KR100927728B1 - 동축선로형 샘플홀더 - Google Patents
동축선로형 샘플홀더 Download PDFInfo
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- KR100927728B1 KR100927728B1 KR1020080009964A KR20080009964A KR100927728B1 KR 100927728 B1 KR100927728 B1 KR 100927728B1 KR 1020080009964 A KR1020080009964 A KR 1020080009964A KR 20080009964 A KR20080009964 A KR 20080009964A KR 100927728 B1 KR100927728 B1 KR 100927728B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2898—Sample preparation, e.g. removing encapsulation, etching
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
Claims (5)
- 한쪽면에는 안착홈이 형성되고 중앙을 관통하여 선로구멍이 형성되는 암부재와,상기 암부재의 안착홈에 결합되고 상기 암부재의 선로구멍과 동축상에 선로구멍이 중앙에 관통하여 형성되는 수부재와,상기 암부재의 안착홈과 수부재 사이에 설치되고 중앙이 빈 링형상으로 형성되는 샘플지지부재와,상기 암부재 및 수부재의 선로구멍에 각각 설치되고 상기 암부재 및 수부재와 전기적으로 서로 단절되도록 절연재로 피복된 상태로 선로구멍에 각각 설치되고 서로 이격된 상태로 설치되는 한쌍의 전송선로와,상기 암부재 및 수부재가 서로 맞닿는 면 반대쪽 면에 각각 설치되고 상기 전송선로와 외부 회로와의 전기적 연결이 이루어지는 한쌍의 커넥터를 포함하는 동축선로 샘플홀더.
- 청구항 1에 있어서,상기 암부재 및 수부재에는 서로 결합된 상태를 유지하는 체결부재가 삽입되는 복수의 체결구멍이 형성되는 동축선로 샘플홀더.
- 청구항 2에 있어서,상기 샘플지지부재에는 상기 체결부재가 삽입되는 복수의 체결구멍을 형성하는 동축선로 샘플홀더.
- 청구항 2에 있어서,상기 체결부재는 수나사가 형성되는 고정볼트와 상기 고정볼트의 수나사와 나사결합되는 암나사가 형성되는 고정너트로 구성하는 동축선로 샘플홀더.
- 청구항 1에 있어서,상기 암부재의 안착홈 및 이에 대응하는 상기 수부재의 결합면에는 각각 링홈을 형성하고,상기 링홈에는 오링을 삽입 설치하는 동축선로 샘플홀더.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080009964A KR100927728B1 (ko) | 2008-01-31 | 2008-01-31 | 동축선로형 샘플홀더 |
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KR1020080009964A KR100927728B1 (ko) | 2008-01-31 | 2008-01-31 | 동축선로형 샘플홀더 |
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KR20090084033A KR20090084033A (ko) | 2009-08-05 |
KR100927728B1 true KR100927728B1 (ko) | 2009-11-18 |
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KR1020080009964A KR100927728B1 (ko) | 2008-01-31 | 2008-01-31 | 동축선로형 샘플홀더 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101502557B1 (ko) * | 2013-11-18 | 2015-03-16 | 한국표준과학연구원 | 물질특성 측정기 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060085925A (ko) * | 2003-11-05 | 2006-07-28 | 니혼 하츠쵸 가부시키가이샤 | 도전성 접촉자 홀더 및 도전성 접촉자 유닛 |
JP2007101237A (ja) | 2005-09-30 | 2007-04-19 | Tdk Corp | 電気特性測定装置および電気特性測定方法 |
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- 2008-01-31 KR KR1020080009964A patent/KR100927728B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20060085925A (ko) * | 2003-11-05 | 2006-07-28 | 니혼 하츠쵸 가부시키가이샤 | 도전성 접촉자 홀더 및 도전성 접촉자 유닛 |
JP2007101237A (ja) | 2005-09-30 | 2007-04-19 | Tdk Corp | 電気特性測定装置および電気特性測定方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101502557B1 (ko) * | 2013-11-18 | 2015-03-16 | 한국표준과학연구원 | 물질특성 측정기 |
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