KR100588058B1 - Method of detecting defect of a panel and luminescnet device employed in the same - Google Patents

Abstract

The present invention relates to a light emitting device capable of inspecting a defect of a panel after the panel and the COF are combined. The light emitting device including a data line, a scan line, and a discharge unit applying a predetermined voltage to the data lines during a discharge time includes a panel and a scan driver. The panel includes pixels formed in regions where the data lines intersect the scan lines. The scan driver sequentially transmits scan signals to the scan lines. Here, during the failure inspection of the panel, the first scan line and the discharge part of the scan lines are connected to a negative electrode power source having a voltage below ground voltage. Since the light emitting device uses holes or dummy pixels formed on the outer surface of the COF, defects of the panel can be easily and accurately inspected even after the panel and the COF are combined.

Panel, COF, Dummy, Scan Line, Ground

Description

METHOD OF DETECTING DEFECT OF A PANEL AND LUMINESCNET DEVICE EMPLOYED IN THE SAME

1 is a plan view showing a conventional light emitting device.

2 is a plan view showing a light emitting device according to a first embodiment of the present invention.

3A is a circuit diagram illustrating the light emitting device of FIG. 2.

FIG. 3B is a timing diagram illustrating scan signals and data current provided to the pixels of FIG. 3A.

3C is a circuit diagram illustrating the discharge part of FIG. 3A.

4 is a circuit diagram showing a light emitting device according to a second preferred embodiment of the present invention.

5 is a circuit diagram showing a light emitting device according to a third embodiment of the present invention.

6 is a circuit diagram showing a light emitting device according to a fourth preferred embodiment of the present invention.

The present invention relates to a panel failure inspection method and a light emitting device used therein, and more particularly, to a panel failure inspection method and a light emitting device used for inspecting the failure of the panel after the panel and the COF is combined.

The light emitting device refers to a device that generates light having a predetermined wavelength when a predetermined voltage is applied from the outside.

1 is a plan view showing a conventional light emitting device. 1 illustrates a light emitting device before the panel 100 and the COF 102 are not coupled.

Referring to FIG. 1, a conventional light emitting device includes a panel 100 and a chip on film (COF) 102.

The panel 100 includes a cell unit 104, data pads 106, first scan pads 108, and second scan pads 110.

The cell unit 104 includes pixels formed in regions where indium tin oxide films (ITO layers) and metal electrode layers intersect.

Data pads 106 are connected to the ITO layers, and scan pads 108 and 110 are connected to the metal electrode layers.

COF 102 includes output electrodes 112, 114, and 116 and integrated circuit chip 118.

The integrated circuit chip 118 transmits data signals to the ITO layers through the data output electrodes 112 and the data pads 106.

In addition, the integrated circuit chip 118 transmits scan signals to the metal electrode layers through the scan output electrodes 114 and 116 and the scan pads 108 and 110.

Output electrodes 112, 114, and 116 couple with pads 106, 108, and 110, respectively, through an ACF film. As a result, panel 100 and COF 102 are coupled.

However, in the conventional light emitting device, whether the panel 100 is defective is inspected before the panel 100 and the COF 102 are coupled. For example, the defect inspection apparatus applies a predetermined positive voltage to the data pads 106 and a predetermined negative voltage to the scan pads 108 and 110 to check the luminance of the pixels.

However, in the conventional light emitting device, after the panel 100 and the COF 102 are coupled, whether the panel 100 is defective or not is not examined.

Therefore, when a failure occurs in the panel 100 in the process of combining the panel 100 and the COF 102, the failure of the panel 100 could not be detected. As a result, when a poor light emitting device is used in a mobile communication terminal or the like, it may cause a defect in the mobile communication terminal.

Therefore, there is a need for a panel failure inspection method and a light emitting device used therefor that can detect a failure of a panel after the panel and the COF are combined.

It is an object of the present invention to provide a panel failure inspection method and a light emitting device used therefor that can inspect a defect of the panel after the panel and the COF are combined.

In order to achieve the above object, a light emitting device including a data line, a scan line and a discharge unit for applying a predetermined voltage to the data lines during a discharge time according to an embodiment of the present invention is a panel and a scan It includes a drive unit. The panel includes pixels formed in regions where the data lines intersect the scan lines. The scan driver sequentially transmits scan signals to the scan lines. Here, during the failure inspection of the panel, the first scan line and the discharge part of the scan lines are connected to a negative electrode power source having a voltage below ground voltage.

