KR100662786B1 - Apparatus for grinding protrusion in color filter layer - Google Patents

Abstract

The present invention is to remove the defective projections generated in the color filter layer by the foreign matter, the projection polishing device of the color filter layer according to the present invention is a detection means for detecting the characteristics of the foreign matter to be generated projections on the color filter layer, and the detection means And polishing means for polishing the projections of the color filter layer after determining the degree of polishing in accordance with the characteristics of the foreign matter detected by the.

Color filter, foreign substance, defective projection, property detection, polishing

Description

Color filter layer projection polishing machine {APPARATUS FOR GRINDING PROTRUSION IN COLOR FILTER LAYER}

1 is a cross-sectional view showing the structure of a liquid crystal display element.

Fig. 2 is a diagram showing defective projections occurring in the color filter layer.

Figure 3 is a view showing a foreign material characteristic detector of the defective projection polishing apparatus according to the present invention.

4 is a view showing a bad protrusion polishing machine according to the present invention.

* Explanation of symbols for main parts of the drawings

130: substrate 134: color filter layer

138: foreign matter 139: defective projection

150: foreign matter detector 154: detect

170: grinding machine 174: polishing tape

176: support

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a projection polishing apparatus of a color filter layer. In particular, the degree of polishing of defective projections according to the components of the foreign substances is detected by detecting an electrical component of the foreign matter that is the cause of the defective projections formed on the color filter layer of the display device such as a liquid crystal display device. The present invention relates to a projection polishing apparatus of a color filter layer, which can be quickly polished and prevent a defect from occurring in a display element.

Recently, with the development of various portable electronic devices such as mobile phones, PDAs, and notebook computers, there is an increasing demand for flat panel display devices for light and thin applications. Such flat panel displays are being actively researched, such as LCD (Liquid Crystal Display), PDP (Plasma Display Panel), FED (Field Emission Display), VFD (Vacuum Fluorescent Display), but mass production technology, ease of driving means, Liquid crystal display devices (LCDs) are in the spotlight for reasons of implementation.

The liquid crystal display device is a transmissive display device. Therefore, a back light is mounted on the rear surface of the liquid crystal panel, and the light emitted from the backlight passes through the liquid crystal layer to implement an image on the display device. In addition, the liquid crystal display device is a display device using light polarization properties. The liquid crystal molecules are operated by the electric field, and only the light of the polarization component in the same direction as the liquid crystal molecules is allowed to pass through the liquid crystal panel. The liquid crystal display may be divided into several methods depending on the method of driving the liquid crystal molecules, but nowadays, thin film transistors are mainly used in view of fast reaction speed and low afterimage.

1 is a diagram showing the structure of a conventional thin film transistor liquid crystal display device. The structure shown in the drawing represents only one liquid crystal cell 1 of the liquid crystal display element, and the liquid crystal display element is formed by gathering a plurality of such liquid crystal cells 1. As shown in the figure, the liquid crystal cell 1 is composed of a thin film transistor substrate on which a thin film transistor is formed and a color filter substrate on which a color filter layer is formed, and liquid crystal is injected between the liquid crystal layer 40. It is completed by forming.

The thin film transistor substrate includes a gate electrode 13 formed on the first substrate 10 made of transparent glass, a gate insulating layer 11 stacked over the entire first substrate 10 on which the gate electrode 13 is formed, and The semiconductor layer 15 formed on the gate insulating layer 11, the source electrode 16 and the drain electrode 17 formed on the semiconductor layer 15, and the drain electrode 17 are electrically connected to each other. When the 15 is activated, the pixel electrode 20 includes a pixel electrode 20 through which a signal is input through the source electrode 16 and the drain electrode 17, and a protective layer 22 formed over the entire first substrate 10.

In addition, the color filter substrate is formed on the transparent first substrate 30 to prevent light from being transmitted to the non-display area (TFT forming area, gate line area, and data line area) of the liquid crystal cell 1. ), A color filter layer 34 formed in the image display area of the liquid crystal cell 1 to realize actual colors, and a signal applied to the liquid crystal cell 1 formed over the second substrate 30. A voltage is applied between the pixel electrode 20 and the common electrode 36 to operate the liquid crystal molecules.

Although not shown in the drawing, the TFT substrate and the color filter substrate are each coated with an alignment film for aligning the liquid crystal molecules, and outside the light that is emitted from a backlight (not shown) and passes through the liquid crystal layer 40. Polarizing plates for polarizing are attached to each other.

As shown in the drawing, the color filter layer 34 is formed to partially overlap the black matrix 32, and the common electrode 36 made of a transparent metal such as indium tin oxide (ITO) is formed of the color filter layer 34. It is formed on the black matrix 32.

