JPWO2024157336A1 - - Google Patents
Info
- Publication number
- JPWO2024157336A1 JPWO2024157336A1 JP2024572554A JP2024572554A JPWO2024157336A1 JP WO2024157336 A1 JPWO2024157336 A1 JP WO2024157336A1 JP 2024572554 A JP2024572554 A JP 2024572554A JP 2024572554 A JP2024572554 A JP 2024572554A JP WO2024157336 A1 JPWO2024157336 A1 JP WO2024157336A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/001972 WO2024157336A1 (ja) | 2023-01-23 | 2023-01-23 | 荷電粒子ビーム装置及び試料片の作製・観察方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2024157336A1 true JPWO2024157336A1 (https=) | 2024-08-02 |
| JPWO2024157336A5 JPWO2024157336A5 (https=) | 2025-09-16 |
Family
ID=91970056
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024572554A Pending JPWO2024157336A1 (https=) | 2023-01-23 | 2023-01-23 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024157336A1 (https=) |
| WO (1) | WO2024157336A1 (https=) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH087121B2 (ja) * | 1990-07-18 | 1996-01-29 | セイコー電子工業株式会社 | 集束荷電ビーム加工方法 |
| JP3805547B2 (ja) * | 1999-01-21 | 2006-08-02 | 株式会社日立製作所 | 試料作製装置 |
| EP1780764A1 (en) * | 2005-11-01 | 2007-05-02 | FEI Company | Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus |
| JP5612493B2 (ja) * | 2010-03-18 | 2014-10-22 | 株式会社日立ハイテクサイエンス | 複合荷電粒子ビーム装置 |
| WO2021130992A1 (ja) * | 2019-12-26 | 2021-07-01 | 株式会社日立ハイテク | 解析システム、ラメラの検査方法および荷電粒子線装置 |
-
2023
- 2023-01-23 WO PCT/JP2023/001972 patent/WO2024157336A1/ja not_active Ceased
- 2023-01-23 JP JP2024572554A patent/JPWO2024157336A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024157336A1 (ja) | 2024-08-02 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A529 | Written submission of copy of amendment under article 34 pct |
Free format text: JAPANESE INTERMEDIATE CODE: A5211 Effective date: 20250606 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20250606 |