KR100874851B1 - Two stage probe socket for camera module installed in a cellular phone - Google Patents

Abstract

A 2-stage probe socket for a camera module in a mobile phone is provided to connect a test probe to the camera module even when a lens of the camera module and a connector are directed to the same direction. A 2-stage probe socket(40) comprises the followings: a socket base(410) in which a camera module of a mobile phone is mounted on upper surface thereof; a socket cover(420) equipped with a plurality of first through-holes and plurality of second through-holes; an upper-side printed circuit board(430) including the first circuit pattern(432) and the second circuit pattern(434a) which are electrically connected with each other; and a lower printed circuit board(440) including the first probe pin which electrically connects the connector and the first circuit pattern, the second probe pin electrically connected to the second circuit pattern, and the third circuit pattern.

Description

Two-stage probe socket for camera module mounted on a mobile phone {TWO STAGE PROBE SOCKET FOR CAMERA MODULE INSTALLED IN A CELLULAR PHONE}

1A is an exemplary diagram schematically showing a camera module used in a conventional cellular phone.

1B is an exemplary view of a conventional mobile phone camera module in which the directions of the connector and the lens are opposite to each other.

2 is a conceptual diagram illustrating an operation of testing a conventional mobile phone camera module with a test probe in which the directions of the connector and the lens are opposite to each other.

3 is an exemplary view of a two-stage probe socket used for a mobile phone camera module in which the direction of the lens module and the direction of the connector are the same according to the present invention;

4A is a block diagram of a two-stage probe socket for a mobile phone camera module according to an embodiment of the present invention.

4B is a perspective view of a two-stage probe socket for a mobile phone camera module with the socket cover closed in accordance with the present invention.

 4C is a block diagram of a probe pin accommodated in a socket cover of a two-stage probe socket according to an embodiment of the present invention.

4D is an exemplary diagram showing an example of a lower printed circuit board of a two-stage probe socket according to an embodiment of the present invention.

5 is a cross-sectional view taken along line AA ′ of FIG. 4 showing an electrical wiring structure inside a two-stage probe socket according to the present invention;

※ Explanation of codes for main parts of drawing

10: mobile phone camera module 40: two-stage probe socket

110: lens module 120: sensor module

120 connector 410 socket base

420: socket cover 430: upper printed circuit board

440: lower printed circuit board 429: first probe pin

500a, 500b: second probe pin

The present invention relates to a probe socket used for assembling and testing a camera module used in a mobile phone, and more particularly, to a two-stage probe socket for a mobile phone camera module having the same direction of a lens and a connector.

The image sensor used in a mobile phone (for example, a camera phone) equipped with a conventional camera is a camera module using CMOS, and the camera module is composed of a sensor module and a lens module. Major camera module manufacturers make various assembly adjustments and tests during the manufacturing process to improve product yields. In this case, the automation equipment is introduced to improve the productivity of the product. The probe socket is a necessary component for the electrical test of the camera module. Due to the nature of the automation equipment, the sharing and modular design of equipment parts is very important, and there is a limit in developing standardized equipment and equipment modules corresponding to various camera modules. In particular, the equipment is standardized according to the shape or direction of the connector mounted on the camera module. Has difficulty in development.

Hereinafter, a conventional mobile phone camera module and a test probe will be described with reference to FIGS. 1A, 1B, and 2.

1 is an exemplary view of a camera module used in a conventional mobile phone.

As shown in FIG. 1A, the conventional mobile phone camera module 10 includes a lens module 110, a sensor module 120, and a circuit pattern 130 for probes on the bottom of the sensor module. The module 10 may further have a connector or a flexible substrate electrically connected to the probe circuit pattern 130.

1B shows a conventional mobile phone camera module equipped with a connector.

