KR100271558B1 - Resin Leakage Inhibition and Surface Corrosion Prevention Composition of Copper-based Leadframes - Google Patents

Resin Leakage Inhibition and Surface Corrosion Prevention Composition of Copper-based Leadframes Download PDF

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KR100271558B1
KR100271558B1 KR1019980036424A KR19980036424A KR100271558B1 KR 100271558 B1 KR100271558 B1 KR 100271558B1 KR 1019980036424 A KR1019980036424 A KR 1019980036424A KR 19980036424 A KR19980036424 A KR 19980036424A KR 100271558 B1 KR100271558 B1 KR 100271558B1
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lead frame
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황길남
박성우
김세진
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김무
주식회사아큐텍반도체기술
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
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    • C09D7/61Additives non-macromolecular inorganic
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D5/00Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
    • C09D5/08Anti-corrosive paints
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D7/00Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
    • C09D7/40Additives
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    • C09D7/63Additives non-macromolecular organic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads

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Abstract

본 발명은 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물에 관한 것으로, 탈이온수의 일정중량에 대한 중량비로서 고급알킬 인산에스테르염 및 고급알킬아릴 폴리에톡시 인산에스테르염으로부터 선택된 임의의 1종인 수지누출 억제제 0.01∼0.5 중량부와; 벤조트리아졸, 벤지이미다졸 및 벤조트리아졸 카르복실산으로부터 선택된 임의의 1종인 부식방지제 0.005∼0.1 중량부와; 인산 및 황산으로부터 선택된 임의의 1종인 pH 조절제 0.085∼0.3 중량부와; 용해제인 수산화나트륨 0.002∼0.7 중량부가 함유되어 pH가 2∼5pH로 유지되도록 조성하여 구리계 리드프레임의 표면 부식을 방지하는 동시에 반도체 칩과 은 도금층이 형성된 다이패드간의 접착계면을 따라 흘러나오는 저분자 수지누출물에 의한 와이어본딩 신뢰성 저하를 억제할 수 있는 특징이 있다.The present invention relates to a resin leakage inhibiting and surface corrosion preventing composition of a copper-based lead frame, which is any one selected from higher alkyl phosphate ester salts and higher alkylaryl polyethoxy phosphate ester salts as a weight ratio to a certain weight of deionized water. 0.01 to 0.5 parts by weight of a resin leakage inhibitor; 0.005 to 0.1 parts by weight of any one kind of corrosion inhibitors selected from benzotriazole, benzimidazole and benzotriazole carboxylic acid; 0.085 to 0.3 part by weight of a pH adjuster selected from phosphoric acid and sulfuric acid; It contains 0.002 ~ 0.7 parts by weight of sodium hydroxide as a solvent to maintain the pH at 2 ~ 5pH to prevent surface corrosion of the copper lead frame and at the same time, low molecular resin flowing out along the adhesive interface between the semiconductor chip and the die pad on which silver plating layer is formed. There is a feature that can suppress the decrease in the wire bonding reliability due to leakage.

Description

구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물Resin Leakage Inhibition and Surface Corrosion Prevention Composition of Copper-based Leadframes

본 발명은 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물에 관한 것이다.The present invention relates to a resin leakage inhibiting and surface corrosion preventing composition of the copper-based lead frame.

특히, 본 발명은 구리계 리드프레임의 다이패드 상에 은 에폭시 접착제를 도팅한 후 반도체 칩을 접착하여 경화하는 경우에 저분자 수지성분이 접착계면을 따라 흘러나와 리드프레임을 오염시키는 것을 방지하는 동시에 구리계 리드프레임의 표면이 부식되는 것을 방지하도록 조성된 조성물에 관한 것이다.Particularly, in the present invention, when a silver epoxy adhesive is doped onto a die pad of a copper lead frame and a semiconductor chip is bonded and cured, a low molecular resin component flows out along an adhesive interface to prevent contamination of the lead frame. It relates to a composition that is formulated to prevent corrosion of the surface of the system leadframe.

