since the organic EL element 65 shown in FIG. 3 is connected to the detection power supply 73 (see FIG. 4) which is a constant current source, the organic EL element 65 having the characteristics shown in FIG. In the white display 89 shown in Fig. 5, the voltage 96 when applying constant current at normal temperature, the voltage 102 when applying constant current at high temperature, and the baking pattern 90, the voltage during application of deteriorating element constant current at normal temperature (98) The voltage 104 at the time of deterioration at the time of high temperature element deterioration at high temperature is used as the detection characteristic, and is output to the detection output line 78. As a result, the detection result of element characteristics on the same horizontal line 91 shown in FIG. 5 is as shown in FIG. The A / D conversion means 84 sets the reference voltage of the A / D conversion at the time of sweep detection from the characteristic at the temperature detection by the initial setting of the reference voltage of the A / D conversion, and the analog data at the time of the sweep detection. The detection output line 78 is converted into the detection result 22 which is digital data, and the baking pixel position information generating means 85 performs the vertical detection start signal 33, the horizontal detection start signal 35, only at the time of burning detection. From the horizontal detection shift clock 36, the pixel position at which the detection result 22 is being output is determined, and output as the positional information 23.

When the organic EL element 65 is connected to the detection power supply 73 which is a constant current source, as shown in FIG. 8, the characteristic of the organic EL element 65 varies with temperature, and as shown in FIG. Similarly, at normal temperature, the voltage 96 when applying constant current or the voltage 98 when applying deteriorating element constant current is output to the detection line output signal 20 as the detection characteristic, and at high temperature, the voltage 102 when applying high temperature constant current. When the high temperature device deterioration constant current is applied, the voltage 104 is output as the detection characteristic to the detection line output signal 20. As a result, the detection result of element characteristics on the same horizontal line 91 shown in FIG. 5 is greatly varied as shown in FIG.

The A / D conversion means 84 performs digital conversion with reference to seven levels within the voltage setting range. As shown in Fig. 10, for example, at normal temperature, since the analog data represented by the detection voltage 100 is digitally converted, the normal temperature voltage setting range 106 is required for the A / D conversion means. It becomes On the other hand, when the ambient temperature is high or the lighting time is long and the panel temperature rises, the level fluctuates significantly compared with the detection voltage 100 as shown in the high temperature detection voltage 105. In this case, digital conversion is impossible in the room temperature voltage setting range 106. Therefore, in order to cope with the same A / D conversion means, it is necessary to widen the voltage setting range as high temperature voltage setting range 107 and increase the number of levels to be converted, or to provide a plurality of A / D conversion means. As a result, a problem arises in that the circuit scale is increased. Therefore, in this embodiment, as shown in FIG. 11, it respond | corresponds by making the reference voltage of the A / D conversion means 84 variable. That is, the detection timing control means 147 performs timing control so that the temperature characteristic is always detected before the burning detection. At the time of the detection of the temperature characteristic, the element characteristic at the temperature detection point 155 is detected. At this time, the comparison voltages 115 to 121 are generated based on the upper reference voltage 149 at the temperature detection and the lower reference voltage 150 at the temperature detection. The upper reference voltage 149 at the time of temperature detection at this time and the lower reference voltage 150 at the time of temperature detection are set to be the maximum range which can be taken in the temperature situation which the characteristic of the organic electroluminescent element 65 uses. Therefore, as shown in Fig. 12A, the spacing between the comparison voltages in the wide voltage setting range also becomes sparse setting. As shown in Fig. 16, the result of the A / D conversion at the temperature detection point 155 in this embodiment is approximately around the seventh comparison voltage 121, so that this result is referred to as the reference voltage 142 at the time of detection. ). A value obtained by outputting a reference voltage 146 at the same level as the reference voltage 142 at the time of burning detection as the reference voltage 154 below, and adding the maximum width to be detected to the reference voltage 142 at the time of burning detection. By setting the above reference voltage 144 to the above reference voltage 153 at the time of burning detection, the comparison voltages 115 to 121 at the time of burning detection are finer than at the time of temperature detection, and can cope with more minute variations. Here, in the present embodiment, the result of the A / D conversion at the temperature detection point 155 is referred to as the following reference voltage. However, the upper reference voltage is added and the lower reference voltage is generated by subtracting the result as the center. The result may be the upper reference voltage, and the lower reference voltage may be generated by subtraction.

