KR100371343B1 - Deposition chamber apparatus for plasma polymerization - Google Patents

Deposition chamber apparatus for plasma polymerization Download PDF

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KR100371343B1
KR100371343B1 KR10-2000-0037988A KR20000037988A KR100371343B1 KR 100371343 B1 KR100371343 B1 KR 100371343B1 KR 20000037988 A KR20000037988 A KR 20000037988A KR 100371343 B1 KR100371343 B1 KR 100371343B1
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deposition chamber
electrode
reaction gas
sample
plasma polymerization
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KR10-2000-0037988A
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KR20020004257A (en
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김병기
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주식회사 엘지이아이
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/513Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using plasma jets
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45587Mechanical means for changing the gas flow
    • C23C16/45591Fixed means, e.g. wings, baffles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32568Relative arrangement or disposition of electrodes; moving means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

본 발명은 플라즈마 중합용 증착장치에 관한 것으로서, 특히 서로 대향되게 설치된 제 1전극과 제 2전극을 구비하여 상기 제 1전극과 제 2전극을 통해 발생된 플라즈마를 이용해 시료에 박막을 형성하는 증착챔버와, 상기 증착챔버의 내부로 반응가스를 균일하게 주입하는 가스주입수단을 포함하고, 상기 가스주입수단은 증착챔버의 상면과 하면 중 적어도 어느 한쪽에는 고르게 배치되도록 설치되어 상기 증착챔버의 내부로 반응가스를 주입시키는 복수개의 가스주입노즐로 구성된 플라즈마 중합용 증착장치를 제공함으로써 증착챔버의 내부에 반응가스가 골고루 분포되어 상기 증착챔버를 통과한 시료의 균일성이 확보되도록 한 것이다.The present invention relates to a deposition apparatus for plasma polymerization, and more particularly, a deposition chamber having a first electrode and a second electrode disposed to face each other, and forming a thin film on a sample using plasma generated through the first electrode and the second electrode. And a gas injection means for uniformly injecting the reaction gas into the deposition chamber, wherein the gas injection means is installed to be evenly disposed on at least one of the upper and lower surfaces of the deposition chamber to react into the deposition chamber. By providing a deposition apparatus for plasma polymerization composed of a plurality of gas injection nozzles for injecting the gas to the reaction gas is evenly distributed in the deposition chamber to ensure uniformity of the sample passed through the deposition chamber.

Description

플라즈마 중합용 증착장치 {DEPOSITION CHAMBER APPARATUS FOR PLASMA POLYMERIZATION}Deposition equipment for plasma polymerization {DEPOSITION CHAMBER APPARATUS FOR PLASMA POLYMERIZATION}

본 발명은 연속 공정 플라즈마 중합장비에 관한 것으로서, 특히 시료의 균일성 확보를 위해 증착챔버의 내부에 반응가스가 골고루 분포되는 구조를 구비한 플라즈마 중합용 증착장치에 관한 것이다.The present invention relates to a continuous process plasma polymerization equipment, and more particularly, to a deposition apparatus for plasma polymerization having a structure in which a reaction gas is evenly distributed in a deposition chamber to ensure uniformity of a sample.

상기한 플라즈마 중합장비는 일반적으로 플라즈마를 이용하여 원료가스, 즉 반응가스를 화학 반응시킴으로써 시료 상에 중합물이 증착되어 상기한 시료의 표면에 박막이 형성되도록 하는 것이다.In the plasma polymerization apparatus, a polymer is deposited on a sample by chemically reacting a source gas, that is, a reaction gas, using a plasma to form a thin film on the surface of the sample.

이때, 상기한 시료의 표면에 형성된 박막은 반응가스의 종류, 플라즈마의 생성을 위해 사용된 전력의 종류 및 전압의 크기, 증착시간 등에 따라 다른 화학적 성질을 갖게 된다.At this time, the thin film formed on the surface of the sample has different chemical properties according to the kind of reaction gas, the kind of power used for generating plasma, the magnitude of voltage, the deposition time, and the like.

즉, 상기한 박막은 그 처리조건에 따라 표면의 강도 변화, 접착 및 흡착, 친수성, 소수성 등의 특성을 얻게 된다.That is, the thin film may obtain characteristics such as surface strength change, adhesion and adsorption, hydrophilicity, and hydrophobicity depending on the processing conditions.

