KR100267612B1 - Apparatus for measuring the thickness of non magnetic coating - Google Patents
Apparatus for measuring the thickness of non magnetic coating Download PDFInfo
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- KR100267612B1 KR100267612B1 KR1019960069958A KR19960069958A KR100267612B1 KR 100267612 B1 KR100267612 B1 KR 100267612B1 KR 1019960069958 A KR1019960069958 A KR 1019960069958A KR 19960069958 A KR19960069958 A KR 19960069958A KR 100267612 B1 KR100267612 B1 KR 100267612B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
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- Analytical Chemistry (AREA)
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- Chemical Kinetics & Catalysis (AREA)
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
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- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
본 발명은 자성물질 상부의 비자성물질 도금량 측정 장치에 관한 것으로서, 더욱 상세하게는 코일에 유도되는 자기 유도량을 검출하여 비자성물질의 도금량을 측정할 수 있도록 한 것이다.The present invention relates to an apparatus for measuring the plating amount of a nonmagnetic material on an upper portion of a magnetic material, and more particularly, to detect a magnetic induction amount induced in a coil to measure a plating amount of the nonmagnetic material.
일반적으로 자성물질의 상부에 도금된 비철금속이나 페인트등의 비자성물질의 도금량을 측정할 때에는 하나의 자성체에 자기장을 발생시키는 코일과 유도 자기를 측정하는 코일을 감아 측정하고 있는 바, 이때에는 자기 저항에 의한 영향이 약하여 미세한 도금층의 변화에 대해서는 정확한 측정이 이루어지지 못하였다.In general, when measuring the plating amount of non-ferrous metal such as non-ferrous metal or paint plated on the upper part of magnetic material, the coil that generates magnetic field and the coil for measuring induction magnet are wound around one magnetic material. Due to the weak influence due to the change of the fine plating layer was not accurate measurement.
상기 미세한 도금층의 측정시에는 엑스레이를 이용하여 측정하는 엑스레이 형광분석법을 사용하고 있다.In the measurement of the fine plating layer, X-ray fluorescence spectroscopy using X-rays is used.
그러나, 이러한 엑스레이 형광 분석법은 미세한 도금층을 정확하게 측정할 수는 있지만 두꺼운 도금층의 측정값은 오차 발생이 심하게 됨은 물론 장비의 소형화가 불가능하여 운반 및 사용이 용이하지 못하게 되는 등의 문제점이 있있다.However, the X-ray fluorescence analysis can accurately measure the fine plated layer, but the measurement value of the thick plated layer has a problem that it is not easy to transport and use because it is not possible to miniaturize the equipment as well as the error occurs.
본 발명은 상기한 문제점을 해결하기 위해 발명한 것으로서, 자성물질과 비자성물질 사이의 자기 저항 차이로 인해 발생되는 유도자기를 감지하여 비자성물질의 도금량을 측정할 수 있는 자성물질 상부의 비자성물질 도금량 측정장치를 제공하는데 그 목적있다.The present invention has been invented to solve the above problems, the nonmagnetic of the upper portion of the magnetic material capable of measuring the amount of plating of the nonmagnetic material by detecting the induction magnet generated due to the difference in magnetic resistance between the magnetic material and the nonmagnetic material The object of the present invention is to provide an apparatus for measuring the amount of coating material.
상기 목적을 달성하기 위한 본 발명 자성물질 상부의 비자성물질 도금량 측정 장치는 자성물질 상부에 도금된 비자성물질에 접속되며 상부 중앙에는 전원에 연결된 코일이 권선되어 있는 "ㄷ"자형 자기장 발생기와, 상기 자기장 발생기의 내측에 설치되며 상부 중앙에는 코일이 권선되어 있는 "ㄷ"자형 유도 자기 감지기와 상기 코일에 연결된 유도자기 측정기로 구성된 것이다.In order to achieve the above object, the present invention provides a non-magnetic material plating amount measuring device on top of a magnetic material generator connected to a non-magnetic material plated on a magnetic material and having a coil connected to a power supply at the center of the upper part. It is installed inside the magnetic field generator, the upper center is composed of a "c" shaped induction magnetic sensor with a coil wound and an inductive magnetic meter connected to the coil.
제1도는 본 발명에 따른 도금량 측정장치의 정면도.1 is a front view of the plating amount measuring apparatus according to the present invention.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
10 : 자성물질 12 : 비자성물질10: magnetic material 12: nonmagnetic material
20 : 자기장 발생기 22,42 : 코일20: magnetic field generator 22, 42: coil
30 : 전원 40 : 유도 자기 감지기30: power 40: inductive magnetic detector
50 : 유도 자기 측정기50: inductive magnetic meter
이하, 본 발명을 도시한 제1도를 참조하여 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in detail with reference to FIG. 1.