As shown in FIG. 1B, in the case of the mobile phone camera module 10 illustrated in the related art, the direction of the lens module 110 in which the field of view of the camera module 10 is formed and the electrical connection between the test probe and the like are made. The directions of the connectors 140 are opposite to each other. Therefore, a test probe such as an automated focusing device or the like can be easily connected to the connector 140 from the direction opposite to the direction of the lens module 110, so that it can be connected without disturbing the field of view formed by the lens module 110. Can be. As a result, it is not necessary to add a separate design change to the configuration of a normal probe socket.

Referring to FIG. 2, the conventional camera module 10 having the opposite direction of the lens module 10 and the direction of the connector 140 is tested with the test probe 240 of the auto focus equipment 260. The operation to be described in detail.

The auto focus equipment 260 is used to assemble and test the camera module. More specifically, the auto focus equipment 260 adjusts the optical distance between the lens module 110 and the sensor module 120 to obtain an optimal image. It is the equipment to find the assembly status that can be. As shown in FIG. 2, the auto focus equipment 260 includes a test probe 240 and a main PC 250 connected thereto. First, when the mobile phone camera module having the opposite direction of the lens and the direction of the connector as shown in FIG. 1B is placed on the test probe socket 230, the connector (not shown) on the opposite side of the lens module 110 and The test probe socket 230 is in an electrically connected state using pins. At this time, since the direction of the lens module 10 and the direction of the pins of the connector 140 are opposite to each other, the opposite side of the lens module 110, even if a separate configuration is not taken inside the test probe socket 230. From the connector 140 and the test probe socket 330 is connected. That is, as shown in FIG. 2, it can be seen that the electrical wiring structure 260 in the test probe socket 230 is very simple. Thereafter, the test probe 240 is driven up and down to electrically connect the lower side of the test probe socket 230 and the probe pin 270 of the test probe 240. The main computer 250 reads the image present in the test chart 220 while moving the lens module 110 up and down under the standard illumination 210, and then processes the image data generated by the sensor module 120 to optimize the image data. Find the point where the image is acquired.

As described above, when the direction of the lens module 110 such as the conventional camera module 10 shown in FIG. 1B and the direction of the connector 140 are opposite to each other, simple electrical wiring as shown in FIG. Through the test probe socket 230 having the structure 260, the mobile phone camera module 10 and the test probe 240 of the autofocus device 260 can be electrically connected easily.

However, when the direction of the lens module and the connector of the mobile phone camera module are directed in the same direction as shown in FIG. 1B, there is a problem in testing the mobile phone camera module with the auto focus device. That is, since the connector is facing the same direction as the lens module, when using a conventional test probe socket, the test probe of the auto focusing equipment should eventually be connected to the connector through the test probe socket in the same direction as the lens. The field of view formed by the lens module may be disturbed. Therefore, even when the direction of the lens module of the mobile phone camera and the direction of the connector are the same, in order to electrically connect the test probe of the auto focus device to the sensor module on the opposite side of the lens module, it is necessary to modify the configuration of the auto focus device. As a result, difficulties in developing standardized autofocus equipment have arisen.

Therefore, even when the direction of the camera lens module and the direction of the connector are opposite to each other, there is an increasing demand to develop a standardized autofocusing device by modifying only the configuration of the test probe socket instead of the configuration of the conventional autofocusing device. It became. That is, since the test probe socket can be easily attached to or detached from the camera module, the need to use the same autofocusing equipment has been increased by changing only the appropriate test probe socket according to the direction of the camera lens module and the direction of the connector. In particular, the need for developing a test probe socket that can be used when the direction of the camera lens module and the direction of the connector are different has increased.

An object of the present invention is a two-stage portable camera that can connect the test probe of the auto focus equipment to the camera module from the opposite direction of the camera lens, even if the lens and the connector of the camera module used in the mobile phone are facing the same direction To provide a probe socket.

Another object of the present invention is to test a mobile phone camera module using a conventional auto focus equipment without changing the configuration and design of the automated equipment equipped with a test probe, a portable camera that enables the development of standardized auto focus equipment It is to provide a two-stage probe socket.

