KR100273982B1 - Device for loading and unloading semiconductor device in test socket - Google Patents

Abstract

PURPOSE: A loading/unloading device in a test socket is provided to prevent damage of the socket by correcting the position of element after tightly fixing it. CONSTITUTION: A guide block(10) is prepared to contact with an element when a picker is descending, in one-piece with a latching member. A first setup plane(12) of a guide is connected to the element top at the bottom of the guide block(10). The guide comprises the first setup plane(12), a second setup plane(13) and a sloping plane(14) and corrects the element position. A base block(16) which can be elevated between the picker and a socket(15) leads the motion of the guide block(10). An elevating member(17) pushes a switch of the socket(15).

Description

Device for loading and unloading semiconductor device in test socket

The present invention relates to a device loading and unloading device in a test socket adapted to be suitable for carrying out another property test by transferring a device after completion of the property test in one socket to another socket.

1 is a perspective view showing a structure of a general test socket and FIG. 2 is a longitudinal sectional view showing a part of FIG. 1, wherein the socket of the above structure serves as an electrical connection between the device and the tester when inspecting the electrical characteristics of the finished device. Done.

Looking at the configuration, a housing (1) made of synthetic resin having a cavity (3) in which the device (2) is seated in the center, and a contact pin (fixed) in the same manner as the lead of the device in the housing and in electrical contact with the device during the test (4) and a pressing piece (5) installed above the contact pin to deform the contact pin to the outside of the cavity as it is pushed downward so that the device can be loaded into the cavity or the unloaded device can be unloaded. Consists of.

Therefore, if the external force is not applied to the pressing piece 5, the contact pin 4 is maintained in the original state by the elastic force of the ring portion 4a and is in a state of being connected with the lead 2a of the element 2.

However, in order to load the device 2 into the cavity 3 or to unload the tested device, as shown in FIG. 3, the picker 6 is lowered and the pusher 7 fixed to the picker 7 of the pressing piece 5 is removed. When the picker 6 is further lowered in the state of being connected to the upper surface, the pressing piece 5 is pressed by the pusher 7, and accordingly the ring portion 4a of the contact pin 4 is deformed, thereby allowing the cavity 3 to be deformed. The pad 8 is attracted to and unloaded the element 2 in the cavity 3 because it is released to the outside and is released from the connection with the lid 2a.

The element unloaded by the picker 6 in this way is transported to another socket side located nearby for another characteristic check and loaded by the opposite operation as described above.

However, since the picker 6 is horizontally moved at a high speed by the robot in order to reduce the cycle time due to the transfer of the device, the conventional device is absorbed by the pad 8 due to the resistance of the picker transfer. (2) and a slip occurs on the adsorption surface of the pad, and thus the position of the device is frequently changed, and thus the device cannot be loaded correctly into the cavity 3 in the test socket when the device is loaded.

In addition, when the picker 6 picks up the device while the device 2 is twisted in the cavity 3 of the socket, there is no means for correcting the device. Since the position of the is incorrect, the lead bent (lead bent) occurs during the test, or the socket or parts are damaged.

The present invention has been made to solve such a problem in the prior art, and even if the device is twisted in the cavity of the socket, the position of the device is corrected when the pad absorbs the device and ascends the device so that the adsorbed device can be accurately inserted into another socket. The purpose is to make it loadable.

Another object of the present invention is to prevent slippage from occurring on the adsorption surface of the device adsorbed on the pad, no matter how quickly the picker adsorbing the device is transported.

According to an embodiment of the present invention for achieving the above object, a pad for adsorbing the device to the picker and a contact pin and a pressing piece is installed in the socket so that the device in the test socket so that the device is adsorbed to the pad according to the lifting of the picker In the loading and unloading apparatus, the guide block is installed to be able to elevate to the outer circumferential surface of the pad and is in contact with the device when the picker is lowered, and a locking block is formed integrally with a locking piece for lowering control, and is formed at the lower end of the guide block. The guide portion for correcting the position of the element to be adsorbed by the first seating surface and the second seating surface and the inclined surface to which the vertical part of the lead is connected, and is provided between the picker and the socket to move up and down to move the guide block Tess consisting of a base block for guiding the lifting block formed on the base block and pressing the pressing piece of the socket The loading and unloading device in a socket apparatus.

