JPWO2024261804A1 - - Google Patents
Info
- Publication number
- JPWO2024261804A1 JPWO2024261804A1 JP2025527216A JP2025527216A JPWO2024261804A1 JP WO2024261804 A1 JPWO2024261804 A1 JP WO2024261804A1 JP 2025527216 A JP2025527216 A JP 2025527216A JP 2025527216 A JP2025527216 A JP 2025527216A JP WO2024261804 A1 JPWO2024261804 A1 JP WO2024261804A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
Landscapes
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/022570 WO2024261804A1 (ja) | 2023-06-19 | 2023-06-19 | マーカ、位置合わせ装置、及び位置合わせ方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024261804A1 true JPWO2024261804A1 (https=) | 2024-12-26 |
Family
ID=93935119
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025527216A Pending JPWO2024261804A1 (https=) | 2023-06-19 | 2023-06-19 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024261804A1 (https=) |
| WO (1) | WO2024261804A1 (https=) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI372859B (en) * | 2008-10-03 | 2012-09-21 | Inotera Memories Inc | Method for manufacturing an electron tomography specimen with fiducial markers and method for constructing 3d image |
| EP2507055A1 (en) * | 2009-12-01 | 2012-10-10 | Applied NanoStructured Solutions, LLC | Metal matrix composite materials containing carbon nanotube-infused fiber materials and methods for production thereof |
| JP5376530B2 (ja) * | 2010-11-29 | 2013-12-25 | テックワン株式会社 | 負極活物質、負極製造方法、負極、及び二次電池 |
| US9104903B2 (en) * | 2012-03-16 | 2015-08-11 | University Of Utah Research Foundation | Microscopy visualization |
| CN104470457B (zh) * | 2012-06-15 | 2018-05-08 | 皇家飞利浦有限公司 | 用于内窥镜微创外科手术的受引导切口规划 |
| US9368321B1 (en) * | 2014-12-22 | 2016-06-14 | Fei Company | Fiducial-based correlative microscopy |
| EP3546167B1 (en) * | 2015-06-24 | 2021-01-13 | Mitsubishi Chemical Corporation | Method for manufacturing fiber-reinforced resin material, and fiber bundle group inspection device |
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2023
- 2023-06-19 JP JP2025527216A patent/JPWO2024261804A1/ja active Pending
- 2023-06-19 WO PCT/JP2023/022570 patent/WO2024261804A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024261804A1 (ja) | 2024-12-26 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20260305 |
|
| RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20260305 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260324 |