KR100279927B1 - Multi-channel bit error rate test method in exchange - Google Patents

Abstract

By measuring the matching quality of the call line equipment by connecting the call line equipment provided in the exchange in the same way as the switch network matching in the actual call processing process, the operator's test request or interruption of the automatic test cycle If detected, the state of the device under test is checked, and if the device under test is located on a different subsystem, a packet for a test request is sent to the device under test to execute test processing on the device under test. Creating a process; determining if the device under test can occupy the entire channel under test; if the device under test can be occupied, using a call processing library to Allocate the entire channel in the same way as Forming a loop by outputting a device control signal for forming a loop between the device and the device under test, and switching between the test device and the device under test when a loop in which all channels are allocated between the bit error rate test device and the device under test is formed. The path setting process, the bit error rate test device generating the test data of the bit pattern and circulating the loop, and the bit pattern data generated by detecting the bit pattern data circulating the loop of the channel allocated by the device under test. And determining the switching network state in comparison with.

Description

Multi-channel bit error rate test method in exchange

The present invention relates to a bit error rate test method of the call routing equipment in the exchange, and more particularly, by connecting the call routing equipment provided in the exchange in the same way as the switch network matching in the actual call processing. It relates to a multi-channel bit error rate ("BER") test method in an exchange that provides reliability for measuring switch network matching quality.

The apparatus for testing the monetary system equipment in the conventional exchanger is provided in the TDX-10A series exchanger, which can be seen in the attached FIG. 1, the test side sub which is equipped with the BER test device 1a. In the system 1, an operator is assigned through a switch network 2 which switches a corresponding path when a call is connected to the sub-system 3 under test with the device under test 3a through input of predetermined data. Looping of the BER test device 1a of the test subsystem 1 and the device under test 3a of the test subsystem 3 by switching only one channel to be tested among a plurality of channels. Form in the state.

As described above, when the BER test device 1a of the test subsystem 1 and the device 3a of the test subsystem 3 are selected, the operator inputs data requesting the start of the test. The sub-system under test 3 having the device 1a is capable of proceeding by detecting whether the device under test 3 is executing a service or whether the module controlling the equipment is accessible to the equipment. If the test is judged to be possible, the test state is shifted and the corresponding channel is looped.

Subsequently, a channel of the BER test device 1a and a switch path of the corresponding test channel are set. When the BER test device 1a and the device under test are located in the same sub-system, only the time-switching is used for the switch path. If the device under test is located in different subsystems, time switching and space-switching are required simultaneously.

As described above, when the channel and the switch path of the BER test device 1a are set, the BER test device 1a generates a bit pattern for the test to the device under test 3a through a looped set channel. send.

At this time, the BER test device 1a of the test subsystem 1 detects, in seconds, the measurement bit pattern returned through the device under test 3a of the test subsystem 3 through a looped channel. The error value was counted against the value generated by the following test bit pattern, and then the channel state of the telephony equipment was measured from the counter value.

As described above, since the test of the call channel is performed on only one channel in the conventional exchange, in the case of a relay line or a PRI (Primary Rate Interface) subscriber, the channel is selected from various channels from the first channel to the thirty channel. Although the processing service is provided, the test result is not sufficiently reflected on this, and thus, there was a problem in that an accurate test could not be performed for each channel providing various call processing services in a real site.

In addition, in the case of the conventional BER test device, the looped bit pattern is measured in seconds, so that reliability of the determination of each channel state is degraded, and the function of measuring the BER for the v5.2 interface is provided in the existing exchange. There was a problem that could not be measured for the v5.2 interface.

The present invention has been made in view of the above-described general problems, and an object thereof is to ensure that the channel assignment and the switching matching of the network in the actual call processing are made identical in the test of the call-path equipment at the exchange. It is intended to provide a reliable test of the test by ensuring that the site can perform a normal function when performing the service and to test all cases where the equipment can match the switch network.

In addition, a loop can be formed for the B-channel on the v5.2 interface to measure the BER of each channel.

