KR100925225B1 - Apparatus for measuring a group of light source - Google Patents

Apparatus for measuring a group of light source Download PDF

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KR100925225B1
KR100925225B1 KR1020080138229A KR20080138229A KR100925225B1 KR 100925225 B1 KR100925225 B1 KR 100925225B1 KR 1020080138229 A KR1020080138229 A KR 1020080138229A KR 20080138229 A KR20080138229 A KR 20080138229A KR 100925225 B1 KR100925225 B1 KR 100925225B1
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light
light source
standard
led
sensor
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KR1020080138229A
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Korean (ko)
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김재을
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주식회사 대한전광
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Priority to CN200910266138A priority patent/CN101769820A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • G01J1/26—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/281—Interference filters designed for the infrared light
    • G02B5/282—Interference filters designed for the infrared light reflecting for infrared and transparent for visible light, e.g. heat reflectors, laser protection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/448—Array [CCD]

Abstract

PURPOSE: An apparatus for measuring a large quantity of light is provided to improve the measuring speed by measuring the light intensity of one LED by using one optical sensor. CONSTITUTION: An apparatus for measuring a large quantity of light includes a lattice type shielding plate(120), a light guide plate(130), a spectrum filter(140), an infrared ray blocking filter(150), and a sensor module(160). The lattice type shielding plate surrounds a side wall of an LED. The light which is generated along the light guide plate from the LED and passes through the lattice type shielding plate progresses. The spectrum filter reduces the brightness of light generated from the LED. The infrared ray blocking filter blocks the infrared ray included in the light passing through the spectrum filter.

Description

집단 광원 측정 장치{APPARATUS FOR MEASURING A GROUP OF LIGHT SOURCE}Collecting light source measuring device {APPARATUS FOR MEASURING A GROUP OF LIGHT SOURCE}

본 발명은 광원 측정 장치에 관한 것으로, 다량의 광원에 대하여 휘도, 색도를 측정할 수 있는 집단 광원 측정 장치에 관한 것이다.The present invention relates to a light source measuring apparatus, and relates to a collective light source measuring apparatus capable of measuring luminance and chromaticity with respect to a large amount of light sources.

현재, 광원은 필라멘트광원(전구), 가스 투입 광원(형광램프), 반도체 광원(LED) 등 다양하게 존재하며, 제조사가 다량의 광원을 제조하는 경우, 각각의 단위 제품은 휘도, 색도 등에서 편차가 필연적으로 발생한다.Currently, light sources exist in various ways such as filament light sources (bulbs), gas input light sources (fluorescent lamps), semiconductor light sources (LEDs), and when a manufacturer manufactures a large amount of light sources, each unit product has a variation in luminance and chromaticity. It inevitably occurs.

이를 줄이기 위하여 제조사들은 자사 제품을 여러 단계의 휘도, 색도 편차별로 랭크를 규정하여 측정함으로써 분리해내고 있다.To reduce this, manufacturers are separating their products by measuring the ranks for different levels of brightness and chromaticity.

이 경우 현재의 기술 수준에서는 평균적으로 랭크 1이면, 10 내지 30% 정도의 편차가 발생하며, 이 정도는 집단 점등하는 경우, 육안으로 식별이 가능하다. 따라서, 이러한 편차를 줄이기 위하여 본 출원인은 "디지털 텔레비젼에 있어서의 픽셀의 휘도보정 장치 및 그를 포함한 영상제어 장치"(특허등록 제372999호) 및 "원색보정기능을 추가한 디지털 텔레비젼 및 디지털텔레비젼의 원색보정 방법"(특허등록 제436890호)을 개발한 바 있다. 이 기술을 이용하여 휘도를 보정하면 1 내지 3% 이내로 편차를 보정할 수 있다.In this case, at the current technology level, on the average, rank 1, a deviation of about 10 to 30% occurs, and this degree can be visually identified when the group is turned on. Accordingly, in order to reduce such deviations, the present applicant has applied for "a luminance correction device of a pixel and an image control device including the same" (Patent Registration No. 372999) and "primary color of a digital television and a digital television with a primary color correction function. Correction method "(Patent No. 436890). Using this technique to correct luminance, the deviation can be corrected to within 1 to 3%.

