KR100378095B1 - Substrate and fabricating method and semiconductor package using the same - Google Patents
Substrate and fabricating method and semiconductor package using the same Download PDFInfo
- Publication number
- KR100378095B1 KR100378095B1 KR1020010039442A KR20010039442A KR100378095B1 KR 100378095 B1 KR100378095 B1 KR 100378095B1 KR 1020010039442 A KR1020010039442 A KR 1020010039442A KR 20010039442 A KR20010039442 A KR 20010039442A KR 100378095 B1 KR100378095 B1 KR 100378095B1
- Authority
- KR
- South Korea
- Prior art keywords
- plane
- same
- insulator
- circuit patterns
- substrate
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Electroplating Methods And Accessories (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
PURPOSE: A substrate and a fabricating method and a semiconductor package using the same are provided to enhance the quality of circuit patterns by plating sequentially plural metallic materials. CONSTITUTION: A plurality of circuit patterns(2) have the first plane(2a) and the second plane(2b). The circuit patterns(2) is formed by plating sequentially Au, Ni, Cu, and Ni on the first plane(2a) or Au, Cu, Ni, and Au on the first plane(2a). An insulator(4) includes the first plane(4a) and the second plane(4b). The second plane(2b) and a side are covered with the insulator(4). The first plane(4a) of the insulator(4) is located on the same plane as the first plane(2a) of the circuit patterns(2). The second plane(4b) of the insulator(4) is located under the second plane(2b) of the circuit patterns(2). A plurality of openings(5) are formed on the second plane(4b) of the insulator(4).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010039442A KR100378095B1 (en) | 2001-07-03 | 2001-07-03 | Substrate and fabricating method and semiconductor package using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010039442A KR100378095B1 (en) | 2001-07-03 | 2001-07-03 | Substrate and fabricating method and semiconductor package using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
KR100378095B1 true KR100378095B1 (en) | 2003-03-29 |
Family
ID=37417015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020010039442A KR100378095B1 (en) | 2001-07-03 | 2001-07-03 | Substrate and fabricating method and semiconductor package using the same |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100378095B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10643937B2 (en) | 2018-05-08 | 2020-05-05 | Advanced Semiconductor Engineering, Inc. | Wiring structure, electronic device and method for manufacturing the same |
-
2001
- 2001-07-03 KR KR1020010039442A patent/KR100378095B1/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10643937B2 (en) | 2018-05-08 | 2020-05-05 | Advanced Semiconductor Engineering, Inc. | Wiring structure, electronic device and method for manufacturing the same |
US11031326B2 (en) | 2018-05-08 | 2021-06-08 | Advanced Semiconductor Engineering, Inc. | Wiring structure, electronic device and method for manufacturing the same |
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