통상적으로, 다이접착공정에 의해 반도체 칩은 리드프레임의 은 도금층이 형성된 다이패드 상부면과 은 에폭시 계열의 접착제에 의해 접착된다. 이와 같이, 다이접착공정이 완료된 리드프레임은 반도체 칩의 하부면과 다이패드의 상부면의 접착계면을 따라 은 에폭시가 경화되는 과정에서 수지의 저분자 부분이 흘러나와 반도체 칩의 본딩패드들과 각기 대응하여 본딩와이어에 의해 전기적으로 연결되는 내부리드들의 은 도금층이 형성된 선단부를 오염시킴으로써, 추후 진행되는 와이어 본딩공정의 신뢰성이 저하되는 단점이 있었다. 따라서, 이러한 리드프레임은 와이어 본딩공정의 신뢰성을 보장하기 위해 별도의 화학세정 공정이 요구되는 공정상의 번거러움이 있었다.Typically, the semiconductor chip is bonded by a die epoxy upper surface to the die pad upper surface on which the silver plating layer of the lead frame is formed by a die bonding process. As described above, the lead frame in which the die bonding process is completed, the low molecular portion of the resin flows out during the curing process of the silver epoxy along the adhesive interface between the lower surface of the semiconductor chip and the upper surface of the die pad, and correspond to the bonding pads of the semiconductor chip. By contaminating the front end portion of the silver plating layer of the inner leads electrically connected by the bonding wire, there was a disadvantage in that the reliability of the wire bonding process to be carried out in the future. Therefore, this lead frame has a cumbersome process that requires a separate chemical cleaning process to ensure the reliability of the wire bonding process.

또한, 구리 또는 구리합금(이하 "구리계"라 한다) 리드프레임은 보관 중에 쉽게 부식되기 때문에, 전술된 공정과 그 이후에 진행되는 공정에 앞서 부식방지제를 표면에 코팅하여 사용된다. 그러나, 벤조트리아졸, 벤지이미다졸 또는 벤조트리아졸 카르복실산 등을 포함하는 대부분의 구리의 부식방지제는 리드프레임의 은도금된 표면의 표면에너지를 증가시켜 수지누출을 오히려 증가시키는 역기능으로 작용하게 되어 수지누출 억제와 구리계 리드프레임의 표면 부식방지라는 두 가지 문제를 동시에 해결할 수 있는 기술이 요구되고 있는 실정이다.In addition, since the copper or copper alloy (hereinafter referred to as “copper-based”) leadframe is easily corroded during storage, it is used by coating a corrosion inhibitor on the surface prior to the above-described process and subsequent processes. However, most copper corrosion inhibitors, including benzotriazole, benzimidazole, or benzotriazole carboxylic acid, act as a dysfunction to increase the surface energy of the silver-plated surface of the leadframe, rather increasing the resin leakage. There is a need for a technology that can simultaneously solve two problems: suppression of resin leakage and prevention of surface corrosion of a copper-based lead frame.

이에 본 발명은 상기와 같은 문제점을 고려하여 창출된 것으로서, 그 목적은 구리계 리드프레임의 표면이 부식되는 것을 방지함과 동시에, 다이패드와 반도체 칩을 접착하는 은 에폭시 접착제의 경화시 접착계면을 따라 흘러나오는 저분자 수지의 누출을 억제할 수 있는 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물을 제공함에 있다.Accordingly, the present invention has been made in consideration of the above problems, and an object thereof is to prevent corrosion of the surface of a copper-based lead frame, and at the same time, to prevent an adhesion surface during curing of a silver epoxy adhesive that bonds a die pad and a semiconductor chip. The present invention provides a composition for inhibiting resin leakage and preventing surface corrosion of a copper-based lead frame capable of suppressing leakage of low molecular resin flowing out.

이러한 본 발명의 목적은, 주성분으로 a)수지누출의 억제를 위한 수용성 인산에스테르염과 b) 구리계 리드프레임 표면의 부식방지제인 벤조트리아졸 또는 벤지이미다졸 화합물 등과 c)보조성분으로 pH 조절제인 인산 또는 황산 그리고, d)보조성분으로 용해제인 수산화나트륨을 일정성분비에 따라 함유하여 조성된 조성물을 제공하여 달성된다.The object of the present invention is a benzotriazole or benzimidazole compound which is a) a water-soluble phosphate ester salt for suppressing resin leakage as a main component and b) a corrosion inhibitor on the surface of a copper-based lead frame, and c) a pH regulator as an auxiliary component. It is achieved by providing a composition composed of phosphoric acid or sulfuric acid and d) sodium hydroxide as an auxiliary component according to a certain ratio.