A light emitting device including data lines, scan lines, and a discharge unit applying a predetermined voltage to the data lines during a discharge time according to another exemplary embodiment of the present invention includes a panel, holes, and a scan driver. The panel includes pixels formed in regions where the data lines intersect the scan lines. The holes are connected to N scan integers of the scan lines. The scan driver sequentially transmits scan signals to the scan lines. In this case, during the failure inspection of the panel, one of the holes and the discharge unit are connected to a cathode power source having a voltage below ground voltage.

A light emitting device including a data line and a discharge unit applying a predetermined voltage to the data lines during a discharge time according to another exemplary embodiment of the present invention include a panel and a scan driver. The panel includes scan lines and dummy scan lines that intersect the data lines. The scan driver sequentially transmits scan signals to the scan lines. In this case, the dummy scan line and the discharge unit are connected to a negative electrode power source having a voltage equal to or less than a ground voltage during the failure inspection of the panel.

According to an exemplary embodiment of the present invention, a method for inspecting a failure of a light emitting device including data lines, scan lines crossing the same, and a discharge unit applying a predetermined voltage to the data lines during a discharge time may include: Connecting one of the scan lines to a first negative power source having a voltage below ground voltage, connecting the discharge unit to a second negative power source having a voltage below ground voltage, and scanning signals to the scan lines Providing sequentially.

According to another exemplary embodiment of the present invention, a method of inspecting a failure of a light emitting device includes data lines, scan lines and dummy scan lines crossing the discharge lines, and a discharge unit applying a predetermined voltage to the data lines during a discharge time. Connecting the dummy scan line to a first negative power source having a voltage below ground voltage, connecting the discharge portion to a second negative power source having a voltage below ground voltage, and connecting scan signals to the scan lines. Transmitting sequentially.

Since the panel inspection method and the light emitting device used therein use holes or dummy pixels formed on the outer surface of the COF, defects of the panel can be easily and accurately inspected even after the panel and the COF are combined.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred method of the panel failure inspection method and a light emitting device used in accordance with the present invention.

FIG. 2 is a plan view showing a light emitting device according to a first preferred embodiment of the present invention, and FIG. 3A is a circuit diagram showing the light emitting device of FIG. 3B is a timing diagram illustrating scan signals and data currents provided to the pixels of FIG. 3A, and FIG. 3C is a circuit diagram illustrating the discharge unit of FIG. 3A.

Referring to FIG. 2, the light emitting device of the present invention includes a panel 200 and a chip on film (COF) 202. The light emitting device according to the preferred embodiment of the present invention is an organic electroluminescent device.

The panel 200 is formed in regions where data pads, scan pads, and indium tin oxide layers (ITO layers) connected to the data pads intersect with metal electrode layers connected to the scan pads. The cell unit 204 includes a plurality of pixels.

The COF 202 includes an integrated circuit chip 212, output electrodes serving as conductors, and a plurality of holes 214 connected to some of the scan pads, respectively.

FIG. 2 is a view showing a light emitting device formed by combining the panel 200 and the COF 202, wherein the connection lines 206, 208, and 210 show the pads of the panel 200 and the output of the COF 202. The electrodes are formed by being joined by an ACF film.

Hereinafter, the light emission operation of the light emitting device of the present invention will be described in detail.

The scan driver 300 provides the scan lines SP1 to SPn to the scan lines S1 to Sn, respectively, as shown in FIG. 3B.

The data storage unit 302 stores input RGB data. In detail, when the ALGBI data is sequentially input, the data storage unit 302 stores the ALGBI data in latches sequentially using a shift register (not shown).

The discharge unit 304 receives the ALGBI data from the data storage unit 302, selects one of the K (integer) discharge voltage levels using the data, and calculates a discharge voltage corresponding to the selected level. As shown in 3b, the data lines are applied to the data lines D1 to Dm during the discharge time dcha.

Preferably, the discharge unit 304 applies a discharge voltage to the data lines D1 to Dm during the discharge time using a plurality of zener diodes as shown in FIG. 3C. However, the discharge voltages corresponding to the Algi ratio data provided thereto are applied to the data lines D1 to Dm, respectively.

Hereinafter, the pixels positioned on the first data line D1 will be described with reference to the function of the discharge voltage.