이러한 플라즈마 중합장비는 반도체 집적회로소자, 초전도소자, 각종 전자소자, 각종 센서를 구성하고 있는 금속막, 반도체막, 절연막, 광도전체막, 확산방지막, 밀착증막의 박막을 제작하는데 널리 사용되고 있다.Such plasma polymerization equipment is widely used to manufacture thin films of metal films, semiconductor films, insulating films, photoconductor films, diffusion barrier films, and adhesion films constituting semiconductor integrated circuit devices, superconducting devices, various electronic devices, and various sensors.

상기한 바와 같은 플라즈마 중합장비는 도 1에 도시된 바와 같이 코일링챔버(10), 증착챔버(20), 언코일링챔버(30)가 연속적으로 배치되어 상기 코일링챔버(10)의 공급롤에 감겨있던 시료가 증착챔버(20) 내부로 공급되면 상기 증착챔버(20)에서 시료의 표면에 박막이 형성되고, 이렇게 박막 형성이 완료된 시료는 언코일링챔버(30)로 회수되도록 되어 있다.In the plasma polymerization apparatus as described above, as shown in FIG. 1, the coiling chamber 10, the deposition chamber 20, and the uncoiling chamber 30 are continuously disposed to supply the coiling chamber 10. When the sample wound on the supply is supplied into the deposition chamber 20, a thin film is formed on the surface of the sample in the deposition chamber 20, and the sample in which the thin film is completed is recovered to the uncoiling chamber 30.

상기한 박막 형성 과정을 도 2를 참조하여 더 상세히 설명하면, 먼저 증착챔버(20) 내부의 압력이 일정한 진공상태로 유지되는 상태에서 상기 증착챔버(20)로 코일링챔버(10)의 시료(M')가 공급되면 각 가스주입구(21)(22)를 통해 증착챔버(20) 내로 반응가스가 주입된다.The thin film forming process will be described in more detail with reference to FIG. 2. First, the sample of the coiling chamber 10 into the deposition chamber 20 in a state in which the pressure inside the deposition chamber 20 is maintained at a constant vacuum state ( When M 'is supplied, the reaction gas is injected into the deposition chamber 20 through each gas inlet 21 and 22.

이때, 상기한 각 가스주입구(21)(22)는 도 3에 도시된 바와 같이, 증착챔버(20) 중 반응가스가 주입되는 측의 상단과 하단에 각각 설치되어 있다.At this time, each of the gas injection ports 21 and 22 is installed at the upper and lower ends of the side into which the reaction gas is injected in the deposition chamber 20, as shown in FIG. 3.

이와 같이 반응가스가 주입되는 동시에, 시료(M')를 사이에 두고 서로 대향되게 위치되도록 설치된 제 1전극(23)과 제 2전극(24)에는 전력공급기(25)에 의해 직류전력 또는 고주파전력이나 저주파전력이 인가되어 상기 증착챔버(20) 내부에 플라즈마가 형성된다.As described above, the reaction gas is injected and at the same time, the first electrode 23 and the second electrode 24 provided to face each other with the sample M 'interposed therebetween by direct current power or high frequency power by the power supply 25. In addition, low frequency power is applied to form plasma in the deposition chamber 20.

즉, 상기 제 1전극(23)과 제 2전극(24) 간의 정전계에 의해 하전입자가 가속되어 하전입자와 하전입자, 또는 하전입자와 각 전극(23)(24)의 충돌에 의한 상호작용에 따라 플라즈마가 생성, 유지되게 된다.That is, the charged particles are accelerated by the electrostatic field between the first electrode 23 and the second electrode 24 to interact with each other by the collision of the charged particles and the charged particles or the charged particles and the electrodes 23 and 24. The plasma is generated and maintained accordingly.

이후, 상기한 플라즈마의 작용에 의해 반응가스가 화학 반응을 일으켜 상기한 시료(M') 상에는 중합물이 증착되게 되고, 이러한 중합물에 의해 시료(M')의 표면에 박막이 형성되게 된다.Thereafter, the reaction gas causes a chemical reaction by the action of the plasma to deposit a polymer on the sample M ', and a thin film is formed on the surface of the sample M' by the polymer.

상기와 같이 박막이 형성된 시료(M')는 언코일링챔버(30)를 향해 배출된다. 이로써, 상기한 시료(M')의 플라즈마 중합에 의한 박막 형성 과정은 완료된다.The sample M 'on which the thin film is formed as described above is discharged toward the uncoiling chamber 30. As a result, the thin film formation process by plasma polymerization of the sample M 'is completed.