그런데, 종래기술의 광학 카메라를 이용한 측정 장치는 여러 문제점을 내포하고 있는 바, 측정된 광원들의 휘도를 보정하는 위 기술들을 실용화하는 데에 많은 어려움을 수반한다.However, the measurement apparatus using the optical camera of the prior art has a number of problems, it involves a lot of difficulties in the practical use of the above techniques for correcting the brightness of the measured light source.

즉, 종래의 광학 카메라를 이용한 측정 장치는 1개의 CCD로 다수개의 LED 광원이 집단된 LED 모듈을 정면에서 촬영하여 광도를 판단하는 장치로서, 카메라 렌즈의 평탄도나 카메라 렌즈의 곡률반경(R)의 밸런스 정도에 따라 광학오차인 에지현상(테두리 현상)이 발생한다. 또한, 동일 제품을 반복 사용시에는 CCD의 감도가 저하되어 측정 오차가 커지게 되는 문제점이 있다. 뿐만 아니라, LED 모듈 하나당 12번의 카메라 컷을 수행하여 하므로 카메라 셔터가 쉽게 마모되어 수명이 짧다. 여기서, 12번의 카메라 컷은 R 색상에 포함된 r값, R 색상에 포함된 g값, R 색상에 포함된 b값, G 색상에 포함된 g값, G 색상에 포함된 r값, G 색상에 포함된 b값, B 색상에 포함된 b값, B 색상에 포함된 r값, B 색상에 포함된 g값, W 색상에 포함된 r값, W 색상에 포함된 g값, 및 W 색상에 포함된 b값을 측정하기 위하여 필요하다.That is, the conventional measuring device using an optical camera is a device for determining the brightness by photographing the LED module in which a plurality of LED light source is collected with one CCD from the front, the flatness of the camera lens or the radius of curvature (R) of the camera lens According to the balance degree, edge phenomenon (border phenomenon) which is an optical error occurs. In addition, when using the same product repeatedly there is a problem that the sensitivity of the CCD is lowered and the measurement error is increased. In addition, 12 camera cuts per LED module make the camera shutter easy to wear and short in life. Here, 12 camera cuts have r values in R color, g values in R color, b values in R color, g values in G color, r values in G color, and G colors. B value included, b value included in B color, r value included in B color, g value included in B color, r value included in W color, g value included in W color, and included in W color It is necessary to measure the b value.

본 발명은 광도를 신속하게 측정할 수 있는 집단 광원 측정 장치를 제공함에 목적이 있다.It is an object of the present invention to provide a collective light source measuring apparatus capable of quickly measuring luminous intensity.

또한, 본 발명은 집단 광원의 측정시에 발생하는 에지 현상을 방지할 수 있는 집단 광원 측정 장치를 제공함에 다른 목적이 있다.In addition, another object of the present invention is to provide an apparatus for measuring a collective light source capable of preventing an edge phenomenon occurring during measurement of the collective light source.

본원의 제1 발명에 따른 집단 광원 측정 장치는, LED 모듈 내 개별 LED와 동일한 위치에 동일한 형태 및 개수의 관통공을 형성하여 상기 개별 LED의 측벽을 포위하는 격자형 차광판; 상기 격자형 차광판의 관통공과 동일한 위치에 동일한 개수의 관통홀을 구비하여 상기 개별 LED로부터 발생하여 상기 격자형 차광판을 통과한 광이 측면으로 새나가지 않으면서 진행하게 하는 도광판; 상기 개별 LED로부터 발생한 광의 휘도를 저감시키는 분광 필터; 상기 분광 필터를 통과한 광 중에 포함된 적외선을 차단하는 적외선 차단 필터; 및 상기 개별 LED의 위치와 대응되는 위치에 복수의 광 센서가 배열되는 센서 모듈을 포함한다.The collective light source measuring device according to the first aspect of the present application includes a grid-shaped light shielding plate surrounding the sidewalls of the individual LEDs by forming the same shape and number of through holes at the same position as the individual LEDs in the LED module; A light guide plate having the same number of through holes at the same position as the through holes of the grid-shaped light shielding plate and allowing the light generated from the individual LEDs to pass through the grid-shaped light-shielding plate without leaking to the side; A spectral filter for reducing the luminance of light generated from the individual LEDs; An infrared cut filter for blocking infrared rays included in the light passing through the spectroscopic filter; And a sensor module in which a plurality of optical sensors are arranged at positions corresponding to positions of the individual LEDs.