여기서, 본 발명에 사용된 수지누출 억제제는 예컨대, 고급알킬 인산에스테르염, 알킬아릴알콕시 인산에스테르염 또는 고급알킬아릴 폴리에톡시 인산에스테르염이며 그 함량은 수세용액(탈이온수)을 기준으로 0.01∼0.5중량부이다. 그리고, 벤조트리아졸, 벤지이미다졸 또는 벤조트리아졸 카르복실산 등의 함량은 0.001∼0.05중량부인데 수지수출 억제제를 기준으로 그 중량비가 10:1∼100:1(수지누출 억제제:부식방지제)을 유지해야 한다. 또한, pH조절제로는 인산이나 황산을 사용하는데 그 함량은 0.085∼0.3중량부이며 보다 바람직하게는 0.16중량부이다. 특히, pH조절제의 산도는 2∼5pH를 유지하여야 한다. 여기서, 수산화나트륨은 고급알킬 인산에스테르염과 벤조트리아졸 카르복실산이 물에 대한 수용도가 매우 낮아 용해제로서 첨가된 것으로,Here, the resin leakage inhibitor used in the present invention is, for example, a higher alkyl phosphate ester salt, an alkylarylalkoxy phosphate ester salt or a higher alkylaryl polyethoxy phosphate ester salt, the content of which is 0.01 to based on a washing solution (deionized water). 0.5 parts by weight. The content of benzotriazole, benzimidazole or benzotriazole carboxylic acid is 0.001 to 0.05 parts by weight, and the weight ratio is 10: 1 to 100: 1 based on the resin export inhibitor (resin inhibitor: corrosion inhibitor). Should be maintained. In addition, phosphoric acid or sulfuric acid is used as a pH adjuster, and the content is 0.085-0.3 weight part, More preferably, it is 0.16 weight part. In particular, the pH of the pH adjuster should be maintained at 2-5pH. Here, sodium hydroxide is a high alkyl phosphate ester salt and benzotriazole carboxylic acid is added as a solubility because of very low water solubility in water,

본 발명에 사용된 고급알킬아릴알콕시 인산에스테르염은 극성을 가진 인산기가 은 도금층과 결합, 예컨대 흡착하여 표면에너지를 낮추어 비극성의 표면을 구현하게 됨으로써 반도체 칩과 다이패드의 접착계면을 따라 저분자 수지성분이 흘러나오는 것을 억제하는 역할을 한다. 또한, 적절한 비율로 첨가된 벤조트리아졸, 벤지이미다졸 또는 벤조트리아졸 카르복실산 등은 선택적으로 구리계 리드프레임의 표면과 결합하여 금속의 부식을 억제하는 작용을 동시에 수행한다.The higher alkylarylalkoxy phosphate ester salt used in the present invention is a low molecular resin component along the adhesion interface between the semiconductor chip and the die pad, since a phosphoric acid group having a polarity is combined with a silver plating layer, for example, by adsorbing to lower the surface energy to realize a nonpolar surface. It serves to suppress this flow. In addition, benzotriazole, benzimidazole or benzotriazole carboxylic acid or the like added in an appropriate ratio may be selectively combined with the surface of the copper-based lead frame to simultaneously inhibit the corrosion of the metal.

그리고, 수산화나트륨은 고급알킬 인산에스테르염과 벤조트리아졸 카르복실산이 물에 대한 수용도가 매우 낮아 이들의 용해제로서 첨가된 것으로, 고급알킬 인산에스테르염과 벤조트리아졸 카르복실산에 대한 중량비가 각기 1:1 및 2:1로 유지되어야 한다.In addition, sodium hydroxide was added as the solubilizer of the higher alkyl phosphate ester salt and benzotriazole carboxylic acid having a very low water solubility in water, and the weight ratio of the higher alkyl phosphate ester salt and the benzotriazole carboxylic acid was different. It should remain 1: 1 and 2: 1.

특히, 조성비율(수지누출 억제제:부식방지제)이 10:1이상이면 부식방지효과는 양호하나 수지누출의 억제효과가 저하되는 반면, 100:1이하이면 수지누출 억제효과는 양호하나 부식방지효과가 양호하지 못하다.In particular, if the composition ratio (resin leakage inhibitor: corrosion inhibitor) is 10: 1 or more, the corrosion prevention effect is good, but the inhibitory effect of resin leakage is lowered. Not good

이하, 본 발명의 바람직한 실시예를 설명하면 다음과 같다.Hereinafter, preferred embodiments of the present invention will be described.

[실험방법]Experimental Method

(1) 시료처리(여기서, "시료"란 구리계 리드프레임으로 특히, 다이패드 상부면에 은 도금층이 형성된 것이다)(1) Sample treatment (here, "sample" is a copper-based lead frame, in particular a silver plating layer formed on the upper surface of the die pad)

수지누출 억제제와 부식방지제를 기본조성으로 하여 선택적으로 pH조절제와 용해제를 표 1∼표 4에 나타나 있는 바와 같이 일정조성된 용액을 비커에 500㎖ 정도 충전하여 준비한다. 여기서, 용액이란 탈이온수의 일정중량에 대한 중량비로서 수지누출 억제제, 부식방지제, pH조절제 및 용해제가 일정 중량부 함유된 조성물을 의미한다.A resin leakage inhibitor and a corrosion inhibitor are used as basic compositions, and a pH control agent and a dissolving agent are optionally prepared by filling a beaker with about 500 ml of a predetermined solution as shown in Tables 1 to 4. Here, the solution refers to a composition containing a predetermined weight part of a resin leakage inhibitor, a corrosion inhibitor, a pH adjusting agent and a dissolving agent as a weight ratio to a predetermined weight of deionized water.