상기에서, 미설명된 참조번호 11은 코일링챔버(10)와 증착챔버(20)를 이어주는 연결통로, 참조번호 31은 증착챔버(20)와 언코일링챔버(30)를 이어주는 연결통로, 참조번호 32는 가스배기구를 각각 나타낸다.In the above description, reference numeral 11 denotes a connection passage connecting the coiling chamber 10 and the deposition chamber 20, and reference numeral 31 denotes a connection passage connecting the deposition chamber 20 and the uncoiling chamber 30. Numeral 32 designates a gas exhaust vent, respectively.

또한, 참조번호 26은 유확산펌프(Diffusion pump), 참조번호 27은 로터리펌프(Rotary pump), 참조번호 28은 써모커플게이지(Thermo couple gauge), 참조번호 29는 이온게이지(Ion gauge)를 각각 나타낸다.In addition, reference numeral 26 denotes a diffusion pump, reference numeral 27 denotes a rotary pump, reference numeral 28 denotes a thermo couple gauge, and reference numeral 29 denotes an ion gauge. Indicates.

그런데, 상기와 같이 구성 및 작동되는 종래의 증착장치는 반응가스가 도 3에 도시된 바와 같이, 각 가스주입구(21)(22)를 통해 시료(M')가 유입되는 측으로 공급된 후 시료(M')와 함께 연결통로(31)로 배출되어 가스배기구(32)를 통해 배출되는 구조이다.However, in the conventional deposition apparatus constructed and operated as described above, the reaction gas is supplied to the side through which the sample M 'is introduced through each gas inlet 21 and 22, as shown in FIG. M ') is discharged to the connection passage 31 and discharged through the gas exhaust port (32).

따라서, 상기한 종래의 플라즈마 중합용 증착장치는 증착챔버(20) 중 시료(M')가 배출되는 측, 즉 출구 측의 상단과 하단에 반응가스가 거의 존재하지 않는 사체적(Dead zone)(D1)(D2)이 발생되고, 이러한 사체적(D1)(D2)으로 인해 상기 증착챔버(20)의 입구 측 시료(M')와 출구 측 시료(M')의 특성치가 달라지게 되어 시료(M')의 균일성 확보가 곤란한 문제점이 있었다.Therefore, the above-described conventional plasma polymerization deposition apparatus has a dead zone in which the reaction gas is hardly present at the upper and lower ends of the sample M 'in the deposition chamber 20, that is, at the outlet side ( D1) and D2 are generated. Due to the dead volume D1 and D2, the characteristic values of the inlet-side sample M 'and the outlet-side sample M' of the deposition chamber 20 are changed. There was a problem that it is difficult to secure uniformity of M ').

본 발명은 상기와 같은 문제점을 해결하기 위하여 안출된 것으로서, 증착챔버의 내부에 반응가스가 골고루 분포되어 상기 증착챔버를 통과한 시료의 균일성이 확보되도록 하는 플라즈마 중합용 증착장치를 제공하는데 그 목적이 있다.The present invention has been made to solve the above problems, and to provide a deposition apparatus for plasma polymerization to ensure uniformity of the sample passed through the deposition chamber by evenly distributed reaction gas in the deposition chamber. There is this.

도 1은 연속 공정 플라즈마 중합장비의 전체 시스템이 개략적으로 도시된 구성도,1 is a schematic view showing the overall system of a continuous process plasma polymerization equipment;

도 2는 일반적인 플라즈마 중합용 증착챔버의 내부 구조가 도시된 평단면도,Figure 2 is a plan sectional view showing the internal structure of a deposition chamber for a typical plasma polymerization,

도 3은 종래 기술에 따른 플라즈마 중합용 증착장치의 가스 흐름 상태가 도시된 개략적인 측단면도,Figure 3 is a schematic side cross-sectional view showing a gas flow state of the deposition apparatus for plasma polymerization according to the prior art,

도 4는 본 발명에 따른 플라즈마 중합용 증착장치가 도시된 측단면도,Figure 4 is a side cross-sectional view showing a deposition apparatus for plasma polymerization according to the present invention,

도 5는 도 4의 A부가 상세히 도시된 구성도이다.5 is a configuration diagram showing part A of FIG. 4 in detail.