Referring to FIG. 3B, the first scan signal SP1 is applied to the first data line D1 to emit light of the first pixel E11, and the first data line D1 corresponding to the first pixel E11. ) Is charged. At this time, the gray level of the first pixel E11 is 40%.

Subsequently, when the gray level of the second pixel E12 is 80%, the discharge unit 304 may apply to the second pixel E12 of the K discharge levels during the second discharge time of the second precharge time PT2. A discharge voltage having a level corresponding to the provided second ALG ratio data is applied to the first data line D1.

As shown in FIG. 3C, the discharge level may be set to six levels. For example, the voltage of the first Zener diode ZD1 is 10V, the voltage of the second Zener diode ZD2 is 8V, the voltage of the third Zener diode ZD3 is 6V, and the fourth Zener diode ZD4. The voltage of 4V may be set to 4V, the voltage of the fifth zener diode ZD5 to 2V, and the voltage of the sixth zener diode ZD6 to ground voltage 0V.

Of course, the discharge level may be set to one level, that is, the zener diodes ZD1 to ZD6 may have the same voltage (for example, 4V).

Thereafter, the precharge driving unit 308 supplies the first data to a level corresponding to the second Algivy data provided to the second pixel E12 during the second precharge time of the second precharge time PT2. Precharge the line D1. That is, the precharge driver 308 precharges the first data line D1 to 80% gray level by applying a second preliminary charging current to the first data line D1.

Subsequently, the data driver 312 provides a current corresponding to the second ALG ratio data provided to the second pixel E12 to the first data line D1 during the second emission time. As a result, the second pixel E12 emits light and its gradation is 80%.

In other words, the discharge unit 304 applies a discharge voltage to the data lines D1 to Dm to the vicinity of the gray level corresponding to the subsequent AlGeB data using a plurality of zener diodes. As a result, the amount of precharge charge required to precharge the data lines D1 to Dm during the precharge time is reduced.

Hereinafter, the defect inspection process of the panel 200 according to the present invention will be described in detail.

2 and 3A, in the failure inspection of the panel 200, a first hole connected to the first scan line S1 of the holes 214 is connected to the ground 316 and the holes 214. The heavy discharge part 304, for example, a second hole connected to the zener diodes is connected to the ground 312. The holes 314 are not connected to the grounds 312 and 316 when operating as a display window in a mobile communication terminal, but are connected to the grounds 312 and 316 only when the panel 200 is defectively inspected.

Here, when the discharge unit 304 is not grounded, the data lines D1 to Dm have a predetermined voltage (for example, 4V), and as a result, a forward voltage is applied to the first pixels E11 to Em1. For example, when the predetermined voltage is 4V and the threshold voltages of the first pixels E11 to Em1 are 3V, the voltages at both ends 4V of the first pixels E11 to Em1 are greater than the threshold voltage. As a result, the first pixels E11 to Em1 emit light regardless of whether the panel 200 is defective. As a result, the defect of the panel 200 cannot be detected.

Therefore, in the failure inspection of the panel 200, the discharge portion 304, for example the zener diodes are grounded.

Referring again to FIG. 3A, in the failure inspection of the panel 200, the scan driver 300 sequentially provides the scan signals PS1 to PSn to the scan lines S1 to Sn as shown in FIG. 3B. .

In detail, the scan driver 300 transmits the first scan signal PS1 to the first pixels E11 to Em1 through the first scan line S1.

Subsequently, the scan driver 300 transmits the second scan signal PS2 to the second pixels E12 to Em2 through the second scan line S2.

In the same manner as described above, the scan driver 300 sequentially provides the scan signals PS1 to PSn to the pixels E11 to Emn.

When the light emitting device of the present invention is used in a mobile communication terminal or the like, the light emitting device uses a low logic region of the scan signals PS1 to PSn. Specifically, when scan signals PS1 to PSn are provided to scan lines S1 to Sn and the data signals are provided to data lines D1 to Dm, pixels E11 to Emn are scanned. Light is emitted in the low logic region of the signals S1 to Sn.

On the other hand, when the light emitting device of the present invention is used for defect inspection of the panel 200, the light emitting device uses a high logic region of the scan signals PS1 to PSn. In this case, the data driver 310 does not generate the data signal.

Hereinafter, in order to explain the defect inspection of the panel 200, for example, the third scan signal PS3 is transmitted to the third pixels E13 to Em3 through the third scan line S3.

