KR0124184B1 - Apparatus for testing the basic subscriber circuit in the ess using isdn - Google Patents

Abstract

A basic subscriber circuit tester in the ISDB whereby the main function is tested automatically, and one ISDB terminal enables to accept the several subscribers during the test of basic subscriber circuit. The matching apparatus having a basic subscriber circuit pack, a control circuit pack and test circuit pack.

Description

Basic subscriber circuit pack tester in all electronic switch for general information and communication network

1 is a schematic block diagram of an all-electronic switch for an ISDN equipped with a basic subscriber circuit pack testing apparatus according to the present invention.

2 is a detailed block diagram of the test circuit pack shown in FIG.

* Explanation of symbols for main parts of the drawings

100: subscriber matching device 101: power supply circuit pack

102: control circuit pack 103: basic subscriber circuit pack

104: test circuit pack 120: CRT

130: terminal

131: Network Termination Equipment (NTE)

132: ISDN (Integrated Servies Digital Netvork) phone

202: digital switch 203: relay

204: EPLD (Erasable Programmable Logic Device)

205: common memory 206: LED (Light Emittng Diode)

The present invention relates to an apparatus for testing a Basic Subscriber Circuit Pack (ISDN) in an electronic switchboard, in particular a TDX-1B switch. The present invention relates to a test apparatus for testing the main functions of the basic subscriber circuit pack.

TDX-1B, among the electronic switchboards for ISOD, has been configured to test subscriber matching function so far with one ISOD terminal per subscriber. When testing one basic subscriber circuit pack, not only a total of eight ISOD terminals were required, but also additional circuits were required to test the connection function of the test circuit. In addition, when testing the B channel, which transmits a voice signal, there was a need to manually check the loopbacked data after transmitting a bit pattern.

Accordingly, an object of the present invention is to provide a basic subscriber circuit pack test apparatus capable of automatically testing the main functions of the basic subscriber circuit pack in the subscriber matching device in the all-electronic exchange for ISOD.

Another object of the present invention is to provide a basic subscriber circuit pack test apparatus that can be performed by using one ISOD terminal when testing the main function of the basic subscriber circuit pack in the subscriber matching device in the electronic switch for the ISOD.

Basic subscriber circuit pack test apparatus according to the present invention for achieving the above object, the CRT for outputting the test results, a terminal for one integrated information communication network and a basic subscriber circuit connected to the CRT and the terminal and having a plurality of subscriber circuits Claims [1] A basic subscriber circuit pack testing apparatus for an all-electronic switching system for an integrated information communication network having a subscriber matching device including at least one pack. A control circuit pack for performing an item selection, a test request, a test release, and a final decision on a test result for testing the basic subscriber circuit pack, and outputting the decision result through a CRT; And a processor for controlling the test function as a whole, a common memory for reading / writing data between the processor and the control circuit pack, a digital switch for transmitting bit pattern data generated by the processor during a B-channel test, A programmable logic device (EPLD) that provides the signals necessary for basic subscriber circuit pack operation, and is configured to include a relay that is controlled by a processor and connects one terminal to the subscriber circuit under test among multiple subscriber circuits, automatically Characterized in that it comprises a test circuit pack for performing a predetermined functional test for the subscriber circuit.

Next, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a schematic block diagram of an exchange having a test apparatus for testing a basic subscriber circuit pack according to the present invention, in the case of a TDX-1B exchange capable of accommodating ISOD.

Referring to FIG. 1, the TDX-1B switch according to the present invention has a subscriber matching device 100 having a test function for a basic subscriber circuit pack, a CRT 120 for outputting a test result, and a subscriber matching device 100. And ISDN terminal 130 for transmitting and receiving digital data.

In particular, the subscriber matching device 100 includes a power supply circuit pack 101, a basic subscriber circuit pack 103, and a basic subscriber circuit pack 130 according to the present invention for supplying power required for each circuit in the subscriber matching device 100. Control circuit pack 102 for performing a function of selecting a test item and finally determining and outputting a test result for a test), and a test circuit pack 104 for performing a substantial test on the basic subscriber circuit pack 103. It is composed of In addition, the ISOD terminal 130 is composed of a network termination equipment (NTE: hereinafter referred to as NTE) 131 and the ISDN phone 132.

FIG. 2 is a detailed block diagram of the test circuit pack 104 shown in FIG. 1 and illustrates a B-channel test generated from the processor 201 and the processor 201 for controlling all functions within the test circuit pack 104. As shown in FIG. The digital switch 202 for transmitting the bit pattern data for the basic subscriber circuit pack 103 or / and the relay 203 and the processor 201 controls the terminal 130 in the basic subscriber circuit pack 103. Relay 203 which serves to connect with subscriber circuit (not shown), clock (FS (Frame Sync, 8KHz), MCLK (Master Clock, 4.096MHz) generation required for basic subscriber circuit pack 103 and various I / The ESR (Erasable Programmable Logic Device) 204 and the control circuit pack 102 having the function of generating the address decode of the O device, the parallel bus (DS-BUS) interface, and the clock signal required by the digital switch 202 are tested circuits. Common menu for reading and writing data to and from the pack 104 It is composed of an LED 206 which is controlled by a common memodry 205 and a control circuit pack 102 to output a test result.