그런 다음, 실온상태 하에서 시료를 용액에 침지시켜 5∼10초 동안 교반한 후 시료를 분리하여 8∼15초, 바람직하게는 10초 동안 탈이온수를 이용하여 수세하여 건조한다.Then, the sample is immersed in the solution at room temperature, stirred for 5 to 10 seconds, the sample is separated, washed with water and dried with deionized water for 8 to 15 seconds, preferably 10 seconds.

(2) 수지누출시험(2) Resin Leak Test

시료처리후, 은 도금층 위에 은 에폭시를 떨어뜨려 25∼35초, 바람직하게는 30초동안 방치한 후 170∼180℃, 바람직하게는 175℃로 유지할 수 있는 오븐에서 50∼70분, 바람직하게는 60분 동안 가열하여 시료처리 전후 수지누출물의 크기를 비교측정한다.After sample treatment, the silver epoxy was dropped on the silver plating layer and left for 25 to 35 seconds, preferably 30 seconds, and then 50 to 70 minutes in an oven capable of maintaining at 170 to 180 ° C, preferably at 175 ° C. Heat for 60 minutes and measure the size of resin leakage before and after sample treatment.

(3) 부식방지시험(3) Corrosion prevention test

비커에 탈이온수를 500㎖정도 충전한 후 90∼110℃, 바람직하게는 100℃를 유지한 상태에서 시료를 침지하여 8∼13분, 바람직하게는 10분 동안 끓인 후 건조한다. 이렇게 건조된 시료의 표면 변색정도를 비교측정하여 방청효과를 확인한다.After filling the beaker with about 500 ml of deionized water, the sample is immersed in a state of 90 to 110 ° C., preferably at 100 ° C., boiled for 8 to 13 minutes, preferably 10 minutes, and dried. The degree of surface discoloration of the dried sample is measured and compared to check the antirust effect.

여기서, 표 1 내지 표 4에 기재된 수지누출 억제제 A,A′,A″는 각기 고급알킬 인산에스테르염, 고급알킬아릴알콕시 인산에스테르염 및 고급알킬아릴 폴리에톡시 인산에스테르염이고, 부식방지제 B,B′,B″는 각기 벤조트리아졸, 벤지이미다졸 및 벤조트리아졸 카르복실산이고, pH조절제 C는 인산 또는 황산이고, 마지막으로 용해제 D는 수산화나트륨이다.Herein, the resin leakage inhibitors A, A 'and A ″ of Tables 1 to 4 are the higher alkyl phosphate ester salts, the higher alkyl aryl alkoxy phosphate ester salts and the higher alkyl aryl polyethoxy phosphate ester salts, respectively. B ′, B ″ are benzotriazole, benzimidazole and benzotriazole carboxylic acid, respectively, pH adjuster C is phosphoric acid or sulfuric acid, and finally solvent D is sodium hydroxide.

비교예Comparative example AA A″A ″ BB B′B ′ B″B ″ CC DD 방청시험결과Antirust test result 수지누출물 크기(㎜)Resin Leak Size (mm) 처리 전(前)Before processing 처리 후(後)After treatment 처리 전(前)Before processing 처리 후(後)After treatment 1One 0.50.5 0.10.1 0.160.16 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1030.103 22 0.050.05 0.160.16 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 33 0.010.01 0.160.16 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 44 0.010.01 0.30.3 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 55 0.0050.005 0.160.16 0.50.5 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 66 0.0050.005 0.0850.085 0.50.5 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 77 0.10.1 0.10.1 0.160.16 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1250.125 88 0.050.05 0.160.16 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0440.044 99 0.010.01 0.160.16 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 1010 0.0050.005 0.160.16 0.10.1 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 1111 0.050.05 0.10.1 0.160.16 0.050.05 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1890.189 1212 0.050.05 0.160.16 0.050.05 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0900.090 1313 0.010.01 0.160.16 0.050.05 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0350.035 1414 0.0050.005 0.160.16 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 1515 0.010.01 0.10.1 0.160.16 0.010.01 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.2600.260 1616 0.050.05 0.160.16 0.010.01 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.8970.897 1717 0.010.01 0.160.16 0.010.01 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0350.035 1818 0.0050.005 0.160.16 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.0250.025 1919 0.50.5 0.050.05 0.30.3 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 2020 0.10.1 0.010.01 0.160.16 0.10.1 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 2121 0.050.05 0.050.05 0.0850.085 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 2222 0.50.5 0.10.1 0.160.16 0.70.7 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.027이하Less than 0.027 2323 0.050.05 0.160.16 0.60.6 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 2424 0.10.1 0.010.01 0.160.16 0.120.12 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 2525 0.0050.005 0.30.3 0.110.11 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 2626 0.010.01 0.010.01 0.160.16 0.030.03 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0110.011 2727 0.0010.001 0.0850.085 0.0120.012 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005