바람직하게는, 상기 복수의 광 센서의 개수는 상기 개별 LED의 개수와 동일하고, 상기 복수의 광 센서는 상기 개별 LED의 휘도를 동시에 측정할 수 있다.Preferably, the number of the plurality of light sensors is equal to the number of the individual LEDs, and the plurality of light sensors may simultaneously measure the luminance of the individual LEDs.

바람직하게는, 상기 적외선 차단 필터는 상기 광 센서의 표면에 부착되는 것을 특징으로 한다.Preferably, the infrared cut filter is attached to the surface of the optical sensor.

또한, 본원의 제2 발명에 따른 집단 광원 측정 장치는, LED 모듈 - 상기 LED모듈의 전면에 분광 필터가 배치됨 - 을 거치하기 위한 LED 모듈 거치대; 상기 LED 모듈 거치대를 전후이동시키기 위한 받침대; 상기 받침대의 일측에 물리적으로 결합된 기둥; 복수의 광 센서 - 상기 광 센서의 표면에는 적외선 차단 필터가 부착됨 - 가 배열된 센서 모듈; 상기 센서 모듈을 거치하기 위한 센서 모듈 거치대; 및 상기 기둥에 연결되어 상기 센서 모듈 거치대를 안착시키기 위한 안착대를 포함한다.In addition, the collective light source measuring apparatus according to the second invention of the present invention, the LED module cradle for mounting the LED module-the spectroscopic filter is disposed in front of the LED module; Pedestal for moving back and forth the LED module cradle; A pillar physically coupled to one side of the pedestal; A sensor module arranged with a plurality of optical sensors, wherein an infrared cut filter is attached to a surface of the optical sensor; A sensor module holder for mounting the sensor module; And it is connected to the pillar includes a seat for mounting the sensor module holder.

바람직하게는, 상기 센서 모듈은 복수의 광 센서가 센서 모듈 PCB에 일렬로 배열되어 구성되며, 상기 광 센서는 센서 PCB에 고정 결합되며, 상기 센서 PCB는 상기 센서 모듈 PCB에 개별적으로 탈착 가능하다.Preferably, the sensor module is composed of a plurality of optical sensors are arranged in a line on the sensor module PCB, the optical sensor is fixedly coupled to the sensor PCB, the sensor PCB is detachable to the sensor module PCB individually.

바람직하게는, 상기 LED 모듈과 상기 센서 모듈 사이를 소정 거리만큼 이격시키고, 상기 LED 모듈의 일렬로 배열된 N개의 LED 마다 그리고 색상마다 순차 점등하여 휘도를 측정할 수 있다.Preferably, the LED module and the sensor module may be spaced apart by a predetermined distance, and the luminance may be measured by sequentially lighting the N LEDs arranged in a line of the LED module and the colors sequentially.

바람직하게는, 상기 LED 모듈과 상기 센서 모듈 사이에 차광판 및 도광판을 배치하고, 상기 LED 모듈의 일렬로 배열된 N개의 LED에 대하여 색상마다 순차 점등하여 휘도를 측정할 수 있다.Preferably, the light blocking plate and the light guide plate may be disposed between the LED module and the sensor module, and the luminance may be measured by sequentially lighting the N LEDs arranged in a line of the LED module for each color.

