JPWO2023182011A5 - - Google Patents

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Publication number
JPWO2023182011A5
JPWO2023182011A5 JP2024510010A JP2024510010A JPWO2023182011A5 JP WO2023182011 A5 JPWO2023182011 A5 JP WO2023182011A5 JP 2024510010 A JP2024510010 A JP 2024510010A JP 2024510010 A JP2024510010 A JP 2024510010A JP WO2023182011 A5 JPWO2023182011 A5 JP WO2023182011A5
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JP
Japan
Prior art keywords
light
numerical aperture
optical system
image processing
irradiated
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Pending
Application number
JP2024510010A
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English (en)
Japanese (ja)
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JPWO2023182011A1 (enExample
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Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/009452 external-priority patent/WO2023182011A1/ja
Publication of JPWO2023182011A1 publication Critical patent/JPWO2023182011A1/ja
Publication of JPWO2023182011A5 publication Critical patent/JPWO2023182011A5/ja
Pending legal-status Critical Current

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JP2024510010A 2022-03-24 2023-03-10 Pending JPWO2023182011A1 (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022048770 2022-03-24
PCT/JP2023/009452 WO2023182011A1 (ja) 2022-03-24 2023-03-10 画像処理方法、画像処理装置、眼科装置、及びプログラム

Publications (2)

Publication Number Publication Date
JPWO2023182011A1 JPWO2023182011A1 (enExample) 2023-09-28
JPWO2023182011A5 true JPWO2023182011A5 (enExample) 2024-11-28

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ID=88101350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024510010A Pending JPWO2023182011A1 (enExample) 2022-03-24 2023-03-10

Country Status (3)

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US (1) US20250110040A1 (enExample)
JP (1) JPWO2023182011A1 (enExample)
WO (1) WO2023182011A1 (enExample)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2731226A1 (en) * 2008-07-21 2010-01-28 Optovue, Inc. Extended range imaging
US9247874B2 (en) * 2013-02-01 2016-02-02 Carl Zeiss Meditec, Inc. Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging
EP3155361B1 (en) * 2014-06-10 2024-08-14 Carl Zeiss Meditec, Inc. Improved frequency-domain interferometric based imaging systems and methods
JP2016041222A (ja) * 2014-08-19 2016-03-31 株式会社トプコン 眼底撮影装置
KR102631506B1 (ko) * 2016-02-12 2024-02-01 더 제너럴 하스피탈 코포레이션 광 간섭 단층촬영을 이용하는 고속 그리고 긴 심도 범위 이미징을 위한 장치 및 방법
CN109414162A (zh) * 2016-05-13 2019-03-01 洛桑联邦理工学院 用于倾斜照明下视网膜吸收相以及暗场成像的系统、方法和装置

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