비교예Comparative example AA A″A ″ BB B′B ′ B″B ″ CC DD 방청시험결과Antirust test result 수지누출물 크기(㎜)Resin Leak Size (mm) 처리 전(前)Before processing 처리 후(後)After treatment 처리 전(前)Before processing 처리 후(後)After treatment 2828 0.50.5 0.10.1 0.160.16 0.20.2 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.9520.952 2929 0.050.05 0.160.16 0.10.1 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 3030 0.10.1 0.10.1 0.160.16 0.20.2 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1300.130 3131 0.010.01 0.30.3 0.020.02 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 3232 0.010.01 0.010.01 0.160.16 0.020.02 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0270.027 3333 0.0010.001 0.0850.085 0.0020.002 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005

수지누출 억제제 (A,A″), 부식방지제 (B,B′,B″), pH조절제(C) 및 용해제(D)가 일정성분비로 조성된 용액을 이용하여 시료에 대한 방청시험 및 수지누출시험을 수행한 결과는 표 1에 나타나 있는 바와 같이, 방청효과는 모든 비교예에 있어 양호한 반면, 비교예 1,7,11,12,15,16,28,30과 같은 조성비율에서는 수지누출물의 크기가 목적하는 크기(0.076㎜ 이하;수지누출물이 와이어본딩의 신뢰성을 저해하지 않고 화학수세가 필요치 않는 정도의 크기)를 만족하지 못함을 알 수 있다.Anti-rust test and resin leakage on samples using a solution composed of resin leakage inhibitor (A, A ″), corrosion inhibitor (B, B ′, B ″), pH adjuster (C) and solubilizer (D) The results of the test are shown in Table 1, while the rust preventive effect is good for all the comparative examples, while the resin leakage of the composition at the composition ratios such as Comparative Examples 1,7,11,12,15,16,28,30 It can be seen that the size does not satisfy the desired size (0.076 mm or less; the size of the resin leakage does not impair the reliability of the wire bonding and does not require chemical washing).

여기서, 수산화나트륨은 고급알킬 인산에스테르염과 벤조트리아졸 카르복실산이 물에 대한 수용도가 매우 낮아 이들의 용해제로서 첨가된 것으로, 고급알킬 인산에스테르염과 벤조트리아졸 카르복실산에 대한 중량비가 각기 1:1 및 2:1로 유지되어야 한다. 또한, 본 비교예에 사용된 용액의 pH는 2∼5pH 정도이다.Here, sodium hydroxide is added as the solubilizer of the higher alkyl phosphate ester salt and benzotriazole carboxylic acid is very low in water solubility in water, the weight ratio of the higher alkyl phosphate ester salt and benzotriazole carboxylic acid, respectively It should remain 1: 1 and 2: 1. In addition, the pH of the solution used for this comparative example is about 2-5 pH.

비교예Comparative example A′A ′ BB B′B ′ 방청시험결과Antirust test result 수지누출물 크기(㎜)Resin Leak Size (mm) 처리 전(前)Before processing 처리 후(後)After treatment 처리 전(前)Before processing 처리 후(後)After treatment 3434 0.50.5 0.50.5 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 3535 0.10.1 0.010.01 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 3636 0.050.05 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 3737 0.50.5 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0440.044 3838 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 3939 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4040 0.0050.005 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4141 0.10.1 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1030.103 4242 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4343 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4444 0.0050.005 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4545 0.050.05 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1120.112 4646 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.0900.090 4747 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4848 0.0050.005 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 4949 0.010.01 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.1550.155 5050 0.050.05 매우나쁨Very bad 좋음good 0.2600.260 0.8970.897 5151 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.0350.035 5252 0.0050.005 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005

수지누출 억제제 (A′), 부식방지제 (B,B′)가 일정성분비로 조성된 용액을 이용하여 시료에 대한 방청시험 및 수지누출시험을 수행한 결과는 표 2에 나타나 있는 바와 같이, 방청효과는 모든 비교예에 있어 양호한 반면, 비교예 41,45,46, 49,50과 같은 조성비율에서는 수지누출물의 크기가 목적하는 크기를 만족하지 못함을 알 수 있다. 특히, 본 비교예 34∼비교예 52는 고급알킬아릴알콕시 인산에스테르염(A')이 산성이기 때문에 pH조절제의 함유가 불필요하나 pH를 2∼5pH로 유지하여야 한다.The results of the anti-rust test and the resin leak test on the sample using a solution composed of a resin leakage inhibitor (A ′) and a corrosion inhibitor (B, B ′) at a constant component ratio are shown in Table 2. While it is good for all the comparative examples, it can be seen that the size of the resin leakage does not satisfy the desired size in the composition ratio, such as Comparative Examples 41,45,46, 49,50. In particular, in Comparative Examples 34 to 52, since the higher alkylarylalkoxy phosphate ester salt (A ') is acidic, the pH control agent is not required, but the pH should be maintained at 2 to 5 pH.