Next, the operation of the present embodiment will be described in detail with reference to FIGS. 1 and 2.

Prior to the description, the functional items that can be tested for the basic subscriber circuit pack 103 are D-channel LT (Line Termination) for transmitting / activating the corresponding subscriber circuit, the test circuit connection function, and the control signal. LT) and NT (Network Termination, hereinafter referred to as NT) reverse circulation function, B channel LT and NT reverse circulation function for transmitting voice information, and DS (D-Channel Signaling) -BUS function.

First, the activation function test of the subscriber circuit is performed as follows.

That is, when the number and subscriber number of the corresponding basic subscriber circuit pack 103 is generated from the control circuit pack 102, it is transmitted to the basic subscriber circuit pack 103 via the DS-BUS and simultaneously transmitted to the test circuit pack 104. do. Accordingly, the basic subscriber circuit pack 103 drives the In / Out test relay (not shown) of the subscriber provided therein, and the test circuit pack 104 is the number of the authorized basic subscriber circuit pack 103. And the subscriber number in the common memory 205 shown in FIG.

Accordingly, the processor 201 in the test circuit pack 104 reads the number of the basic subscriber circuit pack 103 and the subscriber number written in the common memory 205 and outputs a test for controlling the operation of the relay 203. When the control signal output from the processor 201 is applied, the relay 203 connects the terminal 130 to the basic subscriber circuit pack 103 as a corresponding subscriber terminal. The processor 201 controls the EPLD 204 to generate FS (8KHz) and MCLK (4.096MHz) necessary for the corresponding basic subscriber circuit pack 103 to operate normally. The generated FS and MCLK signals are transmitted to the corresponding basic subscriber circuit pack 103.

As such, the signals FS and MCLK necessary for the operation of the corresponding subscriber circuit pack 103 are provided from the test circuit pack 104, the terminal 130 is connected as the corresponding subscriber terminal, and the control circuit pack 102 corresponds to the corresponding circuit. Activation is requested to the basic subscriber circuit pack 103. Accordingly, the basic subscriber circuit pack 103 transmits an activation request signal to the terminal 130 via the relay 203 in the test circuit pack 104. When the result signal according to the activation request is sent from the terminal 130, it is transmitted to the control circuit pack 102 via the relay 203 and the basic subscriber circuit pack 103 of the test circuit pack 104. Accordingly, the control circuit pack 102 outputs the test result for the activation function through the CRT 120 and the LED 206, and requests to release the activation function test to the basic subscriber circuit pack 103 and the test circuit pack 104. Do

When the deactivation function test of the corresponding subscriber circuit is also performed through the same process as the above-described activation function test, when the terminal 130 is connected as the corresponding subscriber terminal and signals necessary for the operation of the basic subscriber circuit pack 103 are provided, the control circuit pack 102 requests deactivation to the base subscriber circuit pack 103. Accordingly, the basic subscriber circuit pack 103 transmits the deactivation request signal to the terminal 130 via the relay 203 in the test circuit pack 104.

The result signal for the deactivation request signal generated from the terminal 130 is transmitted to the control circuit pack 102 through the relay 203 and the basic subscriber circuit pack 103 of the test circuit pack 104. When the result signal for the deactivation function request is transmitted, the control circuit pack 102 outputs the test result for the deactivation function of the corresponding subscriber circuit through the CRT 120 and the LED 206, and the basic subscriber circuit pack 103 and the test. The circuit pack 104 requests the deactivation function test to be released.

The D-channel LT reverse circulation test is performed as follows.

That is, after the number and subscriber number of the corresponding subscriber circuit pack 103 are generated in the control circuit pack 102 and the D-channel LT reverse circulation request signal is outputted, the basic subscriber circuit pack 103 is transmitted through the DS-BUS. Is sent. Accordingly, the basic subscriber circuit pack 103 establishes an LT reverse circulation route for the corresponding subscriber circuit. At this time, the test circuit pack 104 is operated to generate a program synchronization signal and a clock signal to the basic subscriber circuit pack 103 through the EPLD 204.

When the LT reverse circulation route setting result is reported to the control circuit pack 102, the control circuit pack 102 generates predetermined D channel data and sends it to the basic subscriber circuit pack 103. After the transmission, the control circuit pack 102 outputs the result of comparing the returned data from the basic subscriber circuit pack 103 and the transmitted data to the CRT 120 and the LED 206 and releases the D-channel LT reverse circulation test. do.

The D-channel NT reverse circulation test is performed as follows.