In order to achieve the object of the present invention as described above, the present invention provides a two-stage probe socket for a mobile phone camera module that can easily connect the test probe to the mobile phone camera module with the same direction of the lens and the direction of the connector. to provide.

The two-stage probe socket for the mobile phone camera module includes a socket base on which the mobile phone camera module is mounted; A socket cover mounted on an upper surface of the socket base and having a plurality of first through holes and a plurality of second through holes; An upper printed circuit board mounted on an upper side of the socket cover and having a first circuit pattern and a second circuit pattern electrically connected to each other; A first probe pin accommodated in the first through hole and electrically connecting the connector of the camera to the first circuit pattern; A second probe pin received in the second through hole and electrically connected to the second circuit pattern; And a lower printed circuit board mounted on a lower side of the socket base and having a third circuit pattern electrically connected to the second probe pin on an opposite side of the side opposite to the socket base.

Preferably, the lower printed circuit board further includes a fourth circuit pattern and a fifth circuit pattern on a side opposite to the socket base, and the second probe pin is electrically connected to the fourth circuit pattern. A fourth circuit pattern is electrically connected to the fifth circuit pattern, and the fifth circuit pattern is electrically connected to the third circuit pattern.

Preferably, the socket base includes a through portion, the socket cover includes a protrusion provided with the plurality of second through holes, and the protrusion of the socket cover is fitted into and fixed to the through portion of the socket cover.

Preferably, the socket cover is installed on one side of the socket base can be opened and closed.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the present invention.

3 is an exemplary view illustrating a two-stage probe socket used in a mobile phone camera module having the same direction of a lens module and a connector according to the present invention. Hereinafter, the same components will be described with reference numerals used in FIGS. 1A and 1B. Use the same sign.

Referring to FIG. 3, the mobile phone camera module 30 mounted in the two-stage probe socket according to the present invention includes a lens module 110 and a sensor module 120 composed of a lens holder, a PCB, and a CMOS, and a sensor The module 120 is screwed into the lens module 110 by a female screw (not shown) inside the lens holder (not shown). In addition, a probe circuit pattern (not shown) is formed on the bottom surface of the sensor module 120 as shown in FIG. 1A. In addition, as shown in FIG. 3, the connector 140 may be additionally attached to the camera module 30. The connector 140 used in the mobile phone camera module 30 of the present invention has, for example, two rows of pin patterns having ten pins per row, with a pitch between the pins being 0.4 pitch. Meanwhile, in the conventional mobile phone camera module 10, the direction of the lens module 110 and the direction of the connector 140 are opposite to each other as shown in FIG. 1B, while the camera module 30 used in the present invention is As shown in FIG. 3, the direction in which the lens module 110 faces and the direction in which the pins of the connector 140 face are the same.

Hereinafter, a two-stage probe socket for a mobile phone camera module according to an embodiment of the present invention will be described in detail with reference to FIGS. 4A to 4D.

4A is a configuration diagram of a two-stage probe socket for a mobile phone camera module according to an embodiment of the present invention.

As shown in FIG. 4A, the two-stage probe socket 40 for a mobile phone camera module according to an embodiment of the present invention includes a socket base 410, a socket cover 420, an upper printed circuit board 430, and a lower printing. It includes a circuit board 440 and has a two-stage configuration of the socket base 410 and the socket cover 420.

The socket base 410 has a recess 414 on which the mobile phone camera module 30 is mounted, a penetrating portion 412a and a penetrating portion 412b, and a hinge portion 416. According to the two-stage probe socket 40 of the present invention, the mobile phone camera module 30 mounted on the socket base 410 has the same direction as the lens module 110 and the connector 140 as shown in FIG. 3. Module. The recessed part 414 is located in the center of the socket base 410, and is attached to this recessed part 414 so that the direction of the lens module 110 and the direction of the connector 140 face the socket cover. The penetrating portion 412a and the penetrating portion 412b are symmetrically positioned at both sides of the area where the connector 140 of the mobile phone camera module 30 is located when the mobile phone camera module 30 is mounted to the recess 414. do. In addition, one side of the socket cover 420 further includes a hinge portion 416 for allowing the socket cover 420 to be described below to be rotatable.

