KR100617609B1 - Alignment system for bonding substrates in lcd - Google Patents

Abstract

The present invention discloses an alignment device for bonding a substrate of a liquid crystal display device. The disclosed invention provides a reflectance between a corresponding glass mark for the first and second substrates by image processing when bonding the first substrate on which the reflection type glass mark is formed and the second substrate on which the absorption type glass mark is formed. And an alignment device for bonding the substrate of the liquid crystal display device to align the first and second substrates by measuring an absorptivity, wherein the bottom of the first substrate is irradiated with electric charges to form a reflection mark on the first substrate. The CCD camera for measuring the difference in the reflectance difference of the absorption rate of the glass mark of the absorption type with respect to the second substrate is located, and the absorption rate difference of the absorption mark of the absorption type for the upper substrate on the second substrate; Provided with a reflector for amplifying to be similar to a difference in reflectance of the reflection type glass mark relative to the substrate It characterized.

Description

Alignment device for bonding the substrate of the liquid crystal display device {ALIGNMENT SYSTEM FOR BONDING SUBSTRATES IN LCD}

1A is a diagram showing a reflection type glass mark and reflectance of a glass mark formed on a substrate of a conventional liquid crystal display device;

1B is a view showing an absorption type glass mark and an absorption rate of a glass mark formed on a substrate of a conventional liquid crystal display device.

FIG. 2 is a diagram showing a reflection type and an absorption type of a glass mark formed on a substrate of a conventional liquid crystal display, and reflectance and absorption between each glass mark; FIG.

3 is a schematic view showing an alignment device for bonding the substrate of the liquid crystal display according to the present invention.

4 is a view showing a reflection type and an absorption type of the glass mark formed on the substrate of the liquid crystal display according to the present invention and the reflectance and absorption between the respective glass marks.

(Explanation of symbols for the main parts of the drawing)

10-CCD Camera 11-Board

12-Reflector 20-Reflective glass mark

20a-Reflective film 25-Glass mark of absorption type

25a-absorption film

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly, to an alignment device for bonding a substrate of a liquid crystal display device.

A general liquid crystal display device is formed in the following order.

First, an alignment film is printed on the surface of each of the lower substrate on which the TFT and the pixel electrode are formed and the upper substrate on which the color filter is formed. Then, the rubbing process is performed so that the alignment layers have a constant orientation. Then, the surface of the upper lower substrate is cleaned. Thereafter, an airtight seal is printed on the liquid crystal panel on the lower substrate, and a spacer, which is a cell gap retainer, is scattered on the upper substrate. Here, the seal should be printed so that the liquid crystal injection hole is opened.

Thereafter, the upper and lower substrates are assembled at atmospheric pressure, and then a pressing process is performed by predetermined pressing means to maintain a constant cell gap between the upper and lower substrates. At this time, the upper and lower substrates are accurately aligned and assembled by scanning the glass marks formed on the upper and lower substrate edges by image processing of a CCD (charge coupled device) camera.

Here, the glass mark includes a reflection type as shown in FIG. 1A and an absorption type as shown in FIG. 1B. First, as shown in FIG. 1A, the reflective glass mark 1 is formed with a reflective film 1a such as chromium on its surface. When the substrate on which the reflection type glass mark 1 is formed is subjected to image processing by a CCD camera, the portion on which the reflection type glass mark 1 is formed exhibits a relatively higher reflectance than the surface of the substrate. Thereby, the position of the glass mark 1 is grasped | ascertained.

On the other hand, in the absorption mark glass mark 5 shown in FIG. 1B, the absorption film 5a like resin is formed in the surface. When the substrate on which the absorption type glass mark 5 is formed is image processed by a CCD camera, the portion on which the absorption type glass mark 5 is formed exhibits a relatively low absorption rate than the substrate surface. Thereby, the position of the glass mark 5 is grasped | ascertained. Such glass marks are preferably formed of the same type of upper and lower substrates.

Then, the yarn is cured at a predetermined temperature and cut into predetermined cells. Thereafter, the liquid crystal is injected through the liquid crystal injection hole of the yarn, and then the injection hole is sealed. Finally, polarizing plates are attached to the upper and lower rear surfaces of the liquid crystal panel to complete the liquid crystal display device.

In order to secure high-definition and wide viewing angle characteristics of the current liquid crystal display, liquid crystal display devices in which an electrode is not provided on an upper substrate, such as an in-plane switching (IPS) mode or a fringe field switching (FFS) mode, are proposed. have. In this new mode liquid crystal display, a reflective glass mark 1 and an absorption type glass mark 5 are formed on each substrate as shown in FIG. 2, and a reflective glass mark 1 is formed on the lower substrate. ) Is formed and an absorption type glass mark 5 is formed on the upper substrate.

In this way, when the reflection type and the absorption type glass mark are mixed in one liquid crystal display device, the CCD camera has difficulty in accurately measuring the reflectance of the substrate, so that the upper and lower substrates cannot be accurately aligned.

That is, the difference between the reflectance between the reflective film 1a of the reflective glass mark 1 and the lower substrate and the difference between the absorptivity between the absorbing film 5a of the absorption type glass mark 5 and the upper substrate do not coincide with each other. Cannot accurately measure the position of the glass marks 1, 5 of each substrate. Because of this, it is difficult to align exactly when bonding the upper substrate and the lower substrate.