Next, as shown in FIG. 13 to FIG. 16 described above, the element deterioration detection operation when the deterioration characteristic at normal temperature and the deterioration characteristic at high temperature are different will be described below. The organic EL element 65 is connected to the detection power supply 73 which is a constant current source shown in FIG. 4, and the organic EL element 65 whose characteristics vary with temperature is shown in FIG. 17 at room temperature. At the time of application of constant current, voltage 96 at the time of application of constant current, or at the time of application of the constant current, the detection line output signal 20 is outputted as a detection characteristic. When the deterioration constant current is applied, the detection line output signal 20 is output using the voltage 184 as a detection characteristic. As a result, the detection result of the element characteristic on the same horizontal line 91 shown in FIG. 5 fluctuates largely as shown in FIG. 17, compared with the case where the deterioration characteristic at normal temperature and the deterioration characteristic at high temperature are the same. It can be seen that the amplitude (width of the current measurement range) of the detection result is different from each other.

Next, as shown in FIG. 15, the A / D conversion means 84 performs digital conversion with reference to seven levels within a voltage setting range. For example, at normal temperature, since the analog data represented by the detection voltage 100 is digitally converted, the normal temperature voltage setting range 106 becomes the voltage setting range required for the A / D conversion means 84. On the other hand, when the ambient temperature is high or the lighting time is long and the panel temperature rises, the high temperature detection voltage 185 is significantly changed in level compared with the detection voltage 100, and deterioration characteristics and high temperature at room temperature Unlike the case where the deterioration characteristics of the city are the same, it can be seen that the amplitude (width of the current measurement range) also changes.

Such large fluctuations and changes in amplitude are responded by varying the reference voltage (see FIG. 11) of the A / D conversion means 84. The operation is almost the same as the case where the deterioration characteristic at room temperature and the deterioration characteristic at high temperature are the same, but as shown in Fig. 16, the comparison voltages 115 to 121 at the time of detecting the burning at high temperature are compared with the normal temperature. To be large, the upper reference voltage 153 and the lower reference voltage 154 are generated. The upper reference voltage 153 and the lower reference voltage 154 can set the widths of the reference numerals 115 to 121 shown in FIG. 16B, for example, from the characteristic diagrams shown in FIG. 13. Therefore, it can be set based on the width.

By the above operation, the firing and position determination means 21 in FIG. 1 detects the detection result of the firing phenomenon caused by the deterioration of the element in the self-luminescent element display 17 and the firing detection result 22 indicating the level of firing. It outputs as positional information 23 which shows the position, and the baking detection result 22 is stored in the baking information storage means 24 in the address according to the positional information 23. As shown in FIG. Finally, from the burnout information storage means 24, the burnout information of the corresponding pixel is read in accordance with the display timing, and the burnout is eliminated by correcting the display data as necessary.

<2nd embodiment>

EMBODIMENT OF THE INVENTION Hereinafter, 2nd Embodiment of this invention is described in detail using drawing.

Fig. 17 shows a self-luminous element display device as a second embodiment of the present invention. In FIG. 17, the portions denoted by the same reference numerals as in FIG. 1 perform the same operations as those in the first embodiment. Reference numeral 156 denotes a display / detection switch control unit, 157 denotes a display / detection switch control signal, 158 denotes data line driving and black spot defect position determining means, 159 denotes a data line driving and detection line output signal, and 160 denotes a common data line and detection line. It is a self-luminous element display. The display / detection switching control unit 156 generates a data line control signal 7, a scan line control signal 8, and a detection scan line control signal 9, and switches data drive and detection operations to the detection line control signal. The display / detection switching control signal 157 to which the signal to be added is added is generated. The data line driving and firing position discriminating means 158 has both functions of the data line driving means and the firing detecting and position discriminating means shown in the first embodiment, and the data line driving and detecting line output signal 159 are common. The data line and the detection line are connected to the common self-luminous element display 160 through the data line.