The socket cover 420 is provided with a plurality of first through holes 426 in an area corresponding to an area where the connector 140 is located, and protrudes symmetrically on both sides of an area where the plurality of first through holes are located. 422a) and protrusion 422b. The height of the protrusion 422a and the protrusion 422b is configured to be equal to the height of the socket base 410.

In addition, the protrusion 422a and the protrusion 422b each have a plurality of second through holes 424a and second through holes 424b. At this time, the first through hole 426 and the second through holes 424a and 424b have the same pattern as the pin pattern of the connector. Preferably, the socket cover 420 is installed on one side of the socket base 410 is coupled to the hinge portion 416 of the socket base 410 to be rotatable and open. At this time, when the socket cover 420 is closed on the upper side of the socket base 410, the protrusion 422a and the protrusion 422b of the socket cover 420 are respectively the through portion 412a of the socket base 410 and It is fitted to the through part 412b and fixed. The socket cover 428 also has the same opening 428 as the lens module shape. When the socket cover 420 is closed on the upper surface of the socket base 410, the lens module 110 forms a field of view through the opening 428 to read an image. This will be described with reference to FIG. 4B.

4B is a perspective view of a two-stage probe socket for a mobile phone camera module with the socket cover closed in accordance with the present invention.

Since the socket base 410 and the socket cover 420 are connected to each other through the hinge portion 416, the socket cover 410 can be opened and closed. As shown in FIG. 4B, when the socket cover 420 is rotated and closed through the hinge portion 416, the lens module 110 may read an image through the opening 428 in the shape of the lens module 110. . A rectangular concave portion 436 is provided on an upper side of the socket cover, and the concave portion 436 is equipped with an upper printed circuit board to be described below. As described above, the two-stage probe socket for a mobile phone camera according to the present invention has a two-stage configuration in which the socket cover 420 is additionally mounted on the socket base 410. On the other hand, the internal structure of the socket cover 420 will be described in detail later with reference to Figure 4c.

 4C illustrates a configuration of a probe pin accommodated in a socket cover of a probe socket according to an embodiment of the present invention.

Referring to FIG. 4C, the socket cover 420 is a spring connecting the body 510 of the socket cover, the upper plate 520 of the socket cover, and the upper plate 520 of the socket cover body 510 and the socket cover. It includes.

When pressure is applied to the upper plate 520 of the socket cover by the upper printed circuit board 430, the first probe pin 429 and the second through hole 424a accommodated in the first through hole 426. The second probe pin 500a and the second probe pin 500b accommodated in the second through hole 424b are extruded to the outside of the socket cover, so that each of the first and second probe pins 500a and 500b And are electrically connected to the circuit pattern 432, the second circuit pattern 434a, and the second circuit pattern 434b, respectively.

Referring again to FIG. 4A, the upper printed circuit board 430 includes a first circuit pattern 432 in a central region corresponding to the first through hole 426, and each of both sides of the first circuit pattern 432 is provided on the upper printed circuit board 430. A second circuit pattern 434a and a second circuit pattern 434b are provided. In one embodiment of the present invention, the upper printed circuit board 420 has a rectangular shape. The second circuit pattern 434a and the second circuit pattern 434b of the upper printed circuit board 430 are respectively symmetrically and electrically connected to the first circuit pattern. Similar to the first through holes 426 and the second through holes 424a and 424b, the first circuit pattern 432 and the second circuit patterns 434a and 434b are the same as the circuit pattern of the connector 140. Therefore, when the upper printed circuit board 430 is mounted in the recessed portion 436 formed on the upper surface of the socket cover 420 as shown in FIG. 4B, the first circuit pattern 432 has the first through hole 426. ), And each of the second circuit pattern 434a and the second circuit pattern 434b is positioned coincident with the second through hole 424a and the second through hole 424b.

