KR100358513B1 - Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby - Google Patents

Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby Download PDF

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Publication number
KR100358513B1
KR100358513B1 KR1020020006367A KR20020006367A KR100358513B1 KR 100358513 B1 KR100358513 B1 KR 100358513B1 KR 1020020006367 A KR1020020006367 A KR 1020020006367A KR 20020006367 A KR20020006367 A KR 20020006367A KR 100358513 B1 KR100358513 B1 KR 100358513B1
Authority
KR
South Korea
Prior art keywords
electrical contactor
trench
tip part
fabricated
electronic device
Prior art date
Application number
KR1020020006367A
Other languages
English (en)
Inventor
Uk Ki Lee
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Priority to KR1020020006367A priority Critical patent/KR100358513B1/ko
Application granted granted Critical
Publication of KR100358513B1 publication Critical patent/KR100358513B1/ko
Priority to CN2008101355299A priority patent/CN101354405B/zh
Priority to JP2003566894A priority patent/JP2005517192A/ja
Priority to DE10297653T priority patent/DE10297653T5/de
Priority to PCT/KR2002/002073 priority patent/WO2003067650A1/en
Priority to CNB028277597A priority patent/CN100423221C/zh
Priority to AU2002353582A priority patent/AU2002353582A1/en
Priority to US10/350,737 priority patent/US20040018752A1/en
Priority to US11/352,658 priority patent/US7579855B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
KR1020020006367A 2002-02-05 2002-02-05 Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby KR100358513B1 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
KR1020020006367A KR100358513B1 (en) 2002-02-05 2002-02-05 Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby
CN2008101355299A CN101354405B (zh) 2002-02-05 2002-11-08 测试电子装置用电接触元件的制造方法及电接触元件
JP2003566894A JP2005517192A (ja) 2002-02-05 2002-11-08 電子素子検査用の電気的接触体の製造方法及びこれによる電気的接触体
DE10297653T DE10297653T5 (de) 2002-02-05 2002-11-08 Verfahren zum Herstellen eines elektrischen Kontaktbauteils zur Prüfung einer elektrischen Vorrichtung und ein elektrisches Kontaktbauteil
PCT/KR2002/002073 WO2003067650A1 (en) 2002-02-05 2002-11-08 Method for manufacturing electric contact element for testing electro device and electric contact element thereby
CNB028277597A CN100423221C (zh) 2002-02-05 2002-11-08 测试电子装置用电接触元件的制造方法及所制得的电接触元件
AU2002353582A AU2002353582A1 (en) 2002-02-05 2002-11-08 Method for manufacturing electric contact element for testing electro device and electric contact element thereby
US10/350,737 US20040018752A1 (en) 2002-02-05 2003-01-23 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby
US11/352,658 US7579855B2 (en) 2002-02-05 2006-02-13 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020020006367A KR100358513B1 (en) 2002-02-05 2002-02-05 Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby

Publications (1)

Publication Number Publication Date
KR100358513B1 true KR100358513B1 (en) 2002-10-30

Family

ID=37490411

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020020006367A KR100358513B1 (en) 2002-02-05 2002-02-05 Method of fabricating electrical contactor for testing electronic device and electrical contactor fabricated thereby

Country Status (2)

Country Link
KR (1) KR100358513B1 (ko)
CN (1) CN101354405B (ko)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007018367A1 (en) * 2005-08-10 2007-02-15 Phicom Corporation Cantilever-type probe and method of fabricating the same
KR100790465B1 (ko) * 2007-04-04 2008-01-03 주식회사 아이엠 프로브 카드의 니들과 그의 제조 방법
KR100814325B1 (ko) 2007-12-28 2008-03-18 주식회사 파이컴 접속 소자의 접촉 팁 구조
WO2009084770A1 (en) * 2007-12-28 2009-07-09 Phicom Corporation Contact tip structure of a connecting element
KR101273970B1 (ko) 2006-12-11 2013-06-12 (주) 미코에스앤피 프로브의 탐침 및 프로브의 제조방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU3073797A (en) * 1996-05-17 1997-12-05 Formfactor, Inc. Wafer-level burn-in and test
CN1208624C (zh) * 1996-05-17 2005-06-29 福姆法克特公司 用于制造互连元件的方法
EP1135690B1 (en) * 1998-12-02 2003-06-04 Formfactor, Inc. Lithographic contact elements

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007018367A1 (en) * 2005-08-10 2007-02-15 Phicom Corporation Cantilever-type probe and method of fabricating the same
US7678587B2 (en) 2005-08-10 2010-03-16 Phicom Corporation Cantilever-type probe and method of fabricating the same
KR101273970B1 (ko) 2006-12-11 2013-06-12 (주) 미코에스앤피 프로브의 탐침 및 프로브의 제조방법
KR100790465B1 (ko) * 2007-04-04 2008-01-03 주식회사 아이엠 프로브 카드의 니들과 그의 제조 방법
KR100814325B1 (ko) 2007-12-28 2008-03-18 주식회사 파이컴 접속 소자의 접촉 팁 구조
WO2009084770A1 (en) * 2007-12-28 2009-07-09 Phicom Corporation Contact tip structure of a connecting element

Also Published As

Publication number Publication date
CN101354405A (zh) 2009-01-28
CN101354405B (zh) 2012-09-19

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