<도면의 주요 부분에 대한 부호의 설명><Explanation of symbols for the main parts of the drawings>

50 : 증착챔버 51 : 상측 가스주입노즐50: deposition chamber 51: upper gas injection nozzle

53 : 하측 가스주입노즐 55, 57 : 메쉬구조물53: lower gas injection nozzle 55, 57: mesh structure

56, 58 : 메쉬부재 59 : 슬릿56, 58: mesh member 59: slit

M : 시료M: Sample

상기의 목적을 달성하기 위한 본 발명은 서로 대향되게 설치된 제 1전극과 제 2전극을 구비하여 상기 제 1전극과 제 2전극을 통해 발생된 플라즈마를 이용해 시료에 박막을 형성하는 증착챔버와; 상기 증착챔버의 상면과 하면 중 적어도 어느 한쪽에는 고르게 배치되도록 설치되어 상기 증착챔버의 내부로 반응가스를 주입시키는 복수개의 가스주입노즐과; 상기 가스주입노즐의 상측 또는 하측에 배치되어 상기 가스주입노즐에서 주입된 반응가스를 혼합 및 분산시키는 메쉬부재와; 상기 메쉬부재의 양측면에 반응가스가 주입되는 방향과 반대방향으로 경사지게 돌출되어 반응가스의 혼합이 촉진되도록 하는 복수개의 슬릿을 포함하여 구성된 것을 특징으로 한다.The present invention for achieving the above object comprises a deposition chamber having a first electrode and a second electrode provided opposite to each other to form a thin film on the sample using the plasma generated through the first electrode and the second electrode; A plurality of gas injection nozzles installed on at least one of an upper surface and a lower surface of the deposition chamber to inject a reaction gas into the deposition chamber; A mesh member disposed above or below the gas injection nozzle to mix and disperse the reaction gas injected from the gas injection nozzle; It characterized in that it comprises a plurality of slits protruding inclined in the opposite direction to the direction in which the reaction gas is injected to both sides of the mesh member to promote the mixing of the reaction gas.

이하, 본 발명의 실시 예를 첨부한 도면을 참조하여 설명한다.Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.

도 4는 본 발명에 따른 플라즈마 중합용 증착장치가 도시된 측단면도이고, 도 5는 도 4의 A부가 상세히 도시된 구성도이다.Figure 4 is a side cross-sectional view showing a deposition apparatus for plasma polymerization according to the present invention, Figure 5 is a block diagram showing part A of Figure 4 in detail.

상기한 도 4 및 도 5를 참조하면, 본 발명에 따른 플라즈마 중합용 증착장치는 서로 대향되게 설치된 제 1전극과 제 2전극을 구비하여 상기 제 1전극과 제 2전극을 통해 발생된 플라즈마를 이용해 시료(M)에 박막을 형성하는 증착챔버(50)와, 상기 증착챔버(50)의 내부로 반응가스를 균일하게 주입하는 가스주입수단을 포함하여 구성된다.4 and 5, the deposition apparatus for plasma polymerization according to the present invention includes a first electrode and a second electrode which are disposed to face each other, and use plasma generated through the first electrode and the second electrode. It comprises a deposition chamber 50 for forming a thin film on the sample (M), and a gas injection means for uniformly injecting the reaction gas into the deposition chamber (50).

여기서, 상기 가스주입수단은 증착챔버(50)의 상면과 하면에 고르게 배치되도록 설치되어 상기 증착챔버(50)의 내부로 반응가스를 주입시키는 복수개의 가스주입노즐(51)(53)로 구성되고, 상기한 각 가스주입노즐(51)(53)은 증착챔버(50)의 상면에 설치된 상측 가스주입노즐(51)과 증착챔버(50)의 하면에 설치된 하측 가스주입노즐(53)로 구분된다.Here, the gas injection means is composed of a plurality of gas injection nozzles 51 and 53 which are installed to be evenly disposed on the upper and lower surfaces of the deposition chamber 50 to inject the reaction gas into the deposition chamber 50. Each of the gas injection nozzles 51 and 53 is divided into an upper gas injection nozzle 51 provided on an upper surface of the deposition chamber 50 and a lower gas injection nozzle 53 provided on a lower surface of the deposition chamber 50. .

또한, 상기 증착챔버(50)의 상측과 하측에는 반응가스의 분포 균일성이 향상되도록 상기 각 가스주입노즐(51)(53)들을 통해 주입된 반응가스를 통과시키는 동시에 혼합 및 분산시키는 메쉬구조물(55)(57)이 각각 설치된다.In addition, the upper and lower sides of the deposition chamber 50, the mesh structure for passing and mixing and dispersing at the same time while passing the reaction gas injected through the respective gas injection nozzles 51, 53 to improve the uniformity of the reaction gas ( 55 and 57 are respectively installed.