본 발명에 따르면, 하나의 광 센서가 한개의 LED 광도를 측정하므로 측정 속도를 고속화할 수 있고, 렌즈 방식의 측정시에 발생하는 에지 현상을 방지할 수 있다. 또한, 본 발명에 따르면, LED 램프를 사용하는 LED 모듈에서 지향각 보정을 위 하여 예컨대 5 내지 10도 하향 조정된 경우에도, 센서 모듈 거치대에 거치되는 센서 모듈을 5 내지 10도 기울여 장착함으로써 LED 램프의 휘도, 색도를 정확하게 측정할 수 있다. 이에 반해, 종래의 렌즈 방식에 따르면, 지향각 보정을 한 LED 램프가 배열된 LED 모듈의 휘도, 색도를 측정하는 것은 불가능하였다.According to the present invention, since one optical sensor measures one LED luminous intensity, it is possible to speed up the measurement speed and to prevent the edge phenomenon occurring during lens type measurement. In addition, according to the present invention, even if the LED module using the LED lamp is adjusted downward, for example, 5 to 10 degrees for the orientation angle correction, by mounting the sensor module mounted on the sensor module holder by tilting 5 to 10 degrees to the LED lamp The luminance and chromaticity of can be measured accurately. On the other hand, according to the conventional lens system, it was not possible to measure the luminance and chromaticity of the LED module in which the LED lamps with the corrected angle correction are arranged.

이하 첨부된 도면을 참조하여 본 발명의 바람직한 실시예를 상세히 설명하기로 한다. 이에 앞서, 본 명세서 및 청구범위에 사용된 용어나 단어는 통상적이거나 사전적인 의미로 한정해서 해석되어서는 아니되며, 발명자는 그 자신의 발명을 가장 최선의 방법으로 설명하기 위해 용어의 개념을 적절하게 정의할 수 있다는 원칙에 입각하여 본 발명의 기술적 사상에 부합하는 의미와 개념으로 해석되어야만 한다. 따라서, 본 명세서에 기재된 실시예와 도면에 도시된 구성은 본 발명의 가장 바람직한 일실시예에 불과할 뿐이고 본 발명의 기술적 사상을 모두 대변하는 것은 아니므로, 본 출원시점에 있어서 이들을 대체할 수 있는 다양한 균등물과 변형예들이 있을 수 있음을 이해하여야 한다.Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. Prior to this, terms or words used in the specification and claims should not be construed as having a conventional or dictionary meaning, and the inventors should properly explain the concept of terms in order to best explain their own invention. Based on the principle that can be defined, it should be interpreted as meaning and concept corresponding to the technical idea of the present invention. Therefore, the embodiments described in the specification and the drawings shown in the drawings are only one of the most preferred embodiments of the present invention and do not represent all of the technical idea of the present invention, various modifications that can be replaced at the time of the present application It should be understood that there may be equivalents and variations.

도 1은 본 발명의 일실시예에 따른 집단 광원 측정 시스템 단면도이고, 도 2는 본 발명의 일실시예에 따른 집단 광원 측정 시스템 분해 사시도이다.
도 2a는 본 발명의 일실시예에 따른 LED 모듈(110)이고, 도 2b는 본 발명의 일실시예에 따른 격자형 차광판(120)이며, 도 2c는 본 발명의 일실시예에 따른 도광판(130)이고, 도 2d는 본 발명의 일실시예에 따른 센서모듈(160)이다.1 is a cross-sectional view of a collective light source measuring system according to an embodiment of the present invention, and FIG. 2 is an exploded perspective view of the collective light source measuring system according to an embodiment of the present invention.
2A is an LED module 110 according to an embodiment of the present invention, FIG. 2B is a grid light blocking plate 120 according to an embodiment of the present invention, and FIG. 2C is a light guide plate according to an embodiment of the present invention. 130 is a sensor module 160 according to an embodiment of the present invention.

본 발명의 일실시예에 따른 집단 광원 측정 시스템은 LED 모듈(110), 격자형 차광판(120), 도광판(130), 분광 필터(140), 적외선 차단 필터(150), 및 센서 모듈(160)을 포함한다.The collective light source measuring system according to the exemplary embodiment of the present invention includes an LED module 110, a grid-shaped light blocking plate 120, a light guide plate 130, a spectral filter 140, an infrared cut filter 150, and a sensor module 160. It includes.