비교예Comparative example A′A ′ B″B ″ DD 방청시험결과Antirust test result 수지누출물 크기(㎜)Resin Leak Size (mm) 처리 전(前)Before processing 처리 후(後)After treatment 처리 전(前)Before processing 처리 후(後)After treatment 5353 0.50.5 0.10.1 0.20.2 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0150.015 5454 0.050.05 0.10.1 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 5555 0.10.1 0.010.01 0.020.02 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 5656 0.0050.005 0.010.01 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 5757 0.010.01 0.010.01 0.020.02 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0220.022 5858 0.0010.001 0.0020.002 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005

수지누출 억제제(A′), 부식방지제(B″) 및 용해제(D)가 일정성분비로 조성된 용액을 이용하여 시료에 대한 방청시험 및 수지누출시험을 수행한 결과는 표 3에 나타나 있는 바와 같이, 방청효과 및 수지누출 억제효과가 모든 비교예에서 양호한 것으로 확인되었다. 여기서, 수산화나트륨은 벤조트리아졸 카르복실산이 물에 대한 수용도가 매우 낮아 이들의 용해제로서 첨가된 것으로, 벤조트리아졸 카르복실산에 대한 중량비가 2:1로 유지되어야 한다. 또한, 본 비교예에 사용된 용액의 pH는 2∼5pH 정도이다.The results of the anti-rust test and the resin leakage test on the sample using a solution having a resin leakage inhibitor (A ′), a corrosion inhibitor (B ″), and a solvent (D) in a certain component ratio are shown in Table 3. , Antirust effect and resin leakage inhibiting effect were found to be good in all the comparative examples. Here, sodium hydroxide is added to the benzotriazole carboxylic acid as their solubility so low solubility in water, the weight ratio to benzotriazole carboxylic acid should be maintained at 2: 1. In addition, the pH of the solution used for this comparative example is about 2-5 pH.

비교예Comparative example A″A ″ BB B′B ′ CC 방청시험결과Antirust test result 수지누출물 크기(㎜)Resin Leak Size (mm) 처리 전(前)Before processing 처리 후(後)After treatment 처리 전(前)Before processing 처리 후(後)After treatment 5959 0.50.5 0.10.1 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0650.065 6060 0.050.05 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 6161 0.10.1 0.010.01 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 6262 0.0050.005 0.30.3 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 6363 0.010.01 0.010.01 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.8890.889 6464 0.0010.001 0.0850.085 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 6565 0.50.5 0.10.1 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0370.037 6666 0.050.05 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 6767 0.10.1 0.010.01 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.005이하Less than 0.005 6868 0.0050.005 0.30.3 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005 6969 0.010.01 0.010.01 0.160.16 매우나쁨Very bad 매우좋음Very good 0.2600.260 0.0350.035 7070 0.0010.001 0.0850.085 매우나쁨Very bad 좋음good 0.2600.260 0.005이하Less than 0.005

수지누출 억제제(A″), 부식방지제(B,B′) 및 pH조절제(C)가 일정성분비로 조성된 용액을 이용하여 시료에 대한 방청시험 및 수지누출시험을 수행한 결과는 표 4에 나타나 있는 바와 같이, 방청효과는 모든 비교예에 있어 양호한 반면, 비교예 63과 같은 조성비율에서는 수지누출물의 크기가 목적하는 크기를 만족하지 못함을 알 수 있다. 여기서, 또한, 본 비교예에 사용된 용액의 pH는 2∼5pH 정도이다.The results of the anti-rust test and the resin leakage test on the sample using a solution composed of a resin leakage inhibitor (A ″), a corrosion inhibitor (B, B ′), and a pH regulator (C) at a predetermined ratio are shown in Table 4. As can be seen, while the rust preventive effect is good for all the comparative examples, it can be seen that the size of the resin leakage does not satisfy the desired size at the same composition ratio as Comparative Example 63. Here, pH of the solution used for this comparative example is about 2-5 pH.