또한, 상기 메쉬구조물(55)(57)은 반응가스가 주입되는 방향과 동일한 방향으로 설치된 다수의 메쉬부재(56)(58)로 이루어진다.In addition, the mesh structures 55 and 57 include a plurality of mesh members 56 and 58 installed in the same direction as the reaction gas is injected.

또한, 상기한 각 메쉬부재(56)(58)들은 서로 일정한 간격을 사이에 두고 배열되도록 설치되는데, 각 메쉬부재(56)(58)들간의 간격이 너무 크면 아무런 효과를 발생시키지 못하고 반대로 너무 작으면 반응가스의 흐름 자체를 방해하게 되므로 약 15 내지 18 FPI(Fins per Inch)가 되도록 하는 것이 가장 바람직하다.In addition, the mesh members 56 and 58 are installed to be arranged with a predetermined interval therebetween. If the spacing between the mesh members 56 and 58 is too large, no effect is generated and conversely too small. If so, it is most preferable to have about 15-18 FPI (Fins per Inch) because it will disturb the flow of the reaction gas itself.

또한, 상기한 각 메쉬부재(56)(58)의 양측면에는 반응가스의 혼합이 촉진되도록 상기한 반응가스가 주입되는 방향과 반대 방향으로 경사지게 돌출된 3 내지 4개의 슬릿(59)이 각각 형성된다.In addition, on both side surfaces of each of the mesh members 56 and 58, three to four slits 59 protruding obliquely in a direction opposite to the direction in which the reaction gas is injected are formed so as to facilitate mixing of the reaction gases. .

상기와 같이 구성된 본 발명에 따른 플라즈마 중합용 증착장치는 다음과 같이 작동된다.The deposition apparatus for plasma polymerization according to the present invention configured as described above is operated as follows.

먼저, 증착챔버(50) 내부의 압력이 일정한 진공상태로 유지되는 상태에서 상기 증착챔버(50)로 코일링챔버의 시료(M)가 공급되면 상측 가스주입노즐(51)들과 하측 가스주입노즐(53)들을 통해 증착챔버(50) 내로 반응가스가 주입된다.First, when the sample M of the coiling chamber is supplied to the deposition chamber 50 while the pressure inside the deposition chamber 50 is maintained at a constant vacuum state, the upper gas injection nozzles 51 and the lower gas injection nozzles are supplied. The reaction gas is injected into the deposition chamber 50 through the 53.

이후, 상기 각 가스주입노즐(51)(53)을 통해 주입된 반응가스는 상기 증착챔버(50)의 상측과 하측에 각각 설치된 메쉬구조물(55)(57), 즉 다수의 메쉬부재(56)(58)와 슬릿(59)을 통과하면서 혼합 및 분산된 후 시료(M) 측으로 공급된다.Thereafter, the reaction gases injected through the respective gas injection nozzles 51 and 53 are mesh structures 55 and 57, that is, a plurality of mesh members 56, respectively installed on the upper side and the lower side of the deposition chamber 50. The mixture is mixed and dispersed while passing through the 58 and the slit 59 and then supplied to the sample M side.

따라서, 상기한 반응가스는 시료(M)의 표면에서 전체적으로 균일하게 분포되게 된다.Therefore, the reaction gas is uniformly distributed throughout the surface of the sample (M).

이와 같이 반응가스가 주입되는 동시에, 상기 시료(M)를 사이에 두고 서로 대향되게 위치되도록 설치된 제 1전극과 제 2전극에는 직류전력 또는 고주파전력이나 저주파전력이 인가되어 상기 증착챔버(50) 내부에 플라즈마가 형성된다.As described above, the reaction gas is injected and at the same time, DC power or high frequency power or low frequency power is applied to the first electrode and the second electrode which are installed to face each other with the sample M interposed therebetween so that the inside of the deposition chamber 50 is provided. Plasma is formed.

즉, 상기 제 1전극과 제 2전극 간의 정전계에 의해 하전입자가 가속되어 하전입자와 하전입자, 또는 하전입자와 각 전극의 충돌에 의한 상호작용에 따라 플라즈마가 생성, 유지되게 된다.That is, the charged particles are accelerated by the electrostatic field between the first electrode and the second electrode, and the plasma is generated and maintained according to the interaction caused by the collision of the charged particles and the charged particles or the charged particles and the respective electrodes.