FIG. 18 is a diagram showing an embodiment of the configuration of the data line driving and baking position determining means 158. FIG. In FIG. 18, since the same code | symbol as FIG. 4 is the same as that of 1st Embodiment, it performs the same operation. Reference numeral 161 denotes one horizontal latch and analog converting means, 162 denotes a first data line driving signal output, 163 denotes a second data line driving signal output, 164 denotes a third data line driving signal output, and 165 denotes a fourth data line driving signal. Output. As in the first embodiment, the one horizontal latch and the analog converting means 161 acquire the input display correction data 26 in accordance with the horizontal shift clock 29 with the horizontal start signal 28 as the head. Outputs horizontal data as the first data line drive signal output 162, the second data line drive signal output 163, the third data line drive signal output 164, and the fourth data line drive signal output 165. do. In this embodiment, for example, up to the 240th data line drive signal output as in the first embodiment. Reference numeral 166 denotes a detection switch signal, 167 denotes a first data line detection switch, 168 denotes a second data line detection switch, 169 denotes a third data line detection switch, 170 denotes a fourth data line detection switch, and 171 denotes a detection switch signal. First data lines and detection lines, 172 are second data lines and detection lines, 173 are third data lines and detection lines, and 174 are fourth data lines and detection lines. In this embodiment, unlike the first embodiment, the number of detection lines is set to 240 because they are common to the data lines. ... First data line detection switching switch 167, second data line detection switching switch 168, third data line detection switching switch 169, fourth data line detection switching switch 170. According to the detection switch signal 166, the 240th data line detection switching switch may include a first data line driving signal output 162, a second data line driving signal output 163, and a third data line driving signal during display driving. Output 164, fourth data line drive signal output 165,... And the 240th data line driving signal output to the first data line and the detection line 171, the second data line and the detection line 172, the third data line and the detection line 173, the fourth data line and the detection line. (174),. The same operation as the display operation of the first embodiment is performed by outputting to the 240th data line and the detection line. At the time of detection, the first detection line 69, the second detection line 70, the third detection line 71, the fourth detection line 72,... And the 240th detection line, the first data line and the detection line 171, the second data line and the detection line 172, the third data line and the detection line 173, the fourth data line and the detection line 174. ,… The detection operation of the first embodiment is divided into R, G, and B in one horizontal period by connecting to the 240th data line and the detection line. Reference numeral 175 denotes an RGB switching control means, 176 denotes an R display detection selection signal, 177 denotes a G display detection selection signal, and 178 denotes a B display detection selection signal. In the same manner as the first embodiment, the RGB switching control means 175 divides one horizontal period into R, G, and B to write data line signals, and also displays R as a switching signal for dividing the detection into three. And a detection selection signal 176, a G display and detection selection signal 177, and a B display and detection selection signal 178.

FIG. 19 is a diagram illustrating an embodiment of an internal configuration of the data line and the detection line common self-light emitting device display 160. In FIG. 19, since the same code | symbol as FIG. 3 is the same as that of 1st Embodiment, it performs the same operation. Reference numeral 179 denotes a first R display detection common line, 180 denotes a first G display detection common line, 181 denotes a first B display detection common line, and 182 denotes a second R display detection common line. For example, 240 R display detection common lines, G display detection common lines, and B display detection common lines are lined up with 240 in total. First R display detection common line 179, first G display detection common line 180, first B display detection common line 181, second R display detection common line 182,... The 240th R display detection common line, the 240th G display detection common line, and the 240th B display detection common line respectively turn on the data write switch 62 of each pixel when the display driving operation is performed. Is connected to the organic EL element 65 by turning on the detection switch 66 of each pixel at the time of detection, and performing the same signal voltage writing operation as in the first embodiment. The detection operation is performed.

As mentioned above, in this embodiment, operation | movement other than switching and using a data line and a detection line in common is the same as that of 1st embodiment.

As mentioned above, although this invention was demonstrated using an Example, the structure demonstrated by each Example until now is an example to the last, and this invention can be suitably changed within the range which does not deviate from a technical idea. In addition, as long as it does not contradict, mutually demonstrated the structure demonstrated in each Example may be used in combination.

BRIEF DESCRIPTION OF THE DRAWINGS It is a figure which shows one Embodiment of the image display apparatus of this invention, and shows a self-luminous element display apparatus.

FIG. 2 is a diagram illustrating an embodiment of an internal configuration of the display and detection control unit shown in FIG. 1. FIG.

FIG. 3 is a diagram showing an embodiment of the configuration of the interior of the self-luminous element display shown in FIG. 1; FIG.

4 is a diagram showing an embodiment of the configuration of the inside of the baking detection and position discriminating means shown in FIG. 1;

FIG. 5 is an explanatory diagram showing a display example in the case where baking occurs in the self-luminous display shown in FIG. 1; FIG.

6 is a graph showing an example of detection characteristics of the organic EL device shown in FIG. 3;

FIG. 7 is a diagram showing a voltage during constant current application of each pixel on the same horizontal line shown in FIG. 5; FIG.

FIG. 8 is a view showing variation at high temperature of detection characteristics of the organic EL device shown in FIG. 6; FIG.

FIG. 9 is a view showing a variation in voltage at high temperature when a constant current is applied to pixels on the same horizontal line shown in FIG. 7; FIG.