표 1∼표 4에 나타나 있는 비교예들을 비교판단하여 보면, 부식방지제로 사용되는 벤조트리아졸, 벤지이미다졸 또는 벤조트리아졸 카르복실산의 양은 주어진 중량부 범위에서 양호한 방청효과를 나타냈으며, 수지누출 억제제와 부식방지제의 중량비가 100:1∼10:1에서 방청효과와 수지누출억제 효과가 모두 뛰어난 것임을 알 수 있었다. 특히, 수지누출 억제제와 부식방지제의 중량비가 10:1 이상일 경우에는 수지누출이 원하는 범위(0.076㎜) 이상으로 나타남을 알 수 있었다. 또한, 주어진 중량부 범위 내에서 수지누출 억제제와 부식방지제의 중량비가 100:1 이상인 경우에는 용액제조가 어려운 한편, 처리후 수세시간이 길어지고 특히, 부식방지 효과가 충분하지 못함을 알 수 있었다.Comparing the comparative examples shown in Tables 1 to 4, the amount of benzotriazole, benzimidazole or benzotriazole carboxylic acid used as a corrosion inhibitor showed a good anti-corrosive effect in a given weight range. It was found that the anti-rusting effect and the resin leakage suppressing effect were excellent at the weight ratio of the leak inhibitor and the corrosion inhibitor at 100: 1 to 10: 1. In particular, when the weight ratio of the resin leakage inhibitor and the corrosion inhibitor is 10: 1 or more, it was found that the resin leakage appeared in the desired range (0.076 mm) or more. In addition, when the weight ratio of the resin leakage inhibitor and the corrosion inhibitor within a given weight part range of 100: 1 or more, it was difficult to prepare a solution, and the washing time after the treatment was long, and in particular, the corrosion prevention effect was not sufficient.

이상에서 살펴본 바와 같이 본 발명의 조성물에 의하면, 구리계 리드프레임의 표면 부식을 방지하는 동시에 반도체 칩과 은 도금층이 형성된 다이패드간의 접착계면을 따라 흘러나오는 저분자 수지누출물에 의한 와이어본딩 신뢰성 저하를 억제할 수 있는 효과가 있다. 또한, 본 발명의 조성물은 수지누출을 억제함으로써 화학적인 방법에 의해 진행되던 수지누출물 제거공정을 수행하지 않음으로써 리드임의 프레생산성 및 제조단가를 개선할 수 있는 효과가 있다.As described above, the composition of the present invention prevents surface corrosion of the copper-based lead frame and at the same time reduces the wire bonding reliability caused by the low molecular resin leakage flowing along the adhesive interface between the semiconductor chip and the die pad on which the silver plating layer is formed. There is an effect that can be suppressed. In addition, the composition of the present invention has the effect of improving the pre-productivity and manufacturing cost of the lead by suppressing the resin leakage by not performing the resin leakage removal process proceeded by the chemical method.

Claims (4)