격자형 차광판(120)은 LED 모듈(110)내 개별 LED와 동일한 위치에 LED와 동일한 형태 및 개수의 관통공을 형성하여 LED 모듈(110) 내 개별 LED의 측벽을 둘러쌀 수 있고, 개별 LED로부터 발생하는 광이 서로 영향을 주지 않도록 한다.The grid-shaped light shield plate 120 may form the same shape and number of through holes as the LEDs at the same positions as the individual LEDs in the LED module 110 to surround sidewalls of the individual LEDs in the LED module 110, and from the individual LEDs. Make sure that the generated light does not affect each other.

도광판(130)은 격자형 차광판(120)의 관통공과 동일한 위치에 동일한 개수의 관통홀을 구비하여 LED로부터 발생하여 격자형 차광판(120)을 통과한 광이 센서에 도달하기까지 측면으로 새나가지 않도록 한다.The light guide plate 130 has the same number of through holes at the same position as the through holes of the grid-shaped light shielding plate 120 so that light generated from the LED and passing through the grid-shaped light shielding plate 120 does not leak to the side until reaching the sensor. do.

분광 필터(140)는 LED로부터 발생한 광 중 일부만을 통과시킴으로써 광의 휘도를 저감한다.The spectral filter 140 reduces the brightness of the light by passing only a part of the light generated from the LED.

적외선 차단 필터(150)는 분광 필터(140)를 통과한 광 중에 포함된 적외선을 차단한다. 여기서, 본 발명의 일실시예에 따르면, 적외선 차단 필터(150)는 센서 모듈(160) 내 개별 디지털 광 센서 표면에 각각 부착될 수 있다. 또한, 본 발명의 다른 실시예에 따르면, 도시되지는 않았지만, 적외선 차단 필터(150)는 하나의 시트 형태로 센서 모듈(160)의 표면에 배치될 수 있다.The infrared cut filter 150 blocks infrared rays included in the light passing through the spectral filter 140. Here, according to one embodiment of the present invention, the infrared cut filter 150 may be attached to the respective digital optical sensor surface in the sensor module 160, respectively. In addition, according to another embodiment of the present invention, although not shown, the infrared cut filter 150 may be disposed on the surface of the sensor module 160 in the form of a sheet.

센서 모듈(160)은 LED 모듈(110) 내 개별 LED의 위치와 대응되는 위치에 LED와 동일한 개수의 디지털 광 센서가 배열된다.The sensor module 160 has the same number of digital light sensors as the LEDs at positions corresponding to the positions of the individual LEDs in the LED module 110.

한편, 본 발명의 일실시예에 따른 집단 광원 측정 시스템은 색상 별 구동, 즉, 4회의 구동으로 LED 모듈(110) 내 전체 픽셀의 휘도를 측정할 수 있다. 구체적으로, LED 모듈(110) 내 전체 픽셀에 대하여 R 색상의 휘도를 측정하기 위한 전체 픽셀 내 R LED의 구동, G 색상의 휘도를 측정하기 위한 전체 픽셀 내 G LED의 구동, B 색상의 휘도를 측정하기 위한 전체 픽셀 내 B LED의 구동, W 색상의 휘도를 측정하기 위한 전체 픽셀 내 RGB LED의 구동을 수행한다. On the other hand, the collective light source measurement system according to an embodiment of the present invention can measure the luminance of all pixels in the LED module 110 by four color driving, that is, four driving. Specifically, the driving of the R LED in all the pixels to measure the luminance of the R color for all the pixels in the LED module 110, the driving of the G LED in all the pixels to measure the luminance of the G color, the luminance of the B color The driving of the B LEDs in the entire pixels for measurement and the driving of the RGB LEDs in the entire pixels for measuring the luminance of the W color are performed.

도 3은 본 발명의 다른 실시예에 따른 집단 광원 측정 시스템 사시도이고, 도 4는 본 발명의 다른 실시예에 따른 센서 모듈(360)의 세부 구성도이다. 3 is a perspective view of a collective light source measuring system according to another exemplary embodiment of the present invention, and FIG. 4 is a detailed configuration diagram of the sensor module 360 according to another exemplary embodiment of the present disclosure.

