JPWO2023282061A1 - - Google Patents

Info

Publication number
JPWO2023282061A1
JPWO2023282061A1 JP2023533519A JP2023533519A JPWO2023282061A1 JP WO2023282061 A1 JPWO2023282061 A1 JP WO2023282061A1 JP 2023533519 A JP2023533519 A JP 2023533519A JP 2023533519 A JP2023533519 A JP 2023533519A JP WO2023282061 A1 JPWO2023282061 A1 JP WO2023282061A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023533519A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023282061A1 publication Critical patent/JPWO2023282061A1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409Sample holders or containers
    • H01J49/0418Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2023533519A 2021-07-08 2022-06-22 Pending JPWO2023282061A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021113657 2021-07-08
PCT/JP2022/024863 WO2023282061A1 (ja) 2021-07-08 2022-06-22 微生物の質量分析方法

Publications (1)

Publication Number Publication Date
JPWO2023282061A1 true JPWO2023282061A1 (ja) 2023-01-12

Family

ID=84800264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023533519A Pending JPWO2023282061A1 (ja) 2021-07-08 2022-06-22

Country Status (4)

Country Link
EP (1) EP4368984A1 (ja)
JP (1) JPWO2023282061A1 (ja)
CN (1) CN117616274A (ja)
WO (1) WO2023282061A1 (ja)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010205460A (ja) * 2009-03-02 2010-09-16 Shimadzu Corp レーザ脱離イオン化飛行時間型質量分析装置
US10991563B2 (en) * 2018-08-28 2021-04-27 Virgin Instruments Corporation Molecular imaging of biological samples with sub-cellular spatial resolution and high sensitivity
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

Also Published As

Publication number Publication date
CN117616274A (zh) 2024-02-27
WO2023282061A1 (ja) 2023-01-12
EP4368984A1 (en) 2024-05-15

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Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20231127