KR100354161B1 - Fault report controller of base station - Google Patents

Abstract

PURPOSE: A fault report controller of a base station is provided to manage a base station effectively by reducing overload of a node and a BSM monitor in a management system of a device generating a large number of faults burstly. CONSTITUTION: A fault generating detector(100) detects a fault by polling a device during a predetermined period. A fault generating accumulation counter(110) performs a fault report when the detected fault is generated first in the device. The counter(110) counts accumulatively a time of fault generation F(i,j) according to the kinds of fault when the detected fault is generated continuously and then initializes the value of a time of fault remove G(i,j). A continuous fault generation processing unit(140) performs a fault report when the number of the accumulation fault counted is reached to a predetermined fault report critical value(M) and initializes the counter of fault generation First_F(i,j). A fault remove detector(120) detects normalization of fault generated to the device. A fault remove accumulation counter(130) counts accumulatively the value of a time of fault remove G(i,j) in order to discriminate the normalization of the fault. When a time of normalization G(i,j) counted accumulatively is reached to the fault remove critical value(K), a continuous fault remove processing unit(150) initializes a time of the accumulated fault remove F(i,j).

Description

Base station defect report controller

The present invention relates to a system for controlling reporting of device faults that occur continuously.

In the conventional system, a fault report is to report each time an event corresponding to a fault occurs. That is, a fault report is generated whenever a fault occurs.

For example, let's say a fault management controller polling at 600msec detects L faults consecutively in N devices for 30 minutes. Then, this defect management controller reports as many as N × L × 3000 defects.

However, the conventional defect reporting system has the following problems. First, a report program is executed every time an event occurs, thereby increasing the load on an internal processor communication (IPC) node or an upper processor. Therefore, there is a fear that the system may overheat or malfunction.

The present invention is to solve this problem, in the management system (Device) Management system (Management System) of a large number of defects, the purpose of efficiently managing the base station by reducing the overload of the node and BSM monitor There is this.

1 is a block diagram showing a defect report management controller of the present invention.

2 is a flowchart illustrating the operation principle of the present invention.

Explanation of symbols for main parts of the drawings

100: defect occurrence detector (FOD) 110: defect accumulation counter (FOCA)

120: fault elimination detector (FCD) 130: fault elimination cumulative counter (FCCA)

140: continuous defect occurrence processing unit (BOFPS) 150: continuous defect erasure processing unit (BCFPS)

The present invention is characterized in that the defect generation controller and the defect erasing controller operate in interaction with each other.

The device fault management block 200 according to the present invention includes a fault generation controller (hereinafter referred to as FOC) and a fault erase controller (hereinafter referred to as FCC). 1 is a block diagram illustrating a device fault management unit of the present invention. The FOC includes a Fault Occur Detector (FOD) 100, a Fault Occur Counter Accumulator (FOCA) 110, and a BOFPS (Burstly Occured Fault Proccessing Sub-). block 140). In addition, the FCC includes a fault clear detector (FCD: Fault Clear Detector 120), a fault clear accumulator (FCCA: Fault ClearCounter Accumulator) (130), and a continuous fault clearing unit (BCFPS: Burstly Cleared Fault Proccessing Sub-). block 150).

The FOCA 110 accumulates the number of generated defects for each device, and accumulates for each kind of defects. In addition, the FCCA 130 determines whether the generated defect is normalized and counts the number of times that the normalization is normalized to determine whether the defect is normalized. The BOFPS 140 performs a function of determining when to perform a defect report, and the BCFPS 150 performs a function of determining whether to initialize a previously accumulated cumulative coefficient value.

The operation principle of the device defect management unit of the present invention is as follows. 2 is a flowchart illustrating the operating principle of the present invention. First, the device defect management unit 200 polls every 600 ms to detect faults generated from several different boards (board 1, board 2, ... board N). Then, it is determined whether a defect has occurred during polling. If a defect occurs, it is determined whether the specific defect has occurred and the type of the defect is determined. All defects detected in this process are simultaneously detected by FOD and FCD. The FOCA makes a fault report immediately if the detected fault is found to be a fault occurring in the normal state (First_F (i, j) = ON). (i, j). ++), to determine whether the situation occurs continuously.

In other words, if an event of a device was previously normal and found to be the first defect, a defect report is reported. This is because a fault event is generated continuously because it is determined that a defect report has already been reported when it is first detected as a fault event.

At this time, in order to determine the situation in which the fault occurs continuously, the fault count (F (i, j)) of each device and each fault type is accumulated and the erase counter ( Clear Counter) Initializes G (i, j). In this case, i is the number of devices, and j corresponds to the kind of defects generated in the device.

If F (i, j) is accumulated and G (i, j) is initialized, the FCCA of the FCC of the device defect management unit of the present invention determines whether the continuous occurrence of defects corresponding to the device in which the defect has occurred has been normalized. In order to judge, the fault clear count G (i, j) is accumulated by each device and the type of the fault.

Then, BOFPS compares F (i, j) with a defect report threshold value M, which is a predetermined reference value, in order to determine the timing of defect reporting, and continues to poll if F (i, j) is M or less. Fault) is detected, and when F (i, j) reaches M, a fault report is reported to all upper stage faults, and the fault occurrence counter is initialized to zero.

In parallel with this BOFPS, BCFPS compares G (i, j) with the defect elimination threshold K to determine whether to initialize the cumulative count of defects F (i, j) or to continue polling. If G (i, j) is less than or equal to K, polling is continued and defects are detected. If G (i, j) reaches K, the accumulated defect count F (i, j) for each type is initialized to zero.

Thus, BOFPS and BCFPS interact with each other to perform normal operation. The threshold values M and K may be appropriately selected according to the characteristics of the respective devices or the characteristics of the respective defects.

The present invention can improve the efficiency on the IPC node by reducing the number of reports of defects that occur in large quantities, and reduce the processor overhead. In addition, there is an advantage that the central control station can accurately determine the defects and abnormalities of the elements installed in the unmanned base station. In addition, by reducing the amount of message processing of the upper processor and the BSM monitor, it is possible to efficiently perform control and situation monitoring of the base station.

Claims (3)

A defect generation detector for detecting a defect by polling the device for a predetermined period; A defect accumulation cumulative counter which accumulates a defect occurrence count F (i, j) for each type of the device and the side of the defect detected by the defect occurrence detector and initializes the defect erasure count value G (i, j); A continuous defect generation processor for performing a defect report and initializing the cumulative counted number of occurrences of the defect when the number of counted defects F (i, j) reaches a first or predetermined defect report threshold value M; A defect elimination detector for detecting normalization of defects which have occurred in the device; A defect elimination cumulative counter that accumulates a count of the number of defect erasure times G (i, j) for each element and the type of the defect to determine whether the defect is normalized; And a continuous defect elimination processing unit for initializing the accumulated defect occurrence frequency F (i, j) when G (i, j) reaches a predetermined defect erasure threshold value K. Defect report control device, characterized in that. The method of claim 1, wherein the continuous defect occurrence processing unit initializes the defect elimination frequency G (i, j), reports a defect when the defect occurrence frequency F (i, j) is the defect report threshold value M, and the number of defect occurrences. Defect report control device, characterized in that for initializing. 2. The defect report control apparatus according to claim 1, wherein the continuous defect elimination processing unit initializes the defect elimination frequency and the number of defect occurrence times when the defect elimination frequency G (i, j) is the defect elimination threshold value (K).

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