본 발명의 다른 실시예에 따른 집단 광원 측정 시스템은, LED 모듈(110), LED 모듈을 거치하기 위한 LED 모듈 거치대(310), LED 모듈 거치대(310)를 X축 방향으로 전후이동시키기 위한 받침대(320), 받침대(320)에 물리적으로 결합된 복수의 기둥(330), 적어도 하나 이상의 광 센서가 배열된 센서 모듈(360), 센서 모듈(360)을 거치하기 위한 센서 모듈 거치대(350), 및 받침대(320)의 일측에 마련된 복수의 기둥 사이에 연결되어 센서 모듈 거치대(350)를 안착시키기 위한 안착대(340)를 포함한다.Group light source measuring system according to another embodiment of the present invention, the LED module 110, the LED module holder 310 for mounting the LED module, the pedestal for moving back and forth in the X-axis direction (310) 320, a plurality of pillars 330 physically coupled to the pedestal 320, a sensor module 360 having at least one optical sensor arranged thereon, a sensor module holder 350 for mounting the sensor module 360, and It is connected between a plurality of pillars provided on one side of the pedestal 320 includes a seat 340 for seating the sensor module holder (350).

그리고, LED 모듈(110)의 개별 LED에 구동 신호를 제공하기 위한 구동선로(371), 광 센서로부터 검출신호를 출력하기 위한 검출선로(373), 및 구동 신호를 제공하고 검출신호를 수신하여 LED의 휘도를 계산하기 위한 계산부(370)를 포함한다.Then, the drive line 371 for providing a drive signal to the individual LED of the LED module 110, the detection line 373 for outputting the detection signal from the optical sensor, and the drive signal and receives the detection signal to provide the LED The calculation unit 370 for calculating the luminance of the.

한편, 본 발명의 다른 실시예에 따른 센서 모듈(360)은 16개의 광 센서(412)가 센서 모듈 PCB(363)에 일렬로 배열되어 구성된다. 광 센서(412)는 개별적으로 센서 모듈 PCB(363)에 탈착 가능하도록 센서 PCB(410)에 고정 결합되며, 센서 PCB(410)의 고정 핀이 센서 모듈 PCB(363)의 홀(361)에 끼움 결합된다. 광 센서(412)에는 적외선 차단 필터가 부착되며, LED 모듈(110) 위로는 분광 필터가 배 치된다.Meanwhile, in the sensor module 360 according to another exemplary embodiment of the present invention, sixteen optical sensors 412 are arranged in a line on the sensor module PCB 363. The optical sensor 412 is fixedly coupled to the sensor PCB 410 so as to be detachably attached to the sensor module PCB 363, and a fixing pin of the sensor PCB 410 is fitted into the hole 361 of the sensor module PCB 363. Combined. An infrared cut filter is attached to the light sensor 412, and a spectroscopic filter is disposed on the LED module 110.

이상과 같이 구성된 본 발명의 다른 실시예에 따른 집단 광원 측정 시스템은 다음과 같이 동작한다.The collective light source measuring system according to another exemplary embodiment of the present invention configured as described above operates as follows.

즉, LED 모듈(110)과 센서 모듈(360)은 소정 거리만큼 이격된 채, LED 모듈(110)의 일렬로 배열된 16개의 LED에 대하여 R, G, B, W 색상별로 순차 점등한다. 이 때, 일실시예에 따르면, 16개의 LED에 대하여 R 색상을 순차 점등한 후, G 색상, B 색상, 및 W 색상을 순차 점등할 수 있다. 다른 실시예에 따르면, 1개의 LED에 대하여 R, G, B, W 색상을 순차적으로 모두 점등한 후, 다른 LED에 대하여 R, G, B, W 색상을 순차 점등할 수 있다. 일렬로 배열된 16개의 LED에 대한 휘도 측정이 완료되면, LED 모듈 거치대(310)가 X축 방향의 다음 열로 이동한다. 이 때, LED 모듈 내 LED의 휘도를 개별적으로 측정하므로 LED 모듈(110)과 센서 모듈(360) 사이에 별도의 차광판 혹은 도광판을 필요로 하지 않는다.That is, the LED module 110 and the sensor module 360 are sequentially turned on for each of the R, G, B, and W colors of the 16 LEDs arranged in a line of the LED module 110 while being spaced apart by a predetermined distance. At this time, according to one embodiment, the R color for the 16 LEDs are sequentially turned on, and then the G color, the B color, and the W color may be sequentially turned on. According to another exemplary embodiment, all of the R, G, B, and W colors may be sequentially turned on for one LED, and then the R, G, B, and W colors may be sequentially turned on for the other LEDs. When the luminance measurement for 16 LEDs arranged in a line is completed, the LED module holder 310 moves to the next column in the X-axis direction. At this time, since the brightness of the LED in the LED module is individually measured, there is no need for a separate light blocking plate or light guide plate between the LED module 110 and the sensor module 360.

