JPWO2023238465A1 - - Google Patents

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Publication number
JPWO2023238465A1
JPWO2023238465A1 JP2024526242A JP2024526242A JPWO2023238465A1 JP WO2023238465 A1 JPWO2023238465 A1 JP WO2023238465A1 JP 2024526242 A JP2024526242 A JP 2024526242A JP 2024526242 A JP2024526242 A JP 2024526242A JP WO2023238465 A1 JPWO2023238465 A1 JP WO2023238465A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024526242A
Other languages
Japanese (ja)
Other versions
JP7750410B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023238465A1 publication Critical patent/JPWO2023238465A1/ja
Application granted granted Critical
Publication of JP7750410B2 publication Critical patent/JP7750410B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/003—Measuring of motor parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2024526242A 2022-06-09 2023-03-10 部品検査方法および装置 Active JP7750410B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022093398 2022-06-09
JP2022093398 2022-06-09
PCT/JP2023/009217 WO2023238465A1 (ja) 2022-06-09 2023-03-10 部品検査方法および装置

Publications (2)

Publication Number Publication Date
JPWO2023238465A1 true JPWO2023238465A1 (https=) 2023-12-14
JP7750410B2 JP7750410B2 (ja) 2025-10-07

Family

ID=89117973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024526242A Active JP7750410B2 (ja) 2022-06-09 2023-03-10 部品検査方法および装置

Country Status (4)

Country Link
EP (1) EP4538635A4 (https=)
JP (1) JP7750410B2 (https=)
CN (1) CN119317810A (https=)
WO (1) WO2023238465A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014153149A (ja) * 2013-02-07 2014-08-25 Nikon Corp 形状測定装置、構造物製造システム、形状測定方法、及びプログラム
JP2015068654A (ja) * 2013-09-26 2015-04-13 株式会社ニコン 形状測定装置、構造物製造システム及び形状測定用コンピュータプログラム
WO2017126060A1 (ja) * 2016-01-20 2017-07-27 三菱電機株式会社 ３次元計測装置及びその計測支援処理方法
JP2018054430A (ja) * 2016-09-28 2018-04-05 株式会社東芝 検査装置及び計測軌道経路生成方法
JP2020125916A (ja) * 2019-02-01 2020-08-20 Ｋｙｏｔｏ Ｒｏｂｏｔｉｃｓ株式会社 移載対象ワーク記憶システム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5462662B2 (ja) * 2010-02-25 2014-04-02 キヤノン株式会社 位置姿勢計測装置、物体識別装置、位置姿勢計測方法及びプログラム
US9482529B2 (en) * 2011-04-15 2016-11-01 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US10824773B2 (en) * 2017-03-28 2020-11-03 Faro Technologies, Inc. System and method of scanning an environment and generating two dimensional images of the environment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014153149A (ja) * 2013-02-07 2014-08-25 Nikon Corp 形状測定装置、構造物製造システム、形状測定方法、及びプログラム
JP2015068654A (ja) * 2013-09-26 2015-04-13 株式会社ニコン 形状測定装置、構造物製造システム及び形状測定用コンピュータプログラム
WO2017126060A1 (ja) * 2016-01-20 2017-07-27 三菱電機株式会社 ３次元計測装置及びその計測支援処理方法
JP2018054430A (ja) * 2016-09-28 2018-04-05 株式会社東芝 検査装置及び計測軌道経路生成方法
JP2020125916A (ja) * 2019-02-01 2020-08-20 Ｋｙｏｔｏ Ｒｏｂｏｔｉｃｓ株式会社 移載対象ワーク記憶システム

Also Published As

Publication number Publication date
JP7750410B2 (ja) 2025-10-07
EP4538635A1 (en) 2025-04-16
CN119317810A (zh) 2025-01-14
WO2023238465A1 (ja) 2023-12-14
EP4538635A4 (en) 2025-09-17

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