JPWO2023176464A1 - - Google Patents
Info
- Publication number
- JPWO2023176464A1 JPWO2023176464A1 JP2023536874A JP2023536874A JPWO2023176464A1 JP WO2023176464 A1 JPWO2023176464 A1 JP WO2023176464A1 JP 2023536874 A JP2023536874 A JP 2023536874A JP 2023536874 A JP2023536874 A JP 2023536874A JP WO2023176464 A1 JPWO2023176464 A1 JP WO2023176464A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2022040921 | 2022-03-16 | ||
PCT/JP2023/007709 WO2023176464A1 (ja) | 2022-03-16 | 2023-03-02 | 要因推論装置、要因推論方法、要因推論システムおよび端末装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2023176464A1 true JPWO2023176464A1 (ja) | 2023-09-21 |
JPWO2023176464A5 JPWO2023176464A5 (ja) | 2024-02-22 |
Family
ID=88023563
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023536874A Pending JPWO2023176464A1 (ja) | 2022-03-16 | 2023-03-02 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPWO2023176464A1 (ja) |
WO (1) | WO2023176464A1 (ja) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3651693B2 (ja) * | 1995-02-24 | 2005-05-25 | 株式会社東芝 | プラント監視診断装置および方法 |
JP2000075923A (ja) * | 1998-09-03 | 2000-03-14 | Yamatake Corp | 異常診断装置 |
JP5055800B2 (ja) * | 2006-03-23 | 2012-10-24 | オムロン株式会社 | 要因推定装置、プログラムおよびコンピュータ読取可能記録媒体 |
JP5129725B2 (ja) * | 2008-11-19 | 2013-01-30 | 株式会社日立製作所 | 装置異常診断方法及びシステム |
JP5987581B2 (ja) * | 2012-09-14 | 2016-09-07 | 三菱化学株式会社 | Ft計算支援プログラム、ft計算支援方法及びft計算支援装置 |
JP6203169B2 (ja) * | 2014-12-25 | 2017-09-27 | 株式会社東芝 | プロセス評価装置およびプロセス評価プログラム |
JP6991833B2 (ja) * | 2017-10-31 | 2022-01-13 | 株式会社日立製作所 | 因果関係モデル構築システムおよび方法 |
US20190332957A1 (en) * | 2018-04-30 | 2019-10-31 | Fujitsu Limited | Causality for machine learning systems |
KR102242476B1 (ko) * | 2019-02-06 | 2021-04-19 | (주)코에버정보기술 | 관리 시스템 및 그를 위한 기계 학습 장치 및 관리 방법 |
JP7218747B2 (ja) * | 2020-04-28 | 2023-02-07 | Jfeスチール株式会社 | 支援装置及び支援方法 |
-
2023
- 2023-03-02 WO PCT/JP2023/007709 patent/WO2023176464A1/ja active Application Filing
- 2023-03-02 JP JP2023536874A patent/JPWO2023176464A1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2023176464A1 (ja) | 2023-09-21 |
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