또한, 본 발명의 또 다른 실시예에 따르면, 도시되지는 않았지만, 안착대(340)로부터 센서 모듈 거치대(350)를 하방으로 조정하여 LED 모듈(110)과 센서 모듈(360) 간의 간격을 줄이고, LED 모듈(110)과 센서 모듈(360) 사이에 차광판 및 도광판을 배치함으로써 열단위로 LED의 휘도를 측정할 수 있다. 예컨대, 16개의 LED에 대하여 동시에 R 색상을 측정하고, 이후 G 색상, B 색상, 및 W 색상을 순차적으로 점등할 수 있다. In addition, according to another embodiment of the present invention, although not shown, by adjusting the sensor module cradle 350 from the seat 340 to reduce the distance between the LED module 110 and the sensor module 360, By disposing the light blocking plate and the light guide plate between the LED module 110 and the sensor module 360, the luminance of the LED may be measured in units of columns. For example, R colors may be simultaneously measured for 16 LEDs, and then G colors, B colors, and W colors may be sequentially turned on.

한편, 본 발명에 따르면, 다수개의 광 센서를 사용하기 때문에 광 센서를 다음과 같은 방식으로 측정하여 보정할 필요가 있다. 즉, 표준광원을 측정한 후 일정 간격을 유지한 채 개별 센서의 값을 다음 식을 이용하여 계산한다.On the other hand, according to the present invention, since a plurality of optical sensors are used, it is necessary to measure and correct the optical sensors in the following manner. That is, after measuring the standard light source, the value of each sensor is calculated using the following equation while maintaining a constant interval.

광도=(센서측정값/표준광원센서측정값)*표준광원표준광도계측정값
여기서, 상기 표준광원 표준광도계 측정값이라 함은 표준광도계로 표준광원을 소정 간격 유지한 상태에서 측정한 값을 의미하며, 상기 표준광원 센서측정값이라 함은 표준광원을 상기 소정 간격과 동일하게 유지한 상태에서 측정한 값을 의미한다.Luminous intensity = (measured sensor value / standard light source sensor measured value) * standard light source standard photometer measured value
Here, the standard light source measured by the standard photometer means a value measured in a state where the standard light source is maintained at a predetermined interval with a standard photometer, and the standard light source sensor measured value is maintained at the same standard as the predetermined interval. It means the value measured in one state.

이상과 같이, 본 발명은 비록 한정된 실시예와 도면에 의해 설명되었으나, 본 발명은 이것에 의해 한정되지 않으며 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자에 의해 본 발명의 기술사상과 아래에 기재될 특허청구범위의 균등범위 내에서 다양한 수정 및 변형이 가능하다.As described above, although the present invention has been described by way of limited embodiments and drawings, the present invention is not limited thereto and is intended by those skilled in the art to which the present invention pertains. Various modifications and variations are possible within the scope of equivalents of the claims to be described.