That is, when the basic subscriber circuit pack number and subscriber number are generated from the control circuit pack 102 as in the above-described test procedures, the basic subscriber circuit pack 103 is driven by driving the relay 203 in the test circuit pack 104. It connects the terminal 130 of the corresponding subscriber circuit. Then, when the D-channel NT reverse circulation request signal is generated from the control circuit pack 102, the basic subscriber circuit pack 103 and the test circuit pack 104 via the relay 203 via the DS-BUS terminal 130. The D-channel NT reverse circulation request signal is transmitted. Accordingly, the terminal 130 forms a loopback for testing the D channel NT reverse circulation, and sends a loopback formation result.

The control circuit pack 102 generates and transmits predetermined D channel data for the D channel NT reverse circulation test when a response signal for the D channel NT reverse circulation test request is applied. The D channel data is returned to the control circuit pack 102 through the loopback formed in the terminal 130 via the corresponding subscriber circuit in the basic subscriber circuit pack 103 and the relay 203 in the test circuit pack 104. . The control circuit pack 120 compares the returned data with the transmitted D-channel data, outputs the comparison result through the CRT 120 and the LED 206, and releases the D-channel NT reverse circulation test function.

The B-channel LT reverse circulation function test is performed as follows.

That is, after the corresponding subscriber circuit pack number and subscriber number are output from the control circuit pack 102, and the B channel LT reverse circulation function test is required through the DS-BUS, the basic subscriber circuit pack 103 performs the NT reverse circulation test. Form a loop for When a route for the B-channel LT reverse circulation test is formed, the processor 201 of the test circuit pack 104 generates predetermined B-channel data and outputs it to the digital switch 202. The digital switch 104 sends the B channel data transmitted from the processor 201 to the basic subscriber circuit pack 103 via the B-CH. The basic subscriber circuit pack 103 performs a reverse circulation loop formed therein. The B-channel data applied through the result is sent to the test circuit pack 104. The B channel data returned from the basic subscriber circuit pack 103 is written to the common memory 205.

The processor 201 compares the B-channel data written to the common memory 205 with the B-channel data read out and sends the comparison result to the common memory 205. Accordingly, the control circuit pack 102 reads the comparison result written in the common memory 205 to grasp the B channel LT reverse circulation test result, and outputs the result to the CRT 120 and the LED 206. The test circuit pack 104 then requests the B-channel LT reverse circulation test release.

Meanwhile, the B-channel NT reverse circulation function test is performed as follows.

First, the relay 203 in the basic subscriber circuit pack 104 and the test circuit pack 104 according to the corresponding basic subscriber circuit pack number and subscriber number information output from the control circuit pack 102 for the B-channel NT reverse circulation function test. ) And the terminal 130 are connected, and a reverse circulation loop is formed in the terminal 130. As such, when the reverse loop formation is completed, the control circuit pack 102 requests the B channel NT reverse circulation function test to the test circuit pack 104.

When the B-channel NT reverse circulation function test is required, the processor 201 of the test circuit pack 104 generates predetermined B-channel data to pass the basic subscriber circuit pack 104 through the digital switch 202 and the relay 203. And the data sent back to the terminal 130, and the returned data is written to the common memory 205, and is compared with the B-channel data read and sent by the processor 201. The comparison result is written back to the common memory 204, and the control circuit pack 102 reads the comparison result written to the common memory 204 to determine the B-channel NT reverse circulation function test result, and the determination result is the CRT 120 and Output to LED 206. Then disable the B-channel NT reverse circulation function test.

As described above, the present invention as described above is provided with a plurality of ISOD terminals for the basic subscriber circuit pack test by testing the main functions for each subscriber circuit in the basic subscriber circuit pack provided in the exchange using one ISOD terminal. There is an advantage that can solve the hassle that must be done, and the effect of automatically generating the bit pattern for the B channel test (Bit pattern) and the comparison result output with the bit pattern returned from the subscriber circuit pack in the reverse cycle There is also.

Claims (3)

Comprehensive information communication network having a CRT for outputting test results, a terminal for one integrated information communication network, and a subscriber matching device having at least one basic subscriber circuit pack connected to the CRT and the terminal and having a plurality of subscriber circuits. A basic subscriber circuit pack testing apparatus for electronic switching equipment for use; A control circuit pack for performing an item selection, a test request, a test release, and a final decision on a test result for testing the basic subscriber circuit pack, and outputting the decision result through the CRT; And a processor for controlling a test function as a whole, a common memory for reading / writing data between the processor and the control circuit pack, a digital switch for transmitting bit pattern data generated by the processor during a B-channel test, and A programmable logic device (EPLD) which is controlled by the base subscriber circuit pack to provide the signals necessary for operation, and a relay which is controlled by the processor to connect the one terminal to the subscriber circuit of the plurality of subscriber circuits. And a test circuit pack configured to include a test circuit pack for automatically performing a predetermined function test on a subscriber circuit. 3. The comprehensive information according to claim 2, wherein the transmission / reception data read / written to the common memory includes a corresponding subscriber circuit pack number and a subscriber number, data returned in reverse circulation during the B-channel test, and test result data. Basic subscriber circuit pack tester in all electronic switch for communication network. 3. The apparatus of claim 2, wherein the test circuit pack further includes an LED for controlling the control circuit pack and outputting a test result.