Although not shown in the figure, the color filter layer 34 typically includes pixels having R, G, and B pigments.

The color filter layer 34 may be manufactured by various methods. For example, dyeing, printing, and pigment dispersion methods are methods used to fabricate such a color filter layer 34. In the method of forming the color filter layer 34, three steps are required to form a layer having a dye of R, G, and B, that is, an R, G, B color filter layer. That is, the R color filter layer forming process is performed to form an R color filter layer, followed by the G color filter layer forming process and the B color filter forming process, respectively. Therefore, when foreign matter occurs during the previous color filter layer forming process, the foreign matter affects the color filter layer formed by the current process. In particular, since the dyeing method and the pigment dispersion method are formed by a photolithography process using a photoresist, when the process is performed three times, as shown in FIG. The defective protrusion 38 is generated in the filter layer 34.

The defective projections 38 caused by these residues (foreign materials) are a major reason for forming projections on the alignment film when the alignment film (not shown) is formed thereon. Therefore, when the alignment layer is oriented by a process such as rubbing, an alignment misalignment region is generated around the protrusion due to the protrusion, which causes a liquid crystal display element defect such as light leakage phenomenon.

SUMMARY OF THE INVENTION The present invention has been made in view of the above, and an object thereof is to provide a projection characteristic detection device of a color filter layer capable of detecting the characteristic of foreign matter forming projections on the color filter layer.

Another object of the present invention is to provide a projection polishing device of a color capture layer, which enables the rapid and complete polishing of projections by determining the degree of polishing depending on the characteristics of the foreign matter using the property detection apparatus.

In order to achieve the above object, the projection characteristic detection apparatus according to the present invention comprises a main body and a probe installed in the lower portion of the main body and in contact with the foreign matter of the color filter layer, the voltage is applied to the probe flows through the foreign matter It is characterized by detecting the characteristics of the foreign matter by sensing the current.

In addition, the projection polishing device of the color filter layer according to the present invention is a detection means for detecting the characteristics of the foreign matter to generate a projection on the color filter layer, and after determining the degree of polishing according to the characteristics of the foreign matter detected by the detection means of the color filter layer It consists of grinding means for grinding the projections.

The detecting means may include a main body and a probe installed under the main body to detect electrical characteristics of the color filter layer in contact with the foreign matter. The polishing means may include a polishing tape and a polishing tape for polishing the protrusions in contact with the protrusions. It consists of a support in contact with the projection.

At this time, the polishing tape is made of Teflon and aluminum oxide, the polishing degree of the projection is determined by the roughness of the polishing tape, the traveling speed of the polishing tape and the contact pressure of the polishing tape and the projection.

The present invention provides a projection polishing device that can prevent the occurrence of defects in the liquid crystal display by removing the defects generated in the color filter layer. In general, the defective projection formed on the color filter layer is not only formed by foreign matters generated during the process, but also by foreign matters penetrating from the outside during the process. Therefore, the foreign matters include not only organic foreign matters such as photoresist but also metallic foreign matters generated in the liquid crystal display device manufacturing equipment during the process and penetrated into the color filter layer.

In order to remove the defective projections caused by foreign matter, the defective projections must be polished with a polishing machine. Polishing is not only performed on the protruding color filter layer, but also on foreign matters that cause defect projections. However, since the organic foreign matter and the metallic foreign matter have different strengths, when the polishing is performed to the same degree (for example, the polishing is performed at the degree of polishing of the defective projections caused by the organic foreign matter), the metallic foreign matter remains unpolished.

In the present invention, by examining the electrical properties of the foreign matter causing the defective projections to determine whether the foreign matter is an organic foreign matter or metallic foreign matter, according to this determination to polish the defective projections by varying the degree of polishing of the polishing machine can be quickly polished It is possible to prevent the defect of the display element caused by the polished defect protrusion.

Hereinafter, with reference to the accompanying drawings will be described in detail with respect to the defective projection polishing apparatus of the color filter layer according to the present invention.

First, FIG. 3A is a diagram illustrating detecting electrical characteristics of a foreign substance of the color filter layer using the foreign substance characteristic detector 150 of the defective protrusion. As shown in FIG. 3A, the characteristic detector 150 includes a main body 152 and a probe 154 installed on a lower surface of the main body 152. The probe 154 is an electrode made of a conductive material, and an anode and a cathode are alternately arranged as shown in 3b. The detector 150 is inserted into the depth of the color filter layer 134 from the region where the defective protrusion 139 is formed (that is, the region where the foreign matter exists) so that the foreign matter 138 contacts the probe 154. When a voltage is applied to the probe 154 in the state, the current is not detected because the organic foreign matter 138 does not flow through the foreign matter 138. On the other hand, in the case of the metallic foreign material 138, the current is detected because the current flows through the foreign material 138.