4D illustrates an example of a lower printed circuit board of a two-stage probe socket according to an embodiment of the present invention.

4A and 4D, the lower printed circuit board 440 is mounted on the lower side of the socket base 410, and the third circuit pattern 444, the fourth circuit pattern 442a and the fourth circuit pattern ( 442b) and a fifth circuit pattern 446.

The third circuit pattern 444 is formed in a square shape at the center portion of the lower printed circuit board 440 opposite to the surface on which the lower printed circuit board 440 is in contact with the socket base 410, and becomes a circuit pattern to which the test probe contacts.

The fourth circuit pattern 442a and the fourth circuit pattern 442b are symmetrically positioned at both ends of the end surface of the lower printed circuit board 440 in contact with the socket base 410, and the pin pattern of the connector 140. Have the same pattern. When the socket cover 420 rotates to cover the socket base 410, the protrusion 422a and the protrusion 422b of the socket cover 420 are respectively the through portion 412a and the through portion 412b of the socket base 410. The heights of the protrusions 422a and 422b are the same as the thickness of the socket base 410 so that the protrusions 422a and 422b have a lower side (i.e., the socket base 410 has a lower print height). The surface in contact with the substrate 440). At this time, the fourth circuit pattern 442a and the fourth circuit pattern 442b of the lower printed circuit board 440 are respectively formed in the second through hole formed in the protrusion 422a and the protrusion 422b of the socket cover 420, respectively. Correspond to and correspond to 424a and the second through hole 424b.

The fifth circuit pattern 446 is positioned at the center of the surface in contact with the socket base 410 and has a square shape. Preferably, the square shape of the third circuit pattern 444 is about twice as large as the square shape of the fifth circuit pattern 446. The fourth circuit pattern 442a and the fourth circuit pattern 442b described above are electrically connected to the fifth circuit pattern. At this time, since the fourth circuit pattern 442a and the fourth circuit pattern 442b each have two columns of circuit patterns, each column corresponds to each side of the fifth circuit pattern 446 having a square shape. Is electrically connected to the In addition, a circuit pattern corresponding to each side of the fifth circuit pattern 446 is electrically connected corresponding to each side of the third circuit pattern 444, and the test probe finally contacts the third circuit pattern 444. Is electrically connected to the

5 is a cross-sectional view taken along the line A-A 'of FIG. 4A showing the electrical wiring structure inside the two-stage probe socket according to the present invention.

4A and 5, a first propine 429 is received in the first through hole 426, one end of which is electrically connected to the connector 140, and the other end of which is connected to the first circuit. Is electrically connected to the pattern 432. In addition, the second probe pin 500a is accommodated in the second through hole 424a to electrically connect the second circuit pattern 432a and the fourth circuit pattern 442a of the lower printed circuit board 440. In the same manner, the second probe pin 500b is accommodated in the second through hole 424b to electrically connect the second circuit pattern 432b and the fourth circuit pattern 442b of the lower printed circuit board 440. do. Further, a test probe (not shown) is connected to the lower printed arc substrate 440.

That is, as shown in FIG. 5, the pin of the connector 140 is connected to the first circuit pattern 432 of the socket cover 420 through the first probe pin 429, and the first circuit pattern 429. Is symmetrically and electrically connected to the second circuit pattern 432a and the second circuit pattern 432b, respectively. Thereafter, the second circuit pattern 432a and the second circuit pattern 432b are mounted on the bottom surface of the camera module 10 through the second probe pin 500a and the second probe pin 500b, respectively. The lower printed circuit board 440 is connected to a test probe (not shown). That is, when the two-stage probe socket 40 according to the present invention is used for the camera module 10 having the same direction as that of the camera lens module 110 and the connector 140 as shown in FIG. 3, the connector Electrical wiring starting from the pins of 140 is finally electrically connected to the lower printed circuit board 440 located below the camera connector 140. Accordingly, as shown in FIG. 2, it is possible to electrically connect the test probe to the camera module at the side opposite to the lens direction of the camera module in the same manner as in the usual case where the directions of the camera lens module and the connector are opposite to each other. Do. As a result, the two-stage probe socket according to the present invention makes it possible to easily connect the test probe and the camera module without changing the structure of the auto focus device including the test probe even when the direction of the camera lens and the connector are the same. .