이후, 상기한 플라즈마의 작용에 의해 반응가스가 화학 반응을 일으켜 상기한 시료(M) 상에는 중합물이 증착되게 되고, 이러한 중합물에 의해 시료(M)의 표면에 박막이 형성되게 된다.Thereafter, the reaction gas causes a chemical reaction by the action of the plasma to deposit a polymer on the sample M, and a thin film is formed on the surface of the sample M by the polymer.

상기와 같이 박막이 형성된 시료(M)는 언코일링챔버를 향해 배출된다. 이로써, 상기한 시료(M)의 플라즈마 중합에 의한 박막 형성 과정은 완료된다.The sample M in which the thin film is formed as described above is discharged toward the uncoiling chamber. Thus, the thin film formation process by plasma polymerization of the sample M is completed.

상기에서, 미설명된 참조번호 61은 코일링챔버와 증착챔버(50)를 이어주는 연결통로, 참조번호 63은 증착챔버(20)와 언코일링챔버를 이어주는 연결통로, 참조번호 65는 가스배기구를 각각 나타낸다.In the above description, reference numeral 61 denotes a connection passage connecting the coiling chamber and the deposition chamber 50, reference numeral 63 denotes a connection passage connecting the deposition chamber 20 and the uncoiling chamber, and reference numeral 65 denotes a gas exhaust port. Represent each.

상기와 같이 구성되고 동작되는 본 발명에 따른 플라즈마 중합용 증착장치는, 각 가스주입노즐(51)(53)들과 메쉬구조물(55)(57)의 작용에 의하여 반응가스가 증착챔버(50)의 내부에 골고루 분포되게 되므로 시료(M)의 표면에서 반응가스의 분포 상태가 전체적으로 균일하게 되어 상기 증착챔버(50)를 통과한 시료(M)의 균일성이 확보되는 이점이 있다.In the deposition polymerization apparatus for plasma polymerization according to the present invention constructed and operated as described above, the reaction gas is deposited by the action of the gas injection nozzles 51 and 53 and the mesh structures 55 and 57. Since it is evenly distributed inside the distribution state of the reaction gas on the surface of the sample (M) as a whole is uniform, there is an advantage that the uniformity of the sample (M) passed through the deposition chamber 50 is secured.

Claims (4)

서로 대향되게 설치된 제 1전극과 제 2전극을 구비하여 상기 제 1전극과 제 2전극을 통해 발생된 플라즈마를 이용해 시료에 박막을 형성하는 증착챔버와;A deposition chamber having a first electrode and a second electrode disposed to face each other, and forming a thin film on a sample using plasma generated through the first electrode and the second electrode; 상기 증착챔버의 상면과 하면 중 적어도 어느 한쪽에는 고르게 배치되도록 설치되어 상기 증착챔버의 내부로 반응가스를 주입시키는 복수개의 가스주입노즐과;A plurality of gas injection nozzles installed on at least one of an upper surface and a lower surface of the deposition chamber to inject a reaction gas into the deposition chamber; 상기 가스주입노즐의 상측 또는 하측에 배치되어 상기 가스주입노즐에서 주입된 반응가스를 혼합 및 분산시키는 메쉬부재와;A mesh member disposed above or below the gas injection nozzle to mix and disperse the reaction gas injected from the gas injection nozzle; 상기 메쉬부재의 양측면에 반응가스가 주입되는 방향과 반대방향으로 경사지게 돌출되어 반응가스의 혼합이 촉진되도록 하는 복수개의 슬릿을 포함하여 구성된 것을 특징으로 하는 플라즈마 중합용 증착장치.Deposition apparatus for plasma polymerization comprising a plurality of slits protruding obliquely in a direction opposite to the direction in which the reaction gas is injected to both sides of the mesh member to promote the mixing of the reaction gas. 제 1항에 있어서,The method of claim 1, 상기 메쉬부재는 반응가스가 주입되는 방향과 동일한 방향으로 설치된 것을 특징으로 하는 플라즈마 중합용 증착장치.The mesh member is a deposition apparatus for plasma polymerization, characterized in that installed in the same direction as the reaction gas injection direction. 삭제delete 삭제delete
KR10-2000-0037988A 2000-07-04 2000-07-04 Deposition chamber apparatus for plasma polymerization KR100371343B1 (en)

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JPH02157822A (en) * 1988-12-12 1990-06-18 Matsushita Electric Ind Co Ltd Orientation control film and orientation control method and liquid crystal display element
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JPH01278716A (en) * 1988-05-02 1989-11-09 Toshiba Corp Semiconductor thin film forming device
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