As described above, the characteristic detector 150 detects the characteristic of the defective protrusion 139 of the color filter layer 134, and polishes the defective protrusion of the color filter layer 134 with a polishing machine based on the detected characteristic.

4 shows a defective protrusion polishing machine 170 according to the present invention. As shown in the drawing, the defective projection polishing machine 170 is maintained taut by the plurality of rolls 171 and 172 and the rolls 171 and 172 to contact the defective projections 139 of the color filter layer 134 and the roll ( As the 171 and 172 rotate, the polishing tape 174 for polishing the defective protrusion 139 and the support 176 for contacting the polishing tape 174 with the defective protrusion 139 of the color filter layer 134. It is composed. The polishing tape 174 can be made of any material as long as the defective protrusion 139 can be removed. However, in the present invention, the polishing tape 174 is mainly used by adding aluminum oxide to fluorine resin (ie, Teflon). do.

In the defective projection polishing machine 174, when the defective projection 139 occurs in the color filter layer 134, the support part 176 descends to contact the polishing tape 174 with the defective projection 139. In this state, when the polishing tape 174 proceeds by the rotation of the rolls 171 and 172, the defective protrusion 139 is polished and removed by the friction between the polishing tape 174 and the defective protrusion 139.

In this case, the degree of polishing of the defective protrusion 139 is determined by the roughness of the polishing tape 174, the traveling speed of the polishing tape 174, and the contact pressure between the polishing tape 174 and the defective protrusion 139 by the support part 176. Is determined.

In order to remove the defective protrusion 139, only the protrusion 139 of the color filter layer 134 formed by the foreign matter 138 should not be removed, and the foreign matter 138 must also be polished. In the present invention, the characteristic detector 150 detects the characteristics of the foreign matter 138 causing the defective projection 139 of the color filter layer 134, and determines whether the foreign matter 138 is organic or metallic, and then polishes ( 170 to polish the defective projections (139).

That is, when the foreign matter 138 is detected as metallic, the polishing tape 174 having a higher roughness is used or the speed of traveling of the polishing tape 174 is increased when the defective protrusion 139 is polished by the organic foreign matter. Alternatively, polishing may be performed by raising the contact pressure of the defective protrusion 139 of the polishing tape 174 to quickly and completely remove the defective protrusion 139.

On the other hand, the electrical characteristics of the foreign matter 138 detected by the characteristic detector 150 is notified to the operator and the operator based on the polishing mode of the polishing machine 170 (that is, the polishing mode of the organic defective projections and the polishing of the metal defective projections) Mode) may be manually selected, but the detected electrical characteristics may be transferred to the polishing machine 170 to automatically select the polishing mode.

The defective projection polishing device of the color filter layer may be applied to all kinds of display elements in which the color filter layer is formed.

As described above, in the present invention, since the type of the foreign matter causing the defective projection of the color filter layer is detected and the defective projection is polished according to the type, the defective projection can be removed quickly and the liquid crystal display device by the polishing of the incomplete defective projection is possible. It is possible to prevent the failure of.

Claims (11)

Detection means for detecting, by an electrical signal, the property of a foreign matter to be generated on the color filter layer; And And a polishing means for polishing the protrusions of the color fill layer after determining the degree of polishing according to the characteristics of the foreign matter detected by the detection means. The method of claim 1, wherein the detecting means, main body; And The polishing apparatus, characterized in that the probe is installed in the lower portion of the main body to detect the electrical characteristics of the contact with the foreign matter of the color filter layer. The polishing apparatus according to claim 2, wherein the probes are alternately arranged with a cathode and an anode. The polishing apparatus according to claim 3, wherein the electrical signal is applied by a voltage applied to the probe, and the electrical property is detected by measuring a flow of current through the foreign matter by the probe. The method of claim 1, wherein the polishing means, Polishing tape for polishing the protrusions in contact with the protrusions; And And a support part for contacting the polishing tape with the projection. The polishing apparatus according to claim 5, wherein the polishing tape is made of Teflon and aluminum oxide. The polishing apparatus according to claim 5, wherein the polishing degree of the polishing means is determined by the roughness of the polishing tape. The polishing apparatus according to claim 5, wherein the polishing degree of the polishing means is determined by the traveling speed of the polishing tape. The polishing apparatus according to claim 5, wherein the polishing degree of the polishing means is determined by the contact pressure between the polishing tape and the projection. main body; And It is installed in the lower part of the main body consists of a probe in contact with the foreign matter of the color filter layer, And a voltage applied to the probe to detect a current flowing through the foreign material, thereby detecting characteristics of the foreign material. 11. The detection apparatus according to claim 10, wherein the probe has a cathode and an anode arranged alternately.

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