1 is a perspective view showing the structure of a typical test socket

2 is a longitudinal cross-sectional view of a portion of FIG. 1;

3 is a schematic view showing a conventional apparatus

4A and 4C are longitudinal cross-sectional views illustrating the present invention.

4A shows a device loaded into a test socket and a picker positioned directly above the test socket.

4B is a diagram in which the picker is lowered and the pad is connected to the upper surface of the device;

4C is a state diagram in which positions of elements adsorbed on a pad are rearranged

5 is an enlarged view of a main portion of a guide block for explaining a process in which positions of elements that are adsorbed out of alignment are rearranged;

Explanation of symbols for main parts of the drawings

6: picker 8: pad

10: guide block 12: first seating surface

13: 2nd seating surface 14: inclined surface

15 Socket 16 Base Block

17: getting on and off

Hereinafter, the present invention will be described in more detail with reference to FIGS. 4 and 5 as an embodiment.

4A, 4B, and 4C are longitudinal cross-sectional views for explaining the present invention, and FIG. 5 is an enlarged view of a main portion of the guide block for explaining a process of rearranging the positions of elements that are shifted, and are installed in the picker 6. The locking piece 9 is integrally formed at both sides of the outer peripheral surface of the pad 8, and a guide block 10 having a guide part for correcting the position of the device is provided at the bottom of the pad 8 so as to be liftable. Between the guide block 10 is provided with an elastic member 11, such as a coil spring for pushing the guide block downward when no external force is applied to the guide block.

The guide portion formed under the guide block 10 has a first seating surface 12 to which the upper surface of the element 2 is connected, and a second seating surface to which the vertical portion 2b of the bent lead 2a is connected. 13 and an inclined surface 14 for correcting the position of the twisted element 2 by connecting the lead according to the position of the element before the element 2 adsorbed on the pad 8 touches the first seating surface 12. )

In addition, a base block 16 for guiding the position of the guide block 10 is provided between the picker 6 and the socket 15 so as to be liftable, and a pressing piece of the socket 15 is mounted on the guide block 10. A lifting piece 17 for pushing the contact pin 4 downward to the outside of the cavity 3 by pressing downwards therein is elastically installed, and the picker 6 has a base block 16 and a lifting piece 17. The support piece (not shown) which supports is fixed.

At this time, the base block 16 is formed with a guide hole 16a for guiding the outer circumferential surface of the guide block 10 so that when the picker 6 descends, the outer circumferential surface of the guide block 10 is a guide of the base block 16. It descends in the state guided by the ball 16a.

Referring to the operation of the present invention configured as described above is as follows.

For convenience, the process of loading the device 2 into one of the sockets 15 and performing a test and then unloading by the picker 6 and loading into another adjacent socket for another test will be described. Shall be.

When the picker 6 is moved horizontally along the guide rail (not shown) by the robot and is positioned perpendicular to the element 2 in the socket 15 as shown in FIG. 4A, the picker 6 is lowered by lifting means. do.

When the picker 6 is lowered as described above, the base block 16 and the elevating piece 17 which are suspended by the support piece (not shown) are lowered at the bottom of the picker at the same time so that the bottom surface of the elevating piece 17 is the socket 15. Is connected to the pressing piece 5 (see FIG. 3).

If the picker 6 is further lowered in such a state, the gap between the base block 16 and the elastic base is narrowed, and the pressing piece 5 starts to be pressed. Therefore, the contact connected to the lead 2a of the element 2 is reduced. The pin 4 is opened to both sides of the cavity 3.

In the operation as described above, the outer peripheral surface of the guide block 10 installed to the outside of the pad 8 is guided and lowered by the guide hole 16a formed in the base block 16, and at the same time, the locking piece 9 is the base block. Since the upper surface of (16) comes in contact, the lowering is controlled.