1 is a block diagram showing a bit error rate test method of the call system equipment in a conventional exchange,

2 is a block diagram showing a multi-channel bit error rate test method of the call system equipment in the exchange according to an embodiment of the present invention.

<Explanation of symbols for main parts of the drawings>

10: test side subsystem 10a: BER test device

20: test host system 30: space switch

40: host system under test 50: sub system under test

According to the present invention for achieving the above object, in the BER test method of the call system equipment of the exchanger, the state of the device under test is checked when an operator's test request or interruption of the automatic test cycle is detected. Process of doing;

If the devices under test are located on different subsystems, transmitting a packet for a test request to a corresponding device under test to generate a process for executing test processing on the device under test;

Determining whether the device under test can occupy the entire channel to be tested if the device under test is capable of being tested;

If all channels can be occupied in the above state, the call processing library is used to allocate all channels in the same manner as the actual call processing method, and then outputs a device control signal for forming a loop between the BER test device and the device under test. Forming a loop;

Setting a switch path between both devices when a loop in which an entire channel is allocated is formed between the BER test device and the device under test;

The BER test device generating test data of the bit pattern to cycle the loop;

And comparing the bit pattern data generated by detecting bit pattern data circulated through the loop of the channel allocated from the device under test to the generated bit pattern data, and determining the state of the switching network.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

As can be seen in Figure 2, to test the BER of the multi-channel in the currency path of the exchange according to an embodiment of the present invention, the BER test device 10a provided in the test subsystem 10 is tested. The host system 20 is connected to the multi-channel path through time switching to transmit the test bit pattern and receive the looped test data. The test host system 20 and the host under test 40 are connected. The spatial switch 30 to be connected is connected through one optical line to transmit and receive bit pattern test data transmitted and received in a multi-channel path through one optical line, and the spatial switch 30 and the host under test ( 40) are connected via a single optical line to allow the transmission and reception of bit pattern data for the test.

In addition, the device under test 50 and the device under test 50 provided in the subsystem under test 50 are looped through a multi-channel path to transmit and receive bit pattern data for a test.

In the present invention having the connection structure as described above, the operation for the multi-channel BER test is as follows.

If the test request signal of the operator for the test of the monetary system equipment is detected at the exchange or the interrupt signal of the set automatic test cycle is detected at the BER test device 10a of the test subsystem 10, the BER test device 10a If you are a CEPT (Conference of European Postal and Telecommunication) trunk or PRI subscriber, you must enable looping of all bit pattern test data inside the E1 link, and if you are a subscriber concentrator, all bit pattern test data on the condensing channel inside the site. The looping of the device under test 50a, such as the equipment number of the device under test and whether the device 50a can be looped from the length of the channel through which the bit pattern test data is looped, should be possible. Check the status.

In the above case, when the BER test device 10a and the device under test 50a are located on the same subsystem, the test host system 20 and the device under test are not tested unless the space switch 30 is directly tested. Only the time switches 20a and 40a provided in the host system 40 set a channel path for the test, and the BER test device 10a and the device under test 50a are located on different subsystems. If so, the link channel between the host system under test and the host system under test and the remote sub system should be allocated according to whether the devices are located in the remote sub system, and if the space switch 30 is connected via the Internetworking Subsystem (IS), It is necessary.

In the above check, if it is determined that the device under test 50a is located in different subsystems, the test subsystem 10 occupies a channel and sends a channel test request signal (BERMsmtLpRdyRQ) to the subsystem under test 50. ) To generate the process for future processing of the test data.

As described above, if it is determined that the device under test 50a is a testable device and is in an accessible state by checking the state of the device under test 50a, it is checked whether a looping length channel can be looped from an input value. Verify that the test channel can be occupied in its entirety.

If the entire test channel can be occupied in the above, all the channels are allocated in the same manner as the call processing method so that various call processing services are provided in the test function. That is, the channel is allocated to the test state by using the call processing library.