When all of the third pixels E13 to Em3 operate normally, a reverse voltage is applied to the third pixels E13 to Em3, that is, a 20 V voltage corresponding to a high logic at the cathodes of the third pixels E13 to Em3. This voltage is applied to the anodes, and the OV voltage corresponding to the low logic is applied, so that no current path is formed through the entire panel 200. As a result, the panel 200 does not emit light.

On the other hand, when some of the third pixels E13 to Em3, for example, E33 is shorted, E31 emits light in the high logic region of the third scan signal PS3.

In detail, since E33 is short-circuited, the 20V voltage which is the high logic voltage of the 3rd scan signal PS3 is applied to the anode of E31 via E33. In addition, since the first scan line S1 is connected to the ground, 0V is applied to the cathode of E31. As a result, since E31 is subjected to the forward voltage and the voltage difference (20V-0V = 20V) is larger than the threshold voltage, E31 emits light.

That is, when a failure occurs in the pixels E12 to Emn of the panel 200, some pixels of the first pixels E11 to Em1 emit light, and the failure of the panel 200 is detected through the light emission. .

Since the light emitting device of the present invention inspects the defect of the panel 200 by connecting two holes of the holes 214 formed on the outer surface of the COF 202 to the grounds 312 and 316, unlike the conventional light emitting device, the panel Even after the 200 and the COF 202 are coupled, the defect of the panel 200 can be inspected simply and accurately.

The light emitting device according to another embodiment of the present invention may include only two holes. However, since the other inspection can be performed using the holes, the light emitting device preferably includes three or more holes, for example, by connecting the oscilloscope to check whether the signals transmitted to the pixels are correctly transmitted. Do.

4 is a circuit diagram showing a light emitting device according to a second preferred embodiment of the present invention.

Referring to FIG. 4, in the light emitting device of the present invention, two scan lines among the scan lines S1 to Sn are connected to the ground 404.

In the light emitting device according to the first embodiment, when a defect occurs in the first pixels E11 to Em1, the first scan lines S1 are connected to the ground 316, so that the first pixels E11 to Em1 are connected. It was not emitted and could not detect whether the panel 200 was defective.

On the other hand, in the case of the light emitting device according to the second embodiment, since two scan lines of the scan lines S1 to Sn may be connected to the ground 404, the panel 200 may be defective regardless of any defective pixels. Can be detected.

In detail, during the first panel failure inspection, the first scan line S1 is connected to the ground 404 and the second scan line S2 is not connected to the ground 404. Therefore, when a failure occurs in the remaining pixels except for the first pixels E11 to Em1 among the pixels E11 to Emn, the failure of the panel 200 may be detected.

Subsequently, in the second panel failure test, the second scan line S2 is connected to the ground 404 and the first scan line S1 is not connected to the ground 404. Therefore, when a failure occurs in the remaining pixels except for the second pixels E12 to Em2 among the pixels E11 to Emn, the failure of the panel 200 may be detected.

In short, by successively performing the first panel failure inspection and the second panel failure inspection, the failure of the panel 200 is accurately detected regardless of whether or not any pixel has failed.

That is, the light emitting device of the present invention detects a defect by using three holes of the holes 214. Therefore, the light emitting device may include only three holes.

5 is a circuit diagram showing a light emitting device according to a third embodiment of the present invention.

Referring to FIG. 5, unlike the light emitting device according to the first embodiment, the light emitting device of the present invention is connected to a cathode power source in which the first scan line S1 has a negative voltage. Therefore, when a failure occurs in the panel 200, the voltage across the E31 of the present invention is greater than the voltage across the light emitting pixel, for example, across the E31 of the first embodiment.

That is, the light emitting pixel E31 of the present invention emits light brighter than the light emitting pixel E31 of the first embodiment. As a result, the defect inspection of the panel 200 of the present invention can be made easier and more accurate than the defect inspection of the panel 200 of the first embodiment.

In the light emitting device according to another embodiment of the present invention, two scan lines may be connected to the cathode power source.

6 is a circuit diagram showing a light emitting device according to a fourth preferred embodiment of the present invention.

Referring to FIG. 6, the light emitting device of the present invention includes a dummy scan line DS, and the dummy scan line DS is connected to a cathode power source 616 having a voltage equal to or less than a ground voltage (0V). Preferably, the dummy scan line DS is connected to the cathode power source 616 through one of the holes 214.