Accordingly, even if the picker 6 is lowered, the guide block 10 is not lowered, so that the elastic member 11 receives a compressive force.

Thereafter, the pad 8 is connected to the upper surface of the element 2 as shown in FIG. 4B by the continuous lowering of the picker 6, wherein the bottom of the guide block 10 is spaced apart from the upper surface of the element 2 by a predetermined distance. Will be.

In this state, when a vacuum pressure is applied to the pad 8, the element 2 in the cavity 3 is adsorbed to the pad 8.

After the element 2 in the socket 15 is adsorbed to the pad 8 by the above-described operation, the picker 6 located at the bottom dead center is raised. When the picker 6 is raised, the locking piece ( 9) the lowering is controlled so that the position of the element 2 adsorbed to the pad 8 is rearranged by the guide means of the guide block 10 spaced apart from the upper surface of the element 2 by some means. More specifically, it is as follows.

When the element 2 adsorbed to the pad 8 is driven up by the picker 6, the guide block 10 elastically installed at the lower part of the picker 6 by the elastic member 11 does not rise together with the picker. Since the state of being stopped within the flow range of the block is maintained, the leads 2a extending to both sides of the element are connected to the inclined surfaces 14 of the guide block 10 as shown in FIG.

Accordingly, even if the element 2 is twisted and adsorbed on the pad 8, slip occurs between the pad 8 and the upper surface of the element 2 so that the leads 2a positioned on both sides of the element are inclined. The position is corrected so as to be uniformly connected by.

When the pad 8 is raised by the operation as described above, the pad 8 is located at the bottom dead center of the guide block 10 (the point where the pad 8 is located at the bottom by the restoring force of the elastic member) with the position of the element 2 corrected. If further up to), the upper surface of the element 2 adsorbed on the pad 8 is connected to the first seating surface 13 of the guide block 10 as shown in FIG. 4C and at the same time the vertical portion 2b of the lid 2a. Maintains the state connected to the second seating surface (13).

After unloading the element 2 in the socket 15 as described above, the guide block 10 exits the guide hole 16a formed in the base block 16, and the base block 16 and the lifting piece which are in contact with each other. While the 17 is maintained by the elastic member 18 and the picker 6 is reduced as shown in FIG. 4A in an initial state, the element 2 adsorbed to the pad 8 is connected to another adjacent socket. By loading, you can test different electrical performances.

As described above, even if the picker 6 moves horizontally at a high speed to load the element 2 in an adjacent socket, the vertical portion of the lead 2 is connected between the opposing second seating surfaces 13. Since no slip occurs between the pad 8 and the top surface of the device 2, the device can be loaded accurately into the cavity of the socket.

As described above, according to the present invention, the picker does not change the position of the element loaded in the socket, but is correctly adsorbed and then loaded into another adjacent socket, as well as loading the twisted element by position correction. It is possible to prevent damage of lead bands, sockets or components of the device due to inaccuracies.

Claims (2)

Device loading and unloading in a test socket where a pad 8 for adsorbing the device is installed on the picker 6 and a contact pin and a pressing piece are installed on the socket 15 so that the device is adsorbed to the pad as the picker moves up and down. In the device, the guide block 10 is provided so as to be elevated on the outer circumferential surface of the pad and formed in contact with the device when the picker is lowered and integrally formed with a locking piece for lowering control, and is formed at the lower end of the guide block and has an upper surface of the device. A guide portion for correcting the position of the element to be adsorbed, comprising a first seating surface 12 to be connected, a second seating surface 13 to which the vertical portion of the lead is connected, and an inclined surface 14, and elevating between the picker and the socket; Test socket, characterized in that consisting of a base block 16, which is installed to guide the movement of the guide block and the lifting piece 17 formed on the base block to press the pressing piece of the socket. A device for loading and unloading device. The method of claim 1, A guide hole 16a for guiding the outer circumferential surface of the guide block is formed in the base block 16 so that when the picker descends, the outer circumferential surface of the guide block is lowered while being guided to the guide hole of the base block. Unloading device.