도 1은 본 발명의 일실시예에 따른 집단 광원 측정 시스템 단면도,1 is a cross-sectional view of a collective light source measuring system according to an embodiment of the present invention;

도 2는 본 발명의 일실시예에 따른 집단 광원 측정 시스템 분해 사시도,2 is an exploded perspective view of a collective light source measuring system according to an embodiment of the present invention;

도 3은 본 발명의 다른 실시예에 따른 집단 광원 측정 시스템 사시도, 및3 is a perspective view of a collective light source measuring system according to another embodiment of the present invention, and

도 4는 본 발명의 다른 실시예에 따른 센서 모듈(360)의 세부 구성도.4 is a detailed configuration diagram of a sensor module 360 according to another embodiment of the present invention.

*도면의 주요 부분에 대한 간단한 설명** Brief description of the main parts of the drawing *

110: LED 모듈 120: 격자형 차광판110: LED module 120: grid shading plate

130: 도광판 140: 분광 필터130: light guide plate 140: spectral filter

150: 적외선 차단 필터 160: 센서 모듈150: infrared cut filter 160: sensor module

Claims (8)

LED 모듈 내 개별 LED와 동일한 위치에 동일한 형태 및 개수의 관통공을 형성하여 상기 개별 LED의 측벽을 포위하는 격자형 차광판;A lattice-shaped light shielding plate surrounding the sidewalls of the individual LEDs by forming the same shape and number of through holes at the same positions as the individual LEDs in the LED module; 상기 격자형 차광판의 관통공과 동일한 위치에 동일한 개수의 관통홀을 구비하여 상기 개별 LED로부터 발생하여 상기 격자형 차광판을 통과한 광이 측면으로 새나가지 않으면서 진행하게 하는 도광판;A light guide plate having the same number of through holes at the same position as the through holes of the grid-shaped light shielding plate and allowing the light generated from the individual LEDs to pass through the grid-shaped light-shielding plate without leaking to the side; 상기 개별 LED로부터 발생한 광의 휘도를 저감시키는 분광 필터;A spectral filter for reducing the luminance of light generated from the individual LEDs; 상기 분광 필터를 통과한 광 중에 포함된 적외선을 차단하는 적외선 차단 필터; 및 An infrared cut filter for blocking infrared rays included in the light passing through the spectroscopic filter; And 복수의 광 센서 - 상기 광 센서 각각은 상기 개별 LED의 위치와 대응되는 위치에 일대일로 배치됨 - 가 배열되는 센서 모듈을 포함하며, A plurality of optical sensors, each of the optical sensors disposed one-to-one at a position corresponding to the position of the individual LEDs; 상기 복수의 광 센서의 개수는 상기 개별 LED의 개수와 동일하고, 상기 복수의 광 센서는 상기 개별 LED의 휘도를 동시에 측정할 수 있는 것을 특징으로 하는 집단 광원 측정 장치.The number of the plurality of light sensors is the same as the number of the individual LED, the plurality of light sensors can collectively measure the brightness of the individual LED, characterized in that the collective light source measuring device. 삭제delete 제1항에 있어서,The method of claim 1, 상기 적외선 차단 필터는 상기 광 센서의 표면에 부착되는 것을 특징으로 하는 집단 광원 측정 장치.And said infrared cut filter is attached to a surface of said light sensor. 삭제delete 삭제delete 삭제delete 삭제delete 제1항 또는 제3항에 있어서,The method according to claim 1 or 3, 상기 복수의 광 센서의 광도는 다음의 수학식을 이용하여 계산되는 것을 특징으로 하는 집단 광원 측정 장치.The light intensity of the plurality of light sensors are calculated using the following equation. 광도=(센서측정값/표준광원센서측정값)*표준광원표준광도계측정값Luminous intensity = (measured sensor value / standard light source sensor measured value) * standard light source standard photometer measured value 여기서, 상기 표준광원 표준광도계 측정값이라 함은 표준광도계로 표준광원을 소정 간격 유지한 상태에서 측정한 값을 의미하며, 상기 표준광원 센서측정값이라 함은 표준광원을 상기 소정 간격과 동일하게 유지한 상태에서 측정한 값을 의미함 Here, the standard light source measured by the standard photometer means a value measured in a state where the standard light source is maintained at a predetermined interval with a standard photometer, and the standard light source sensor measured value is maintained at the same standard as the predetermined interval. Means the value measured in one state
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