구리계 리드프레임의 부식을 방지하는 동시에 상기 구리계 리드프레임의 은 도금층이 형성된 다이패드 일면과 반도체 칩의 일면을 접착하는 은 에폭시 접착제가 경화과정에서 저분자 수지부분이 접착계면을 따라 흘러나와 상기 리드프레임을 오염시키는 것을 억제하기 위한 리드프레임 세정용액에 있어서,A low-molecular resin portion flows along the adhesive interface during the curing process to prevent corrosion of the copper-based lead frame and at the same time, a silver epoxy adhesive that bonds one surface of the die pad and the die pad on which the silver plating layer of the copper-based lead frame is formed. A lead frame cleaning solution for suppressing contamination of a frame, 탈이온수의 일정중량에 대한 중량비로서 고급알킬 인산에스테르염 및 고급알킬아릴 폴리에톡시 인산에스테르염으로부터 선택된 임의의 1종인 수지누출 억제제 0.01∼0.5 중량부와; 벤조트리아졸, 벤지이미다졸 및 벤조트리아졸 카르복실산으로부터 선택된 임의의 1종인 부식방지제 0.005∼0.1 중량부와; 인산 및 황산으로부터 선택된 임의의 1종인 pH 조절제 0.085∼0.3 중량부와; 용해제인 수산화나트륨 0.002∼0.7 중량부가 함유되어 pH가 2∼5pH로 유지되도록 조성된 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물.0.01 to 0.5 parts by weight of any one of the resin leakage inhibitors selected from higher alkyl phosphate ester salts and higher alkylaryl polyethoxy phosphate ester salts as a weight ratio to deionized water; 0.005 to 0.1 parts by weight of any one kind of corrosion inhibitors selected from benzotriazole, benzimidazole and benzotriazole carboxylic acid; 0.085 to 0.3 part by weight of a pH adjuster selected from phosphoric acid and sulfuric acid; A composition for inhibiting resin leakage and preventing surface corrosion of a copper-based lead frame, which contains 0.002 to 0.7 parts by weight of sodium hydroxide as a solvent to maintain a pH of 2 to 5 pH. 구리계 리드프레임의 부식을 방지하는 동시에 상기 구리계 리드프레임의 은 도금층이 형성된 다이패드 일면과 반도체 칩의 일면을 접착하는 은 에폭시 접착제가 경화과정에서 저분자 수지부분이 접착계면을 따라 흘러나와 상기 리드프레임을 오염시키는 것을 억제하기 위한 리드프레임 세정용액에 있어서,A low-molecular resin portion flows along the adhesive interface during the curing process to prevent corrosion of the copper-based lead frame and at the same time, a silver epoxy adhesive that bonds one surface of the die pad and the die pad on which the silver plating layer of the copper-based lead frame is formed. A lead frame cleaning solution for suppressing contamination of a frame, 탈이온수의 일정중량에 대한 중량비로서 수지누출 억제제인 고급알킬아릴알콕시 인산에스테르염 0.01∼0.5 중량부와; 벤조트리아졸 및 벤지이미다졸로부터 선택된 임의의 1종인 부식방지제 0.005∼0.5 중량부가 함유되어 pH가 2∼5pH로 유지되도록 조성된 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물.0.01 to 0.5 parts by weight of a higher alkylarylalkoxy phosphate ester salt which is a resin leakage inhibitor as a weight ratio to a certain weight of deionized water; A composition for inhibiting resin leakage and surface corrosion of a copper-based lead frame, which contains 0.005 to 0.5 parts by weight of a corrosion inhibitor, which is any one selected from benzotriazole and benzimidazole, to maintain a pH of 2 to 5 pH. 구리계 리드프레임의 부식을 방지하는 동시에 상기 구리계 리드프레임의 은 도금층이 형성된 다이패드 일면과 반도체 칩의 일면을 접착하는 은 에폭시 접착제가 경화과정에서 저분자 수지부분이 접착계면을 따라 흘러나와 상기 리드프레임을 오염시키는 것을 억제하기 위한 리드프레임 세정용액에 있어서,A low-molecular resin portion flows along the adhesive interface during the curing process to prevent corrosion of the copper-based lead frame and at the same time, a silver epoxy adhesive that bonds one surface of the die pad and the die pad on which the silver plating layer of the copper-based lead frame is formed. A lead frame cleaning solution for suppressing contamination of a frame, 탈이온수의 일정중량에 대한 중량비로서 수지누출 억제제인 고급알킬아릴알콕시 인산에스테르염 0.01∼0.5 중량부와; 부식방지제인 벤조트리아졸 카르복실산 0.001∼0.1 중량부와; 용해제인 수산화나트륨 0.002∼0.1 중량부가 함유되어 pH가 2∼5pH로 유지되도록 조성된 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물.0.01 to 0.5 parts by weight of a higher alkylarylalkoxy phosphate ester salt which is a resin leakage inhibitor as a weight ratio to a certain weight of deionized water; 0.001 to 0.1 parts by weight of benzotriazole carboxylic acid which is a corrosion inhibitor; A composition for inhibiting resin leakage and preventing surface corrosion of a copper-based lead frame, which contains 0.002 to 0.1 parts by weight of sodium hydroxide as a solvent to maintain a pH of 2 to 5 pH. 구리계 리드프레임의 부식을 방지하는 동시에 상기 구리계 리드프레임의 은 도금층이 형성된 다이패드 일면과 반도체 칩의 일면을 접착하는 은 에폭시 접착제가 경화과정에서 저분자 수지부분이 접착계면을 따라 흘러나와 상기 리드프레임을 오염시키는 것을 억제하기 위한 리드프레임 세정용액에 있어서,A low-molecular resin portion flows along the adhesive interface during the curing process to prevent corrosion of the copper-based lead frame and at the same time, a silver epoxy adhesive that bonds one surface of the die pad and the die pad on which the silver plating layer of the copper-based lead frame is formed. A lead frame cleaning solution for suppressing contamination of a frame, 탈이온수의 일정중량에 대한 중량비로서 수지누출 억제제인 고급알킬아릴 폴리에톡시 인산에스테르염 0.01∼0.5 중량부와; 벤조트리아졸 및 벤지이미다졸로부터 선택된 임의의 1종인 부식방지제 0.001∼0.1 중량부와; 인산 및 황산으로부터 선택된 임의의 1종인 pH 조절제 0.085∼0.3 중량부가 함유되어 pH가 2∼5pH로 유지되도록 조성된 구리계 리드프레임의 수지누출억제 및 표면부식방지용 조성물.0.01 to 0.5 parts by weight of a higher alkylaryl polyethoxy phosphate ester salt which is a resin leakage inhibitor as a weight ratio to a predetermined weight of deionized water; 0.001 to 0.1 parts by weight of any one of corrosion inhibitors selected from benzotriazole and benzimidazole; A composition for inhibiting resin leakage and surface corrosion of a copper-based lead frame, which contains 0.085 to 0.3 parts by weight of a pH regulator, which is any one selected from phosphoric acid and sulfuric acid, to maintain a pH of 2 to 5 pH.
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