The foregoing description of the disclosed embodiments is provided to enable any person skilled in the art to make use of the invention. Many variations of these embodiments will be apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Accordingly, the invention is not limited to the embodiments disclosed herein, and the invention is given the broadest scope consistent with the principles and novel features disclosed herein.

By using the portable camera two-stage pross socket of the present invention, even when the lens and the connector of the camera module used in the mobile phone are facing the same direction, it does not obstruct the view of the lens, it is automatically from the opposite direction of the camera lens The test probe of the focusing instrument can be connected to the camera module.

In addition, by using the portable camera two-stage probe socket of the present invention, it is possible to test a mobile phone camera module using a conventional autofocus equipment without changing the configuration and design of the automation equipment equipped with a test probe, the standardized autofocus Enable the development of equipment.

Claims (9)

In the two-stage probe socket for a mobile phone camera module having a lens and a connector in the same direction, A socket base on which the mobile phone camera module is mounted; A socket cover mounted on an upper surface of the socket base and having a plurality of first through holes and a plurality of second through holes; An upper printed circuit board mounted on an upper side of the socket cover and having a first circuit pattern and a second circuit pattern electrically connected to each other; A first probe pin accommodated in the first through hole to electrically connect the connector to the first circuit pattern; A second probe pin received in the second through hole and electrically connected to the second circuit pattern; And A lower printed circuit board mounted on a lower side of the socket base, the lower printed circuit board having a third circuit pattern electrically connecting the second probe pin and the test probe to an opposite side of the side opposite to the socket base; Probe socket only. The method of claim 1, The lower printed circuit board further includes a fourth circuit pattern and a fifth circuit pattern on a side facing the socket base. The second probe pin is electrically connected to the fourth circuit pattern, the fourth circuit pattern is electrically connected to the fifth circuit pattern, and the fifth circuit pattern is electrically connected to the third circuit pattern. , 2-stage probe socket. The method according to claim 1 or 2, The socket base includes a through portion, The socket cover includes a protrusion provided with the plurality of second through holes, And a protrusion of the socket cover is fitted into and fixed to a through portion of the socket base.  The method of claim 3, wherein The through parts of the socket base are symmetrically located at both sides of the connector, respectively. The protrusions of the socket cover are symmetrically located at both sides of an area in which the first through hole is located corresponding to the through part. The second circuit pattern is located symmetrically on both sides of the first circuit pattern corresponding to the protrusion, The fourth circuit pattern is symmetrically located on both sides of the side surface opposite to the socket base corresponding to the through part, The second probe pin, the second circuit pattern, and the fourth circuit pattern are respectively connected, the two-stage probe socket. The method of claim 2, And the third circuit pattern and the fifth circuit pattern have the same shape, and the third circuit pattern has a larger shape than the fifth circuit pattern. The method of claim 5, wherein And the third circuit pattern and the fifth circuit pattern have a square shape. The method according to claim 1 or 2, When pressure is applied to the socket cover by the upper printed circuit board, the first probe pin and the second probe pin are extruded out of the socket cover to correspond to the first and second circuit patterns of the upper printed circuit board. Two-stage probe sockets, each electrically connected to a circuit pattern. The method according to claim 1 or 2, The socket cover is installed on one side of the socket base, two stage probe socket capable of opening and closing. The method according to claim 1 or 2, And the area in which the camera module is mounted is a recess shape.

Images