As described above, in each state in which all of the channels are transitioned to the test state, the sub-system under test 50 performs a test bit pattern, which is a device control signal for controlling the device under test 50a to loop the assigned test channel. BERMsmtLpRdyRQ) data is generated, looping is established, and the result is applied to the test host system 20. The test host system 20 then connects the matching contact of the spatial switch 30 through a single optical line of the assigned channel. The test bit pattern data is transmitted to the host 40 under test.

The host under test 40 forms the test bit pattern data applied from the space switch 30 through a single optical line in a multi-channel path through the time switching 40a, thereby preventing the test target sub-system 50 from being tested. Looping test device 50a and then test bit pattern data received via the assigned multi-channel path through the time switch 40a to the test switch host system via the assigned one optical line with spatial switch 30 Loop at (20).

The time switching 20a of the test-side host system 20 sends the test bit pattern data, which is looped and received through a single optical line allocated with the spatial switch 30, to the time switching 20a as a multi-channel path. After matching, it is applied to the BER test device 10a side of the test subsystem 10.

Accordingly, the BER test device 10a of the test subsystem 10 receives looped and re-applied test bit pattern data and then transmits the received test bit pattern data and the received data in milliseconds (to test the channel condition). It compares by Mili-Second) unit and determines the channel matching state of the equipment.

When the channel switching path for looping the test bit pattern data is set in the same manner as the path of the call processing process, if space switching is required, it must be via one optical line, and the test host system 20 and When the host system 40 under test and the remote subscriber matching device are connected by the CEPT link, the test bit pattern is adjusted by adjusting the time slot synchronization of the test bit pattern data transmitted and received through each channel so as to pass through one CEPT link. It prevents the loss of data by transferring it through another path.

As described above, the present invention performs the allocation and switching of channels in the same manner as the actual call processing service in circulating the test call system of the exchange to circulate the test bit pattern data so that the device under measurement provides a service at the site. It is possible to accurately detect whether a normal function can be performed at the time of the test, thereby providing reliability in the progress of the test, and to test all cases where the equipment under test can be matched to the switch network of the exchanger. The performance and quality of the product can be judged stably.

In addition, the present invention provides reliability in the test results measured by measuring the error of BER in milliseconds, and can form a loop for the B-channel on the v5.2 interface, thereby providing reliability for matching test of the network. .

Claims (5)

A BER test method of a call path equipment of a switch, the method comprising: checking a state of a device under test when an operator's test request or an interruption of an automatic test cycle is detected; If the devices under test are located on different subsystems, transmitting a packet for a test request to a corresponding device under test to generate a process for executing test processing on the device under test; Determining whether the device under test can occupy the entire channel to be tested if the device under test is capable of being tested; If all channels can be occupied in the above state, the call processing library is used to allocate all channels in the same manner as the actual call processing method, and then outputs a device control signal for forming a loop between the BER test device and the device under test. Forming a loop; Setting a switch path between the test device and the test device when a loop is formed in which the entire channel is allocated between the BER test device and the device under test; The BER test device generating test data of the bit pattern to cycle the loop; And detecting bit pattern data circulated through the loop of the channel allocated from the device under test, and comparing the bit pattern data with the generated bit pattern data to determine the state of the switching network. Channel bit error rate test method. The multi-channel path of claim 1, wherein the BER test device and the test host system in the test sub-system are looped in a multi-channel path by matching through time switching due to the allocation of the entire channel. The path is connected by one optical line or CEPT link by matching through a space switch and looped to the host under test, and the loop connected by one optical line to the host under test is multi-channel matched by time switching. A multi-channel bit error rate test method in an exchange characterized in that it loops to the device under test of the subsystem side. The method of claim 1, wherein the test host and the test host set a new call processing library to allocate a plurality of channels on one optical line or a CEPT link, and synchronize synchronization between time slots. Multi-channel bit error rate test method at exchange. The multi-channel bit error rate test method according to claim 1, wherein the multi-channel allocation information is included in the multi-channel test request data for transmission to the device under test and transmitted to the device under test. 2. The method of claim 1, wherein the status check of the device under test checks whether substantial looping is possible by the device number of the device under test and the length of the loop channel.