제1도는 본 발명에 따른 도금량 측정장치의 정면도로서 이를 참조하면 자성물질(10)의 상부에 도금된 비자성물질(12)에는 "ㄷ"자형 자기 발생기(20)의 저면이 접속되어 있고 상기 자기 발생기(20)의 상부 중앙에는 코일(22)이 권선되어 있으며 이의 양끝단은 전원(30)과 연결되어 있다.1 is a front view of the plating amount measuring apparatus according to the present invention. Referring to this, the bottom surface of the "c" magnetic generator 20 is connected to a nonmagnetic material 12 plated on an upper portion of the magnetic material 10. The coil 22 is wound around the upper center of the generator 20, and both ends thereof are connected to the power source 30.
한편, 상기 자기 발생기(20)의 내측에는 저면이 비자성물질(12)에 접속되도록 "ㄷ"자형 유도 자기 감지기(40)가 설치되어 있고, 상기 유도 자기 감지기(40)의 상부 중앙에는 코일(42)이 권선되어 있으며, 이의 양끝단은 유도 자기 측정기(50)와 연결되어 있다.On the other hand, the inner side of the magnetic generator 20 is a "c" shaped inductive magnetic sensor 40 is installed so that the bottom surface is connected to the nonmagnetic material 12, the coil ( 42 is wound, and both ends thereof are connected to an inductive magnetic meter 50.
따라서, 본 발명은 전원(30)에 저주파 교류 전압을 인가하면 코일(22)에서는 자기가 발생되고, 상기 자기는 자기 발생기(20)와 자성 물질(10)에 사이에도 제1도에 도시한 점선 화살표와 같은 자기회로(60)를 구성하게 된다.Accordingly, in the present invention, when a low frequency AC voltage is applied to the power supply 30, magnetism is generated in the coil 22, and the magnetism is shown in FIG. 1 between the magnetic generator 20 and the magnetic material 10. It forms a magnetic circuit 60 such as an arrow.
이때, 자성물질(10)에 전달되는 자기장의 세기는 비자성물질(12)의 도금두께에 따라 달라지게 된다.At this time, the strength of the magnetic field transmitted to the magnetic material 10 will vary depending on the plating thickness of the nonmagnetic material 12.
한편, 상기 자성물질(10)에 전달된 자기의 일부는 유도 자기 감지기(40)로 유도되어 제1도에 도시한 일정 쇄선과 같이 유도 자기 회로(70)를 구성하게 되며, 상기 유도 자기 회로(70)는 코일(42)을 통해서 유도 자기 측정기(50)로 측정하게 되므로 비자성물질(12)의 도금량이 측정된다.On the other hand, a part of the magnets transmitted to the magnetic material 10 is guided to the induction magnetic detector 40 to form an induction magnetic circuit 70 as shown in the dashed line shown in FIG. 1, the induction magnetic circuit ( 70 is measured by the induction magnetometer 50 through the coil 42, the plating amount of the nonmagnetic material 12 is measured.
또한 자성물질(10)이 없는 상태에서는 유도 감지 측정기(50)에 유도 자기가 측정되지 않게 되며 비자성물질(12)이 도금되지 않은 자성물질(10)을 측정할 때에는 유도 감지 측정기(50)에 감지되는 측정 값이 크게 감지되므로 자성물질(10)유무는 물론 비자성물질(12)의 도금유무도 측정할 수 있게 되는 것이다.In addition, when the magnetic material 10 is not present, the inductive magnetism is not measured by the inductive sensor 50, and when the magnetic material 10 is not plated with the nonmagnetic material 12, the inductive sensor 50 is measured. Since the detected measured value is largely detected, the presence or absence of the magnetic material 10 will be able to measure the presence or absence of plating of the nonmagnetic material 12.
이상에서와 같이 본 발명은 코일에서 발생되어 유도 자기 감지기로 유도되는 유도 자기를 측정하는 간단한 방법으로 도금층의 두께 측정은 물론 도금층의 유무를 측정할 수 있게 되는 매우 유용한 발명이다.As described above, the present invention is a very useful invention that can measure the thickness of the plating layer as well as the presence or absence of the plating layer by a simple method of measuring the induced magnetism generated in the coil and induced by the induction magnetic detector.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960069958A KR100267612B1 (en) | 1996-12-23 | 1996-12-23 | Apparatus for measuring the thickness of non magnetic coating |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960069958A KR100267612B1 (en) | 1996-12-23 | 1996-12-23 | Apparatus for measuring the thickness of non magnetic coating |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR19980051093A KR19980051093A (en) | 1998-09-15 |
| KR100267612B1 true KR100267612B1 (en) | 2000-10-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960069958A KR100267612B1 (en) | 1996-12-23 | 1996-12-23 | Apparatus for measuring the thickness of non magnetic coating |
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| KR (1) | KR100267612B1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020006355A (en) * | 2000-07-12 | 2002-01-19 | 이구택 | Coating Weight Measurement System |
| KR100643349B1 (en) * | 2000-12-21 | 2006-11-10 | 주식회사 포스코 | A method for evaluating shield effect of low frequency electromagnetic field of steel plate |
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- 1996-12-23 KR KR1019960069958A patent/KR100267612B1/en not_active IP Right Cessation
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| KR19980051093A (en) | 1998-09-15 |
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