Accordingly, the present invention is to solve the above-described problems, and even if the reflection type glass mark and the absorption type glass mark are mixed in the liquid crystal display device, the substrate bonding of the liquid crystal display device that can align the upper and lower substrates accurately can be achieved. An object of the present invention is to provide an alignment device.

The alignment device for bonding the substrate of the liquid crystal display device according to the present invention for achieving the above object of the present invention when the first substrate on which the reflection type glass mark is formed and the second substrate on which the absorption type glass mark is bonded An alignment apparatus for substrate bonding of a liquid crystal display device for aligning the first and second substrates by measuring the reflectance and the absorptivity between the corresponding glass marks on the first and second substrates by performing image processing. At the bottom of the first substrate, a CCD camera is disposed that irradiates an electric charge to measure a difference in reflectance of a glass mark of a reflection type with respect to the first substrate and a difference in absorption of a glass mark of an absorption type with respect to the second substrate. The difference in the absorption rate of the absorption type glass mark on the upper substrate is formed on the substrate. A reflector for amplifying to be similar to the difference in reflectivity of the group of the reflection-type glass mark is provided.

Here, the reflector is characterized in that the semiconductor wafer, the reflector is characterized in that the micro-gauge for controlling the degree of amplification of the difference in reflectance is built.

According to the present invention, in a liquid crystal display device in which a reflection type glass mark and an absorption type glass mark are mixed, a reflector is provided on the substrate when the reflectance between the substrate and the glass mark is measured by a CCD camera. As a result, the difference in reflectance between the absorption-type glass mark and the substrate is amplified by the degree of reflectance between the reflection-type glass mark and the substrate, thereby accurately aligning the upper and lower substrates.

(Example)

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

3 is a view schematically showing an alignment device for bonding a substrate of a liquid crystal display according to the present invention, and FIG. 4 is a glass mark and angle of reflection type and absorption type formed on a substrate of the liquid crystal display according to the present invention. A diagram showing reflectance and absorptivity between glass marks.

In the present invention, when the reflection type glass mark 20 and the absorption type glass mark 25 are formed on the upper substrate and the lower substrate, respectively, for example, the reflection type glass mark 20 for the lower substrate is formed. The difference in the reflectance of the reflecting film 20a and the difference in the absorptivity of the absorbing film 25a constituting the absorption mark glass mark 25 for the upper substrate, for example, must be coincident with each other. Thus, the reflecting mirror 12 is provided on the upper substrate on which the absorption type glass mark 25 is formed.

That is, as shown in FIG. 3, the CCD camera 10 recognizes that the upper substrate and the lower substrate on which the reflection type glass mark 20 and the absorption type glass mark 25 are formed are in contact with each other for bonding. It is disposed below the substrate 11. In the above, the CCD camera 10 irradiates an electric charge under the recognition substrate 11 to measure the reflectance of the reflection type glass mark on the lower substrate and the absorption rate of the absorption type glass mark on the upper substrate. At this time, the upper surface of the recognition substrate 11 is provided with a reflector 12 for amplifying the difference in the absorption rate of the absorption type of the glass mark on the upper substrate. At this time, a micro gauge is built in the reflector 12 so that the amplification degree of the absorption rate of the absorption type glass mark is almost equal to the reflectance of the reflection type glass mark, so that the reflection width and the absorption width of the lower substrate and the upper substrate are increased. Adjust this to match almost. At this time, the reflector 12 does not affect the reflectance of the reflection type glass mark, and a semiconductor wafer is used as the reflector 12.

As such, as the reflector 12 is installed on the substrate 11 to be recognized, as shown in FIG. 4, the difference in reflectance between the substrate 11 and the reflective glass mark 20 and the substrate 11 and The difference in reflectance of the absorption type glass mark 25 can be matched, so that the upper substrate and the lower substrate can be exactly aligned. Here, reference numeral 20a denotes a reflecting film such as chromium, and 25a denotes an absorbing film such as resin.

As described in detail above, according to the present invention, in the liquid crystal display device in which the reflection type glass mark and the absorption type glass mark are mixed, the reflectance and the absorption rate of each glass mark on the lower substrate and the upper substrate with a CCD camera When measuring, install the reflector on the recognition board. Accordingly, the absorption rate of the absorption type glass mark with respect to the upper substrate is amplified to the degree of reflectance of the reflection type glass mark with respect to the lower substrate to accurately align the upper substrate and the lower substrate.

Claims (3)

The reflectance and the absorptivity between the corresponding glass marks on the first and second substrates are measured by image processing when the first substrate on which the reflection type glass mark is formed and the second substrate on which the absorption type glass mark is formed are bonded. An alignment apparatus for bonding a substrate of a liquid crystal display device to align the first and second substrates. At the bottom of the first substrate, a CCD camera is disposed that irradiates an electric charge to measure a difference in reflectance of a glass mark of a reflection type with respect to the first substrate and a difference in absorption of a glass mark of an absorption type with respect to the second substrate. And a reflector configured to amplify a difference in absorbance of the glass mark of the absorption type on the upper substrate to be similar to a difference in reflectance of the glass mark of the reflection type on the first substrate. Alignment device for substrate bonding of a display device. The alignment apparatus of claim 1, wherein the reflector is a semiconductor wafer. The alignment apparatus of claim 1 or 2, wherein a micro gauge for controlling amplification degree of the difference in reflectance is embedded in the reflecting mirror.

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