10 is an explanatory diagram showing an example of reference voltage setting in A / D conversion.

FIG. 11 is a diagram showing an embodiment of an internal configuration of the A / D converter shown in FIG. 4; FIG.

12 is a view for explaining the operation of the A / D converter shown in FIG.

FIG. 13 is a diagram in the case where variation in the detection characteristics of the organic EL element shown in FIG. 6 at a high temperature exhibits different characteristics from those shown in FIG. 8;

FIG. 14 is a diagram in the case where the fluctuation at the high temperature of the voltage when the constant current is applied to the pixels on the same horizontal line shown in FIG. 7 exhibits different characteristics from those shown in FIG.

Fig. 15 is a diagram in which the characteristics at the time of exchange of the reference voltage setting in the A / D conversion show different characteristics from those shown in Fig. 10;

FIG. 16 is a diagram showing an embodiment in a case where fluctuations at the high temperature of the operation of the A / D converter shown in FIG. 11 exhibit different characteristics from those shown in FIG. 12;

17 shows another embodiment of the image display device of the present invention.

FIG. 18 is a diagram showing an embodiment of an internal configuration of the data line driving and baking position discriminating means shown in FIG. 17; FIG.

FIG. 19 is a diagram showing an embodiment of an internal configuration of a data line and a detection line common self-light emitting device display shown in FIG. 17; FIG.

<Explanation of symbols for the main parts of the drawings>

1: horizontal sync signal

2: vertical sync signal

3: Enable data

4: display data

5: synchronous clock

6: display and detection control unit

11 data line driving means

13: voltage generating means for light emission

15: scanning line driving means

17: self-luminous element display

18: element characteristic detection scanning means

21: bake detection and position determining means

24: means for storing information

26: baking pixel data correction means

28: drive timing generating means

37: means for calculating the correction amount

Claims (16)

An image display apparatus including a display portion constituted by a plurality of display elements, a signal line for inputting a display signal voltage to the display portion, and a display control portion for controlling the display signal voltage. A detection power supply, a switching switch for flowing a current of the detection power supply to the display element, a detection circuit for detecting a current flowing through the display element, and information detected by the detection circuit, and storing A detection information storage circuit for correcting the display signal voltage, The detection circuit measures a second current by a second reference voltage different from the first reference voltage by setting a first current measurement range based on a first reference voltage to perform current detection, and then feeding back the detected current amount. And the range is set to perform current detection. The method of claim 1, And said switching switch connects said detection power supply and said display element in a period other than a period for outputting the display signal voltage in one display period. The method of claim 1, And the detection power supply is a constant current source. The method of claim 1, And the detection circuit determines the level of the degradation element, and the detection information storage circuit stores the state of the degradation element for one screen. The method of claim 4, wherein And the display control circuit corrects display data input to the deterioration element. The method of claim 1, And a switching switch for time-dividing and supplying respective signals in charge of red, green, and blue in the display unit in the supply of the display signal voltage. The method of claim 1, And the width of the first current measurement range is equal to the width of the second current measurement range. The method of claim 1, And the width of the first current measurement range and the width of the second current measurement range are different from each other. An image display device comprising a display portion constituted by a plurality of display elements, a data signal line for inputting a display signal voltage to the display portion, and a display control portion for controlling the display signal voltage, A detection power supply, a switching switch for flowing a current of the detection power supply through the detection signal line to the display element, a detection circuit for detecting current flowing through the display element, and information detected by the detection circuit, A detection information storage circuit for correcting the display signal voltage with information, wherein the data signal line and the detection signal line are composed of a common signal line switched by a switching circuit, The detection circuit measures a second current by a second reference voltage different from the first reference voltage by setting a first current measurement range based on a first reference voltage to perform current detection, and then feeding back the detected current amount. And the range is set to perform current detection. 10. The method of claim 9, And said switching switch connects said detection power supply and said display element in a period other than a period for outputting the display signal voltage in one display period. 10. The method of claim 9, And the detection power supply is a constant current source. 10. The method of claim 9, And the detection circuit determines the level of the degradation element, and the detection information storage circuit stores the state of the degradation element for one screen. The method of claim 12, And the display control circuit corrects display data input to the deterioration element. 10. The method of claim 9, And a switching switch for time-dividing and supplying respective signals in charge of red, green, and blue in the display unit in the supply of the display signal voltage. 10. The method of claim 9, And the width of the first current measurement range is equal to the width of the second current measurement range. 10. The method of claim 9, And the width of the first current measurement range and the width of the second current measurement range are different from each other.

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