When some of the pixels E11 to Emn, for example, E33 is shorted, the third dummy pixel DP3 of the dummy pixels DP1 to DPm emits light in the high logic region of the third scan signal PS3. do.

In detail, since E33 is short-circuited, a 20V voltage which is a high logic voltage of the third scan signal PS3 is applied to the anode of the third dummy pixel DP3 through E33. In addition, since the dummy scan line DS is connected to the cathode power source 616, 0 V or a negative voltage is applied to the cathode of the third dummy pixel DP3. As a result, since the forward voltage is applied to the third dummy pixel DP3 and the voltage difference is greater than the threshold voltage 3V, the third dummy pixel DP3 emits light.

That is, when a failure occurs in the pixels E11 to Emn of the panel 200, some pixels of the dummy pixels DP1 to DPm emit light, and the failure of the panel 200 is detected through the light emission.

Preferred embodiments of the present invention described above are disclosed for purposes of illustration, and those skilled in the art having ordinary knowledge of the present invention will be able to make various modifications, changes, additions within the spirit and scope of the present invention, such modifications, changes and Additions should be considered to be within the scope of the following claims.

As described above, since the panel defect inspection method and the light emitting device used therein according to the present invention use holes or dummy pixels formed on the outer surface of the COF, the panel defect can be easily and accurately corrected even after the panel and the COF are combined. There is an advantage to inspecting.

Claims (11)

A light emitting device comprising data lines, scan lines, and a discharge unit configured to apply a predetermined voltage to the data lines during a discharge time. A panel including pixels formed in regions where the data lines and the scan lines cross each other; And A scan driver for sequentially transmitting scan signals to the scan lines, And a first scan line and the discharge part of the scan lines are connected to a cathode power source having a voltage less than a ground voltage during the failure test of the panel. The method of claim 1, further comprising holes connected to some of the scan lines. And a first hole of the holes connects the first scan line to a first cathode power source of the cathode power source. The light emitting device of claim 2, wherein the second one of the holes connects the discharge unit to a second one of the cathode power sources. The light emitting device of claim 1, wherein the discharge unit comprises one or more zener diodes connected to the data lines. A light emitting device comprising data lines, scan lines, and a discharge unit configured to apply a predetermined voltage to the data lines during a discharge time. A panel including pixels formed in regions where the data lines and the scan lines cross each other; Holes connected to N scan integers of the scan lines; And A scan driver for sequentially transmitting scan signals to the scan lines, The light emitting device of claim 1, wherein one of the holes and the discharge unit are connected to a cathode power source having a voltage below ground voltage. The panel of claim 5, wherein the first one of the holes is connected to the cathode power source during the first panel failure inspection, and the second one of the holes is connected to the cathode power source during the second panel failure inspection. Light emitting device used for defect inspection. A light emitting device comprising data lines and a discharge unit configured to apply a predetermined voltage to the data lines during a discharge time. A panel including scan lines and dummy scan lines that intersect the data lines; And A scan driver for sequentially transmitting scan signals to the scan lines, And the dummy scan line and the discharge unit are connected to a cathode power source having a voltage equal to or less than a ground voltage during the failure inspection of the panel. The light emitting device of claim 7, wherein the discharge unit comprises one or more zener diodes connected to the data lines. A method for inspecting a failure of a light emitting device including data lines, scan lines crossing the same, and a discharge unit applying a predetermined voltage to the data lines during a discharge time, the method comprising: Connecting one scan line of the scan lines to a first cathode power source having a voltage below ground voltage; Connecting the discharge unit to a second negative power source having a voltage equal to or less than a ground voltage; And And sequentially providing scan signals to the scan lines. The method of claim 9, wherein the connecting to the first cathode power source comprises: Connecting a first scan line to the first cathode power source when inspecting a first light emitting device failure; And And connecting a second scan line to the first cathode power source during a second light emitting device failure test. A method for inspecting a failure of a light emitting device including data lines, scan lines and dummy scan lines intersecting the same, and a discharge unit applying a predetermined voltage to the data lines during discharge time, Connecting the dummy scan line to a first cathode power source having a voltage below ground voltage; Connecting the discharge unit to a second negative power source having a voltage equal to or less than a ground voltage; And And sequentially transmitting scan signals to the scan lines.

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