JPWO2024203900A1 - - Google Patents
Info
- Publication number
- JPWO2024203900A1 JPWO2024203900A1 JP2025510746A JP2025510746A JPWO2024203900A1 JP WO2024203900 A1 JPWO2024203900 A1 JP WO2024203900A1 JP 2025510746 A JP2025510746 A JP 2025510746A JP 2025510746 A JP2025510746 A JP 2025510746A JP WO2024203900 A1 JPWO2024203900 A1 JP WO2024203900A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/04—Display or data processing devices
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/26—Friction force microscopy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Image Analysis (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023047940 | 2023-03-24 | ||
| PCT/JP2024/011391 WO2024203900A1 (ja) | 2023-03-24 | 2024-03-22 | 情報処理装置、情報処理方法及びプログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024203900A1 true JPWO2024203900A1 (https=) | 2024-10-03 |
Family
ID=92906415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025510746A Pending JPWO2024203900A1 (https=) | 2023-03-24 | 2024-03-22 |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4675284A1 (https=) |
| JP (1) | JPWO2024203900A1 (https=) |
| WO (1) | WO2024203900A1 (https=) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5519572B2 (ja) | 2011-05-09 | 2014-06-11 | 株式会社日立ハイテクノロジーズ | 磁気力顕微鏡用カンチレバー |
| JP6957197B2 (ja) * | 2017-05-17 | 2021-11-02 | キヤノン株式会社 | 画像処理装置および画像処理方法 |
| US10169852B1 (en) * | 2018-07-03 | 2019-01-01 | Nanotronics Imaging, Inc. | Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging |
| JP7303896B2 (ja) * | 2019-11-08 | 2023-07-05 | オリンパス株式会社 | 情報処理システム、内視鏡システム、学習済みモデル、情報記憶媒体及び情報処理方法 |
| EP3937120B1 (en) * | 2020-07-08 | 2023-12-20 | Sartorius Stedim Data Analytics AB | Computer-implemented method, computer program product and system for processing images |
| JP2022134649A (ja) * | 2021-03-03 | 2022-09-15 | 地方独立行政法人東京都立産業技術研究センター | 走査型プローブ顕微鏡、情報処理装置、およびプログラム |
-
2024
- 2024-03-22 JP JP2025510746A patent/JPWO2024203900A1/ja active Pending
- 2024-03-22 EP EP24780018.8A patent/EP4675284A1/en active Pending
- 2024-03-22 WO PCT/JP2024/011391 patent/WO2024203900A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024203900A1 (ja) | 2024-10-03 |
| EP4675284A1 (en) | 2026-01-07 |