KR100852093B1 - 오차를 최소화하는 선형광 형상검출 시스템 및 방법 - Google Patents
오차를 최소화하는 선형광 형상검출 시스템 및 방법 Download PDFInfo
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- KR100852093B1 KR100852093B1 KR1020050076801A KR20050076801A KR100852093B1 KR 100852093 B1 KR100852093 B1 KR 100852093B1 KR 1020050076801 A KR1020050076801 A KR 1020050076801A KR 20050076801 A KR20050076801 A KR 20050076801A KR 100852093 B1 KR100852093 B1 KR 100852093B1
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- South Korea
- Prior art keywords
- correction
- image
- light source
- linear light
- point
- Prior art date
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- 238000000034 method Methods 0.000 title claims abstract description 45
- 238000012937 correction Methods 0.000 claims abstract description 79
- 238000001514 detection method Methods 0.000 claims abstract description 23
- 230000003287 optical effect Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000009466 transformation Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 241000143945 Pontia protodice Species 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0181—Memory or computer-assisted visual determination
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Geometry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (6)
- 선형광원과 카메라를 이용하는 형상검출에 있어서, 보정판(5)에 일정한 간격이면서 두 열로 분포된 보정점(6)의 영상을 얻고, 보정점의 두 열의 중심의 임의의 위치에 선형광(8)을 투사하고, 보정점의 실제좌표를 알고 있을 때, 선형광원의 중심에 해당하는 기준광점(14)의 영상좌표를 계산하고, 주위의 2개 이상의 보정점의 영상좌표와 실제좌표를 이용하여, 기준광점의 실제좌표를 계산하여, 기준광점의 영상좌표와 실제좌표로 이루어진 보정파일(11)을 생성하는 보정 방법.
- 제 1항에 있어서 기준광점의 영상좌표와 실제좌표를 계산하기 위해, 기준광점(14)의 주위의 좌우편의 가장 근접한 보정점 2개로 이루어진 4개의 보정점을 선택하고, 4개의 보정점의 영상좌표를 실제좌표로 원근변형(perspective warping)하고, 그로부터 기준광점(14)의 실제좌표를 계산해내는 보정 방법.
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050076801A KR100852093B1 (ko) | 2005-08-22 | 2005-08-22 | 오차를 최소화하는 선형광 형상검출 시스템 및 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050076801A KR100852093B1 (ko) | 2005-08-22 | 2005-08-22 | 오차를 최소화하는 선형광 형상검출 시스템 및 방법 |
Publications (2)
Publication Number | Publication Date |
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KR20070022514A KR20070022514A (ko) | 2007-02-27 |
KR100852093B1 true KR100852093B1 (ko) | 2008-08-13 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020050076801A KR100852093B1 (ko) | 2005-08-22 | 2005-08-22 | 오차를 최소화하는 선형광 형상검출 시스템 및 방법 |
Country Status (1)
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KR (1) | KR100852093B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20210088364A (ko) * | 2020-01-06 | 2021-07-14 | 효성중공업 주식회사 | 전동기 공극 평가 장치 및 방법 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113379837B (zh) * | 2021-06-30 | 2024-09-10 | 深圳中科飞测科技股份有限公司 | 检测设备的角度校正方法、设备及计算机可读存储介质 |
CN116423084B (zh) * | 2023-06-02 | 2023-09-15 | 武汉船舶职业技术学院 | 无需附加设备的2d振镜自动校正方法及系统 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6542249B1 (en) * | 1999-07-20 | 2003-04-01 | The University Of Western Ontario | Three-dimensional measurement method and apparatus |
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- 2005-08-22 KR KR1020050076801A patent/KR100852093B1/ko not_active IP Right Cessation
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6542249B1 (en) * | 1999-07-20 | 2003-04-01 | The University Of Western Ontario | Three-dimensional measurement method and apparatus |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20210088364A (ko) * | 2020-01-06 | 2021-07-14 | 효성중공업 주식회사 | 전동기 공극 평가 장치 및 방법 |
KR102416992B1 (ko) * | 2020-01-06 | 2022-07-05 | 효성중공업 주식회사 | 전동기 공극 평가 장치 및 방법 |
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KR20070022514A (ko) | 2007-02-27 |
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